Information
-
Patent Grant
-
6204720
-
Patent Number
6,204,720
-
Date Filed
Friday, October 9, 199826 years ago
-
Date Issued
Tuesday, March 20, 200123 years ago
-
Inventors
-
Original Assignees
-
Examiners
- Callahan; Timothy P.
- Nguyen; Minh
Agents
- Fliesler, Dubb, Meyer & Lovejoy LLP
-
CPC
-
US Classifications
Field of Search
US
- 327 530
- 327 538
- 327 378
- 327 512
- 327 513
- 327 540
- 327 541
- 326 32
- 326 31
- 323 907
-
International Classifications
-
Abstract
Control circuitry is used to provide a uniform temperature distribution between multiple power supplies on a chip which drive a single load. The power supplies each include a MOSFET with a source to drain path connecting VDD to the single load. The control circuitry includes a bipolar diode placed close to the MOSFET in each power supply unit, each diode providing a voltage varying inversely proportional to temperature changes resulting from power dissipated by its respective MOSFET. The control circuitry further includes components in each power supply unit to provide the voltage from the bipolar diode with the lowest voltage (or highest temperature) on a bus external to the power supply units. The bus voltage is then examined in the control circuitry in each of the power supply units and if the bipolar diode voltage in a unit is equal to the bus voltage, that unit does not increase current from its respective MOSFET to the load since it has the highest temperature. Other power supply units which have a diode voltage greater than the bus voltage will increase current supplied from their respective MOSFETs to the load. Lower temperature units will then heat up and higher temperature units will cool down until an equilibrium is reached.
Description
BACKGROUND OF THE INVENTION
1. Field of the Invention
This invention relates to a circuit for controlling load current from multiple power supplies connected to drive a single load.
2. Description of the Related Art
FIG. 1
shows a block diagram of a power supply circuit wherein multiple power supply units
100
1
-
100
N
drive a common load
102
. The power supply units
100
1
-
100
N
may each include a power metal oxide semiconductor field effect transistor (MOSFET) having a source to drain connecting V
DD
to the load
102
. As an alternative to MOSFETS, the power supply units
100
1
-
100
N
may also include some other suitable power or switching elements. Current provided to the load
102
in each of the power supply units
100
1
-
100
N
is controlled using a voltage bias circuit driving the gate of each of the power MOSFET transistors in the power supply units
100
1
-
100
N
. Typically, the bias circuitry is controlled so that the load current is equally shared between the MOSFETs of the power supply units
100
1
-
100
N
.
By equally distributing the load current between the power MOSFETs of the power supply units
100
1
-
100
N
, the difficulty a particular unit may have in achieving a desired current level is not taken into account. For example, suppose two power supply units share a 10 amp load. A typical current sharing scheme would force each power supply unit to provide
5
amps of load current. Now assume that a MOSFET in a first power supply unit has a drain to source resistance (Rds) that is 25% higher than the second power supply unit. The power dissipated by the first power supply unit would then be 25% higher than power dissipated by the second unit. The first unit could then run significantly hotter than the second unit, potentially causing reliability problems.
SUMMARY OF THE INVENTION
The present invention allows multiple power supply units to drive a single load with each power supply unit contributing equally from the perspective of power dissipation so that a uniform temperature can be achieved among all power supply units.
The present invention senses power dissipated in each power supply unit by measuring the temperature of the integrated circuit power supply unit, and then controls the current provided from each power supply unit to equalize the temperatures.
The present invention includes current control circuitry with a first bipolar diode placed in close thermal proximity to the MOSFET in each power supply unit. By being placed in close thermal proximity to a MOSFET, each first diode provides a voltage varying inversely proportional to temperature changes caused by power dissipated from the respective MOSFET.
The control circuitry further includes a second diode and amplifier provided in each power supply unit to apply the voltage from the first diode with the lowest voltage (or highest temperature) on a bus external to the power supply units. The amplifier and second diode of each power supply unit then function so that if the voltage across the first diode in a unit is equal to the bus voltage, the bias voltage applied to the gate of the MOSFET in that unit is not increased since it has the highest temperature. However, if the unit has a first diode voltage greater than the bus voltage, bias voltage applied to the gate of the MOSFET in the unit is increased so that the unit supplies a greater share of the load current. Lower temperature units will then heat up and higher temperature units will cool down until an equilibrium is reached.
BRIEF DESCRIPTION OF THE DRAWINGS
Further details of the present invention are explained with the help of the attached drawings in which:
FIG. 1
is a block diagram of power supply units driving a single load; and
FIG. 2
shows multiple power supply units driving a single load along with control circuitry of the present invention to provide a uniform temperature distribution between the power supply units.
DETAILED DESCRIPTION
FIG. 2
shows multiple linear power supply units
200
1
-
200
N
connected in parallel to drive a single load
250
. The power supply units
200
1
-
200
N
include control circuitry of the present invention to provide a uniform temperature distribution. Detailed circuitry is shown in
FIG. 2
for the power supplies
200
1
and
200
2
. Although circuitry for linear power supply units are shown, the present invention as described in detail below is likewise applicable to other power supply schemes, such as switching power supplies or power elements other than MOSFETs.
As with prior art power supply units, each of the units
200
1
-
200
N
includes a respective power MOSFET
202
1
-
202
N
each having a source to drain path connecting one of power supplies V
DD1-V
DDN
to the load
250
. Although the power supplies V
DD1
-V
DDN
are shown as separate devices, a single power supply may likewise be used with the source to drain of each of the power MOSFETs
202
1
-
202
N
connecting the single power supply to the load
250
.
The MOSFETS
202
1
-
202
N
are each connected with a respective amplifier
204
1
-
204
N
to form primary regulating or biasing loops in each power supply. The output voltage at the load terminal
252
is sensed at the inverting input of each of the amplifiers
204
1
-
204
N
in the loops and compared to the series combination of respective voltage sources
206
1
-
206
N
and
208
1
-
208
N
as sensed at a noninverting terminal of the amplifier. If the voltage at the load terminal
252
drops below the voltage applied to the noninverting input of one of the amplifiers
204
1
-
204
N
, the amplifier will turn on to increase the voltage on the gate of the MOSFET connected to its output, resulting in increased current provided from the respective MOSFET. The voltage sources
206
1
-
206
N
are fixed voltage references all with the same voltage for each of the power supply units, while the voltage sources
208
1
-
208
N
are adjustable voltage sources receiving a control voltage and supplying a voltage much less than any of the voltage sources
206
1
-
206
N
.
The control circuitry of the present invention for biasing the gate of the MOSFETs
202
1
-
202
N
in each of the power supply units includes a respective bipolar diode
210
1
-
210
N
. Each diode
210
1
-
210
N
is a temperature sensing diode placed in close thermal proximity to a corresponding MOSFET
202
1
-
202
N
in the power supply units. As current increases through each MOSFET, so does temperature, so the voltage across a corresponding diode
210
1
-
210
N
should drop inversely proportional to temperature by the well known approximation of −2 mV per degree Celsius of temperature rise. The temperature of the chip in the vicinity of each MOSFET can then be represented by voltage across one of the diodes
210
1
-
210
N
with a known current flowing through the diode.
A known current is provided to the diodes
210
1
-
210
N
with respective current sources
212
1
-
212
N
. The current sources
212
1
-
212
N
each connect a respective one of the power supplies V
DD1
-V
DDN
to one of the diodes
210
1
-
210
N
. The current sources
212
1
-
212
N
can each be provided by a transistor having a gate connected to a voltage reference. With the diodes
210
1
-
210
N
being p-n type bipolar diodes, the current source will be connected to the p terminal, while the n terminal will be connected to V
SS
.
The power supply units each further include a respective amplifier
214
1
-
214
N
and second diode
216
1
-
216
N
. The second diodes
216
1
-
216
N
each have a p-n type junction with a p terminal connected to the inverting input of a respective amplifier
214
1
-
214
N
and an n terminal connected to the output of the respective amplifier
214
1
-
214
N
. The voltage difference from the inverting to the noninverting input of the amplifiers
214
1
-
214
N
is applied to the control input of a voltage source
208
1
-
208
N
in each of the power supply units.
The inverting input of the amplifiers
214
1
-
214
N
are connected together to form a bus
218
. The bus
218
is connected by a resistor
220
to the power supply V
DD1
for the power supply unit
202
1
.
In operation, the respective amplifiers
214
1
-
214
N
and second diodes
216
1
-
216
N
of each power supply unit function to force the voltage from the one of the bipolar diodes
210
1
-
210
N
which has the lowest voltage onto the bus
218
. Such a function is provided since the noninverting input of the amplifier
214
1
-
214
N
with the lowest bipolar diode voltage will be lower than its inverting input voltage and its output will forward bias a respective diode
216
1
-
216
N
to charge the bus
218
so that its noninverting and inverting inputs will be equal. The bipolar diodes
210
1
-
210
N
which do not have the lowest voltage will drive their respective amplifiers
214
1
-
214
N
so as to reverse bias their respective diodes
216
1
-
216
N
and, thus, will not affect the voltage on bus
218
. Note that the diode voltages of bipolar diodes
210
1
-
210
N
are related to the die temperature in the area they are located, and the diode with the lowest voltage will correspond with the power supply unit which is the hottest.
By having inputs connected to one of diodes
210
1
-
210
N
and the bus
218
as well as to provide the control voltage for voltage sources
208
1
-
208
N
, the amplifiers
214
1
-
214
N
also function to measure the temperature of the diodes
210
1
-
210
N
relative to the diode controlling the bus
218
and increase the temperature of the cooler power supply units to match that of the warmest power supply unit. To do so, the amplifier
214
1
-
214
N
of the hottest power supply unit will provide no voltage difference between its inputs to the control input of its respective variable voltage source
208
1
-
208
N
, so its respective power MOSFET
202
1-N
voltage will not cause additional current to be applied to the load
250
. A difference will be applied between the noninverting and inverting terminals of amplifiers
214
1
-
214
N
in cooler power supply units so their respective voltage sources
208
1
-
208
N
will apply additional voltage to increase current from their respective power MOSFETS. Temperature in the cooler power supply units will, thus, increase relative to the hottest power supply unit. The die temperatures for the different power supply units will then approach the same value.
The present invention works particularly well with monolithic power control chips, because such a chip will have power MOSFET temperatures which are substantially the same temperature as the die area in which the temperature sensing diodes are located.
Although the invention has been described above with particularity, this was merely to teach one of ordinary skill in the art how to make and use the invention. Many modifications will fall within the scope of the invention, as that scope is defined by the claims which follow. For example, although the present invention is implemented using diodes
210
1
-
210
N
which provide a voltage dependent on temperature, other elements such as resistors which provide a temperature dependent voltage may likewise be used.
Claims
- 1. An integrated circuit including a plurality of power supply units for driving a load terminal, each power supply unit comprising:a power transistor having a source to drain path connecting a first power supply terminal (VDD) to the load terminal, and having a gate; a variable voltage source having a first voltage supply terminal coupled to the gate of the power transistor, and having a voltage control terminal; a first diode having a p-n junction with a p terminal coupled by a current source to the first power supply terminal (VDD) and an n terminal coupled to a second power supply terminal (VSS); a first amplifier having a noninverting terminal coupled to the p terminal of the first diode, an inverting terminal coupled to a bus line, and an output, wherein a voltage difference from the noninverting terminal to the inverting terminal of the first amplifier is coupled to the voltage control input of the variable voltage source; and a second diode having a p-n junction with a p terminal coupled to the inverting input of the first amplifier and an n terminal coupled to the output of the first amplifier.
- 2. The integrated circuit of claim 1, further comprising:a resistor having a first terminal coupled to the bus line and a second terminal coupled to the first power supply connection (VDD).
- 3. The integrated circuit of claim 1 wherein each power supply further comprises:a second amplifier having a noninverting terminal connected to the first voltage terminal of the variable voltage source, an output coupled to the gate of the power transistor, and a noninverting input coupled to the load terminal.
- 4. The integrated circuit of claim 3 further comprising:a voltage source connected between the second power supply terminal (VSS) and a second voltage terminal of the variable voltage source.
US Referenced Citations (2)
Number |
Name |
Date |
Kind |
5939872 |
Dubos et al. |
Aug 1999 |
|
5973542 |
Okayasu et al. |
Oct 1999 |
|