The present invention relates generally to field effect transistors (FET) devices for motor drivers.
Variable blower controllers, or linear power modules, are devices that use power transistors operating in their linear region to achieve a variable DC voltage across a motor. As a result of operating in a linear manner, the transistors dissipate significant power and produce heat. The heat is removed from the system using a heat sink which is typically placed directly into the air stream of the vehicle HVAC system.
The energy of a large voltage transient will increase the power dissipated by the transistor as the voltage across the transistor and the current through it increase. As a result, the temperature of the transistor will rise. In the event of multiple transients, or a single significantly large and long duration transient, it is possible for the transistor maximum temperature rating to be exceeded. The result in this case can be an inoperable or improperly operating device.
Why not shut the transistor off? If one can shut the transistor off during the transient event, the instantaneous power dissipated by the transistor will be zero, but another problem then typically arises. As the transistor is turned off, the inductive load still tries to push current through the transistor, hence a voltage build up will be seen across the transistor terminals. Depending on the size of the inductive load, the voltage build up across the transistor terminals can exceed the device rating, and thus may damage the device.
The present invention provides a new discrete circuit to provide protection for power transistors used to drive DC motors in a linear fashion. The present invention employs a circuit to detect an over-voltage transient, such as a vehicle alternator load dump, and forces or adjusts the drive transistor into saturation or a full-on state, thus lowering the power dissipated by the power transistor.
A discrete circuit that is capable of detecting an atypically large voltage at the battery connection is used to force or adjust the power transistor to a full on condition. If a large voltage transient is detected, a “sense circuit” will inform a “transistor drive circuit” of the event. If the inductive load is running during the transient event (i.e., the transistor is operating in a linear mode), the transistor drive circuit will turn the transistor full on, thus decreasing the transistor power dissipation. If the inductive load was off before the voltage transient event occurs, the transistor drive circuit will keep the transistor off.
Referring now to the drawings and the illustrative embodiments depicted therein, a load dump protection system is operable to provide protection for power transistors used to drive DC motors (such as blower motors for vehicles) in a linear fashion. The present invention employs a circuit to detect an over-voltage transient, such as a vehicle alternator load dump, and forces or adjusts the drive transistor into saturation or a full-on state, thus lowering the power dissipated by the power transistor.
As shown in
As shown in
The output of the comparator, when the battery voltage exceeds the threshold level or limit, drives a bipolar (NPN) transistor (Q4) into saturation. The collector of the transistor forces an op-amp circuit (U1:B and surrounding circuit) to apply a maximum voltage to the base of the power FET (U2) to force the power FET fully on. A diode (D5) (or other suitable diode or element) is disposed at the gate of the NPN transistor and allows the microprocessor (U4) (used in this application) to override the circuit and keep the transistor (Q4) off. Other circuitry means or elements may be implemented to provide a path for the microprocessor to override the op-amp circuit, or other circuitry means or elements may be implemented to replace the diode's role and/or the microprocessor's role, while remaining within the spirit and scope of the present invention.
In the illustrated embodiment, the resistors may comprise 0.1 W, 5 percent, 200 ppm resistors, and the capacitors may comprise 50 V, 20 percent capacitors. Test points 33, 27, 29, 30, 31 and 48 may be used for in-circuit programming of microprocessor U4. The microprocessor may comprise any suitable processor while remaining within the spirit and scope of the present invention.
During load testing, and as shown in
Optionally, the circuit and variable blower controller may utilize aspects of the variable blower controllers described in U.S. Pat. Nos. 7,065,435 and 6,871,126, which are hereby incorporated herein by reference in their entireties.
Changes and modifications to the specifically described embodiments may be carried out without departing from the principles of the present invention, which is intended to be limited only by the scope of the appended claims, as interpreted according to the principles of patent law.
The present application claims benefit of U.S. provisional application Ser. No. 60/872,681, filed Dec. 4, 2006, which is hereby incorporated herein by reference in its entirety.
Number | Name | Date | Kind |
---|---|---|---|
4002959 | Schadlich et al. | Jan 1977 | A |
4044295 | Ferraiolo et al. | Aug 1977 | A |
4389990 | Murray | Jun 1983 | A |
4418298 | Suzuki et al. | Nov 1983 | A |
4427931 | Tsukihashi | Jan 1984 | A |
4481448 | Bishop | Nov 1984 | A |
4511829 | Wisniewski | Apr 1985 | A |
4523134 | Kinoshita et al. | Jun 1985 | A |
4562393 | Loyzim et al. | Dec 1985 | A |
4583028 | Angersbach et al. | Apr 1986 | A |
4626962 | Ahn et al. | Dec 1986 | A |
4665350 | Angi et al. | May 1987 | A |
4749922 | Hoppe et al. | Jun 1988 | A |
4803410 | Shinohara et al. | Feb 1989 | A |
4893067 | Bhagwat et al. | Jan 1990 | A |
4893215 | Urushiwara et al. | Jan 1990 | A |
4899256 | Sway-Tin | Feb 1990 | A |
4999556 | Masters | Mar 1991 | A |
5070267 | Sano et al. | Dec 1991 | A |
5119265 | Qualich et al. | Jun 1992 | A |
5230035 | Spring | Jul 1993 | A |
5285146 | Pierret et al. | Feb 1994 | A |
5329238 | Hofsass et al. | Jul 1994 | A |
5363024 | Hiratsuka et al. | Nov 1994 | A |
5521785 | Schmidt et al. | May 1996 | A |
5594307 | Adachi et al. | Jan 1997 | A |
5747956 | Lamm | May 1998 | A |
5781385 | Permuy | Jul 1998 | A |
5799869 | Pichotta | Sep 1998 | A |
5917296 | Frey et al. | Jun 1999 | A |
5988517 | Bauer et al. | Nov 1999 | A |
6018234 | de Savasse | Jan 2000 | A |
6054198 | Bunyan et al. | Apr 2000 | A |
6064931 | Sawada et al. | May 2000 | A |
6175791 | Oouchi | Jan 2001 | B1 |
6180880 | Loibl et al. | Jan 2001 | B1 |
6201366 | Menegoli | Mar 2001 | B1 |
6281827 | Hsieh | Aug 2001 | B1 |
6329785 | Starkie et al. | Dec 2001 | B1 |
6404607 | Burgess et al. | Jun 2002 | B1 |
6587338 | LaCroix et al. | Jul 2003 | B2 |
6871126 | Gorman et al. | Mar 2005 | B2 |
6927549 | Ashiya et al. | Aug 2005 | B2 |
7065435 | Gorman et al. | Jun 2006 | B2 |
20020066281 | Gunasekera | Jun 2002 | A1 |
20020150478 | Aoki | Oct 2002 | A1 |
20030057899 | LaCroix | Mar 2003 | A1 |
20030063900 | Wang et al. | Apr 2003 | A1 |
20030090919 | Merceron et al. | May 2003 | A1 |
20030123224 | LaCroix et al. | Jul 2003 | A1 |
20030204292 | Wang et al. | Oct 2003 | A1 |
Number | Date | Country | |
---|---|---|---|
20080130178 A1 | Jun 2008 | US |
Number | Date | Country | |
---|---|---|---|
60872681 | Dec 2006 | US |