The invention may best be understood by reference to the following description taken in conjunction with the accompanying drawings, in which:
Although the invention will be described in connection with certain preferred embodiments, it will be understood that the invention is not limited to those particular embodiments. On the contrary, the invention is intended to include all alternatives, modifications and equivalent arrangements as may be included within the spirit and scope of the invention as defined by the appended claims.
Turning now to
The motor circuit protector 100 includes a control panel 112 with a full load ampere (“FLA”) dial 114 and an instantaneous trip point (“Im”) dial 116 which allows the user to configure the motor circuit protector 100 for a particular type of motor to be protected within the rated current range of the motor circuit protector 100. The full load ampere dial 114 allows a user to adjust the full load which may be protected by the motor circuit protector 100. The instantaneous trip point dial 116 has settings for automatic protection (three levels in this example) and for traditional motor protection of a trip point from 8 to 13 times the selected full load amperes on the full load ampere dial 114. The dials 114 and 116 are located next to an instruction graphic 118 giving guidance to a user on the proper settings for the dials 114 and 116. In this example, the instruction graphic 118 relates to NEC recommended settings for the dials 114 and 116 for a range of standard motors. The motor circuit protector 100 includes a breaker handle 120 that is moveable between a TRIPPED position 122 (shown in
The motor circuit protector 100 includes a power supply circuit 216, a trip circuit 218, an over-voltage trip circuit 220, a temperature sensor circuit 222, a user adjustments circuit 224, and a microcontroller 226. In this example, the microcontroller 226 is a PIC16F684-E/ST programmable microcontroller, available from Microchip Technology, Inc. based in Chandler, Ariz., although any suitable programmable controller, microprocessor, processor, etc. may be used. The microcontroller 226 includes current measurement circuitry 241 that includes a comparator and an analog-to-digital converter. The trip circuit 218 sends a trip signal to an electromechanical trip solenoid 228, which actuates a trip mechanism, causing the breaker handle 120 in
The signals from the three current transformers 210, 212 and 214 are rectified by a conventional three-phase rectifier circuit (not shown in
The configurable inputs of the microcontroller 226 include a power supply capacitor input 232, a reference voltage input 234, a reset input 236, a secondary current input 238, and a scaled secondary current input 240, all of which are coupled to the power supply circuit 216. The microcontroller 226 also includes a temperature input 242 coupled to the temperature sensor circuit 222, and a full load ampere input 244 and an instantaneous trip point input 246 coupled to the user adjustments circuit 224. The user adjustments circuit 224 receives inputs for a full load ampere setting from the full load ampere dial 114 and either a manual or automatic setting for the instantaneous trip point from the instantaneous trip point dial 116.
The microcontroller 226 also has a trip output 250 that is coupled to the trip circuit 218. The trip output 250 outputs a trip signal to cause the trip circuit 218 to actuate the trip solenoid 228 to trip the breaker handle 120 based on the conditions determined by the control algorithm 230. The microcontroller 226 also has a burden resistor control output 252 that is coupled to the power supply circuit 216 to activate current flow across a burden resistor (not shown in
The breaker handle 120 controls manual disconnect operations allowing a user to manually move the breaker handle 120 to the OFF position 126 (see
The over-voltage trip circuit 220 is coupled to the trip circuit 218 to detect an over-voltage condition from the power supply circuit 216 to cause the trip circuit 218 to trip the breaker handle 120 independently of a signal from the trip output 250 of the microcontroller 226. The temperature sensor circuit 222 is mounted on a circuit board proximate to a copper burden resistor (not shown in
The microcontroller 226 first operates the power supply circuit 216 in a startup mode when a reset input signal is received on the reset input 236. A charge mode provides voltage to be stored for actuating the trip solenoid 228. After a sufficient charge has been stored by the power supply circuit 216, the microcontroller 226 shifts to a normal operation mode and monitors the power supply circuit 216 to insure that sufficient energy exists to power the electro-mechanical trip solenoid 228 to actuate the breaker handle 120. During each of these modes, the microcontroller 226 and other components monitor for trip conditions.
The control algorithm 230 running on the microcontroller 226 includes a number of modules or subroutines, namely, a voltage regulation module 260, an instantaneous trip module 262, a self protection trip module 264, an over temperature trip module 266 and a trip curves module 268. The modules 260, 262, 264, 266 and 268 generally control the microcontroller 226 and other electronics of the motor circuit protector 100 to perform functions such as governing the startup power, establishing and monitoring the trip conditions for the motor circuit protector 100, and self protecting the motor circuit protector 100. A storage device 270, which in this example is an electrically erasable programmable read only memory (EEPROM), is coupled to the microcontroller 226 and stores data accessed by the control algorithm 230 such as trip curve data and calibration data as well as the control algorithm 230 itself. Alternately, instead of being coupled to the microcontroller 226, the EEPROM may be internal to the microcontroller 226.
The trip circuit 218 may be activated in a number of different ways. As explained above, the over-voltage trip circuit 220 may activate the trip circuit 218 independently of a signal from the trip output 250 of the microcontroller 226. The microcontroller 226 may also activate the trip circuit 218 via a signal from the trip output 250, which may be initiated by the instantaneous trip module 262, the self protection trip module 264, or the over temperature trip module 266. For example, the instantaneous trip module 262 of the control algorithm 230 sends a signal from the trip output 250 to cause the trip circuit 218 to activate the trip solenoid 228 when one of several regions of a trip curve are exceeded. For example, a first trip region A is set just above a current level corresponding to a motor locked rotor. A second trip region B is set just above a current level corresponding to an in-rush current of a motor. The temperature sensor circuit 222 outputs a signal indicative of the temperature, which is affected by load current and ambient temperature, to the over temperature trip module 266. The over temperature trip module 266 will trigger the trip circuit 218 if the sensed temperature exceeds a specific threshold. For example, load current generates heat internally by flowing through the current path components, including the burden resistor, and external heat is conducted from the breaker lug connections. A high fault current may cause the over temperature trip module 266 to output a trip signal 250 (
The trip signal 250 is sent to the trip circuit 218 to actuate the solenoid 228 by the microcontroller 226. The trip circuit 218 may actuate the solenoid 228 via a signal from the over-voltage trip circuit 220. The requirements for “Voltage Regulation,” ensure a minimum power supply voltage for “Stored Energy Tripping.” The trip circuit 218 is operated by the microcontroller 226 either by a “Direct Drive” implementation during high instantaneous short circuits or by the control algorithm 230 first ensuring that a sufficient power supply voltage is present for the “Stored Energy Trip.” In the case where the “Stored Energy” power supply voltage has been developed, sending a trip signal 250 to the trip circuit 218 will ensure trip activation. During startup, the power supply 216 may not reach full trip voltage, so a “Direct Drive” trip operation is required to activate the trip solenoid 228. The control for Direct Drive tripping requires a software comparator output sense mode of operation. When the comparator trip threshold has been detected, the power supply charging current is applied to directly trip the trip solenoid 228, rather than waiting for full power supply voltage.
The over-voltage trip circuit 220 can act as a backup trip when the system 200 is in “Charge Mode.” The control algorithm 230 must ensure “Voltage Regulation,” so that the over-voltage trip circuit 220 is not inadvertently activated. The default configuration state of the microcontroller 226 is to charge the power supply 216. In microcontroller control fault scenarios where the power supply voltage exceeds the over voltage trip threshold, the trip circuit 218 will be activated. Backup Trip Levels and trip times are set by the hardware design.
The user adjustments circuit 224 accepts inputs from the user adjustment dials 114 and 116 to adjust the motor circuit protector 100 for different rated motors and instantaneous trip levels. The dial settings are converted by a potentiometer to distinct voltages, which are read by the trip curves module 268 along with temperature data from the temperature sensor circuit 222. The trip curves module 268 adjusts the trip curves that determine the thresholds to trigger the trip circuit 218. A burden circuit 306 in the power supply circuit 216 allows measurement of the secondary current signal, which is read by the instantaneous trip module 262 from the peak secondary current analog-to-digital input 238 (shown in
As shown in
Embedded software 230 is provided for switching a trip unit, such as the motor circuit protector 100, when detecting a failure mode in the trip unit. The software 230 implements switch detection algorithms that include failure mode detection. The algorithm 230 can be used on any trip unit system that accesses calibrated trip pick-up data, including the motor circuit protector 100. As described in more detail in connection with
Aspects of the present invention enable a fail-safe operation mode where user adjustments (such as adjustments of the full load ampere dial 114 and/or the instantaneous trip point dial 116) can revert to predetermined protective levels. An electronic circuit for a potentiometer is configured to present a percentage of a microcontroller's analog/digital (“A/D”) full scale to an A/D input pin, where one channel is used for each user adjustment position.
The user adjustment circuit 224 can be used as a switch for detecting an open contact fault, a short-to-ground fault, and/or a short to a supplied or reference voltage. As described in more detail below in reference to
Aspects of the present invention provide numerous improvements and benefits. In an example, the potentiometer's vulnerability to electrostatic discharge (“ESD”) is decreased by increasing an over-surface distance of the adjustment button. The adjustment button interacts with a cover to increase the likelihood that the adjustment button will easily rotate only to a designed switch position, not to an unintended in-between position. The adjustment button interacts with the cover to have increased consistent feel to a user by incorporating, for example, three detent pressure arms (or spring elements) located symmetrically around the user adjustment button 120 degrees apart.
In another example, low cost components can be utilized (while achieving improved over-all system performance), eliminating need for switch calibration, and providing the ability to use quantitative techniques to verify switch performance in a production test process. Trip unit products can be easily and securely updated, independent of embedded software product design. For example, trip point changes in relation to switch settings can be made without changing product software code as long as data points are within a maximum/minimum range.
Referring to switch calibration and switch performance, a statistical distribution of data corresponding to switch settings can be used to determine position thresholds. The position thresholds and device performance are monitored for each trip unit. Additionally, automated process techniques can be used during product development to quantitatively monitor user adjustment performance. For example, mechanical torque, angular orientation, and microprocessor data have correlated profiles that can be quantitatively adapted for monitoring user-adjustment performance. This quantitative approach is an improvement over an approach that requires manual inspection of mechanical user adjustment.
The automated process technique involves a functional tester with two motors that can rotate the switches 114, 116 to any position. The motors are coupled to motor drivers that detect the amount of current needed to drive each switch 114, 116 to different positions. A torque can be derived directly from this current, and the rotation (in degrees) can be derived from the torque or from optical decoders in the motors that detect the amount of rotation a motor shaft has turned. The functional tester is coupled to communicate the switch rotation angle to the microcontroller 226. The automated process technique automatically rotates the switches 114, 116 to various positions, measures the corresponding torque required to put the switches into the various positions, calculates the angle of rotation (i.e., the distance traveled by the motor) from the torque or from the optical decoders, and communicates, via the microcontroller 226, an A/D count that represents the voltage level from a potentiometer 510.
The user adjustment circuit is mechanically aligned with the user-adjustment button so that button position “P5” 403 is nominally at 50% resistance. An analog/digital (“A/D”) reference voltage (“Vdd”) is presented to a switch circuit, and each analog voltage converted by the A/D converter into corresponding digital values can be expressed as a percentage of the reference voltage (i.e., “% Vdd”).
The mechanical orientation of the switch relative to a resistive element of the potentiometer sets a signal presented to a microcontroller for measurement. According to an implementation of the present invention, the mechanical design of the switch is illustrated as a nine-position switch, with a “Detent” feature in-between positions and “Stop” features at the switch extremes (i.e., “P1” and “P9”). Table 1 shows some of the electromechanical parameters considered in the software design.
The switch positions can be determined from experimental test results of voltages at the microcontroller's inputs for each of the desired mechanical positions, i.e., A/D inputs also referred to as “FLA” (full load amperes) and “Im” (instantaneous trip point current) inputs. The movement of the switch within a particular position is considered and expressed as a maximum voltage allowable value and a minimum voltage allowable value. These voltage values may be expressed as a percentage of the switch reference voltage or as the equivalent respective 8 bit A/D threshold values, such as, e.g., the threshold values (also referred to as “thresholds”) illustrated below in Table 2.
Switch error detection is accomplished by implementation of a “SW_HIGH_ERR” specification, independently, for both “FLA” and “Im” switches. Is If a switch is oriented past a stop-feature maximum limit, then a switch error will be detected and the switch logic shall revert to a specified position, such as illustrated in Table 2. For example, when the “SW_HIGH_ERR” limit is reached, both the “FLA” and the “Im” switches default to position 1 setting, independently.
Analogously, trip points stored in the EEPROM 270 (there are 81 in a specific aspect, which represent high temperature settings) are associated with 27 FLA and Im position combinations. A diagnostic routine periodically adds up all the trip point data values and compares the summed values against a checksum. If the checksum does not match the summed values, a Diagnostics Trip will occur, eventually causing the MCP 100 to trip. Alternately, instead of causing a Diagnostics Trip, the diagnostic routine can revert to predetermined trip point settings. In an aspect, the predetermined settings are set to a low pickup level. In this manner, the integrity of trip points and trip data stored in the EEPROM 270 can be verified. When the verification fails, either tripping can occur, or the trip curve settings can be automatically reverted to predetermined low pickup settings.
On start-up, switch positions should be determined before attempting instantaneous (“INST”) trip detection. Optionally, it is permissible to read an adjacent switch position at the minimum/maximum extremes of the mechanical adjustments. However, the software 230 should read the correct switch positions at the nominal (or center) mechanical switch adjustment markings. Labels identifying the adjustment markings should be aligned to mechanical specifications.
A user adjusts the switch positions, either from an “Energized” or “De-energized” state. The software design considers one or more of the electrical and software parameters shown below in Table 3. While the application is running, the switch settings are updated at the “Switch Change Perception” rate. A minimum “Switch Change Perception” rate may be specified to spread over time a temperature compensation calculation.
FSv corresponds to the full-scale voltage of the A/D converter to which the FLA and Im inputs 244, 246 are coupled. For example, FSv may correspond to 5 volts (nominal). The A/D converter may be part of the measurement circuit 241 shown in
Switch position settings may determine product trip curve settings. These settings are realized by implementing a switch to an EEPROM 270 trip point lookup algorithm. The same translation algorithm can be implemented in a plurality of circuit breakers. Each switch setting permutation may correspond to a specified pair of “A” and “B/C” trip points as per breaker trip settings specifications.
The “A” and “B/C” trip points may be implemented as 16 bit words in 8 bit EEPROM memory 270. The formatting of “A” and “B” trip data can be identical and 10 bit left justified. The “C” trip points are packed within the “B/C” word and 5 bit right justified. This trip data organization is convenient for implementing the switch translation algorithm, specified by the equations listed below in Table 4.
Note that in Table 4, the convention “[x:H]” is the high byte of word x, while “[x:L]” is the low byte of word x. Also, the “SW1” and “SW2” variables correspond respectively to the “FLA” and “Im” switch positions, 1 through 9.
As stated above, the trip curve profiles are stored in the EEPROM memory 270. The various combinations of “FLA” 114 and “Im” 116 adjustments will cause the control algorithm 230 to point to specific pickup values stored in EEPROM memory 270. The EEPROM values will represent the actual A/D pickup levels for the corresponding settings.
In an implementation, there are twenty-seven independent trip regions “A,” for each of the breakers, specifically for the first three “Im” switch 116 positions. For all remaining “Im” switch 116 positions, trip region “A” equals “B” and region “C” exists. Table 5.13.1 shows the storage requirements for trip curve implementation in the EEPROM 270.
The software trip curve settings are dependent on the combination of “FLA” and “Im” user adjustment switches 114, 116. For example, in an implementation, there are nine different FLA settings, in addition to nine “Im” settings for each of the “FLA” settings. This is equivalent to eighty-one different trip curve profiles for the circuit breaker 100. Each of the eighty-one different settings correspond to a different trip profile.
The following exemplary table lists for each breaker size, the FLA settings corresponding to each of the switch positions 1-9 of the FLA dial 114. For example, the circuit breaker 100 may have a current rating of 30 A rms, 50 A rms, etc. For each current rating, there are different FLA settings as set forth in the table below.
Likewise, for each “Im” (instantaneous trip point current), there is defined a set of auto setting multipliers and manual settings corresponding to FLA multiples. The following table lists examples of such settings.
For each FLA-Im combination, there are stored in the EEPROM 270 for each trip curve A, B, C, the peak rms primary current Ip, the peak primary current Ip, and the peak secondary current Is.
The mechanical button is adjusted to a first position (412). The mechanical adjustment causes a first signal to be received from the user adjustment circuit (414). The first signal is indicative of a trip curve. The first signal is associated with one of a plurality of trip curves (416) and a first trip curve is produced in response to the association between the first signal and the plurality of trip curves (418). An operating trip curve is set to be the first trip curve (420).
The spring element 506a includes the rigid base 506b, the flex member 506c, and the location nipple 506d. The rigid base 506b is in direct contact with the shoulder 506j and connects two flex members 506c of respective adjacent spring elements 506a. A gap separates the flex member 506c and the shoulder 506j, and the location nipple 506d is located generally in a central location of the flex member 506c.
The stop 506e is located generally over one of the rigid bases 506b and is in contact with the shoulder 506j. Furthermore, the stop 506e includes the two stopping surfaces 506f, which are symmetrically located at opposing ends of the stop 506e.
The shoulder 506j is generally a cylinder centrally located on top of the insulation disc 506g. The shoulder 506j is surrounded by the spring elements 506a and the stop 506e. Starting on a top surface of the shoulder 506j, an arrow-shaped blind hole 506k is provided for receiving a tool when rotational movement of the adjustment switch 506 is required.
The insulation disc 506g is located at the bottom of the adjustment button 506, below the shoulder 506j. The insulation disc 506g has a diameter that is greater than the diameter of the shoulder 506j, to increase resistance to ESD and to provide protection against pollutants entering the cavity located between the insulation disc 506g and the printed wire assembly 508. When a user, such as a customer, touches a top exterior surface of the cover 504, static electricity carried by the user may try to reach internal electronics through air or over surfaces located between the adjustment button 506 and the cover 504. The insulation disc 506g increases the distance that ESD needs to travel to go from a front face of the adjustment button 506 (e.g., a top surface of the adjustment button 506 in which the arrow-shaped hole 506k is located) to the potentiometer 510 and other components on the printed wire assembly 508. Thus, the insulation disc 506g increases ESD protection by increasing through-air or over-surface distance of the adjustment button 506. In addition, the insulation disc 506g protects against pollutants (such as environmental debris, dust, oil, and the like) from entering the cavity between the insulation disc 506g and the printed wire assembly 508, which may interfere with the potentiometer 510.
To increase ESD protection of the potentiometer 510, a bottom surface of the insulation disc 506g is greater than the bottom face of the potentiometer 510. For example, as more clearly shown in
The protrusion 506h is centrally located on a bottom surface of the insulation disc 506g and has a cross-shaped profile. The illustrated embodiment of the protrusion 506h is also referred to as an “X” style protrusion.
The bearing surface 504a defines in part the circular hole 504e, which locates the adjustment switch 506 and allows rotational movement of the adjustment switch 506. The shoulder 506j has a diameter dimensioned such that a top portion of the shoulder 506j can protrude through the hole 504e.
The stop limits 504b are located below the bearing surface 504a. Specifically, each stop limit 504b is a surface formed by removing material along the depth of the hole 504e such that a partial greater-diameter hole is formed within the hole 504e.
The position detents 504c are located below the stop limits 504b, along the circumference and near the bottom of the hole 504e (in the interior of the cover 504). Each detent 504c is defined by two detent walls 504d coupled by a trough 504g. In addition, each detent 504c is connected to another detent 504c by a common crest 504f. Specifically, the crest 504f is located at the intersection of two detent walls 504d that are not part of the same detent 504c and that is a point generally closest to a center axis of the hole 504e.
When the adjustment switch 506 is inserted into the hole 504e, the flex members 506c are generally aligned with the position detents 504c along an axial direction of the hole 504e. Additionally, a center axis of the adjustment switch 506 is generally collinear with the center axis of the hole 504e. Each of the location nipples 506d is located within a corresponding clearance formed by two detent walls 504d between two consecutive crests 504f.
When the adjustment switch 506 is rotated relative to the cover 504, the location nipples 506d comes into contact with the detent walls 504d. The flex member 506c of the spring elements 506a elastically deforms towards the center axis of the adjustment switch 506 to allow the location nipple 506d to move over a crest 504f of a position detent 504c. When the movement forces the location nipple 506d of each spring element 506a past a respective crest 504f, the location nipple 506d is forced by the flex member 506c into a centered position between two detent walls 504d that are not joined by a crest 504f. In the centered position the location nipple 506d is generally aligned with the trough 504g of a respective detent 504c.
The crests 504f are designed such that they reduce the likelihood that a location nipple 506d of the adjustment switch 506 will statically stop on top of any crest 504. For example, the angles and radius sizes of the crests are selected to provide crests that are as small as possible for achieving the current invention. In another example, the detent walls 504d should have an angle that allows easy centering of the location nipples 506d. Accordingly, the design of the position detents 504c should reduce, or eliminate, the amount of play that the adjustment switch 506 can move relative to the hole 504e. The feel and accuracy of the position detents 504c movements should take into considerations other factors, such as possible tolerance stack-ups of the potentiometer 510 relative to the printed wire assembly 508, the “X” style protrusion 506h relative to the “X” style pocket 511, etc.
While particular embodiments, aspects, and applications of the present invention have been illustrated and described, it is to be understood that the invention is not limited to the precise construction and compositions disclosed herein and that various modifications, changes, and variations may be apparent from the foregoing descriptions without departing from the spirit and scope of the invention as defined in the appended claims.
The present application claims the benefit of U.S. Provisional Application No. 60/831,006, filed Jul. 14, 2006, titled “Motor Circuit Protector,” which is hereby incorporated by reference in its entirety.
Number | Date | Country | |
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60831006 | Jul 2006 | US |