This invention generally relates to electronic systems and in particular it relates to low drop-out voltage regulators.
Low drop-out voltage regulators (LDO) are widely used in portable electronics equipment such as cellular phones, pagers, and digital cameras to provide a constant-voltage power supply for analog/digital circuits. The power supply rejection ratio (PSRR) is one of the most important requirements for the LDO design, which measures the LDO's ability to suppress power supply noise. In conventional LDO design, the PSRR is mainly determined by the open-loop gain of the error amplifier in the negative feedback circuit. The conventional LDO suffers from an inherent PSRR performance limitation. This limitation is due to the difficulty in the design of the error amplifier with high open-loop gain and high bandwidth. An approach to improve the PSRR is to increase the area of the power PMOS in the LDO, but it is restricted by the area requirement.
A low drop-out voltage regulator uses a voltage subtractor circuit to form a power supply rejection boost circuit. The voltage subtractor is inserted between the pass element and the amplifier of the low drop-out regulator. The voltage regulator circuit includes a pass element coupled between an input node and an output node; a voltage feedback circuit coupled to the output node; an amplifier having an input coupled to the voltage feedback circuit; and a voltage subtractor having a control node coupled to an output of the amplifier, an output coupled to a control node of the pass element, and an input coupled to the input node.
In the drawings:
A preferred embodiment low drop-out voltage regulator with power supply rejection boost circuitry is shown in FIG. 1. The circuit of
The power supply rejection boost circuitry is a voltage subtractor 36. The voltage subtractor 36 increases the PSRR by a significant amount without changing the error amplifier 26, the power PMOS 20, or any other circuit in the LDO. The voltage subtractor 36 is inserted between the control terminal of the LDO (gate terminal of the power PMOS 20) and the output terminal of the error amplifier 26. The variation of the control voltage (Vgs of PMOS 20) caused by the disturbance of the input voltage Vbat of the LDO can be cancelled out by the voltage subtractor 36. Therefore, the output voltage at node Vo becomes much less sensitive to the power supply noise. In addition, the voltage subtractor 36 has very small output resistance, and high current driving capability which improves the transient and frequency response of the LDO.
The power supply rejection boost circuitry improves supply noise rejection performance significantly without adding much complexity to the regulator system. The boost circuit is simple and consumes negligible silicon area and power.
While this invention has been described with reference to an illustrative embodiment, this description is not intended to be construed in a limiting sense. Various modifications of the illustrative embodiment, as well as other embodiments of the invention, will be apparent to persons skilled in the art upon reference to the description. It is therefore intended that the appended claims encompass any such modifications or embodiments.
This application claims priority under 35 USC § 119 (e) (1) of provisional application No. 60/340,550 filed Dec. 13, 2001.
Number | Name | Date | Kind |
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3344340 | Webb | Sep 1967 | A |
3538423 | Goleniewski | Nov 1970 | A |
4933625 | Hayakawa | Jun 1990 | A |
5191278 | Carpenter | Mar 1993 | A |
5550461 | Pouzoullic | Aug 1996 | A |
5909109 | Phillips | Jun 1999 | A |
5929617 | Brokaw | Jul 1999 | A |
5955915 | Edwards | Sep 1999 | A |
6707340 | Gough | Mar 2004 | B1 |
Number | Date | Country | |
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20030111987 A1 | Jun 2003 | US |
Number | Date | Country | |
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60340550 | Dec 2001 | US |