Low dropout linear regulator having high power supply rejection and low quiescent current

Abstract

Methods and apparatus are disclosed for providing stable voltage references from within a low dropout voltage regulator. Some embodiments utilize dependable semiconductor inherent attributes to generate a voltage reference, such as a band-gap voltage reference.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a circuit diagram of a prior art linear voltage regulator.

FIG. 2 is a high-level circuit diagram of a LDO voltage regulator in accordance with an embodiment of the invention.

FIG. 3 a detail circuit diagram of the LDO voltage regulator of FIG. 2.

DETAILED DESCRIPTION

The following disclosed embodiments describe stable and low dropout voltage regulators that also generate their own voltage references. Some embodiments utilize semiconductor inherent attributes to generate the voltage references.

In the following description, numerous specific details are provided, such as the identification of various system components, to provide a thorough understanding of embodiments of the invention. One skilled in the art will recognize, however, that the invention can be practiced without one or more of the specific details, or with other methods, components, materials, etc. In some instances, well-known structures, materials, or operations are not shown or described in detail to avoid obscuring aspects of various embodiments of the invention.

Reference throughout this specification to “one embodiment” or “an embodiment” means that a particular feature, structure, or characteristic described in connection with the embodiment is included in at least one embodiment of the present invention. Thus, the appearance of the phrases “in one embodiment” or “in an embodiment” in various places throughout this specification are not necessarily all referring to the same embodiment. Furthermore, the particular features, structures, or characteristics may be combined in any suitable manner in one or more embodiments.

FIG. 1 shows a typical prior art implementation of a linear DC/DC voltage regulator which employs a classical negative-feedback closed-loop control system to keep the output voltage V_out at a desired level, where V_out is dictated by a reference voltage V_ref. In the feedback part of the circuit of FIG. 1, a fraction of the output voltage, V_fb, is fed back to an error amplifier 105. Resistors R1 and R2 produce the feedback gain and determine what fraction of V_out is fed back as V_fb, where V_fb=V_out×R1/(R1+R2).

In the feed-forward part of the circuit of FIG. 1, an error amplifier 105 compares V_fb with the reference voltage V_ref and amplifies the resulting deviation/error to generate an error voltage V_err. In the feed-forward part of the circuit of FIG. 1, the actuating signal V_err is used to drive transistor 103, which acts as an actuator in this control system. Transistor 103 regulates the amount of current passing through R1 and R2 and, therefore, generates the output voltage V_out.

In this classical closed-loop control system, any change of V_out generates an error signal V_err which forces V_out back to its designated level. A drop in V_out causes an increase in V_err, subsequently an increase in the current passing through R1 and R2. And a rise in V_out causes a drop in V_err and subsequently a drop in the current passing through R1 and R2. Because the circuit continuously keeps V_fb equal to V_ref, and since V_fb=V_out×R1/(R1+R2), therefore, V_out=V_ref(130 R₂/R₁).

As seen from the above equation, the bottle neck in the performance of the voltage regulator of FIG. 1 is the stability of the reference voltage V_ref. Such circuit performs very well in terms of following the reference voltage; however, providing a dependable and a stable reference voltage is another matter altogether and is a burden on the user of the voltage regulator. For example, as illustrated in FIG. 1, any change of the V_dd will change V_ref via the V_ref generator and a V_ref change is as much as V_ref+ΔV_dd/(PSRR×V_ref), where PSRR is the power supply rejection ratio of the V_ref generator circuit. As can be seen, to obtain a stable V_ref, PSRR should be very large.

The following disclosed embodiments provide stable voltage references from within the voltage regulating circuit. Some embodiments employ dependable semiconductor inherent attributes to generate a voltage reference, such as a band-gap voltage reference.

FIG. 2 is a simplified high-level circuit diagram of an LDO voltage regulator in accordance with an embodiment of the present invention. In FIG. 2, while reference voltage V_comp, 209, is illustrated separately, it is not to be provided from the outside of the circuit and V_ref is derived from the regulated output voltage V_out, which significantly enhances the PSRR. As will become clearer from FIG. 3, V_comp is also generated within the circuit and is regulated by the error amplifier 203. In some embodiments V_comp is a part of the error amplifier 203.

FIG. 2 also illustrates a control loop, wherein V_fb is a feedback signal that carries some information regarding the output voltage V_out to an error amplifier 203. Resistors R1 and R2 determine the feedback gain and are employed to send back only a fraction of V_out. Resistor R2 is optional if V_out is to be fed back without significant reduction.

In the circuit of FIG. 2, the feedback signal V_fb is compared with the internally generated reference voltage V_comp and is amplified to produce an error signal V_err. The error signal V_err, with the assistance of the current source 205, which may be a cascade of current sources, produces an actuating signal V_act that controls transistor 207. In the control loop of FIG. 2, transistor 207 acts as an actuator that regulates the flow of current through R1 and also to the output. Note that the error signal V_err and/or V_act may be voltage or current signals.

FIG. 3 is a more detailed circuit diagram of the LDO linear regulator 201, depicted in FIG. 2. The pass transistor 207 is designated as QP16. Transistors QP13 and QN17 are used to help drive the pass transistor QP16, and also contribute to the error amplification process. Transistors QP13 and QN17 are in the feedback path for controlling transistor QP16. Transistors QP18 and QP21 form a current source. Transistors QP21 and QP19 also form another current source.

The current through resistor R47 is determined by adding the currents through R51 and R52, which are the two branches of a current mirror that is partially defined by transistors QN15 and QN16. Because in this current mirror the currents through R51 and R52 are equal and the same current passes through R51 and R46, the current through the resistor R47 will be equal to two times the current passing through the resistor R46. The voltage across R46 is equal to the difference of the base-emitter voltage of QN15 and QN16. Therefore, the current through R46 can be written as:

V _R46 =V _BE(QN16) −V _BE(QN15) =ΔV _BE =V _T ln10,

which is about 60 mv at room temperature. Therefore I_R46 can be written as:

I _R46 =V _R46 /R46=ΔV_BE/R46=V_Tln10/R46=I_o

or as I_R46=I_R51=½I_R47,

which results in: I_R47=2ΔV_BE/R46.

Furthermore, V_ref can be written as:

$\begin{array}{c}{V}_{\mathrm{ref}}=V_{\mathrm{BE}\left(\mathrm{QN16}\right)}+I_o\times \mathrm{R52}\\ =V_{\mathrm{BE}\left(\mathrm{QN16}\right)}+\left(V_T\ln 10\right)\times \mathrm{R52}/\mathrm{R46},\mathrm{or}\\ =V_{\mathrm{BE}\left(\mathrm{QN16}\right)}+I_{\mathrm{R46}}\times \mathrm{R51}.\end{array}\hspace{1em}\hspace{1em}$

Therefore, the voltage at the output can be written as:

$\begin{array}{c}{V}_{\mathrm{out}}=V_{\mathrm{ref}}+I_{\mathrm{R47}}\times \mathrm{R47},\mathrm{or}\\ =V_{\mathrm{BE}\left(\mathrm{QN16}\right)}+I_{\mathrm{R46}}\times \mathrm{R51}+I_{\mathrm{R47}}\times \mathrm{R47}\\ =V_{\mathrm{BE}\left(\mathrm{QN16}\right)}+\Delta V_{\mathrm{BE}}\times \mathrm{R51}/\mathrm{R46}+2\Delta V_{\mathrm{BE}}\times \mathrm{R47}/\mathrm{R46}\\ =V_{\mathrm{BE}\left(\mathrm{QN16}\right)}+\Delta V_{\mathrm{BE}}\left(\mathrm{R51}+2\mathrm{R47}\right)/\mathrm{R46}\\ =V_{\mathrm{BE}\left(\mathrm{QN16}\right)}+\left(V_T\ln 10\right)\left(\mathrm{R51}+2\mathrm{R47}\right)/\mathrm{R46}.\end{array}\hspace{1em}$

As evident from the above equation, a low V_out can be achieved by choosing different resistor values.

In the example circuit of FIG. 3, V_out=V_BE(QN16)+20ΔV_BE. Furthermore, in this embodiment any change in V_out will translate into a change in V_ref which affects the base of transistor QN17. The signals at the base of transistor QN17, in turn, send a similar signal to the base of transistor QP13, which controls transistor QP16 and which, in turn, regulates V_out.

The passage of these signals through QN17 and QP13 also amplifies the error signal originating from transistor QN16. Hence, the control loop of the voltage regulator of FIG. 3 utilizes the base-emitter voltage V_BE and ΔV_BE of the current mirror transistors as the foundation of a stable reference voltage without resorting to any outside voltage reference.

The above detailed descriptions of embodiments of the invention are not intended to be exhaustive or to limit the invention to the precise form disclosed above. While specific embodiments of, and examples for, the invention are described above for illustrative purposes, various equivalent modifications are possible within the scope of the invention, as those skilled in the relevant art will recognize. For example, while steps or components are presented in a given order, alternative embodiments may perform routines having steps or components in a different order. The teachings of the invention provided herein can be applied to other systems, not necessarily the network model described here. The elements and acts of the various embodiments described above can be combined to provide further embodiments and some steps or components may be deleted, moved, added, subdivided, combined, and/or modified. Each of these steps may be implemented in a variety of different ways. Also, while these steps are shown as being performed in series, these steps may instead be performed in parallel, or may be performed at different times.

Unless the context clearly requires otherwise, throughout the description and the claims, the words “comprise,” “comprising,” and the like are to be construed in an inclusive sense as opposed to an exclusive or exhaustive sense; that is to say, in the sense of “including, but not limited to.” Words in the above detailed description using the singular or plural number may also include the plural or singular number respectively. Additionally, the words “herein,” “above,” “below,” and words of similar import, when used in this application, shall refer to this application as a whole and not to any particular portions of this application. When the claims use the word “or” in reference to a list of two or more items, that word covers all of the following interpretations of the word: any of the items in the list, all of the items in the list, and any combination of the items in the list.

The teachings of the invention provided herein could be applied to other systems, not necessarily the system described herein. These and other changes can be made to the invention in light of the detailed description. The elements and acts of the various embodiments described above can be combined to provide further embodiments.

All of the above patents and applications and other references, including any that may be listed in accompanying filing papers, are incorporated herein by reference. Aspects of the invention can be modified, if necessary, to employ the systems, functions, and concepts of the various references described above to provide yet further embodiments of the invention.

These and other changes can be made to the invention in light of the above detailed description. While the above description details certain embodiments of the invention and describes the best mode contemplated, no matter how detailed the above appears in text, the invention can be practiced in many ways. Details of the network model and its implementation may vary considerably in their implementation details, while still being encompassed by the invention disclosed herein. As noted above, particular terminology used when describing certain features, or aspects of the invention should not be taken to imply that the terminology is being re-defined herein to be restricted to any specific characteristics, features, or aspects of the invention with which that terminology is associated. In general, the terms used in the following claims should not be construed to limit the invention to the specific embodiments disclosed in the specification, unless the above Detailed Description section explicitly defines such terms. Accordingly, the actual scope of the invention encompasses not only the disclosed embodiments, but also all equivalent ways of practicing or implementing the invention under the claims.

While certain aspects of the invention are presented below in certain claim forms, the inventors contemplate the various aspects of the invention in any number of claim forms. Accordingly, the inventors reserve the right to add additional claims after filing the application to pursue such additional claim forms for other aspects of the invention.

Claims

1. A low dropout voltage regulator, comprising: a controllable pass device situated between a power source and an output port of the regulator for controlling current from the power source to the output port;an error amplifier that includes an internally generated reference voltage, wherein the error amplifier is in electrical communication with the output port through a first resistor and senses voltage differences between the output port and the internal reference voltage, and wherein the reference voltage is based on at least one inherent attribute of an error amplifier component; anda feedback connection between the error amplifier and the controllable pass device, wherein the feedback connection includes at least one current source to control the pass device based on the sensed voltage difference between the output port voltage and the internal reference voltage.

2. The low dropout voltage regulator of claim 1, wherein the controllable pass device is a transistor.

3. The low dropout voltage regulator of claim 1, wherein the error amplifier comprises a current mirror and the internal reference voltage is based on a base-emitter voltage of current mirror transistors.

4. The low dropout voltage regulator of claim 1, wherein the reference voltage is based on a band-gap voltage of an error amplifier transistor.

5. The low dropout voltage regulator of claim 1, wherein at least a part of the error amplification comprises a combination of a transistor and a current source.

6. The low dropout voltage regulator of claim 1, wherein the amplification includes two cascading stages, each comprising a combination of a transistor and a current source.

7. The low dropout voltage regulator of claim 1, wherein the pass device is a PNP transistor, and wherein the error amplifier comprises a current mirror that comprises two NPN transistors an emitter of one of which is connected to a lower voltage than the power source voltage and an emitter of the other NPN transistor is connected to the lower voltage through a second resistor and collectors of both NPN transistors are connected to the first resistor through two substantially similar third and fourth resistors, and wherein the output voltage is a function of a base-emitter voltage of at least one of the NPN transistors.

8. The low dropout voltage regulator of claim 1, wherein the controllable pass device is a transistor the gate of which is connected to a current source and also to a second pass transistor the gate of which is controlled by an output of the error amplifier.

9. A method of low dropout voltage regulating, the method comprising: controlling current from a power source to an output port using a controllable pass device that is situated between the power source and the output port;sensing a voltage difference between the output port and an internally generated reference voltage using an error amplifier that is in electrical communication with the output port, wherein the reference voltage is based on at least one inherent attribute of an error amplifier component; andregulating the pass device based on the sensed voltage difference by feeding back a signal from the error amplifier to the controllable pass device.

10. The method of claim 9, wherein the controllable pass device is a transistor.

11. The method of claim 9, wherein the error amplifier comprises a current mirror and the internal reference voltage is partially based on a band-gap voltage of a current mirror transistor.

12. The method of claim 9, wherein there is a second series resistor between the first resistor and ground.

13. The method of claim 9, wherein at least a part of the error amplification comprises a combination of a transistor and a current source.

14. The method of claim 9, wherein the amplification includes two or more cascading stages each comprising a combination of a transistor and a current source.

15. The method of claim 9, wherein the pass device is a PNP transistor, and wherein the error amplifier comprises a current mirror that comprises two NPN transistors an emitter of one of which is connected to a lower voltage than the the power source voltage and an emitter of the other NPN transistor is connected to the lower voltage through a second resistor and collectors of both NPN transistors are connected to a first resistor through two substantially similar third and fourth resistors, and wherein the output voltage is a function of a base-emitter voltage of the NPN transistors.

16. The method of claim 9, wherein the controllable pass device is a transistor the gate of which is connected to a current source and also to a second pass transistor the gate of which is controlled by an output of the error amplifier.

17. A low dropout voltage regulating apparatus comprising: means for controlling current from a power source to an output port;means for sensing a voltage difference between the output port and an internally generated reference voltage, wherein the reference voltage is partially based on at least an inherent attribute of a semiconductor component;means for amplifying the sensed voltage difference; andmeans for regulating the controlling means, based on the amplified sensed voltage difference.

18. The apparatus of claim 17, wherein the means for sensing a voltage difference between the output port and an internally generated reference voltage comprises a current mirror and the internal reference voltage is based on a band-gap voltage of the current mirror transistor.

19. The apparatus of claim 17, wherein the means for amplification includes two or more cascading stages each comprising a combination of a transistor and a current source.

20. The apparatus of claim 17, wherein the means for controlling current from a power source to an output port is a PNP transistor, and wherein the means for amplification comprises a current mirror that comprises two NPN transistors an emitter of one of which is connected to a lower voltage than a power source voltage and an emitter of the other NPN transistor is connected to the lower voltage through a resistor.