The present invention relates generally to semiconductors, and more particularly to amplifier circuits that compensate current leakage.
Semiconductor circuits, regardless of the process used in manufacturing, exhibit a variation in their operating characteristics as a result of processing, voltage and temperature (PVT) variations. For example, within a same manufacturing process all of the transistors are not manufactured with precisely the same physical characteristics. Any variation results in a difference in the operating performance of the circuit. Additionally, the temperature that exists at each junction of n-type and p-type material directly affects the performance of the device associated with that junction. Such variations create a number of serious operational issues. Due to varied operating conditions, the propagation delay and the output impedance of amplifiers varies widely. Propagation delay is the amount of time it takes for a transistor to switch state once a control signal is applied to make the transistor switch. When a differential amplifier is used a common mode voltage is selected as a reference voltage for one of the two input signal. The output logic state of the amplifier is determined by a value of the other input signal relative to the common mode voltage. For low power supply voltage systems operating at high frequencies, the other input signal does not typically obtain a value that adequately turns off transistors. The partial conduction of transistors in an amplifier results in one or more current paths existing between a power supply voltage terminal and a ground terminal that are not intended to exist. Such current paths result in undesired leakage paths for current to flow and undesirably use power. Leakage current paths are particularly problematic for electronic products that use batteries.
The present invention is illustrated by way of example and not limitation in the accompanying figures, in which like references indicate similar elements, and in which:
Skilled artisans appreciate that elements in the figures are illustrated for simplicity and clarity and have not necessarily been drawn to scale. For example, the dimensions of some of the elements in the figures may be exaggerated relative to other elements to help to improve understanding of embodiments of the present invention.
In operation, the inverter 20 functions to remove a floating voltage state that can otherwise exist at node 15. Amplifier circuit 10 functions as a differential amplifier to amplify a difference between the input voltages VIN(−) and VIN(+). Assume in one form that VDD is a positive power supply voltage and that VSS is an earth ground. In many product applications, such as battery-powered wireless devices, the value of VDD is approximately one volt. The voltage VIN(−) functions as a reference voltage. The value of VOUT therefore is determined to be a logic high or logic low value depending upon whether the other input, VIN(+), is above or below the reference voltage. In a differential amplifier the desired value for the reference voltage VIN(−) is a common mode voltage value that is one-half of the value of VDD. The one-half value permits as much voltage swing above the reference point as below it and is thus symmetric. However, when VDD is a small value, such as one volt, there is typically no more than one-half volt between the reference voltage or trip point and the maximum or minimum voltage. With propagation delays and high switching frequencies the voltages applied to the gates of the transistors are not typically high enough or low enough to fully turn off the transistors. As a result, leakage currents may develop in amplifier circuit 10. For example, transistors 12 and 14 function as an inverter. When VIN(+) is near ground or VSS, node 15 is pulled to VDD by transistor 14 via transistor 16. Transistor 12 is non-conductive to reinforce node 15 having a high voltage. However, as the voltage at node 15 increases, node 15 operates to start to bias transistor 16 off and prevent node 15 from reaching the VDD power supply voltage potential. The inability of node 15 from reaching the full VDD power supply voltage potential results in transistor 16 being partially conductive rather than being fully turned off. The partial conduction of transistor 16 and the resulting conduction of transistor 18 from the higher voltage at node 15 results in a leakage current being conducted by transistors 16 and 18 from VDD to VSS. To prevent this unwanted power dissipation, the inverter 20 is provided to fully pull node 15 up to the full VDD voltage potential. Inverter 20 uses the voltage at node 30 as an input to determine whether to connect the VDD or the VSS supply voltages to node 15. Transistors 28 and 32 function as an inverter that responds to the bias from VIN(−) to provide a voltage at node 30. When VIN(−) assumes a reference voltage value that is the common mode voltage of one-half the value of VDD, initially both of transistors 28 and 32 are partially conductive. The increase in voltage at node 15 from the low value of VIN(+) causes transistor 18 to be conductive. When both transistor 18 and transistor 32 conduct, node 30 is connected to VSS. In response transistor 22 of inverter 20 is strongly conductive and connects VDD directly to node 15. This action overcomes the inability of transistors 16 and 14 to connect VDD to node 15 and fully turns off transistor 16. As a result, no leakage current is permitted to flow through transistors 16, 28, 32 and 18.
Similarly, when the VIN(+) voltage is close to the VDD power supply voltage, transistor 12 is biased on and transistor 14 is biased off. If VIN(−) is the common mode reference voltage, initially transistors 28 and 32 are partially conductive. Node 15 is low enough in voltage to initially make transistor 16 conductive. However transistor 18 may also be somewhat conductive and cause a leakage current to flow through transistors 16, 28, 32 and 18. However, with transistors 16 and 28 being conductive to some degree, node 30 is connected to VDD. A logic high voltage on node 30 causes transistor 24 of inverter 20 to be conductive and directly connect VSS to node 15. The action of inverter 20 thus quickly turns transistor 18 off. Thus the leakage current path is broken as a result of the operation of inverter 20. Inverter 20 has transistors which are not sized as large transistors as the inverter 20 does not need to drive a large signal. As a result, the inverter 20 may be referred to as a weak inverter and is size efficient to implement. Inverter 20 functions to eliminate current leakage paths in amplifier circuit 10. Inverter 20 modifies the voltage at node 15 by either pulling node 15 up to VDD or pulling node 15 down to VSS.
Illustrated in
In operation, amplifier circuit 21 has a single input signal in the form of voltage VIN(+). The inverter formed by transistors 28 and 32 is driven by the output of the inverter formed by transistors 14 and 12. Inverter 20 again functions to modify the voltage at node 15 to eliminate a current leakage path through transistors 16, 28, 32 and 18 or through transistors 16, 14, 12 and 18. Assume at start-up that the nodes in amplifier circuit 21 are discharged. When VIN(+) has a logic high or VDD value, transistor 12 is conductive and transistor 14 is non-conductive. As a result of node 15 initially being low, transistor 16 and transistor 28 are conductive and couple VDD to node 30. Node 30 therefore biases transistor 22 off and transistor 24 on. Transistor 24 connects VSS directly to node 15 and reinforces the low created by a high VIN(+). This action eliminates a leakage current path through transistors 16, 28, 32 and 18 that would have been caused by a logic indeterminate state existing on node 15 in response to neither of transistors 16 and 18 turning fully off. Amplifier circuit 21 thus is a single-input/single-output amplifier that efficiently conserves power while enabling the use of a VDD voltage value that may not have a large enough magnitude to quickly turn off a transistor due to propagation delays and a small voltage difference between transistor threshold and supply voltage values.
Illustrated in
In operation, amplifier circuit 33 is a single input/single output amplifier that uses control circuitry to enable and disable the inverter function previously described that biases node 15 to eliminate a leakage current path. When the CONTROL signal is asserted as an active high signal, transistors 54 and 58 are made conductive. The operation of amplifier circuit 33 is otherwise similar to the operation of amplifier circuit 21 of
Illustrated in
In operation, amplifier circuit 45 is a differential input/single output amplifier having the inverter 50 used in
Illustrated in
By now it should be appreciated that there has been provided an amplifier circuit that removes leakage current. In one form the leakage current path is selectively removed in response to a CONTROL signal. Depending upon the power consumption issues, selective use of the inverter 20 and inverter 50 in the amplifier is beneficial as a power and speed tradeoff exists. In other applications the amplifier is a differential amplifier having two distinct inputs. The embodiments described herein are useful for many circuit applications, such as dual data rate (DDR) clock and data receivers. The various transistor connections that are illustrated in which connections to the bulk or substrate are detailed function to establish transistor electrical parameters and to assist in avoiding transistor latch-up phenomena. In the illustrated forms the amplifier circuit is implemented with three inverters in which one of the inverters functions to pull up or pull down an output of a first of the three inverters. The pull up or pull down function ensures that the output of the first inverter has a voltage value which is one of the positive power supply or the negative power supply (i.e. typically the ground power supply terminal). It should be understood that all circuitry illustrated and described herein may be implemented either in silicon or another semiconductor material or alternatively by software code representation of silicon or another semiconductor material.
In one form there is herein provided a circuit having a first inverter having an input terminal, an output terminal, a first voltage supply terminal, and a second voltage supply terminal. A second inverter has an input terminal, an output terminal, a first voltage supply terminal, and a second voltage supply terminal. A first transistor has a first current electrode for receiving a first power supply voltage, a control electrode coupled to the output terminal of the first inverter, and a second current electrode coupled to the first voltage supply terminals of both the first and second inverters. A second transistor has a first current electrode coupled to the second voltage supply terminals of both the first and second inverters, a control electrode coupled to the output terminal of the first inverter, and a second current electrode for receiving a second power supply voltage. A third inverter has an input terminal coupled to the output terminal of the second inverter, and an output terminal coupled to the output terminal of the first inverter. In one form the input terminals of the first and second inverters are for receiving a differential input signal. In another form the input terminal of the first inverter is for receiving a logic signal and the input terminal of the second inverter is for receiving a reference voltage. In another form the input terminal of the second inverter is coupled to the output terminal of the first inverter. In another form the third inverter has a third transistor having a first current electrode for receiving the first power supply voltage, a control electrode coupled to the output terminal of the second inverter, and a second current electrode coupled to the output terminal of the first inverter. A fourth transistor has a first current electrode coupled to the second current electrode of the third transistor, a control electrode coupled to the output terminal of the second inverter, and a second current electrode for receiving the second power supply voltage. In another form a third transistor has a first current electrode for receiving the first power supply voltage, a control electrode coupled to the output terminal of the second inverter, and a second current electrode. A fourth transistor has a first current electrode coupled to the second current electrode of the third transistor, a control electrode for receiving a first control signal, and a second current electrode coupled to the output terminal of the first inverter. In another form a fifth transistor has a first current electrode coupled to the second current electrode of the fourth transistor, a control electrode for receiving a second control signal, and a second current electrode. A sixth transistor has a first current electrode coupled to the second current electrode of the fifth transistor, a control electrode coupled to the output terminal of the second inverter, and a second current electrode for receiving the second power supply voltage. In another form the input terminals of the first and second inverters are for receiving a differential input signal. In yet another form the input terminal of the first inverter is for receiving a logic signal and the input terminal of the second inverter is for receiving a reference voltage. In yet another form the first, third, and fourth transistors are of a first conductivity type, and the second fifth and sixth transistors are of a second conductivity type. In yet another form the first power supply voltage is a positive power supply voltage and the second power supply voltage is ground.
In another form there is provided a circuit having a first transistor having a first current electrode, a control electrode, and a second current electrode. A second transistor has a first current electrode coupled to the second current electrode of the first transistor, a control electrode coupled to the control electrode of the first transistor, and a second current electrode. A third transistor has a first current electrode coupled to a first power supply voltage terminal, a control electrode coupled to the second current electrode of the first transistor, and a second current electrode coupled to the first current electrode of the first transistor. A fourth transistor has a first current electrode coupled to the second current electrode of the second transistor, a control electrode coupled to the second current electrode of the first transistor, and a second current electrode coupled to a second power supply voltage terminal. A fifth transistor has a first current electrode coupled to the second current electrode of the third transistor, a control electrode, and a second current electrode. A sixth transistor has a first current electrode coupled to the second current electrode of the fifth transistor, a control electrode coupled to the control electrode of the fifth transistor, and a second current electrode coupled to the first current electrode of the fourth transistor. A seventh transistor has a first current electrode coupled to the first power supply voltage terminal, a control electrode coupled to the second current electrode of the fifth transistor, and a second current electrode coupled to the second current electrode of the first transistor. An eighth transistor has a first current electrode coupled to the second current electrode of the seventh transistor, a control electrode coupled to the control electrode of the seventh transistor, and a second current electrode coupled to the second power supply voltage terminal. In another form the first power supply voltage terminal is for receiving a positive power supply voltage, and the second power supply voltage terminal is coupled to ground. In yet another form the control electrodes of the first, second, fifth, and sixth transistors are for receiving a differential input signal. In yet another form the control electrodes of the first and second transistors are for receiving an input logic signal, and the control electrodes of the fifth and sixth transistors are for receiving a reference voltage. In yet another form the control electrodes of the fifth and sixth transistors are coupled to the second current electrode of the first transistor. In another form a ninth transistor has a first current electrode coupled to the second current electrode of the seventh transistor, a control electrode for receiving a first control signal, and a second current electrode coupled to the second current electrode of the first transistor. A tenth transistor has a first current electrode coupled to the second current electrode of the ninth transistor, a control electrode for receiving a second control signal, and a second current electrode coupled to the first current electrode of the eighth transistor. In another form the control electrodes of the fifth and sixth transistors are coupled to the second current electrode of the first transistor.
In yet another form there is herein provided a circuit having a first P-channel transistor having a first current electrode, a control electrode, and a second current electrode. A first N-channel transistor has a first current electrode coupled to the second current electrode of the first P-channel transistor, a control electrode coupled to the control electrode of the first P-channel transistor, and a second current electrode. A second P-channel transistor has a first current electrode coupled to a first power supply voltage terminal, a control electrode coupled to the second current electrode of the first P-channel transistor, and a second current electrode coupled to the first current electrode of the first P-channel transistor. A second N-channel transistor has a first current electrode coupled to the second current electrode of the first N-channel transistor, a control electrode coupled to the second current electrode of the first P-channel transistor, and a second current electrode coupled to a second power supply voltage terminal. A third P-channel transistor has a first current electrode coupled to the second current electrode of the second P-channel transistor, a control electrode, and a second current electrode. A third N-channel transistor has a first current electrode coupled to the second current electrode of the third P-channel transistor, a control electrode coupled to the control electrode of the third P-channel transistor, and a second current electrode coupled to the first current electrode of the second N-channel transistor. A fourth P-channel transistor has a first current electrode coupled to the first power supply voltage terminal, a control electrode coupled to the second current electrode of the third P-channel transistor, and a second current electrode coupled to the second current electrode of the first P-channel transistor. An fourth N-channel transistor having a first current electrode coupled to the second current electrode of the fourth P-channel transistor, a control electrode coupled to the control electrode of the fourth P-channel transistor, and a second current electrode coupled to the second power supply voltage terminal. In one form the control electrodes of the third P-channel transistor and the third N-channel transistor are coupled to the second current electrode of the first P-channel transistor. In another form there is herein provided a fifth P-channel transistor having a first current electrode coupled to the second current electrode of the fourth P-channel transistor, a control electrode for receiving a first control signal, and a second current electrode coupled to the second current electrode of the first P-channel transistor. A fifth N-channel transistor has a first current electrode coupled to the second current electrode of the fifth P-channel transistor, a control electrode for receiving a second control signal, and a second current electrode coupled to the first current electrode of the fourth N-channel transistor.
In the foregoing specification, the invention has been described with reference to specific embodiments. However, one of ordinary skill in the art appreciates that various modifications and changes can be made without departing from the scope of the present invention as set forth in the claims below. For example, the embodiments described herein may be implemented with any type of transistors. Accordingly, the specification and figures are to be regarded in an illustrative rather than a restrictive sense, and all such modifications are intended to be included within the scope of present invention.
Benefits, other advantages, and solutions to problems have been described above with regard to specific embodiments. However, the benefits, advantages, solutions to problems, and any element(s) that may cause any benefit, advantage, or solution to occur or become more pronounced are not to be construed as a critical, required, or essential feature or element of any or all the claims. As used herein, the terms “comprises,” “comprising,” or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.
Benefits, other advantages, and solutions to problems have been described above with regard to specific embodiments. However, the benefits, advantages, solutions to problems, and any element(s) that may cause any benefit, advantage, or solution to occur or become more pronounced are not to be construed as a critical, required, or essential feature or element of any or all the claims. As used herein, the terms “comprises,” “comprising,” or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. The terms a or an, as used herein, are defined as one or more than one. The term plurality, as used herein, is defined as two or more than two. The term another, as used herein, is defined as at least a second or more. The terms including and/or having, as used herein, are defined as comprising (i.e., open language). The term coupled, as used herein, is defined as connected, although not necessarily directly, and not necessarily mechanically.