There are applications in which it is desirable to monitor certain equipment for possible exposure to excessive vibration or shock that could cause damage to the equipment. Such equipment may need to be monitored continuously for extended time periods without service or an external electrical power supply. There is a need for a sensor that can be used in such applications.
Low-power sensors for monitoring exposure of an object to a stimulus are provided. An exemplary embodiment of the low-power sensors comprises a proof mass; at least one piezoelectric device operable to generate a current when the proof mass imparts a force on the piezoelectric device in response to the proof mass undergoing a transient acceleration when the object is subjected to a stimulus; and an electronic circuit connected to the piezoelectric device. The electronic circuit is at least partially controlled in response to the current generated from the first piezoelectric device due to the stimulus.
Another exemplary embodiment of the low-power sensors for monitoring exposure of an object to a stimulus a proof mass is provided. The sensor comprises at least first, second and third surfaces perpendicular to orthogonal x, y and z axes, respectively. The sensor comprises at least one first piezoelectric device operatively associated with the first surface, at least one second piezoelectric device operatively associated with the second surface, and at least one third piezoelectric device operatively associated with the third surface. At least one of the first, second and third piezoelectric devices is operable to generate a current when the proof mass imparts a force thereon in response to the proof mass undergoing a transient acceleration when the object is subjected to a stimulus. The sensor comprises first, second and third electronic circuits connected to the first, second and third piezoelectric sensors, respectively, and which are at least partially controlled in response to the current generated from at least one of the first, second and third piezoelectric devices, respectively, due to the stimulus.
Flexible circuits are also provided. An exemplary embodiment of the flexible circuits comprises at least one piezoelectric device comprising a flexible substrate composed of a first dielectric material; at least one first electrode on a surface of the substrate; at least one first layer of piezoelectric material on the first electrode; a second dielectric material on the first layer of piezoelectric material; a second electrode on the second dielectric material; and at least one second layer of piezoelectric material on the second electrode. The flexible substrate comprises cut lines and fold lines along which the flexible circuit can be folded to form a three-dimensional structure.
Low-power shock and vibration sensors for monitoring exposure of objects to shock or vibration are provided. For conciseness, the term “stimulus” is used herein to refer to shock or vibration. Embodiments of the sensors can be used to monitor objects over extended time periods without service of the sensor, or an external power supply. Methods of monitoring objects for exposure to a stimulus, flexible circuits and methods of making the flexible circuits are also provided.
Objects that are sensitive to shock or vibration can be monitored by the sensors. For example, the objects can be easily physically damaged, caused to malfunction, react strongly, or explode when subjected to a stimulus. For example, the objects can be sensitive electronic devices or include sensitive electronic components, paintings, sculptures, glassware, containers of unstable chemicals (e.g., explosive liquid or dry chemicals), or explosive devices. The objects can have high value. The objects can be directly exposed to the environment, or housed inside of containers, for example. The sensors are operable to detect transient accelerations of such objects resulting from a stimulus. The stimulus can result from lifting, falling, sliding and/or shaking of objects, from the objects being struck by another object, an individual or the like, or from transporting objects, for example.
The embodiment of the sensor 100 shown in
In the embodiment, the proof mass 102 is rigid and acts to impart a mechanical force on at least one of the piezoelectric devices 104 via the thrust plate(s) 113 when the proof mass 102 undergoes a transient acceleration. As described in greater detail below, the electronic circuits 150 connected to the piezoelectric devices 104 are at least partially controlled in response to current generated from the piezoelectric devices 104 due to the object 120 being subjected to a stimulus. This control of the electronic circuits 150 by the current generated from the stimulus allows the sensor 100 to consume low power when no transient acceleration is present.
When the object 120 is subjected to a stimulus and the proof mass 102 imparts a force on at least one of the piezoelectric devices 104 via one or more thrust plate(s) 113, the piezoelectric device(s) 104 produce(s) an electrical output due to this change in load. The mass of the proof mass 102 is sufficiently larger than the mass of each piezoelectric device 104 so that the proof mass 102 imparts a desired compressive force on the piezoelectric devices 104. For example, the proof mass 102 can have a mass of about 4 g to about 50 g. The proof mass 102 mechanically amplifies the compressive force generated by the transient acceleration of the piezoelectric devices 104 to increase the current output. Increasing the mass of the proof mass 102 (by increasing its volume) increases the current generated from the piezoelectric devices 104, but also increases the amount of space occupied by the proof mass 102. The proof mass 102 is composed of a suitable material so that it meets size constraints and provides the desired mass in the sensor 100. For example, the proof mass 102 can be composed of tungsten, steel or the like, and is typically solid.
The proof mass 102 can have any suitable shape. In the embodiment, the proof mass 102 is rectangular-shaped or square-shaped and has flat surfaces. For example, the proof mass 102 can be square-shaped and have side dimensions of about 2 mm to about 20 mm, e.g., about 5 mm.
The piezoelectric devices 104 can be made from any suitable piezoelectric material that provides desired performance characteristics in the sensor 100. For example, the piezoelectric material can be a lead zirconate titanate (PZT) ceramic material, such as PZT5H or PZT5A, or a ferroelectric material, such as PMNT. Different piezoelectric devices 104 of a given sensor 100 can include two or more different piezoelectric materials to provide different performance characteristics, e.g., greater sensitivity, with respect to monitoring different axial directions of the object.
The piezoelectric material is typically in layer form. The layers can have any suitable shape, such as rectangular, square, other polygonal shapes, circular (wafers), or the like. Layers or the piezoelectric material typically have a thickness of about 100 μm to about 1 mm, such as about 200 μm to about 500 μm. In an exemplary embodiment, the piezoelectric material is rectangular or square shaped with sides having a dimension of about 2 mm to about 10 mm. Wafers of the piezoelectric material can typically have a diameter of about 2 mm to about 10 mm.
The voltage associated with mechanical loading of a piezoelectric material increases with its thickness. To avoid an overly high voltage caused by such loading, the piezoelectric device 104 can include a plurality of relatively thinner layers of the piezoelectric material, such as two to ten layers, as opposed, for example, to one thick layer of the piezoelectric material. As shown in
In exemplary embodiments of the shock and vibration sensor, one or more piezoelectric devices can be selectively arranged with respect to the proof mass to allow detection of a stimulus in one or more directions that are of most interest for the particular object that the sensor is operatively associated with. The exemplary embodiment of the sensor 100 shown in
A second piezoelectric device is typically provided on the top surface 211 of the proof mass 202. For simplicity, the second piezoelectric device is not shown in
The sensor 200 can also comprise a protective rigid housing (not shown) that surrounds the proof mass 202 and the piezoelectric device(s) 204. The housing can have a structure such as that of the housing 108 shown in
Fabrication of an exemplary embodiment of the piezoelectric device 204 shown in
In the embodiment, the top surface 231 of the substrate 230 is typically cleaned, such as by etching, prior to further fabrication steps. A seed material (not shown) of a suitable metal, such as titanium, can be applied on the cleaned top surface 231. The seed material can be formed by sputtering, for example.
As shown in
For simplicity, the embodiment shown in
As shown in
As shown in
As shown in
Thrust plate 256 is provided on the piezoelectric material 254. The thrust plate 256 is rigid and can be composed of the same dielectric material as the substrate 230.
Other exemplary embodiments of the low-power sensor have multi-axis stimulus sensing capabilities. These embodiments of the sensor provide two-axis sensing (x, y; x, z; or y, z axes sensing), or three-axis (x, y, z) sensing.
The sensor 400 includes leads 442 connected to the respective piezoelectric devices 404 and to a PC board connector 444. Each individual lead 442 can be connected to an individual electronic circuit 450.
The sensor 400 is constructed to prevent the proof mass 402 from colliding with any one of the piezoelectric devices 404 when an object that the sensor 400 is operatively associated with is subjected to a stimulus. This construction prevents associated false readings of an actual stimulus, by introducing a preload during fabrication such that the piezoelectric material of the piezoelectric devices 404 is always in compression.
In the embodiment, each piezoelectric device 404 includes a rigid thrust plate 435 provided on the front face of the piezoelectric device 404 (facing the proof mass 402). The thrust plates 435 are configured to distribute normal forces over their planar front contact surface.
In the embodiment of the sensor 400 shown in
The compliant material 432 can be one or more layers of a polymer. For example, the compliant material can be an elastomer, such as RTV silicone, rubber, neoprene, foam, or the like. The compliant material 432 can have any suitable thickness, such as about 2 mm to at least about 10 mm. The compliant material 432 includes cavities 442 in which individual spheres 434 are held in place, but are able to rotate during movement of the proof mass 402. The spheres 434 act to transmit normal forces to contacts surfaces of the thrust plates 435. The thrust plates 435 spatially distribute the normal forces. The spheres 434 also minimize frictional resistance in the orthogonal directions parallel to the surfaces of the proof mass 402. By placing spheres 434 in direct contact with the surfaces 436, 438, 440 (and typically the other three surfaces) of the proof mass 402 and with the thrust plates 435, gaps are eliminated between the proof mass 402 and the thrust plates 435, orthogonal motion of the proof mass 402 is substantially not constrained by friction when a stimulus occurs, and false readings of an actual stimulus by the sensor 400 due to friction are at least substantially eliminated.
Typically, shocks or vibrations act on the multi-axis sensor 400 along two or three axial directions. Accordingly, the force associated with a stimulus typically includes components in at least two of the x, y and z axial directions. For such forces, the direction of the force can be determined by vector addition of the individual force components.
Other exemplary embodiments of the single-axis sensor can be made by modifying the sensor 400 shown in
Exemplary embodiments of the piezoelectric devices can be fabricated from a two-dimensional, flexible circuit.
In some other exemplary embodiments, all six regions 568 do not include one more piezoelectric devices 564. For example, embodiments of a single-axis sensor can include one or more piezoelectric devices 564 in only one or two regions, and embodiments of a two-axis sensor can include one or more piezoelectric devices 564 in only two, three or four regions.
The flexible circuit 560 can be formed into a three-dimensional sensor.
In the embodiment, the sensor 570 includes a connector tab 562 for sending a signal from the flexible circuit 560 to another circuit associated with the sensor. For example, the circuit can include individual circuits connected to each piezoelectric device 564.
Another exemplary embodiment of the flexible circuits is shown in
The flexible circuit 760 is constructed such that it can formed into a three-dimensional configuration. The flexible circuit 760 can be formed into a box configuration, such as that of the sensor 570 shown in
In the exemplary embodiment, the electronic circuit 850 is connected to a single piezoelectric device 804. The piezoelectric device 804 can be, for example, one of the piezoelectric devices 404 shown in
When the sensor including the piezoelectric device 804 is subjected to a stimulus, the piezoelectric material of the piezoelectric device 804 is mechanically deformed. This deformation causes the piezoelectric device 804 to generate a charge. When the piezoelectric material is compressed, a positive voltage is produced. When the piezoelectric material is subjected to tension, a negative voltage is produced. In the embodiment, the electronic circuit 850 includes a full wave rectifier 810 operable to rectify the signal generated by the voltage of the piezoelectric device 804 such that the voltage is always positive and the current flows in one direction.
In the embodiment, the electronic circuit 850 comprises an event driven circuit 820. The event driven circuit 820 includes an amplifier 822 and an interrupt 824 (e.g., amplifier 824) that detects changes in the piezoelectric device 804 charge with time (i.e., current). The amplifier 822 and 824 converts the magnitude of the current to a voltage and stores the voltage in a peak and hold 826 (e.g., capacitor 826). In real time, the current is sensed to determine whether it exceeds a threshold current corresponding to a threshold transient acceleration. For multi-axis sensors that include at least three piezoelectric devices and associated electronic circuits, the threshold acceleration has three directional components ax, ay and az, for the respective x, y and z axes of the sensor. These three threshold transient accelerations can have the same or different magnitudes. The threshold accelerations can be selected to correspond to accelerations that can cause damage to the object. The capacitor 826 holds the peak voltage for a sufficient period of time for microcontroller 850 to read the peak voltage value. When the piezoelectric device 804 generates a current that exceeds the threshold current, the amplifier 822 and 824 draws current from a power conditioning unit 830 connected to power supply 840 (i.e., battery) to create a voltage in proportion to the current from the piezoelectric device 804. The voltage on the capacitor 822 is directly proportional to the amplitude of the transient acceleration.
The signal from the piezoelectric device 804 is also detected by the circuit associated with amplifier 830, and this voltage triggers an interrupt 824, which uses the rectified signal (through a JFET), to awaken the microcontroller 860 from its sleep mode. The microcontroller 860 can monitor the interrupt 824 and release a counter to determine the duration of the stimulus. The counter value infers the frequency of the stimulus. The size of the capacitor 826 can be selected to maintain its peak voltage with minimal sag, and to allow the microcontroller 860 to react to the interrupt and read the peak capacitor voltage value. The awoken microcontroller 860 reads the peak value stored by the peak and hold unit 826 and records the peak value in a memory along with a time stamp, indicating both the amplitude and time of the event. If there is no additional information stored by the peak and hold unit 826 (i.e., information related to other events that exceed the threshold acceleration value), the micro-controller 860 then goes back to sleep.
Minutes, hours, days, months, or years later, a communication module 870 connected to the microcontroller 860 is activated. The communication module 870 can be activated from an outside stimulus, such as RFID reader. Activating the communication module 870 triggers an interrupt 880 that awakens the microcontroller 860 to allow the stored peak value(s) to be read by the communication module 870 and recorded on another device. The micro-controller 860 then goes back to sleep. In
As discussed above, an electronic circuit, such as the electronic circuit 850, can be connected to each individual piezoelectric device of the shock and vibration sensor. For such embodiments of the sensor, when an object is subjected to shock or vibration, depending on the magnitude and direction of the shock with respect to the piezoelectric devices, less than all of the sensors typically may not generate a current that exceeds the threshold current. The magnitude and direction of the transient acceleration is determined from the individual current values generated from the piezoelectric devices. For example, when the sensor 400 shown in
It will be appreciated by those skilled in the art that the present invention can be embodied in other specific forms without departing from the spirit or essential characteristics thereof. The presently disclosed embodiments are therefore considered in all respects to be illustrative and not restricted. The scope of the invention is indicated by the appended claims rather than the foregoing description and all changes that come within the meaning and range and equivalence thereof are intended to be embraced therein.
Number | Name | Date | Kind |
---|---|---|---|
4552028 | Burckhardt et al. | Nov 1985 | A |
4711128 | Boura | Dec 1987 | A |
4885623 | Holm-Kennedy et al. | Dec 1989 | A |
4891984 | Fujii et al. | Jan 1990 | A |
4916505 | Holm-Kennedy | Apr 1990 | A |
4926682 | Holm-Kennedy et al. | May 1990 | A |
4926693 | Holm-Kennedy et al. | May 1990 | A |
4951510 | Holm-Kennedy et al. | Aug 1990 | A |
5083466 | Holm-Kennedy et al. | Jan 1992 | A |
5090254 | Guckel et al. | Feb 1992 | A |
5095762 | Holm-Kennedy et al. | Mar 1992 | A |
5101669 | Holm-Kennedy et al. | Apr 1992 | A |
5466348 | Holm-Kennedy | Nov 1995 | A |
5473930 | Gademann et al. | Dec 1995 | A |
5784507 | Holm-Kennedy et al. | Jul 1998 | A |
5834646 | Kvisteroy et al. | Nov 1998 | A |
6034613 | Hart et al. | Mar 2000 | A |
6051380 | Sosnowski et al. | Apr 2000 | A |
6485905 | Hefti | Nov 2002 | B2 |
6564637 | Schalk et al. | May 2003 | B1 |
6807872 | Le Traon et al. | Oct 2004 | B2 |
7188511 | Stuetzler | Mar 2007 | B2 |
7231803 | Stuetzler | Jun 2007 | B2 |
7475607 | Oboodi et al. | Jan 2009 | B2 |
7692219 | Holm-Kennedy | Apr 2010 | B1 |
8066945 | Willett et al. | Nov 2011 | B2 |
20050136419 | Lee | Jun 2005 | A1 |
20050150305 | Oboodi et al. | Jul 2005 | A1 |
20080258179 | Tour et al. | Oct 2008 | A1 |
Number | Date | Country | |
---|---|---|---|
20080168840 A1 | Jul 2008 | US |