The present invention concerns a low pressure wire ion plasma discharge source, in particular for use as an ion source for secondary emission electron beam, especially for a pulsed X-ray source. This type of pulsed X-ray generator is typically used as a pre-ionization source for high energy excimer lasers.
Principle of such an X-ray source is described for example by Friede et al. in U.S. Pat. No. 4,955,045. Typically, with reference to
To obtain a reliable ion source for X-ray generator, in particular to be used in high energy excimer lasers, the WIP discharge has to meet several requirements:
Experience shows that it is rather difficult to fulfill these requirements altogether.
Creating an ion plasma in a low pressure gas such as helium by applying a high voltage pulse leads to a large statistical uncertainty linked to the presence of the free electrons necessary to initiate the gas breakdown. This causes a large jitter between the time the pulsed voltage is applied to the wire(s) and the inception of the plasma. Such jitter can depend on external conditions such as applied voltage, changing conditions of the surface of the ionization chamber walls and time between the applied voltage pulse and the previous discharge (see “Helium memory effect”, Kurdle and al., J. Phys. D: Appl. Phys. 32(1999), 2049-2055).
Makarov in EP-2.079.092 is proposing a solution to this problem where instead of a single pulsed WIP discharge, several successive discharges (at high repetition rate, typically 100 Hz) are applied to the wire(s) before applying the negative pulse to the cathode. Due to the “memory” effect of low pressure gas (typically helium) discharge, the jitter is reduced for each successive discharge, improving the stability (in time and intensity) of the plasma created by the last positive pulse. However, this solution has several drawbacks:
In this case, stability and low jitter come at the expense of uniformity.
On the other hand, it is also known from Gueroult et al., “Particle in cell modelling of the observed modes of a DC wire discharge”, Journal of Physics D: Appl. Phys., Vol. 43, Nº 36, that WIP discharge can be sustained continuously at low (DC) current (typically <1 m A/cm). Gueroult et al. also shows (see
Japanese patent application JP-4-255654A discloses a pulsed electron gun comprising a low pressure gas ionization chamber housing an anode wire for generating positive ions by pulsed ionization of the gas. A DC voltage is applied in advance to the anode wire and a pulsed voltage is further applied to the anode wire. Thus, the plasma density inside the ionization chamber is increased and the number of positive ions extracted from the plasma and reaching the surface of the cathode is also increased. However, applying both the DC voltage and the pulsed voltage to the same anode wire presents the following drawbacks:
Therefore, the aim of the present invention is to provide a low pressure wire ion plasma (WIP) discharge source, in particular for use as an ion source for secondary emission electron beam, especially for a pulsed X-ray source, overcoming the prior art drawbacks.
In particular, the aim of the present invention is to provide a low pressure wire ion plasma discharge source ensuring easy plasma establishment with a low jitter, a good stability and uniformity (constricted phase).
The above goals are achieved according to the invention by providing a low pressure wire ion plasma (WIP) discharge source that comprises an elongated ionization chamber and at least two anode wires, preferably parallel, extending longitudinally within the ionization chamber, wherein a first of said at least two anode wires is connected to a direct current (DC) voltage supply and a second of said at least two anode wires is connected to a pulsed voltage supply.
In operation, the first anode wire supplied with a DC voltage serves as an auxiliary source that provides excited or ionized species. These species serve as seeds for establishment of a pulsed high current plasma when the second anode wire is supplied with a high pulsed voltage, thus ensuring low jitter, stability and uniformity of the final main plasma.
Preferably, the direct current applied to the first anode wire is a low current (typically ≤1 mA/cm) to obtain and maintain the final main plasma in a uniform mode (constricted phase).
The low pressure WIP discharge source of the invention can comprise more than two anode wires. Either the DC voltage supply or the pulsed voltage supply can be connected to two or more parallel anode wires.
A typical configuration comprises a single anode wire connected to the DC voltage supply and two parallel anode wires connected to the pulsed voltage supply. The anode wire(s) can be connected to the pulsed voltage supply by one or both ends, or in case of multiple anode wires by alternating opposite ends of the anode wires.
In a preferred embodiment, the ionization chamber comprises a main elongated chamber and an auxiliary elongated chamber which are in fluidic communication along their lengths, preferably their entire lengths through a slit. At least one longitudinally extending anode wire, connected to the DC voltage supply, is housed within the auxiliary chamber and at least one longitudinally extending anode wire, connected to a pulsed voltage supply, is housed within the main chamber of the ionization chamber. With such an arrangement cross-talk or short circuit during application of the main high current pulse is avoided.
The present invention will now be described in detail with reference to the drawings which represent:
In
A first anode wire is connected to a DC voltage supply 4 intended to apply to the wire a high DC voltage (typically 0.5 to 1 kV) and a low DC current (typically 1 mA/cm).
The second anode wire is connected to a pulsed voltage supply 5 intended to apply a single high voltage (typically 1-5 kV) and high current (typically ≥1 A/cm; <10 μs) pulse.
By continuously applying a high voltage to one anode wire, thus creating a continuous current through said wire, when subsequently applying a high DC voltage to the other wire, a stable WIP discharge with almost no jitter is safely obtained. Of course, number and positioning of the anode wires of each type (DC and pulsed) can be chosen to optimize ion density and uniformity. Also, when several anode wires supplied with a pulsed high voltage are used, pulsed high voltage can be supplied to a same single end of the wires, both ends of the wires or an opposite end of each wire.
In a specific embodiment, as shown in
Main chamber 11 houses two parallel anode wires 14a, 14b extending longitudinally within the chamber (of course, only one anode or more than two anode wires may also be used).
Auxiliary chamber 12 houses an anode wire 15 extending longitudinally therein (of course, more than one anode wire may be disposed within the auxiliary chamber 12.
The anode wire(s) 15 located within the auxiliary chamber 12 is connected to a high voltage/low current DC supply (as shown in
The elongated main and auxiliary chambers may have any suitable shapes such as parallelepipedic or cylindrical shapes. The overall longitudinal length of the main and auxiliary chambers is typically 1 m or more.
In reference with
1. Ionization Camber Characteristics
2. Operation
Typical Delays:
The sequence and waveforms for operation are shown in
Number | Date | Country | Kind |
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16151863 | Jan 2016 | EP | regional |
Filing Document | Filing Date | Country | Kind |
---|---|---|---|
PCT/EP2017/050596 | 1/12/2017 | WO | 00 |
Publishing Document | Publishing Date | Country | Kind |
---|---|---|---|
WO2017/125315 | 7/27/2017 | WO | A |
Number | Name | Date | Kind |
---|---|---|---|
3721915 | Reilly | Mar 1973 | A |
4888776 | Dolezal et al. | Dec 1989 | A |
4955045 | Friede et al. | Sep 1990 | A |
5097475 | Perzl | Mar 1992 | A |
5134641 | Friede et al. | Jul 1992 | A |
8664863 | Makarov | Mar 2014 | B2 |
20050067564 | Douglas | Mar 2005 | A1 |
20080308410 | Teschner | Dec 2008 | A1 |
20090114815 | Vanderberg | May 2009 | A1 |
20110057565 | Makarov | Mar 2011 | A1 |
20120146509 | Hermanns | Jun 2012 | A1 |
20130040067 | Kennedy | Feb 2013 | A1 |
20140076715 | Gorokhovsky | Mar 2014 | A1 |
20180247797 | Gorokhovsky | Aug 2018 | A1 |
Number | Date | Country |
---|---|---|
2 079 092 | Jul 2009 | EP |
4-255654 | Sep 1992 | JP |
H06-332327 | Dec 1994 | JP |
H08-36982 | Feb 1996 | JP |
H09-233244 | Sep 1997 | JP |
Entry |
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Sentis, Marc L. et al., “Design and Characteristics of High Pulse Repetition Rate and High Average Power Excimer Laser Systems,” IEEE Journal of Quantum Electronics, vol. 27, No. 10, Oct. 1, 1991, pp. 2332-2339. |
International Search Report, PCT/EP2017/050596, dated Mar. 29, 2017. |
Written Opinion, PCT/EP2017/050596, dated Mar. 29, 2017. |
Japanese Office Action for Application No. 2018-554635 dated May 21, 2019 with English translation provided. |
Korean Office Action, dated Jul. 22, 2019, from corresponding Korean patent application No. 10-2018-7020865. |
Clark, Jr et al.; A Long Pulse, High-Current Electron Gun for e-Beam Sustained txcimer Lasers; IEEE Journal of Quantum Electronics; Feb. 1978; vol. QE-14, No. 2; pp. 126-129. |
Number | Date | Country | |
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20190027336 A1 | Jan 2019 | US |