Low topography thermal inkjet drop ejector structure

Information

  • Patent Grant
  • 6227657
  • Patent Number
    6,227,657
  • Date Filed
    Monday, June 19, 2000
    24 years ago
  • Date Issued
    Tuesday, May 8, 2001
    23 years ago
Abstract
The systems and methods of this invention allows for an electrical contact structure of the drop ejecting transducer in an inkjet printhead to be designed in such a way that the relatively thick electrical contact lines are not in the ink drop ejection path between the drop ejector transducer and the corresponding nozzle. Such a design thereby minimizes any visible defects due to misdirected satellite drops.
Description




BACKGROUND OF THE INVENTION




1. Field of Invention




This invention relates generally to the mechanical and electrical structure of the thermal inkjet drop ejectors.




2. Description of Related Art




A conventional thermal inkjet transducer array is essentially a large bank of thin-film resistive heaters electrically connected in parallel. In particular, a thermal inkjet printer comprises an array of drop ejectors. Each drop ejector has an ink channel having an inlet end and a nozzle end and contains a resistive heater. The nozzle end of each resistive heater in the array of drop ejectors is connected to a common electrical bus, which in turn is connected to an electrical power supply providing a printer operating voltage. Each individual drop ejector is driven to eject a droplet of ink by grounding an inlet end of the resistive heater through an individually-addressable driver transistor.




The common electrical bus should be narrow, so that the length of the ink nozzle can be kept as short as possible. This tends to increase drop ejection energy efficiency. To reduce the electrical series resistance of the common bus, it is desirable to make the common bus relatively thick. Often, the common bus will have two or more layers of metal and/or polysilicon.




SUMMARY OF THE INVENTION




However, this thick bus structure presents a “bump”-shaped obstacle in the nozzle that misdirects the ejected main drop and/or associated satellite droplets that are ejected with the main drop. The misdirected satellite drops tend to limit the print quality achievable with drop ejectors having this bump-shaped obstacle. Unfortunately, no reasonable alternative to these drop ejectors was previously available.




This invention provides an electrical contact structure that connects the resistive heaters of the drop ejectors to the common bus that avoid the bump-shaped mechanical structure of the conventional electrical contact structure.




This invention separately provides a mechanical structure for the electrical contact structure between the common bus and the resistive heater that avoids placing relatively thick electrical contact layers in an ink drop ejection path between the resistive heater of the drop ejector and the nozzle of that drop ejector.




This invention separately provides a low-topography inkjet printhead drop ejector array that avoids a large common bus structure in the front of the drop ejectors.




This invention separately provides a low-topography inkjet printhead drop ejector array that locates individual electrical feed-through lines between each drop ejector in the array.




This invention separately provides an inkjet printhead drop ejector array that reduces visible defects due to misdirected satellite drops.




This invention separately provides inkjet printhead drop ejector arrays that relocates the thick electrical contact lines from the ink drop ejection path between the drop ejector resistive heater and the corresponding nozzle.




In various exemplary embodiments of a thermal inkjet printhead according to this invention, the high-current common bus does not extend in front of the row of resistive heaters in the array of drop ejectors. Instead, a flat layer of highly-doped polysilicon forms the common bus. This flat, highly-doped polysilicon layer runs between the resistive heaters and is routed to interconnection pads for each ink drop ejector without placing a bump in the path of an exiting ink droplet.




In various exemplary embodiments, a floor of the ink channel is left more or less flat at the level of the resistive heater. A layer of passivation material, such as, for example, silicon nitride, can be added to the nozzle region of the ink channel to reduce any residual topography. By making the floor of the ink channel more or less coplanar from an inlet end of the resistive heater through the nozzle and out to the front face of the printhead, the topographic features that contribute to misdirecting main drops and/or creating satellite drops are reduced.




These and other features and advantages of this invention are described in, or are apparent from, the following detailed description of various exemplary embodiments of the low-topography inkjet printhead drop ejectors according to this invention.











BRIEF DESCRIPTION OF THE DRAWINGS




Various exemplary embodiments of this invention will be described in detail, with reference to the following figures, wherein:





FIG. 1

illustrates the effect of ink channel topography on ink drop formation;





FIG. 2

shows one exemplary embodiment of a low-topography inkjet printhead structure according to this invention;





FIG. 3

, as shown by cross-section line III—III in

FIG. 2

, is a cross-sectional view of one exemplary embodiment of a common bus connecting line portion of a low-topography inkjet printhead structure according to this invention;





FIG. 4

, as shown by the cross-section line IV—IV in

FIG. 2

, is a cross-sectional view of one exemplary embodiment of a connection structure between the common bus connection line portion and the common bus of the low-topography inkjet printhead structure according to this invention;





FIG. 5

, as shown by the cross-section line V—V in

FIG. 2

, a second cross-sectional view of the exemplary embodiments of the common bus connection line portion and the common bus shown

FIGS. 3 and 4

; and





FIG. 6

, as shown by the cross-section line VI—VI in

FIG. 2

, is a cross-sectional view of one exemplary embodiment of a portion of an inkjet drop ejector ink channel of the low-topography inkjet printhead structure according to this invention.











DETAILED DESCRIPTION OF EXEMPLARY EMBODIMENTS





FIG. 1

illustrates the effect on ink drop formation caused by the nozzle topography of a conventional inkjet printhead drop ejector that has the conventional bump-shaped common bus connection structure discussed above. As shown in

FIG. 1

, the conventional inkjet printhead drop ejector


10


includes a channel plate


12


and a heater plate


14


. The channel and heater plates


12


and


14


combine with a polymer spacer layer (not shown) to form an ink channel


20


extending laterally between the channel plate


12


and the heater plate


14


. A polysilicon resistive heater


16


is formed on or over the heater plate


14


. The common bus connection structure


18


connects the polysilicon resistive heater


16


to a high-voltage power supply. In particular, in conventional thermal inkjet printers, the high-voltage power supply is usually in the range of approximately 40 volts.




When the circuit including the polysilicon resistive heater


16


and the connection structure


18


is closed, current flows through the connection structure


18


and the polysilicon resistive heater


16


, causing resistive heating. This resistive heating pumps thermal energy into the ink contained within the ink channel


20


. Eventually, a portion of the ink in the ink channel


20


vaporizes, forcing ink past the bump


18


and through a nozzle


22


. A top of the nozzle


22


is defined by the channel plate


12


, while a bottom of the nozzle


22


is defined by the heater plate


14


, and the sides of he nozzle


22


are defined by the polymer spacer layer. In particular, the nozzle


22


is on the other side of the connection structure


18


from the polysilicon resistive heater


16


. Thus, the bump-shaped connection structure


18


tends to act as a flow-restriction-like member in the ink channel


20


.




The bubble formed in the ink channel


20


causes a portion of the ink


24


to extend out of the nozzle


22


. In particular, the force applied by the bubble on the incompressible ink


24


causes a main drop


30


to be ejected from the nozzle


22


. However, due to the shape and position of the bump-shaped connection structure


18


, one or both of two disadvantageous effects can occur as the main drop


32


is ejected from the ink channel


20


.




First, the main drop


32


can be misdirected (as shown by drop


30


) as it is ejected out of the inkjet nozzle


22


. That is, the main drop


32


ideally exits the ink channel


20


in a direction that is perpendicular to the surface of the recording medium


40


at which the ink drop


32


is ejected. However, due to the bump-shaped connection structure


18


, the main drop


32


exits the ink channel


20


at an angle (as shown by drop


30


) to the desired direction, reducing the accuracy of ink spot placement on the recording medium


40


from the desired location by a distance “d”.




Secondly, the bump-shaped connection structure


18


can cause disturbances in the flow of the ink as it exits the nozzle


22


. When the main drop


30


is ejected from the nozzle


22


, one or more small satellite drops


30


are generated which also impact the recording medium


40


. This disturbance causes one or more satellite drops


30


to depart from the trajectory of the main drop


32


as the ink is ejected from the nozzle


22


. In particular, the satellite drops


30


will be ejected at an angle


0


divergent relative to the main drop


32


.




Thus, the topography of the ink channel


20


created by the bump-shaped connection structure


18


induces one or more print defects in the images formed by the inkjet printer. As described above, these print defects are related to departures from the ideal flight path of the main drop


32


and differences in the flight paths between the main drop


32


and any satellite drops


30


that may have been ejected with the main drop


32


. These defects cause the resulting printed images to be fuzzy, to have elongated spot aspect ratios, to have banding, and/or to have spot width variations. For example, if the inkjet printer forms images by printing swaths in both a forward and a return direction, the motion vector of the printhead will alternately additively or subtractively add to the flight path vectors of the satellite drops, causing the satellite drops to alternatively extend outside of, or fall within, the main drop as it lands on the recording medium


40


. Thus, depending on which way the printhead carriage moves relative to the recording medium


40


, the size of the spot formed by the combination of the main drop


30


and any satellite drops


32


will change.





FIG. 2

is a top plane view of one exemplary embodiment of a low-topography inkjet printhead structure


100


according to this invention. In particular,

FIG. 2

shows a top plane view of the heater plate


102


of the low-topography inkjet printhead structure


100


according to this invention. As shown in

FIG. 2

, a plurality of ejector structures


110


is interleaved with a plurality of common bus connection portions


120


. Each of the ejector structures


110


includes an address line connection portion


112


that connects that ejector structure


110


to a high-voltage driver transistor that selectively connects and disconnects the ejector structure


110


to ground. The address line connection portion


112


is located at an inlet end of a resistive heater


114


. A polymer nozzle structure


116


is formed over the resistive heater


114


and ends in a nozzle


118


.




It should be appreciated that, as outlined below, the resistive heater


114


can be formed by a layer of doped polysilicon. However, it should also be appreciated that the resistive heater


114


can also be formed using a thin-film resistor in place of the doped polysilicon layer within the ink channel


20


. It should further be appreciated that the thin-film resistor can be formed using any appropriate process, such as, for example, sputtering.




Each of the common bus connection structures


120


forms a connection structure


124


that connects a common bus portion


130


to a drive voltage bus that is held at the drive voltage. In general, for most common thermal inkjet printers, the drive voltage is 40 volts. The common bus portion


130


extends across a front portion of the heater plate


102


and connects to each of the resistive heaters


114


. In the exemplary embodiment shown in

FIG. 2

, the common bus connection portion


120


connects to the drive voltage bus at a location behind the ejector structures


1


relative to the nozzles


118


. In particular, the common bus connection portion


120


includes a linear connection portion


122


connected to the common bus


130


through the connection structure


124


.





FIG. 3

, as shown by cross-section line III—III in

FIG. 2

, is a cross-sectional view of the linear connection portion


122


taken across the long axis of the linear connection portion


122


. As shown in

FIG. 3

, a field oxide layer


200


forms at least a portion of the heater plate


102


. A relatively lightly-doped (N


+


) layer


210


is formed on or over the field oxide layer


200


. In the region of the linear portion


122


of the connection portion


120


, the relatively lightly-doped polysilicon layer


210


is patterned to form a plurality of the resistive heaters. A first insulative layer


220


is formed and patterned to act as an insulative layer between adjacent resistive heater portions of the patterned polysilicon layer


210


and a protective layer


230


formed on or over the insulative layer


220


and the relatively lightly-doped polysilicon layer


210


.




As shown in

FIG. 3

, in various exemplary embodiments, the protective layer


230


is a multi-layer protective layer


230


. In various exemplary embodiments, the multi-layer protective layer


230


comprises a pair of layers. In particular, the multilayer protective layer


230


comprises a lower silicon nitride


232


layer formed using a chemical vapor deposition process and an upper beta-phase tantalum layer


235


.




In various exemplary embodiments, the multi-layer protective layer


230


should overlap the first insulative layer


220


by approximately 2 μm to reduce the likelihood that, outside of the ink channel, the beta phase tantalum layer


235


does not terminate on the polysilicon layers


220


, described above, and


270


, described below. Otherwise, if the tantalum layer


235


terminates in electrical contact with one of the polysilicon layers


220


or


270


, the polysilicon becomes damaged near the edge of the tantalum layer


235


and unacceptably low polysilicon-tantalum breakdown voltages occur.




The protective layer


230


is used both to protect against the cavitation forces generated within the ink channel


20


as vapor bubbles of the ink form and collapse within the ink channel


20


to eject ink drops from the ejector structures


110


, and to provide electrical isolation between the polysilicon heater structure


210


, which is held at the drive voltage, and the ink


24


in contact with the tantalum layer


235


.




It should be appreciated that, in other various exemplary embodiments, any other known or later developed protection layer, whether a single layer structure or a multi-layer structure, can be used in place of the multi-layer protective layer


230


described above, so long as that protective layer is able to adequately protect the resistive heater


114


against chemical attack by the ink or by the cavitation forces and/or thermal forces generated by the ink bubbles as they form and collapse within the ink channels


20


. It should also be appreciated that the protection structure outside of the ink channels


20


, whether the protective layer is the multi-layer protective layer


230


described above or any other known or later developed protective layer, can be patterned away from any regions outside of the ink channels


20


. In this case, a separate planarizing layer can be put down in place of the protective layer in order to reduce the topography of the low-topography inkjet printhead structure


100


according to this invention.




A second insulative layer


240


is formed on or over the protective layer


230


and positioned generally vertically over the space formed between the relatively lightly-doped polysilicon layers


210


. A conductive metal layer


250


is then formed on or over the second insulative layer


240


. An insulative passivation layer


260


is formed on or over the conductive metal layer


250


, the second insulative layer


240


and partially over the protective layer


230


to completely encapsulate the second insulation layer


240


and the conductive metal layer


250


.




As indicated above, the protective layer


230


is thus only absolutely necessary within the ink channels


20


. However, the protective layer


230


is also used outside of the ink channels


20


as an electrical isolation and surface passivation layer in the nozzle


118


. That is, in the regions outside the ink channels


20


, the protective layer


230


can be utilized to provide electrical, mechanical, and chemical protection to underlying circuit elements of the heater wafer


102


without adding additional topographical structures above the top surface plane of the resistive heater


114


formed by the top surface of the protective layer


230


. In contrast, using the second insulating layer


240


or the passivation layer


260


for these purposes, as is generally done in prior art devices, would generate undesirable additional topographical structures.




In various exemplary embodiments, the field oxide layer


200


acts as an electrical and thermal insulation layer and is approximately 1.5 μm thick. In various exemplary embodiments, the field oxide layer


200


is formed using a thermal steam oxide process. In various exemplary embodiments, the relatively lightly-doped polysilicon layer


210


is approximately 4500 Å thick and is formed using any appropriate chemical vapor deposition or physical vapor deposition process. The first insulative layer


220


, in various exemplary embodiments, includes a silicon oxide layer approximately 1,000 Å thick and a 7,000 Å thick doped glass layer. In various exemplary embodiments, the silicon oxide layer is formed using a thermal dry-oxygen process, while the doped glass layer is formed using a low-pressure chemical vapor deposition process with a subsequent oxygen high-temperature reflow process. In particular, in various exemplary embodiments, this doped glass layer has a phosphorous (P) content of approximately 7.2 percent by weight.




The multi-layer protective layer


230


, in various exemplary embodiments, has a lower silicon nitride layer


232


and an upper tantalum layer


235


. The silicon nitride layer


232


is formed using a pyrolytic low-pressure chemical vapor deposition process and is approximately 1500 Å thick. The tantalum layer


235


is approximately 2500 Å thick. The tantalum layer


235


is deposited as beta-phase tantalum and is formed by sputtering. The second insulative layer


240


, in various exemplary embodiments, includes a silicon oxide layer that is approximately 1.0 μm thick and formed using a plasma-enhanced chemical vapor deposition process and a TEOS (tetra-ethyl-ortho-silicate) precursor.




The conductive metal layer is approximately 1.25 μm thick. In various exemplary embodiments, the conductive metal layer


250


is an aluminum-silicon alloy having 1 percent by weight silicon and is formed by sputtering. Prior to depositing the conductive metal layer


250


, the exposed surfaces of the various layers are etched using an radio frequency sputter etch process to clean the exposed silicon surfaces to improve the contact resistance of the conductive metal layer


250


. The passivation layer


260


is, in various exemplary embodiments, approximately 1500 Å thick and is formed using plasma enhanced chemical vapor deposition using a TEOS (tetra-ethylortho-silicate) precursor. The passivation layer


260


also includes a 1.0 μm silicon nitride layer formed by plasma-enhanced chemical vapor deposition.




As mentioned above, the protective layer


230


acts as a heater protection layer providing both chemical and mechanical protection to the resistive heater


114


in the ejector structure


110


. The passivation layer


260


also acts as a mechanical and chemical protection layer. Because the passivation layer


260


encapsulates the conductive metal layer


250


, the passivation layer


260


also provides electrical protection.




It should be appreciated that, while the various layers described above are formed, in various exemplary embodiments, using the various thicknesses and processes described above, that any known or later developed process for forming one of the above-outlined layers can be used so long as it results in a layer having the proper mechanical and/or electrically properties as discussed herein. Thus, while various materials, thicknesses and/or deposition processes have been discussed above with respect to layers


200


-


260


, it should be appreciated that this discussion is illustrative only, and not intended to be limiting of the scope of this invention.





FIG. 4

, as shown by the cross-section line IV—IV in

FIG. 2

, is a cross-sectional view illustrating how the conductive metal layer


250


is electrically connected to a relatively highly-doped (N


++


) polysilicon layer


270


forming the common bus structure


130


for the ejector structures


110


. As shown in

FIG. 4

, the relatively highly-doped polysilicon layer


270


is formed on or over the field oxide layer


200


and under the first and second insulation layers


220


and


240


and the protective layer


230


. In particular, the conductive metal layer


250


contacts the relatively heavily-doped polysilicon layer


270


either directly or through one or more conductive barrier structures.





FIG. 5

, as shown by the cross-section line V—V in

FIG. 2

, is a cross-sectional view of the common bus connection portion


120


along the long dimension of the common bus connection portion


220


, showing both the structure of the common bus connection portion


122


and the contact portion


124


.





FIG. 6

, as shown by the cross-section line VI—VI in

FIG. 2

, is a cross-sectional view along the long axis of the resistive heater


114


and extending through the nozzle


118


. As shown in

FIG. 6

, the common bus portion


130


, formed by the relatively heavily-doped polysilicon layer


270


, and the resistive heater portion


114


, formed by the relatively lightly-doped polysilicon layer


210


, are positioned laterally adjacent to each other to form a conductive path from the drive voltage bus to ground through the common bus connection portion


122


, the connection structure


124


, the common bus


130


, the resistive heater


114


and the address line connection portion


112


to ground. Thus, current flows through the relatively heavily-doped polysilicon layer


270


and into the relatively lightly-doped polysilicon layer


220


.




This current flow through the relatively lightly-doped polysilicon layer


210


causes resistive heating in the relatively lightly-doped polysilicon layer


210


. In particular, the relatively heavily-doped polysilicon layer


270


has a resistivity that is less than the resistivity of the relatively lightly-doped polysilicon layer


220


. In various exemplary embodiments, the resistivity of the relatively heavily-doped polysilicon portion layer is on the order of 20 Ω/□. In contrast, relatively lightly-doped polysilicon layer


210


has a resistivity on the order of 200-3000 Ω/□. In general, the relatively lightly-doped polysilicon layer


210


should have a resistivity that is 1 to 2 orders of magnitude greater that the resistivity of the relatively heavily-doped polysilicon layer


270


. This tends to cause most of the resistive heating to occur in the relatively lightly-doped polysilicon layer


220


, and relatively little of the resistive heating to occur in the relatively heavily-doped polysilicon layer


270


.




In various exemplary embodiments, the polysilicon layers


210


and


270


are doped using phosphorus. Phosphorus is particularly useful because phosphorus reduces roughening of the surface of the polysilicon layers


210


and


270


. However, it should be appreciated that any other known or later developed dopant can be used, including arsenic, and even p-type dopants, such as boron.




The heat created by the resistive heating in the relatively lightly-doped polysilicon layer


210


flows through the thermally conductive protective layer


230


and heats the ink in the ink channel


20


sufficiently to cause the ink to vaporize and eject a drop through the nozzle


118


.




As shown in

FIG. 6

, the passivation layer


260


and the protective layer


230


form a generally flat topography. In particular, the connection structure


118


shown in

FIG. 1

is moved out of the ejector structure


110


to a portion of the heater plate


102


that is laterally adjacent to the ejector structure


110


, as shown in FIG.


2


. Thus, while the complex, multi-layer contact structure


124


that is located at the front of the heater plate


102


is required for each ejector structure


110


, this complex, multi-layer contact structure


124


avoids introducing any additional topography into the ejector structure


110


and especially avoids ejecting any additional topography into the ejector structure


110


at locations close to the nozzle


118


.




In particular, as shown in

FIG. 6

, the surface of the resistive heater


114


is essentially or substantially flat. It should be appreciated that, to the extent the resistive heater shown in

FIG. 6

is not completely flat, a portion of the passivation layer


260


can be added to the ejector structure


110


at a region near the nozzle


118


to remove any residual topography that may be created by the field oxide


200


and the polysilicon layers


210


and


270


. It should be appreciated that, in various exemplary embodiments of the ink jet printhead according to this invention, for a given ink formulation, drop size, and/or drop ejection frequency, the most defect-free image formed on the recording medium


40


is obtained when the portion of the passivation layer


260


is provided in the ink channel


20


between the protective layer


230


and the nozzles


22


. In contrast, in various other exemplary embodiments of the ink jet printhead according to this invention, for other ink formulations, drop sizes, and/or drop ejection frequencies, the most defect-free image formed on the recording medium


40


is obtained when this portion of the passivation layer


260


is omitted from the ink channel


20


.




However, it should be appreciated that, if it is provided in the ink channel


20


, this portion of the passivation layer


260


is nonetheless spaced from the protective layer


230


and the relatively heavily-doped polysilicon portion


270


, thus forming a valley or divot


280


in the topography of the resistive heater


114


. It should be appreciated that this valley or divot


280


, in various exemplary embodiments, is approximately 1 μm wide along the resistive heater


114


, and, in the various exemplary embodiments, it is approximately 0.5 μm deep. While this valley or divot


280


may generate de-minimis disturbances in the flow of ink through the nozzles


118


, removing this valley or divot


280


by attempting to butt the passivation layer


260


directly up against the protective layer


230


and the relatively heavily-doped polysilicon portion


270


tends to create a ridge that extends into the ink channel


20


and thus creates exactly the type of bump-shaped obstacle in the ink channel


10


that this invention was directed to reduce.




In particular, referring back to

FIG. 1

, the ink channel


20


has a height h


1


that is, in various exemplary embodiments, on the order of 20 μm. In contrast, the bump-shaped connection structure


18


has a height h


2


that is approximately 7 μm. Thus, the bump-shaped connection structure


18


has a height that is one-third or more of the height of the ink channel


20


itself In contrast, the valley or divot


280


, which has a depth of approximately 0.5 μm, is only 2.5% of the height h


1


of the ink channel


10


. Even if the portion of the passivation layer


260


is emitted at the front of the ink channel


20


near the nozzle


22


, the topography encountered by ink flowing from the protection layer


230


through the nozzle


22


is only a small 0.5 μm drop on to a smooth nozzle floor, as opposed to the large 7 μm constriction in a 20 μm nozzle present in the conventional ink channel.




Thus, by making the portion of the ejector structure


110


formed on the heater plate


102


more or less coplanar from the portion of the resistive heater


114


adjacent the address line connection portion


112


through to the nozzle


118


, the topographical features in the conventional thermal inkjet printhead that contribute to main and satellite drop misdirection are reduced, if not minimized or even fully eliminated.




It should also be appreciated that the relatively complex multi-layer contact structure


124


shown in

FIGS. 4 and 5

provides a good, low-resistance electrical connection between the drive voltage bus and the common bus


130


.




It should be appreciated that additional complexity in the multi-layer contact structure shown in

FIGS. 4 and 5

arises because the tantalum layer


235


should not be allowed to make electrical contact with either the high voltage drive power supply or to ground. That is, the protective layer


230


should be electrically floating. In particular, if the tantalum layer


235


is inadvertently connected to the 40V drive voltage, the ink can electrolyze and known print defects associated with electrolyzed ink will occur. In contrast, if the tantalum layer


235


is inadvertently connected to ground, high electric fields will be induced that will eventually result in failure of the resistive heaters in the regions of these high electric fields.




It should be appreciated that, in the various exemplary embodiments outlined above, the various exemplary materials and thicknesses of the various exemplary layers have been particularly selected to improve the chemical resistance against the ink and to improve the ability of the various electrical connection structures to operate at voltage levels up to 50 volts.




It should be appreciated that the thermal inkjet printer having the ejection structure


110


and connection structure


124


described above can be used in any known or later developed image forming device, such as a copier, a printer, a facsimile machine, or the like. It should be appreciated that the low-topography thermal inkjet printhead drop ejector structure


100


according to this invention allows the ejector structures to be packed at a high density without introducing topographical features that are detrimental to print quality. At the same time, the low-topography thermal inkjet printhead drop ejector structures


100


according to this invention does not compromise the resistance in the drop ejectors to the corrosive operating environment of a thermal inkjet printer. Finally, it should be appreciated that the low-topography thermal inkjet printhead drop ejectors structure


100


according to this invention reduce voltage variations that can occur from one end of the ejector array to the other end of the ejector array, which tend to introduce variations in ink drop size from one end of the array to the other.




While this invention has been described in conjunction with the exemplary embodiments outlined above, it is evident that many alternatives, modifications and variations will be apparent to those skilled in the art. Accordingly, the exemplary embodiments of the invention, as set forth above, are intended to be illustrative, not limiting. Various changes may be made without departing from the spirit and scope of the invention.



Claims
  • 1. A thermal inkjet printhead, comprising:an ink channel portion including a resistive heater and terminating in a nozzle; a common bus electrically connected to the resistive heater and having a resistivity that is lower than a resistivity of the resistive heater, the common bus positioned between the resistive heater and the nozzle; a connection line that is laterally adjacent to the ink channel portion and that extends approximately perpendicular to the common bus; and a connection structure, including at least one additional layer, that connects the connection line and the common bus, the connection structure positioned laterally adjacent to, and outside of, the ink channel.
  • 2. The thermal inkjet printhead of claim 1, wherein the connection line comprises:a field oxide layer; a doped polysilicon layer formed over the field oxide layer; at least a first insulation layer formed over the field oxide layer and the doped polysilicon layer; a conductive metal layer formed over at least the first insulation layer; and a passivation layer formed over the conductive metal layer and at least the first insulation layer.
  • 3. The thermal inkjet printhead of claim 2, wherein the at least first insulation layer comprises:a first insulation layer formed between adjacent patterned areas of the doped polysilicon layer and formed over the field oxide layer and the doped polysilicon layer; a protective layer formed over the first insulation layer and the doped polysilicon layer; and a second insulation layer formed over the protective layer, wherein the conductive metal layer is formed over the second insulation layer and the passivation layer is formed over the conductive metal layer, the second insulation layer and the protective layer.
  • 4. The thermal inkjet printhead of claim 3, wherein the protective layer comprises:a silicon nitride layer formed over the first insulation layer and the doped polysilicon layer; and a beta-phase tantalum layer formed over the silicon nitride layer.
  • 5. The thermal inkjet printhead of claim 1, wherein the connection structure comprises:a field oxide layer; a doped polysilicon layer formed over the field oxide layer; a conductive metal layer electrically connected to the doped polysilicon layer; and a passivation layer formed over the conductive metal layer and the doped polysilicon layer.
  • 6. The thermal inkjet printhead of claim 5, further comprising:at least one insulation layer formed between the doped polysilicon layer and the passivation layer.
  • 7. The thermal inkjet printhead of claim 6, further comprising:a protective layer; and a second insulation layer, wherein the first insulation layer is formed over the doped polysilicon layer, the protective layer is formed over the first insulation layer and the doped polysilicon layer, the second insulation layer is formed over the doped polysilicon layer, the first insulation layer and the protective layer, the conductive metal layer is formed over the doped polysilicon layer and the second insulation layer, and the passivation layer is formed over the conductive metal layer, the second insulation layer and the protective layer.
  • 8. The thermal inkjet printhead of claim 7, wherein the protective layer comprises:a silicon nitride layer formed over the doped polysilicon layer and the first insulation layer; and a beta-phase tantalum layer formed over the silicon nitride layer.
  • 9. The thermal inkjet printhead of claim 1, wherein the ink channel comprises:a field oxide layer; a relatively lightly-doped polysilicon layer forming the resistive heater and formed over the field oxide layer; a relatively heavily-doped polysilicon layer formed over the field oxide layer and positioned adjacent to and in electrical contact with the relatively lightly-doped polysilicon layer, the relatively heavily-doped polysilicon layer forming a common bus; a protective layer formed over the relatively lightly-doped polysilicon layer, the relatively heavily-doped polysilicon layer and the field oxide layer and forming a substantially flat surface; and a passivation layer formed over the field oxide layer in a nozzle portion of the ink channel, the passivation layer being substantially co-planar with the substantially flat surface of the protective layer.
  • 10. The thermal inkjet printhead of claim 9, further comprising a valley formed between the passivation layer and the protective layer, the valley having a depth and a width that does not substantially negatively affect ink flow through the ink channel as ink droplets are ejected from the ink channel.
  • 11. The thermal inkjet printhead of claim 1, wherein the ink channel comprises:a field oxide layer; a thin-film resistor forming the resistive heater and formed over the field oxide layer; a doped polysilicon layer formed over the field oxide layer and positioned adjacent to and in electrical contact with the thin-film resistor, the doped polysilicon layer forming a common bus; a protective layer formed over the thin-film resistor, the doped polysilicon layer and the field oxide layer and forming a substantially flat surface; and a passivation layer formed over the field oxide layer in a nozzle portion of the ink channel, the passivation layer being substantially co-planar with the substantially flat surface of the protective layer.
  • 12. The thermal inkjet printhead of claim 11, further comprising a valley formed between the passivation layer and the protective layer, the valley having a depth and a width that does not substantially negatively affect ink flow through the ink channel as ink droplets are ejected from the ink channel.
  • 13. A thermal inkjet printhead, comprising:a channel plate; a heater plate positioned adjacent to the channel plate to form at least one ink channel between the heater and the channel plates, each ink channel terminating in a nozzle through which ink droplets are ejected from the ink channel, the heater plate comprising: for each ink channel, a resistive heater formed in that ink channel; a common bus layer extending through each ink channel and, in each ink channel, in electrical contact with the resistive heater formed in that ink channel; a protective layer formed over the resistive heater and the common bus layer; and within each ink channel, a portion of a passivation layer positioned adjacent to the common bus layer and the protective layer such that a topography of the heater plate within that ink channel is substantially flat.
  • 14. A thermal inkjet printhead, comprising:a channel plate; a heater plate positioned adjacent to the channel plate to form at least one ink channel between the heater and the channel plates, each ink channel terminating in a nozzle through which ink droplets are ejected from the ink channel, the heater plate comprising: for each ink channel, a resistive heater formed in that ink channel; a common bus layer extending through each ink channel and, in each ink channel, in electrical contact with the resistive heater formed in that ink channel; a protective layer formed over the resistive heater and the common bus layer; and within each ink channel, a portion of a passivation layer positioned adjacent to the common bus layer and the protective layer such that asymmetries within that ink channel upstream of the nozzle of that ink channel are reduced. comprises a polysilicon layer.
  • 15. A thermal inkjet printhead, comprising:an ink channel portion including a resistive heater, the ink channel terminating in a nozzle; a common bus layer electrically connected to the resistive heater and having a resistivity that is lower than a resistivity of the resistive heater, the common bus positioned between the resistive heater and the nozzle within the ink channel; an insulative layer formed over the common bus layer outside of the ink channel; a protective layer formed over the resistive heater, the insulative layer and the common bus layer; and a connection line that is laterally adjacent to the ink channel portion and that extends approximately perpendicular to the common bus layer, the connection line extending over the common bus layer and the protective layer and electrically connected to a top surface of the common bus layer through the protective layer and the insulative layer; wherein edges of the protective layer over the common bus layer outside of the ink channel terminate over the insulative layer and do not contact the common bus layer.
  • 16. The thermal inkjet printhead of claim 15, wherein the protective layer comprises:a silicon nitride layer formed over the first insulation layer and the doped polysilicon layer; and a beta-phase tantalum layer formed over the silicon nitride layer.
  • 17. The thermal inkjet printhead of claim 15, wherein the restrictive heater comprises a polysilicon layer.
  • 18. The thermal inkjet printhead of claim 17, wherein the polysilicon layer comprises a doped polysilicon layer.
  • 19. The thermal inkjet printhead of claim 15, wherein the resistive heater comprises a thin film resistor.
  • 20. The thermal inkjet printhead of claim 19, wherein the thin film resistor comprises a sputtered thin-film resistor.
US Referenced Citations (6)
Number Name Date Kind
4445266 Mai et al. May 1984
4742019 Bechade May 1988
4887098 Hawkins et al. Dec 1989
5257042 Buhler Oct 1993
5534901 Drake Jul 1996
5988797 Itoh Nov 1999