The subject matter described herein relates to reducing the magnetic field inside a linear accelerator.
A linear particle accelerator (linac) can be used to accelerate charged subatomic particles or ions by subjecting them to a series of oscillating electric potentials in an acceleration chamber. In an exemplary linac application, the accelerated particles may be directed toward a target which, when struck by the particles, enables the generation of a photon beam that may be used in medical radiation therapy.
Typical linear accelerators include a particle source and an acceleration chamber that is kept under vacuum. In many linear accelerators, maintenance of the vacuum in the acceleration chamber is facilitated by a vacuum pump, for example, an ion pump. Many ion pumps include a Penning trap that confines electrons in the center of the Penning trap. The confined electrons then ionize gas particles that also enter the Penning trap. Once ionized, an electric field directs the ions to a getter that captures them, thus reducing the gas density in the linear accelerator.
In a first aspect, a system can include a linear accelerator, and ion pump, and a compensating magnet. The ion pump can have an ion pump magnet position, an ion pump magnet shape, an ion pump magnet orientation, and an ion pump magnet magnetic field profile. The compensating magnet can have a position, a shape, an orientation, and a magnetic field profile. Also, at least one of the position, shape, orientation, and magnetic field profile of the compensating magnet reduces at least one component of a magnetic field in the linear accelerator resulting from the ion pump magnet.
In some variations, the orientation of the compensating magnet can be such that the magnetic field due to the ion pump magnet is substantially canceled in at least one location in the linear accelerator. Also, the linear accelerator can have an electron beam path and the reduction or cancellation of the magnetic field can be along the electron beam path.
In other variations, at least one of the position, shape, orientation, and magnetic field profile can be substantially similar to at least one of the ion pump magnet position, ion pump magnet shape, ion pump magnet orientation, and ion pump magnet magnetic field profile. Also, the compensating magnet can be a current carrying coil.
In other variations, the ion pump magnet and the compensating magnet can each have a C-shape, with each of the C-shapes having an opening. The openings of the ion pump magnet and the compensating magnet can face each other.
In other variations, at least one of the position, shape, orientation, and magnetic field profile of the compensating magnet can be configured to reduce a gradient of the magnetic field in the linear accelerator.
The accompanying drawings, which are incorporated in and constitute a part of this specification, show certain aspects of the subject matter disclosed herein and, together with the description, help explain some of the principles associated with the disclosed implementations. In the drawings,
When practical, similar reference numbers denote similar structures, features, or elements.
The subject matter of this application describes methods and systems for magnetic field compensation in a linear accelerator. References in this specification to “an embodiment,” “one embodiment,” and the like, mean that the particular feature, structure, or characteristic being described is included in at least one embodiment of the present subject matter. Occurrences of such phrases in this specification do necessarily all refer to the same embodiment.
A vacuum pump 120 can be connected to linear accelerator 100 to provide a vacuum. An electron beam can then travel unobstructed inside linear accelerator 100 along a central axis 130. In one implementation, vacuum pump 120 can be an ion pump. Ion pumps utilize electric and magnetic fields to ionize gas inside the ion pump and divert the ionized gases to collection plates or getters. In one implementation, ion pump 120 (indicated by the dashed line) can include an ion pump magnet 110. When an “ion pump magnet” is referred to herein it may refer to a single magnet design such as in
Ion pump magnet position can be, for example, the location of ion pump magnet 110 relative to central axis 130 of the linear accelerator 100 or to any fixed point relative to linear accelerator 100.
Ion pump magnet shape can describe the overall shape or configuration of the ion pump magnet 110.
Ion pump magnet orientation can refer to the particular disposition of ion pump magnet 110 relative to a particular object, location, vector, etc. For example, ion pump magnetic orientation can describe ion pump magnet 110 being angled, mirrored, rotated, shifted, etc. Ion pump magnet orientation can also define an ion pump magnet polarity. One example of ion pump magnet polarity is shown in
Ion pump magnetic field profile can describe the strength and shape of the magnetic field resulting from ion pump magnet 110. Ion pump magnetic field profile can include a magnetic field that permeates other portions of ion pump 120, the linear accelerator 100, and any surrounding space or other components. One portion of an ion pump magnetic field profile 220 is illustrated in
The magnetic field profile of ion pump 120, and magnetic fields from other sources, can affect the focusing and/or trajectory of the electron beam. This in turn can affect the quality of the beam and, for example, dose delivered to the patient during radiotherapy treatment. Electron beam homogeneity at a treatment location in a patient can be reduced by an electron beam that has been deviated or defocused by a magnetic field.
As illustrated in
With ion pump magnet 110 and compensating magnet 210 arranged with at least partial symmetry, the magnetic field can be reduced, or substantially canceled, along central axis 130 of linear accelerator 100. Due to magnetic field reduction along central axis 130 of linear accelerator 100 by compensating magnet 210, reduction in at least one component of the magnetic field can also occur along the electron beam path proximate to central axis 130.
In one implementation, position, shape, orientation, and/or magnetic field profile of the compensating magnet 210 can be substantially similar to at least one of the ion pump magnet position, ion pump magnet shape, ion pump magnet orientation, and ion pump magnet magnetic field profile. The compensating magnet 210 can also essentially be a copy of the ion pump magnet 110 in materials, model, construction, etc. This implementation is illustrated in
In another implementation, compensating magnet 210 can be an opposing magnet within a second ion pump (not shown). The second ion pump can be positioned in such a way to achieve the reduction of the magnetic field in linear accelerator 100 as described herein.
In yet another implementation, compensating magnet 210 can be current carrying coil(s) that generate a magnetic field. In this way the opposed current carrying coil(s) can act to cancel the magnetic field similar to opposing ion pump magnets.
The position, shape, orientation, and magnetic field profile of compensating magnet 210 can be configured to reduce the gradient of the magnetic field at one or more locations in the linear accelerator 100. Here, ion pump magnet 110 and compensating magnet 210 are oriented at an angle 310 of 45 degrees relative to central axis 130 of linear accelerator 100 to reduce the magnetic field gradient. While
The present disclosure contemplates that at least one of the position, shape, orientation, and magnetic field profile of the compensating magnet and at least one of the ion pump magnet position, ion pump magnet shape, ion pump magnet orientation, and ion pump magnet magnetic field profile are selected to cause the least reduction in a beam quality of the linear accelerator. For example, characteristics of the ion pump may be selected to minimize the effect of the ion pump magnet on the beam of the linear accelerator, while perhaps sacrificing the quality of the vacuum produced, but in a manner causing the least reduction in beam quality overall. In addition, the ion pump magnet and/or the compensating magnet may be preferentially placed closer to the linear accelerator's target than to its electron beam source.
In the descriptions above and in the claims, phrases such as “at least one of” or “one or more of” may occur followed by a conjunctive list of elements or features. The term “and/or” may also occur in a list of two or more elements or features. Unless otherwise implicitly or explicitly contradicted by the context in which it used, such a phrase is intended to mean any of the listed elements or features individually or any of the recited elements or features in combination with any of the other recited elements or features. For example, the phrases “at least one of A and B;” “one or more of A and B;” and “A and/or B” are each intended to mean “A alone, B alone, or A and B together.” A similar interpretation is also intended for lists including three or more items. For example, the phrases “at least one of A, B, and C;” “one or more of A, B, and C;” and “A, B, and/or C” are each intended to mean “A alone, B alone, C alone, A and B together, A and C together, B and C together, or A and B and C together.” Use of the term “based on,” above and in the claims is intended to mean, “based at least in part on,” such that an unrecited feature or element is also permissible.
The subject matter described herein can be embodied in systems, apparatus, methods, and/or articles depending on the desired configuration. The implementations set forth in the foregoing description do not represent all implementations consistent with the subject matter described herein. Instead, they are merely some examples consistent with aspects related to the described subject matter. Although a few variations have been described in detail above, other modifications or additions are possible. In particular, further features and/or variations can be provided in addition to those set forth herein. For example, the implementations described above can be directed to various combinations and subcombinations of the disclosed features and/or combinations and subcombinations of several further features disclosed above.
The current application claims priority under § 35 U.S.C. § 119(e) to U.S. Provisional Patent Application No. 62/305,970 filed Mar. 9, 2016 and entitled “MAGNETIC FIELD COMPENSATION IN A LINEAR ACCELERATOR,” the contents of which are hereby incorporated by reference in its entirety.
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Number | Date | Country | |
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20170265290 A1 | Sep 2017 | US |
Number | Date | Country | |
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62305970 | Mar 2016 | US |