The present disclosure relates generally to a magnetic field generating apparatus for magnetic resonance imaging, and particularly to a magnetic field generating apparatus with compensation of the variation of the central field.
Magnetic resonance imaging (MRI) for medical diagnostics or otherwise requires a magnetic field generating apparatus capable of producing a high degree of final homogeneity in the magnetic field generated in the imaging volume. To accomplish this high degree of homogeneity, shimming systems are used, which often include passive shimming elements. Steel shim elements placed inside the patient bore and saturated by the main field provide a desirable degree of compensation to offset manufacturing and environmental inhomogeneities inherent in the MRI system. The total amount and location of the shimming steel varies from magnet to magnet, where large amounts of steel may be required in magnets with high original inhomogeneity, or in magnets situated in a strong magnetic environment.
With shimming steel, saturation magnetization of the shim elements decreases with temperature, that is, dBsat/dT<0, thereby resulting in a compensation system that is temperature sensitive. Shim elements positioned between the gradient coils and the bore of the magnet vacuum vessel are subject to heating coming from the gradient coils during scanning. Most of the shim elements in the MRI system produce a negative contribution to the central field B0, where B0 is Bz at z=0, that decreases with temperature, such that as the temperature rises, the central field B0 in the magnet rises. Since imaging RF frequency is directly proportional to the central field B0, a stable central field B0 is important for generating a high image quality from the MRI system. The temperature sensitivity of the B0 shimming system imposes limitations on the allowable amount of shimming steel that may be used, thereby effecting the overall shimming capacity.
Acquiring an ability to compensate for B0 temperature sensitivity of the shimming system would release the above restrictions, allow an increase in shimming capacity, and enable different design solutions in an MRI scanner system. Accordingly, there is a need in the art for an improved MRI shimming system.
Embodiments of the invention include a magnetic field generating apparatus for use in magnetic resonance imaging (MRI). The apparatus includes an annular magnet field generator defining a patient bore, a gradient coil disposed between the magnetic field generator and the patient bore, a first set of shim elements, and a second set of shim elements. The patient bore has an imaging volume, a z-axis, and an isocenter. The first set of shim elements are disposed at a region between the magnetic field generator and the imaging volume, and the second set of shim elements are disposed at the region at a location having equal to or greater than a specified Z/R ratio, where Z defines an axial distance from the isocenter and R defines a radial distance from the z-axis.
Other embodiments of the invention include a magnetic field generating apparatus for use in magnetic resonance imaging (MRI). The apparatus includes an annular magnet field generator defining a patient bore, a gradient coil disposed between the magnetic field generator and the patient bore, a first set of shim elements, a second set of shim elements, a first heater, and a second heater. The patient bore has an imaging volume, a z-axis, and an isocenter. The first set of shim elements are disposed at a first region between the magnetic field generator and the imaging volume. The second set of shim elements have a first portion disposed at a second region and a second portion disposed at a third region between the magnetic field generator and the imaging volume, at a location having a specified Z/R ratio greater than about 0.707, where Z defines an axial distance from the isocenter and R defines a radial distance from the z-axis. The first heater is disposed at the second region, and the second heater is disposed at the third region. The first and second heaters regulate the temperature of the first and second portions of the second set of shim elements substantially independent from the first set of shim elements.
Further embodiments of the invention include a method for compensating for the B0 field variations in a magnetic field generating apparatus for use in MRI, the B0 field variations arising from a temperature change at a first set of shimming elements configured and disposed to compensate for manufacturing and environmental B0 field inhomogeneities inherent in a magnetic field generator of the apparatus. The, method includes disposing a second set of shimming elements between the magnetic field generator and an imaging volume of the apparatus at a location having a Z/R ratio greater than about 0.707.
Referring to the exemplary drawings wherein like elements are numbered alike in the accompanying Figures:
An embodiment of the invention provides a magnetic field generating apparatus for use in magnetic resonance imaging (MRI) having two sets of magnetic field adjusting shim elements. A first set of shim elements are configured to compensate for the inhomogeneities resulting from the main field generator, and a second set of shim elements are configured to compensate for the inhomogeneities resulting from a temperature change in the first set of shim elements. While embodiments described herein depict two sets of shim elements, it will be appreciated that the disclosed invention is not so limited and may also be applicable to multiple sets of shim elements, particularly with respect to the second set of shim elements.
Reference is now made to
As depicted in
As mentioned previously, the saturation magnetization of shim elements 150 tend to decrease with temperature, dBsat/dT<0, thereby resulting in a decrease in magnetization contribution from shim elements 150 as the temperature in region 145 increases. Viewed another way, as the temperature in region 145 increases, the first set of shim elements 150 tend to produce less of a negative contribution to the central field B0, where B0 is Bz at z=0, such that a rise in temperature of shim elements 150 results in a rise in the central field from the magnet (field generator) 105. In accordance with embodiments of the invention, strategic placement of compensating shims (second set of shim elements) 155 will provide a counterbalancing contribution dB0comp to the central field. Referring now to
In an embodiment, shim elements 150 and 155 may be made of a material having the same magnetization temperature sensitivity, such as for example a magnetic material having a dBsat/dT<0 on the order of about −0.01%/° C., or on the order of about −0.2 mT/° C. (millitesla-per-degree-Celsius). Alternatively, shim elements 155 may be made of a material with low Curie temperature and having a greater magnetization temperature sensitivity than that of shim elements 150, such as nickel-iron alloy with approximately 30% nickel, for example, Thermoflux® alloys (available from Vacuumschmelze) having a dBsat/dT<0 on the order of up to −2%/° C., or on the order of up to −6.5 mT/° C. Where shim elements 155 are made from Thermoflux® alloy, the shims lose their magnetization as their temperature rises from 20° C. to about 50–80° C. By using shim elements 155 having a higher magnetization temperature sensitivity than shim elements 150, that is, |dBsat(shim 155)/dT|>>|dBsat(shim 150)/dT|, more effective B0 field compensation may be achieved, and/or smaller compensating elements may be used for shim elements 155.
To provide for an adjustable B0 field compensation, field generator 105 may include a ring housing 160 adapted to house the second set of shim elements 155, thereby enabling the degree of B0 field compensation resulting from the second set of shim elements 155 to be adjustable by using different amounts of magnetic materials for shim elements 155.
In an alternative embodiment, and with reference now to
More specifically describing the configuration illustrated in
To assist with the temperature regulation of the second set of shim elements 155, temperature sensors 205 may be disposed at the first region 165 so as to provide a signal representative of the temperature of at least a portion of the first set of shim elements 150 to control system 120. In response thereto, control system 120 controls heaters 195, 200 at regions 170, 180. In this manner, the temperature of the second set of shim elements 155 may be adjusted to provide the appropriate change in B0 field compensation to compensate for variations arising from a change in temperature at the first set of shim elements 150.
The use of heaters 195, 200 may enable a higher temperature change at the second set of shims 155 as compared to the temperature change experienced by the first set of shims 150, thereby enabling a large range of dB0 compensation to be achieved with smaller compensating elements for the second set of shims 155.
In an alternative embodiment, a magnetic field sensor, for example an NMR probe, 210 may be disposed at the patient bore 130 so as to provide a signal representative of the magnetic field in the imaging volume within patient bore 130. In this manner, a signal from sensor 210 is received at control system 120, which in turn controls the operation of heaters 195, 200 at regions 170, 180 for controlling the degree of B0 field compensation to adjust for dynamic B0 field inhomogeneities observed at patient bore 130. By using magnetization sensor 210 in a feedback loop, B0 field compensation may be controlled by B0 field tracking rather than temperature sensing at shims 150, thereby providing a more direct B0 field compensation.
Alternatively, as depicted in
In view of the foregoing described structure, a method for compensating for the B0 field variations in the magnetic field generating apparatus 102 for use in MRI, the B0 field variations arising from a temperature change at the first set of shimming elements 150 configured and disposed to compensate for manufacturing and environmental B0 field inhomogeneities inherent in a magnetic field generator 105 of the apparatus 102, may be accomplished by disposing a second set of shimming elements 155 between the magnetic field generator 105 and the gradient coil 110 of the apparatus 102, or radially within the gradient coil 110, at a location having a Z/R ratio that is greater than about 0.707. In another embodiment, the compensating method may be accomplished by disposing the second set of shimming elements 155 between the magnetic field generator 105 and a gradient coil 110 of the apparatus 102, or radially within the gradient coil 110, at a location having a Z/R ratio that is equal to or greater than about 1.7.
As disclosed, some embodiments of the invention may include some of the following advantages: the ability to remove restrictions on B0 temperature sensitivity coming from the passive shim elements 150 and other sources; the ability to realize higher shimming capacity, thereby reducing the number of rejected magnets and/or the cost of their rework; higher image quality of the MRI scanner by effectively controlling B0 temperature-induced instability from magnetization inhomogeneities; and, the reduction or elimination of superconducting shim coils without compromising image quality, thereby reducing overall system cost.
While the invention has been described with reference to exemplary embodiments, it will be understood by those skilled in the art that various changes may be made and equivalents may be substituted for elements thereof without departing from the scope of the invention. In addition, many modifications may be made to adapt a particular situation or material to the teachings of the invention without departing from the essential scope thereof. Therefore, it is intended that the invention not be limited to the particular embodiment disclosed as the best or only mode contemplated for carrying out this invention, but that the invention will include all embodiments falling within the scope of the appended claims. Moreover, the use of the terms first, second, etc. do not denote any order or importance, but rather the terms first, second, etc. are used to distinguish one element from another. Furthermore, the use of the terms a, an, etc. do not denote a limitation of quantity, but rather denote the presence of at least one of the referenced item.
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