Magnetic low-pass filter

Abstract

Methods and configurations are disclosed for providing band-pass magnetic filtering of signals in magnetic communications and anomaly detection using diamond nitrogen-vacancy (DNV).

Description

FIELD

The subject technology generally relates to magnetometers, and more particularly, to a magnetic band-pass filter.

BACKGROUND

A number of industrial applications including, but not limited to, medical devices, communication devices, and navigation systems, as well as scientific areas such as physics and chemistry can benefit from magnetic detection and imaging. Many advanced magnetic imaging systems can operate in limited conditions, for example, high vacuum and/or cryogenic temperatures, which can make them inapplicable for imaging applications that require ambient conditions. Furthermore, small size, weight and power (SWAP) magnetic sensors of moderate sensitivity, vector accuracy, and bandwidth are valuable in many applications.

Magnetic communication is a promising field that has many advantageous features for environments such as water, in which acoustic waves have been widely used for many decades. The use of acoustic waves for underwater wireless communication (e.g., sonar) although wide spread, may be faced with a number of challenges such as large propagation delays, low bandwidth, and high bit-error rates, due to adverse effects by ambient noise, fading, and multipath propagation. Magnetic communication may also be advantageous in harsh environments such as ground penetration applications.

SUMMARY

Various aspects of the subject technology provide methods and systems for filtering signals in magnetic communication and anomaly detection using diamond nitrogen-vacancy (DNV) technology. In some implementations, digital filtering is performed on the signals detected by a DNV sensor. Such digital filtering uses additional computing power and algorithms to filter out unwanted signals from the useable signal data. Moreover, such digital filtering may add additional computational components to the system, thereby increasing the size of the system. Accordingly, it may be useful to construct an analog filter for filtering unwanted signals from the useful signals prior to digital processing of the DNV signal data. Such analog filtering may include a low pass filter that uses one or more loops of wire about a portion of the DNV sensor and a resistor to filter out high frequency magnetic content from the signal detected by the DNV sensor. In some instances, the resistor may be a variable resistor, such as a potentiometer, to modify the filtering frequency. In some implementations, the analog filtering may include a high pass filter that uses a diamagnetic material with the DNV sensor to filter out low frequency magnetic content from the signal detected by the DNV sensor. In some implementations, the low pass and high pass filters can be combined to create a bandpass filter for the DNV sensor. In some instances, the orientation of the one or more loops of wire and/or diamagnetic material relative to the DNV sensor may permit spatial attenuation of the magnetic signal detected by the DNV sensor.

One implementation relates to a diamond nitrogen vacancy sensor that includes a diamond having one or more nitrogen vacancies, a loop of conductive material positioned about a portion of the diamond, and a resistor coupled to a first end of the loop and a second end of the loop. The loop and resistor form a low pass filter for the DNV sensor.

In some implementations, the loop includes several loops. In some implementations, the resistor is a variable resistor, such as a potentiometer. In some implementations, a modification to the potentiometer selectively attenuates a set of high frequency magnetic signals.

Another implementation relates to a DNV sensor that includes a diamond having one or more nitrogen vacancies, a first loop of conductive material positioned about a first portion of the diamond, a second loop of conductive material positioned about a second portion of the diamond, a first resistor coupled to a first end of the first loop and a second end of the first loop, and a second resistor coupled to a third end of the second loop and a fourth end of the second loop. The first loop of conductive material is positioned within a first plane, and the first loop and first resistor form a first low pass filter for the DNV sensor in a first spatial orientation. The second loop of conductive material is positioned within a second plane, and the second loop and second resistor form a second low pass filter for the DNV sensor in a second spatial orientation. The second plane and first plane may be orthogonal.

In some implementations, the first loop includes several loops. In some implementations, the first resistor is a variable resistor, such as a potentiometer. In some implementations, the second resistor is a variable resistor, such as a potentiometer. In some implementations, a first modification to the first variable resistor or first potentiometer selectively attenuates a first set of high frequency magnetic signals for the first low pass filter for the first spatial orientation, and a second modification to the second variable resistor or second potentiometer selectively attenuates a second set of high frequency magnetic signals for the second low pass filter in the second spatial orientation.

Yet another implementation relates to a system that includes a DNV sensor and a controller configured to modify a variable resistor of the DNV sensor. The DNV sensor includes a diamond having one or more nitrogen vacancies, a loop of conductive material positioned about a portion of the diamond, and a variable resistor coupled to a first end of the loop and a second end of the loop. The loop and variable resistor form a low pass filter for the DNV sensor.

In some implementations, the controller modifies the variable resistor to selectively attenuate the low pass filter. In some implementations, the controller modifies the variable resistor to selectively attenuate the low pass filter based on an orientation of a detected magnetic signal.

Still a further implementation relates to a system that includes a DNV sensor and a controller configured to modify an orientation of the DNV sensor. The DNV sensor includes a diamond having one or more nitrogen vacancies, a loop of conductive material positioned about a portion of the diamond, and a variable resistor coupled to a first end of the loop and a second end of the loop. The loop and variable resistor form a low pass filter for the DNV sensor.

In some implementations, the controller modifies the orientation of the DNV sensor based on an orientation of a detected magnetic signal.

Yet a further implementation relates to a DNV sensor that includes a diamond having one or more nitrogen vacancies, a first loop of conductive material positioned about a first portion of the diamond, a second loop of conductive material positioned about a second portion of the diamond, a third loop of conductive material positioned about a third portion of the diamond, a first resistor coupled to a first end of the first loop and a second end of the first loop, a second resistor coupled to a third end of the second loop and a fourth end of the second loop, and a third resistor coupled to a fifth end of the third loop and a sixth end of the third loop. The first loop of conductive material is positioned within a first plane, and the first loop and first resistor form a first low pass filter for the DNV sensor in a first spatial orientation. The second loop of conductive material is positioned within a second plane, and the second loop and second resistor form a second low pass filter for the DNV sensor in a second spatial orientation. The third loop of conductive material is positioned within a third plane, and the third loop and third resistor form a third low pass filter for the DNV sensor in a third spatial orientation. The second plane and first plane may be orthogonal, and the third plane may be orthogonal to the first plane and the second plane.

In some implementations, the first resistor, second resistor, and/or third resistor is a variable resistor or potentiometer. In some implementations, a first modification to the first potentiometer selectively attenuates a first set of high frequency magnetic signals for the first low pass filter for the first spatial orientation, a second modification to the second potentiometer selectively attenuates a second set of high frequency magnetic signals for the second low pass filter in the second spatial orientation, and a third modification to the third potentiometer selectively attenuates a third set of high frequency magnetic signals for the third low pass filter in the third spatial orientation.

Another implementation relates to a DNV sensor that includes a diamond having one or more nitrogen vacancies, a first loop of conductive material positioned about a first portion of the diamond, a second loop of conductive material positioned about a second portion of the diamond, a third loop of conductive material positioned about a third portion of the diamond, a first resistor coupled to a first end of the first loop and a second end of the first loop, a second resistor coupled to a third end of the second loop and a fourth end of the second loop, and a third resistor coupled to a fifth end of the third loop and a sixth end of the third loop. The first loop of conductive material is positioned within a first plane, and the first loop and first resistor form a first low pass filter for the DNV sensor in a first spatial orientation. The second loop of conductive material is positioned within a second plane, and the second loop and second resistor form a second low pass filter for the DNV sensor in a second spatial orientation. The third loop of conductive material is positioned within a third plane, and the third loop and third resistor form a third low pass filter for the DNV sensor in a third spatial orientation. The second plane and first plane may be orthogonal, and the third plane may be orthogonal to the first plane and the second plane. The DNV sensor further includes a diamagnetic material positioned adjacent to the diamond.

In some implementations, the first resistor, second resistor, and/or third resistor is a variable resistor or potentiometer. In some implementations, a first modification to the first potentiometer selectively attenuates a first set of high frequency magnetic signals for the first low pass filter for the first spatial orientation, a second modification to the second potentiometer selectively attenuates a second set of high frequency magnetic signals for the second low pass filter in the second spatial orientation, and a third modification to the third potentiometer selectively attenuates a third set of high frequency magnetic signals for the third low pass filter in the third spatial orientation.

Yet another implementation relates to a DNV sensor that includes a diamond having a nitrogen vacancy and a diamagnetic material positioned relative to the diamond to form a high pass filter.

In some implementations, the diamagnetic material is a first diamagnetic material positioned at a first end of the diamond. In some implementations, the DNV sensor further includes a second diamagnetic material positioned at a second end of the diamond. In some implementations, the first end is opposite the second end. In some implementations, the diamagnetic material is a liquid and the diamond is positioned within the diamagnetic material. In some implementations, the diamagnetic material surrounds the diamond. In some implementations, the DNV sensor further includes a loop of conductive material positioned about a portion of the diamond and a variable resistor coupled to a first end of the loop and a second end of the loop. The loop and variable resistor forming a low pass filter for the DNV sensor.

Yet a further implementation relates to a method for neutralizing a magnetic signal. The method includes providing a DNV sensor, detecting a magnetic signal, and modifying a value for one or more of a first variable resistor or a second variable resistor based on the detected magnetic signal. The DNV sensor may include a diamond having one or more nitrogen vacancies, a first loop of conductive material positioned about a first portion of the diamond, a second loop of conductive material positioned about a second portion of the diamond, a first resistor coupled to a first end of the first loop and a second end of the first loop, and a second resistor coupled to a third end of the second loop and a fourth end of the second loop. The first loop of conductive material is positioned within a first plane, and the first loop and first resistor form a first low pass filter for the DNV sensor in a first spatial orientation. The second loop of conductive material is positioned within a second plane, and the second loop and second resistor form a second low pass filter for the DNV sensor in a second spatial orientation. The second plane and first plane may be orthogonal.

In some implementations, the first variable resistor or the second variable resistor is a potentiometer. In some implementations, the DNV sensor further includes a third loop of conductive material positioned about a third portion of the diamond with the third loop of conductive material positioned in a third plane and the third plane being orthogonal to the first plane and second plane. The third variable resistor is coupled to a fifth end of the third loop and a sixth end of the third loop, and the third loop and third variable resistor forming a third low pass filter for the DNV sensor in a third spatial orientation.

Still a further implementation relates to a method for neutralizing a magnetic signal. The method includes providing a DNV sensor, detecting a magnetic signal, and modifying an orientation of the loop of the DNV sensor based on the detected magnetic signal. The DNV sensor includes a diamond having a nitrogen vacancy, a loop of conductive material positioned about a portion of the diamond, and a resistor coupled to a first end of the loop and a second end of the loop to form a low pass filter for the DNV sensor.

In some implementations, the resistor is a potentiometer.

In the following description, reference is made to the accompanying attachments that form a part thereof, and in which are shown by way of illustration, specific embodiments in which the subject technology may be practiced. It is to be understood that other embodiments may be utilized and changes may be made without departing from the scope of the subject technology.

BRIEF DESCRIPTION OF THE DRAWINGS

The details of one or more implementations are set forth in the accompanying drawings and the description below. Other features, aspects, and advantages of the disclosure will become apparent from the description, the drawings, and the claims, in which:

FIG. 1 is an overview diagram of a diamond of a DNV sensor with a low pass filter and a high pass filter;

FIG. 2 is graphical diagram of an example signal detected with a DNV sensor that includes a test signal without filtering;

FIG. 3 is an overview diagram of a diamond of a DNV sensor with a low pass filter and showing a magnetic field of the environment, a change in the magnetic field of the environment, and an induced magnetic field by the low pass filter to filter high frequency signals;

FIG. 4 is another overview diagram of a diamond of a DNV sensor with two low pass filters arranged for spatial attenuation;

FIG. 5 is an overview diagram of a diamond of a DNV sensor relative to a diamagnetic material and showing alignment of the poles of the diamagnetic material relative to the induced magnetic field;

FIG. 6 is a graphical diagram of magnetism in a diamagnetic material relative to the applied magnetic field;

FIG. 7 is a process diagram for modifying a filtering frequency of a low pass filter for a DNV sensor based on a detected magnetic field;

FIG. 8 is a process diagram for modifying an orientation of a DNV sensor with a low pass filter based on a detected magnetic field;

FIG. 9 is a block diagram depicting a general architecture for a computer system that may be employed to implement various elements of the systems and methods described and illustrated herein.

It will be recognized that some or all of the figures are schematic representations for purposes of illustration. The figures are provided for the purpose of illustrating one or more embodiments with the explicit understanding that they will not be used to limit the scope or the meaning of the claims.

DETAILED DESCRIPTION

Following below are more detailed descriptions of various concepts related to, and implementations of, methods, apparatuses, and systems for providing filtering for signals in magnetic communications and anomaly detection using diamond nitrogen-vacancy (DNV) sensors. The subject technology provides a band-pass filter that allows users to focus on particular frequency signals for anomaly detection and an operating frequency band that permits limited environment noise for communication. A filtered signal increases signal-to-noise (SNR) for communications and anomaly detection. The filtered signal has reduced unwanted signals and allows the operator to better interpret the signal. Magnetic communication using a magnetic medium presents advantageous features for ground penetrating applications and underwater environments. A limitation to the application of the magnetic communications is the noisy operational environment. The disclosed technology addresses this issue by providing suitable magnetic filtering.

In some implementations, a system of the subject technology attenuates magnetic communication signals outside of a targeted frequency region. In the electrical world, band-pass filters may be realized using a combination of resistors and capacitors and/or other passive or active elements. In the magnetic world, however, solenoids and diamagnetic material can be employed to perform the desired filtering functions.

FIG. 1 overview diagram of a diamond 102 having a nitrogen vacancy of a DNV sensor 100 with a low pass filter 110 and a high pass filter 120. As shown in FIG. 1, the low pass filter 110 and high pass filter 120 cooperate to form a magnetic band-pass filter. The low pass filter 110 is formed by a solenoid that uses the diamond 102 as a core and includes a resistor 112 and a loop of conductive material 114 looped about a portion of the diamond 102. In some implementations, the loop 114 of conductive material may include a plurality of loops about the diamond 102. The resistor 112 is electrically coupled to a first end of the loop 114 and a second end of the loop 114. In some implementations, the resistor 112 is a constant resistor. In other implementations, the resistor 112 may be a variable resistor, such as a potentiometer or other tunable resistor element. With a variable resistor, a modification of the resistance can selectively attenuate a set of high frequency magnetic signals. That is, for instance, a modification to a resistance applied by a potentiometer can modify the upper frequency that is attenuated by the low pass filter 110. Thus, higher frequency magnetic signals can be attenuated to reduce the noise relative to an expected signal to be detected by the DNV sensor 100. The solenoid formed by the loop 114 and resistor 112 resists changing magnetic fields and generates opposing fields proportional to the rate of change of the changing magnetic field, which has a greater effect on alternating magnetic fields. In some implementations, the solenoid formed by the loop 114 and the resistor 112 may include a capacitor to control the shape of the low pass filter 110.

The high pass filter 120 is formed by a diamagnetic material 122 positioned relative to the diamond 102. The diamagnetic material 122 is repelled by an external magnetic field as the diamagnetic material 122 generates an induced magnetic field that aligns anti-parallel to an applied environmental magnetic field. Based on the selected diamagnetic material 122, the low frequency for magnetic signals that are filtered out can be changed. In some implementations, the diamagnetic material 122 may have a magnetic permeability of approximately 0.9. The diamagnetic material 122 may act as a DC blocker to filter out low frequency magnetic signals emitted from DC current or devices.

Using the combination of the diamagnetic material 122 as a high pass filter 120 and one or more solenoids as low pass filters 110, a band pass filter may be formed for the DNV sensor 100. If the low pass filter 110 includes a tunable resistor 112, then the attenuation of an alternating magnetic field can be optimized for a desired frequency band. That is, varying the resistance for the low pass filter 110 can vary the high frequency magnetic signals that are attenuated while the high pass filter 120 filters the low frequency magnetic signals.

FIG. 2 is a graphical diagram 200 depicting an example magnetic signal 202 that includes a test signal 204 without utilizing filtering. The magnetic signal 202 corresponds to the use of a DNV-sensor-based equipment deployed in a vehicle being driven in a rural area with a manageable magnetic noise floor. The equipment was used to read magnetic signals while the vehicle that a DNV sensor is deployed on was very noisy. This combined with the proximity to the equipment makes it difficult to recover the test signal 204 from the noise of the example magnetic signal 202. Given the noise of the magnetic signal 202, providing a filtering mechanism to remove and/or reduce magnetic signal noise may increase the signal-to-noise ratio (SNR) to provide better clarity when receiving a particular signal of interest, such as the test signal 204.

FIG. 3 depicts a diamond 302 of a DNV sensor 300 with a low pass filter 310 and showing a magnetic field 350 of the environment, a change 352 in the magnetic field of the environment, and an induced magnetic field 354 by the low pass filter to filter high frequency signals. In the arrangement shown, the diamond 302 operates as the core of a solenoid made up of a loop of conductive material 312 and a resistor 314 that acts as the low pass filter 310. The diamond 302 is exposed to an external magnetic field 350, B. When external magnetic field 350, B, is then changed by a change in the magnetic field 352, ΔB, such as based on external magnetic noise from the environment, then the change in magnetic field 352, ΔB, causes the solenoid to induce a current 316 in the conductive material 312 proportional and opposite to the rate of change of the magnetic field 352 according to the Lenz law (EMF=−NΔΦ/Δt), where ΔΦ is the change in magnetic flux, Δt is the incremental change in time, N is the number of turns of the conductive material 312 about the diamond 302, and EMF is the induced electro-magnetic force (EMF). The induced current 316 due to the generated EMF has a greater effect on high frequency magnetic signals, due to the derivative term ΔΦ/Δt, and the effect can be tuned by both the number of turns, N, in the conductive material 312 and the resistance provided by the resistor 314. In some implementations, a variable resistor 314 can be used to change the operating region of the low-pass filter 310. In some implementations, the variable resistor 314 may be a potentiometer. In some implementations, the variable resistor 314 may be coupled to a first end of a loop of the conductive material 312 and a second end of the loop of the conductive material 312 to form the low pass filter 310. In some implementations, the solenoid formed by the loop of conductive material 312 and the resistor 314 may include a capacitor to control the shape of the low pass filter 310.

In some implementations, a controller, such as shown in FIG. 9, may be coupled to the variable resistor 314 and/or to a component for adjusting the variable resistor 314. For instance, a digital potentiometer may be used as the variable resistor 314 and a controller may be configured to modify a resistance of the variable resistor 314. In some implementations, as described in greater detail herein, the controller may be configured to modify a resistance of the variable resistor 314 to selectively attenuate the low-pass filter 410. The selective attenuation may be responsive to a strength and/or orientation of a detected magnetic disturbance or magnetic signal.

In other implementations, the controller may be configured to modify an orientation of the DNV sensor 300. For instance, the DNV sensor 300 may be mounted to a structure to allow for modification of a rotational orientation of the DNV sensor 300 in one or more directions. For instance, the DNV sensor 300 may be mounted to a printed circuit board (PCB) or other suitable structure that can be mechanically or otherwise rotated in one or more directions. The modification of the orientation of the DNV sensor 300 may be responsive to an strength and/or orientation of a detected magnetic disturbance or magnetic signal.

FIG. 4 depicts a diamond 402 of a DNV sensor 400 with a first low pass filter 410 and a second low pass filter 420. In the arrangement shown, the diamond 402 operates as the core of a first solenoid of the first low pass filter 410 made up of a first loop of conductive material 412 and a first resistor 414 and as the core of a second solenoid of the second low pass filter 420 made up of a second loop of conductive material 422 and a second resistor 424. In some implementations the first loop and/or second loop can be made from several loops of conductive material. In the implementation shown, the first loop of conductive material 412 is positioned in a first plane relative to the diamond 402 and the second loop of conductive material 422 is positioned in a second plane relative to the diamond 402 such that the first and second planes are orthogonal. Thus, the first low pass filter 410 is a low pass filter for a first spatial orientation and the second low pass filter 420 is a low pass filter in a second spatial orientation. In some implementations, the first solenoid formed by the first loop of conductive material 412 and the first resistor 414 and/or the second solenoid formed by the second loop of conductive material 422 and the second resistor 424 may include a capacitor to control the shape of the low pass filter 410, 420.

If the first resistor 414 and second resistor 424 have the same resistance, then the attenuation from the low pass filters 410, 420 is strongest at the diagonal between the first low pass filter 410 and second low pass filter 420 due to the induced EMF. If the first resistor 414 has a greater resistance than the second resistor 424, then the attenuation from the low pass filters 410, 420 will be stronger nearer to the first plane within which the first low pass filter 410 is positioned than the second planed within which the second low pass filter 420 is positioned. In some implementations, the first resistor 414 and/or second resistor 424 can be variable resistors. In some implementations, the first variable resistor 414 and/or the second variable resistor 424 may be a potentiometer. In some implementations, the first resistor 414 may be coupled to a first end of the first loop of the conductive material 412 and a second end of the first loop of the conductive material 412 to form the first low pass filter 410. The second resistor 424 may be coupled to a first end (e.g., a third end) of the second loop of the conductive material 422 and a second end (e.g., a fourth end) of the second loop of the conductive material 422 to form the second low pass filter 420.

The first variable resistor 414 can be used to independently change the operating region of the first low-pass filter 410 and the second variable resistor 424 can be used to independently change the operating region of the second low-pass filter 420. The independent change of the operating region of the low pass filters 410, 420 can modify the spatial orientation of the maximum attenuation, thereby providing modifying the spatial orientation of the maximum attenuation due to the induced EMF. Thus, in some implementations, a controller, such as shown in FIG. 9, may be coupled to the first variable resistor 414 and/or to a component for adjusting the first variable resistor 414 and the second variable resistor 424 and/or a component for adjusting the second variable resistor 424 to modify the spatial orientation of the maximum attenuation relative to the diamond 402. For instance, a digital potentiometer may be used as the first variable resistor 414 and/or second variable resistor 424 and a controller may be configured to modify a resistance of the first variable resistor 414 and/or second variable resistor 424. In some implementations, as described in greater detail herein, the controller may be configured to modify a resistance of the first variable resistor 414 and/or second variable resistor 424 to selectively attenuate the first low-pass filter 410 and/or second low pass filter 420. The selective attenuation may be responsive to a strength and/or orientation of a detected magnetic disturbance or magnetic signal. In some implementations, a modification to the first variable resistor 414, such as a potentiometer, attenuates a set of high frequency magnetic signals for the first low pass filter 410 for the first spatial orientation. A modification to the second variable resistor 424, such as a potentiometer, attenuates a set of high frequency magnetic signals for the second low pass filter 420 for the second spatial orientation.

In some further implementations, the diamond 402 operates as the core of a third solenoid of a third low pass filter made up of a third loop of conductive material and a third resistor. In some implementations the third loop can be made from several loops of conductive material. The third loop of conductive material may be positioned in a third plane relative to the diamond 402 such that third plane is orthogonal to the first plane of the first low pass filter 410 and the second plane of the second low pass filter 420. Thus, the third low pass filter is a low pass filter for a third spatial orientation. The third resistor may be coupled to a first end (e.g., a fifth end) of the third loop of the conductive material and a second end (e.g., a sixth end) of the third loop of the conductive material to form the third low pass filter The third resistor may be a variable resistor, such as a potentiometer. In some implementations, a modification to the third variable resistor attenuates a set of high frequency magnetic signals for the third low pass filter for the third spatial orientation. The third low pass filter, third resistor, third loop, etc. may be further constructed and/or used in a similar manner to the first low pass filter 410, first resistor 414, first loop 412, etc. as described above except that the third low pass filter is positioned in the third spatial orientation. Thus, with the first low pass filter 410, second low pass filter 420, and third low pass filter, a variation of the resistances applied to each variable resistor can modify the spatial orientation of the maximum attenuation relative to the diamond 402.

In any of the DNV sensors 100, 300, 400 described herein, a diamagnetic material, such as diamagnetic material 122, may be utilized for a high pass filter, as will be described in greater detail herein.

FIG. 5 depicts a diamond 502 of a DNV sensor 500 relative to a diamagnetic material 510 and showing alignment of the poles 512 of the diamagnetic material 510 relative to the induced magnetic field 520. The diamagnetic material 510 is repelled by an external magnetic field, B, and the diamagnetic material 510 generates an induced magnetic field, B₁, that aligns anti-parallel to an applied environmental magnetic field.

FIG. 6 depicts the behavior of a diamagnetic material for use in a high pass filter relative to an external or applied environmental magnetic field, B. The curve 600 depicts the variation of magnetism, M, of a diamagnetic material versus the external or applied environmental magnetic field, B. As shown in FIG. 6, the magnetism of the diamagnetic material is opposite to the applied magnetic field and includes a delay until a constant magnetic field for the diamagnetic material is achieved. The delay is due to the diamagnetic material, such as diamagnetic material 510, having regions, such as poles 512 that align anti-parallel to the external magnetic field and require some amount of time to realign opposite to the external magnetic field. These effects, however, may not be instantaneous and the diamagnetic material experiences a charging time similar to a charging time of a capacitor. Thus, high frequency magnetic signals spend less time in an orientation than slow modulating signals. This allows a high-frequency portion of a magnetic signal to pass through the diamagnetic material while a low-frequency portion of the magnetic signal is filtered. The magnetic permeability and the size of the diamagnetic material can vary the effect.

Referring back to FIG. 5, based on the selected diamagnetic material 510, the low frequency for magnetic signals that are filtered out can be changed. In some implementations, the diamagnetic material 510 may have a magnetic permeability of approximately 0.9. The diamagnetic material 510 may act as a DC blocker to filter out low frequency magnetic signals emitted from DC current or devices. In some implementations, the diamagnetic material 510 may be positioned at an end of the diamond 502. In some implementations, the diamagnetic material 510 may be positioned at an end of the diamond 502 based on the position of one or more current or expected DC currents or devices relative to the DNV sensor 500. In other implementations, the DNV sensor 500 may be rotated to align the diamagnetic material 510 relative to the current or expected DC currents or devices. In other implementations, multiple diamagnetic materials 510 may be positioned about the diamond 502. For instance, a pair of diamagnetic materials 510 may be positioned at opposing ends of the diamond 502 of the DNV sensor 500. Further still a diamagnetic cube of material may be formed about the DNV sensor 500. In still further implementations, the diamagnetic material 510 may be a liquid material and the diamond 502 of the DNV sensor 500 may be positioned within the liquid diamagnetic material 510 or otherwise surrounded by the diamagnetic material 510.

FIG. 7 depicts a method 700 for modifying a filtering frequency of a low pass filter for a DNV sensor based on a detected magnetic field. The method 700 includes providing a diamond nitrogen vacancy sensor (block 702). The DNV sensor may be any of the DNV sensors 100, 300, 400, 500. In some implementations, the DNV sensor may be similar to DNV sensor 300 and may include a diamond having a nitrogen vacancy and a low pass filter. The low pass filter may include a loop of conductive material positioned about the diamond and a variable resistor coupled to a first end of the loop and a second end of the loop. In other implementations, the DNV sensor may be similar to DNV sensor 400 and may include a diamond having a nitrogen vacancy, a first low pass filter in a first spatial orientation, and a second low pass filter in a second spatial orientation. The first low pass filter may include a first loop of conductive material positioned about a first portion of the diamond and a first variable resistor coupled to a first end of the first loop and a second end of the first loop. The second low pass filter may include a second loop of conductive material positioned about a second portion of the diamond and a second variable resistor coupled to a first end (e.g., a third end) of the second loop and a second end (e.g., a fourth end) of the second loop. The first loop of conductive material may positioned within a first plane, and the second loop of conductive material may be positioned in a second plane. In some implementations, the first plane and second plane are orthogonal. In some implementations, the first variable resistor and/or the second variable resistor is a potentiometer. In some further implementations, the DNV sensor may further include a third loop of conductive material positioned about a third portion of the diamond such that the third loop of conductive material is positioned in a third plane. The third plane may be orthogonal to the first plane and second plane. In still further implementations, either of the DNV sensors 300, 400 may include a diamagnetic material, such as diamagnetic material 510 described herein.

The method 700 further includes detecting an interfering magnetic signal (block 704). Detecting of the interfering magnetic signal may include detecting the interfering magnetic signal with the DNV sensor. In some implementations, the detection of the interfering magnetic signal is performed with a controller, such as shown in FIG. 9, in electric communication with the DNV sensor. In other implementations, detecting the interfering magnetic signal may be with another component in electric communication with the controller. The detecting of the interfering magnetic signal may simply include detecting an orientation of magnetic signals above a predetermined high frequency.

The method 700 further includes modifying a value for one or more of the first variable resistor or the second variable resistor based on the detected magnetic signal (block 706). The modification of the value for the first variable resistor and/or the second variable resistor may be performed by the controller. In some implementations, the controller may include instructions to modify a digital potentiometer for the first variable resistor and/or second variable resistor. In other implementations, the controller may modify another component to modify a value for the resistance of the first variable resistor and/or second variable resistor. Modifying the resistance value for the first variable resistor and/or second variable resistor to a zero or substantially zero resistance value may result in attenuating substantially all high frequency magnetic signals.

In some implementations, one or more low pass filters may be tuned based on attenuating substantially all high frequency magnetic signals and adjusting the resistance value of the variable resistor until a test signal is detected or setting the resistance value of the variable resistor to a minimum attenuation and increasing the attenuation until a predetermined frequency value for filtering is achieved.

FIG. 8 is another method 800 for modifying an orientation of a DNV sensor with a low pass filter based on a detected magnetic field. The method 800 includes providing a diamond nitrogen vacancy sensor (block 802). The DNV sensor may be any of the DNV sensors 100, 300, 400, 500. In some implementations, the DNV sensor may be similar to DNV sensor 300 and may include a diamond having a nitrogen vacancy and a low pass filter. The low pass filter may include a loop of conductive material positioned about the diamond and a variable resistor coupled to a first end of the loop and a second end of the loop. In other implementations, the DNV sensor may be similar to DNV sensor 400 and may include a diamond having a nitrogen vacancy, a first low pass filter in a first spatial orientation, and a second low pass filter in a second spatial orientation. The first low pass filter may include a first loop of conductive material positioned about a first portion of the diamond and a first variable resistor coupled to a first end of the first loop and a second end of the first loop. The second low pass filter may include a second loop of conductive material positioned about a second portion of the diamond and a second variable resistor coupled to a first end (e.g., a third end) of the second loop and a second end (e.g., a fourth end) of the second loop. The first loop of conductive material may positioned within a first plane, and the second loop of conductive material may be positioned in a second plane. In some implementations, the first plane and second plane are orthogonal. In some implementations, the first variable resistor and/or the second variable resistor is a potentiometer. In some further implementations, the DNV sensor may further include a third loop of conductive material positioned about a third portion of the diamond such that the third loop of conductive material is positioned in a third plane. The third plane may be orthogonal to the first plane and second plane. In still further implementations, either of the DNV sensors 300, 400 may include a diamagnetic material, such as diamagnetic material 510 described herein.

The method 800 further includes detecting a magnetic signal (block 804). Detecting of the magnetic signal may include detecting the magnetic signal with the DNV sensor. In some implementations, the detection of the magnetic signal is performed with a controller in electric communication with the DNV sensor. In other implementations, detecting the magnetic signal may be with another component in electric communication with the controller. The detecting of the magnetic signal may simply include detecting an orientation of magnetic signals above a predetermined high frequency.

The method 800 further includes modifying an orientation of the loop of the DNV sensor based on the detected magnetic signal (block 806). The modification of the orientation of the loop of the DNV sensor may be performed by the controller. Modification of the orientation of the loop of the DNV sensor may include modifying an orientation of the DNV sensor itself and/or may modify the orientation of the loop independent of the orientation of the diamond of the DNV sensor. In some implementations, the controller may include instructions to modify an orientation of the DNV sensor and/or loop and DNV sensor through mechanical components, such as a servo, an actuator, etc.

FIG. 9 is a diagram illustrating an example of a system 900 for implementing some aspects of the subject technology, such as the controller. The system 900 includes a processing system 902, which may include one or more processors or one or more processing systems. A processor can be one or more processors. The processing system 902 may include a general-purpose processor or a specific-purpose processor for executing instructions and may further include a machine-readable medium 919, such as a volatile or non-volatile memory, for storing data and/or instructions for software programs. The instructions, which may be stored in a machine-readable medium 910 and/or 919, may be executed by the processing system 902 to control and manage access to the various networks, as well as provide other communication and processing functions. The instructions may also include instructions executed by the processing system 902 for various user interface devices, such as a display 912 and a keypad 914. The processing system 902 may include an input port 922 and an output port 924. Each of the input port 922 and the output port 924 may include one or more ports. The input port 922 and the output port 924 may be the same port (e.g., a bi-directional port) or may be different ports.

The processing system 902 may be implemented using software, hardware, or a combination of both. By way of example, the processing system 902 may be implemented with one or more processors. A processor may be a general-purpose microprocessor, a microcontroller, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), a Field Programmable Gate Array (FPGA), a Programmable Logic Device (PLD), a controller, a state machine, gated logic, discrete hardware components, or any other suitable device that can perform calculations or other manipulations of information.

A machine-readable medium can be one or more machine-readable media, including no-transitory or tangible machine-readable media. Software shall be construed broadly to mean instructions, data, or any combination thereof, whether referred to as software, firmware, middleware, microcode, hardware description language, or otherwise. Instructions may include code (e.g., in source code format, binary code format, executable code format, or any other suitable format of code).

Machine-readable media (e.g., 919) may include storage integrated into a processing system such as might be the case with an ASIC. Machine-readable media (e.g., 910) may also include storage external to a processing system, such as a Random Access Memory (RAM), a flash memory, a Read Only Memory (ROM), a Programmable Read-Only Memory (PROM), an Erasable PROM (EPROM), registers, a hard disk, a removable disk, a CD-ROM, a DVD, or any other suitable storage device. Those skilled in the art will recognize how best to implement the described functionality for the processing system 902. According to one aspect of the disclosure, a machine-readable medium is a computer-readable medium encoded or stored with instructions and is a computing element, which defines structural and functional interrelationships between the instructions and the rest of the system, which permit the instructions' functionality to be realized. Instructions may be executable, for example, by the processing system 902 or one or more processors. Instructions can be, for example, a computer program including code for performing methods of the subject technology.

A network interface 916 may be any type of interface to a network (e.g., an Internet network interface), and may reside between any of the components shown in FIG. 9 and coupled to the processor via the bus 904.

A device interface 918 may be any type of interface to a device and may reside between any of the components shown in FIG. 9. A device interface 918 may, for example, be an interface to an external device (e.g., USB device) that plugs into a port (e.g., USB port) of the system 900.

The foregoing description is provided to enable a person skilled in the art to practice the various configurations described herein. While the subject technology has been particularly described with reference to the various figures and configurations, it should be understood that these are for illustration purposes only and should not be taken as limiting the scope of the subject technology.

One or more of the above-described features and applications may be implemented as software processes that are specified as a set of instructions recorded on a computer readable storage medium (alternatively referred to as computer-readable media, machine-readable media, or machine-readable storage media). When these instructions are executed by one or more processing unit(s) (e.g., one or more processors, cores of processors, or other processing units), they cause the processing unit(s) to perform the actions indicated in the instructions. In one or more implementations, the computer readable media does not include carrier waves and electronic signals passing wirelessly or over wired connections, or any other ephemeral signals. For example, the computer readable media may be entirely restricted to tangible, physical objects that store information in a form that is readable by a computer. In one or more implementations, the computer readable media is non-transitory computer readable media, computer readable storage media, or non-transitory computer readable storage media.

In one or more implementations, a computer program product (also known as a program, software, software application, script, or code) can be written in any form of programming language, including compiled or interpreted languages, declarative or procedural languages, and it can be deployed in any form, including as a stand-alone program or as a module, component, subroutine, object, or other unit suitable for use in a computing environment. A computer program may, but need not, correspond to a file in a file system. A program can be stored in a portion of a file that holds other programs or data (e.g., one or more scripts stored in a markup language document), in a single file dedicated to the program in question, or in multiple coordinated files (e.g., files that store one or more modules, sub programs, or portions of code). A computer program can be deployed to be executed on one computer or on multiple computers that are located at one site or distributed across multiple sites and interconnected by a communication network.

While the above discussion primarily refers to microprocessor or multi-core processors that execute software, one or more implementations are performed by one or more integrated circuits, such as application specific integrated circuits (ASICs) or field programmable gate arrays (FPGAs). In one or more implementations, such integrated circuits execute instructions that are stored on the circuit itself.

In some aspects, the subject technology is directed to magnetic band-pass filters for signals in magnetic communications and anomaly detection using diamond nitrogen-vacancy (DNV). In some aspects, the subject technology may be used in various markets, including for example and without limitation, advanced sensors and magnetic communication systems markets.

The description of the subject technology is provided to enable any person skilled in the art to practice the various embodiments described herein. While the subject technology has been particularly described with reference to the various figures and embodiments, it should be understood that these are for illustration purposes only and should not be taken as limiting the scope of the subject technology.

There may be many other ways to implement the subject technology. Various functions and elements described herein may be partitioned differently from those shown without departing from the scope of the subject technology. Various modifications to these embodiments may be readily apparent to those skilled in the art, and generic principles defined herein may be applied to other embodiments. Thus, many changes and modifications may be made to the subject technology, by one having ordinary skill in the art, without departing from the scope of the subject technology.

A reference to an element in the singular is not intended to mean “one and only one” unless specifically stated, but rather “one or more.” The term “some” refers to one or more. Underlined and/or italicized headings and subheadings are used for convenience only, do not limit the subject technology, and are not referred to in connection with the interpretation of the description of the subject technology. All structural and functional equivalents to the elements of the various embodiments described throughout this disclosure that are known or later come to be known to those of ordinary skill in the art are expressly incorporated herein by reference and intended to be encompassed by the subject technology. Moreover, nothing disclosed herein is intended to be dedicated to the public regardless of whether such disclosure is explicitly recited in the above description.

Claims

1. A diamond nitrogen-vacancy (DNV) sensor comprising: a diamond having one or more nitrogen vacancies;a loop of conductive material positioned adjacent to a portion of the diamond; anda resistor coupled to a first end of the loop and a second end of the loop, the loop and resistor forming a low pass filter for the DNV sensor.

2. The DNV sensor of claim 1, wherein the loop comprises a plurality of loops.

3. The DNV sensor of claim 1, wherein the resistor is a variable resistor.

4. The DNV sensor of claim 1, wherein the resistor is a potentiometer.

5. The DNV sensor of claim 4, wherein a modification to the potentiometer selectively attenuates a set of high frequency magnetic signals.

6. A system comprising: a vacancy sensor including: a vacancy material having a vacancy,a loop of conductive material positioned adjacent to a portion of the vacancy material, anda variable resistor coupled to a first end of the loop and a second end of the loop, the loop and variable resistor forming a low pass filter for the vacancy sensor; anda controller configured to modify the variable resistor.

7. The system of claim 6, wherein the controller modifies the variable resistor to selectively attenuate the low pass filter.

8. The system of claim 6, wherein the controller modifies the variable resistor to selectively attenuate the low pass filter based on an orientation of a detected magnetic signal.

9. A system comprising: a vacancy sensor including: a vacancy material having a vacancy,a loop of conductive material positioned adjacent to a portion of the vacancy material, anda variable resistor coupled to a first end of the loop and a second end of the loop, the loop and variable resistor forming a low pass filter for the vacancy sensor; anda controller configured to modify an orientation of the vacancy sensor.

10. The system of claim 9, wherein the controller modifies the orientation of the vacancy sensor, wherein the vacancy sensor is a diamond nitrogen vacancy sensor, based on an orientation of a detected magnetic signal.