The Present invention relates to a magnetic recording medium and a magnetic storage apparatus, specifically relates to a magnetic recording medium and a magnetic storage apparatus for high density recording.
With the development of information processing technology, a magnetic storage apparatus used as an external storage apparatus of a computer is required to have improved performance such as a high-capacity and a high speed transfer. To this end, perpendicular recording technology has been developed in order to achieve a magnetic recording with a high recording density in recent years.
For a perpendicular magnetic recording medium, it is helpful to reduce noise generated from a recording layer (or a magnetic layer) thereof to realize the high recording density of a longitudinal magnetic recording layer. In a conventional way, the noise has been reduced by enhancing a coercitivity of the recording layer or refining magnetic grains composing the magnetic layer.
In order to enhance the coercitivity of the recording layer or refining the magnetic grains of the recording layer, it is relatively effective to: construct the recording layer into a double-layered structure; construct the recording layer in a granular layer; and form a Ru intermediate layer under the recording layer. The double-layered structure and the granular layer have been presented in, e.g., Japanese Laid-open Patent Publication 2006-309919. By constructing the granular recording layer, oxide segregates the magnetic grains, thereby better segregating magnetically the magnetic grains from each other. The Ru intermediate layer is formed to facilitate the separation of the magnetic grains in the recording layer.
Yet, constructing the double-layered recording structure or the granular recording layer, or forming the Ru intermediate layer under the recording layer still remains an issue vis-avis further improvement of reading/writing performance. This is considered to be attributed to insufficient magnetic separation of the magnetic grains in the recording layer. The reading/writing performance can be expressed with a signal-to-noise-ratio (SNR), VMM2L giving an indication of an error rate and an effective track width WCW.
This effective track width WCW is an effective width of a track determined by measuring a writing width of the magnetic head from a profile obtained by writing/reading data by moving the magnetic head in the track width direction on the magnetic recording medium.
In accordance with an aspect of an embodiment, a magnetic recording medium has a substrate, a nonmagnetic granular layer formed above the substrate and a recording layer formed on the nonmagnetic granular layer. The nonmagnetic granular layer is made of CoCr alloy with an hcp or an fcc crystal structure in which a nonmagnetic material segregates virtually-columnar magnetic grains.
Accordingly, an object of the present invention is to provide a magnetic recording medium and a magnetic storage apparatus whose reading/writing performances are further improved.
The present invention will be explained with reference to the accompanying drawings.
Embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
In this embodiment, a recording layer is formed on a nonmagnetic granular layer in a magnetic recording medium. Forming the nonmagnetic granular layer improves the reading/writing performances of the magnetic recording medium. It is considered that the nonmagnetic granular layer contributes to improve the magnetic separation of the magnetic grains in the recording layer. Alternatively, the nonmagnetic granular layer can be formed on the intermediate layer. When the nonmagnetic granular layer is formed on an intermediate layer, the magnetic separation of the magnetic grains in the recording layer is further improved.
The magnetic recording medium 1-1 shown in
Thicknesses of the APS-SUL 12 and the underlayer 13 are respectively approximately 50 nm and 5 nm here. A thickness of the protective layer 17 is approximately 6-10 nm here. Materials and structures of members forming the lower part of the magnetic recording medium such as the substrate 11, the APS-SUL 12, the underlayer 13 are not limited as shown in embodiments later described. For example, the underlayer 13 is not necessarily composed of the Ni alloy but also can be composed of other alloys such as Ta, Ti or Co alloys that have an fcc crystal structure and can control an orientation of an upper layer.
The nonmagnetic granular layer 15 is composed of CoCr alloy having an hcp crystal structure or the fcc crystal structure such that substantially-columnar magnetic grains are segregated with nonmagnetic material. A thickness of the nonmagnetic granular layer 15 is approximately 1-8 nm here. The CoCr alloy is made of CoCrX1 alloy, and the X1 contains one or more elements selected from among Pt, Ta and Ru. The nonmagnetic material contains at least one element selected from among oxides such as SiO2, TiO2, Cr—OX, Ta2O5, and ZrO2 and nitrides such as SiN, TiN, CrN, TaN, ZrN. The nonmagnetic granular layer 15 acts to orient the magnetic grains of the recording layer 16 deposited on its surface.
The recording layer 16 is composed of the Co alloy having the hcp crystal structure such that the virtually-columnar magnetic grains are segregated with the nonmagnetic material, and its thickness is approximately 8-12 nm here. The Co alloy is made of CoFe, CoCr, CoCrPt and CoCrPtB. The nonmagnetic material contains at least one element selected from among the oxides such as SiO2, Tio2, Cr—OX, Ta2O5, and ZrO2 and nitrides such as SiN, TiN, CrN, TaN and ZrN. The recording layer 16 can have a single layer structure or a multilayer structure.
The magnetic recording medium 1-2 shown in
For the sample SMP2, it is confirmed that its effective track width WCW can be narrowed approximately 8 nm compared to the sample 1. For the sample 3, the VMM2L can be decreased 0.2 compared to the sample 1 where its effective track width WCW is the same, while if the VMM2 is the same, the effective track width WCW can be narrowed approximately 13 nm. Further, comparing the sample SMP2′ and the sample SPM3′ having the nonmagnetic granular layers composed of CoCrX1—SiO2 to the sample SMP1, even where X1 contains one or more element selected from among Pt, Ta and Ru, the same improvement effect can be seen. Judging from the fact that forming the nonmagnetic granular layer 15 improves the reading/writing performances, the nonmagnetic granular layer 15 apparently accelerates the magnetic separation of the magnetic grains in recording layer 16. Again, where the nonmagnetic granular layer 15 is formed on the intermediate layer 14, the magnetic separation of the magnetic grains in the recording layer can be further accelerated.
A magnetic recording medium 1-3 shown in
The seed layer 22 is composed of an approximately 2-10 nm thickness of CrTi. The soft magnetic underlayer 23 is composed of, e.g., a lower underlayer 23-1 made of approximately 5-30 nm thickness of CoFeZrTa, a magnetic domain control layer 23-2 made of approximately 0.4-3 nm thickness of Ru and an upper underlayer 23-3 made of CoFeZrTa. The CoFezrTa upper underlayer 23-3 is of, e.g., approximately 5-30 nm in thickness, containing 40-50 at. % of Fe, 4-9 at. % of Zr and 2-10 at. % of Ta. The orientation control layer 24 is, e.g., constructed of approximately 2-15 nm thickness of NiCr. The intermediate layer 25 is composed of, e.g., a lower nonmagnetic layer 25-1 made of approximately 3-15 nm thickness of Ru and an upper nonmagnetic layer 25-2 made of approximately 3-10 nm thickness of Ru. The nonmagnetic granular layer 26 is composed of, e.g., approximately 0.5-5 nm thickness of CoCr—SiO2, containing 30-50 at. % of the Cr and 4-12 mol. % of SiO2. The recording layer 27 is composed of, e.g., a lower granular magnetic layer 27-1 made of CoCrPt—TiO2, acting as a main recording layer and an upper magnetic layer 27-2 made up of CoCrPtB, acting as a recording auxiliary layer 27-2. The CoCrPtB upper magnetic layer 27-2 is of, e.g., approximately 3-12 nm in thickness, containing 5-25 at. % of Co, 5-25 at. % of Pt and 1-15 at. % of B. The protective layer 17 is composed of approximately 4 nm thickness of the DLC.
Next, a manufacturing method of the magnetic recording medium 1-3 shown in
Firstly, a rigidity of the surface of the substrate 21 made of a nonmagnetic material such as glass is increased by chemical processing, then the seed layer 22 is formed by growing the CrTi alloy to a thickness of approximately 3 nm by the sputter technique with 0.3-0.8 Pa of sputtering pressures. A growth rate of the seed layer 22 is not specified, however, in this embodiment, it is of 2 nm/sec. With the seed layer 22, the surface condition of the substrate 21 does not affect the layers deposited thereon in the post-processes. Furthermore, the seed layer acts as an adhesive layer adhering the layers with the substrate 21. If a problem on a crystallinity of the layers deposited in the post-processes will not arise without forming the seed layer 22, it is not necessary to form it.
A material of the substrate 21 is not limited to glass. Where the magnetic recording medium 1-3 is a solid medium such as a hard disk, a plastic substrate, an Al alloy substrate plated NiP or a silicon substrate can also be used as the substrate 21. Where the magnetic recording medium 1-3 is a flexible tape-like medium, a PET (poly ethylene terephthalate) substrate, a PEN (poly ethylene naphthalate) substrate or a polyimide substrate can also be used as the substrate 21.
Then, on the seed layer 22, the lower underlayer 23-1 is formed by growing soft magnetic amorphous FeCoZrTa to a thickness of approximately 20 nm by sputtering with 0.3-0.8 Pa sputtering pressures and a 5 nm/sec growth rate. The soft magnetic amorphous material composing the lower underlayer is not limited to FeCoZrTa. An alloy containing any of Fe or Co and one or more additive elements can be also used as the lower underlayer 23-1.
With the sputter method described above, the magnetic domain control layer 23-2 is formed by growing approximately 0.4-3 nm thickness of Ru on the lower underlayer 23-1. A material composing the magnetic domain control layer 23-2 is not limited to Ru, but also can be Rh, Ir and Cu.
Thereafter, the upper underlayer 23-3 is formed by growing the soft magnetic amorphous FeCoZrTa to approximately 20 nm in thickness on the magnetic domain control layer 23-2 with the sputter technique under the same conditions used in forming the lower underlayer 23-1. The amorphous material composing the upper underlayer 23-3 is not limited to FeCoZrTa, but also can be other amorphous material such an alloy containing any of Fe or Co and one or more additive element.
On the seed layer 22, the soft magnetic underlayer 23 having the lower underlayer 23-1, the magnetic domain control layer 23-2 and the upper underlayer 23-3 is formed. For the soft magnetic underlayer 23 having such structure, the magnetic domain control layer 23-2 couples the lower underlayer 23-1 and the upper underlayer 23-3 antiferromagnetically. Therefore, the magnetizations of both underlayers 23-1 and 23-3 are stabilized in a reciprocally anti-parallelism state. Even though the adjacent magnetizations in the upper underlayer 23-3 (or the lower underlayer 23-1) are reversely directed each other in the film plane, in other words, “in face-to-face directions”, the magnetic flux flowing from there will be refluxed in the soft magnetic underlayer 23 because the magnetizations of the upper underlayer 23-3 and the lower underlayer 23-1 are in the anti-parallelism state. Consequently, the magnetic flux originated from the magnetic domain wall is less likely to flow upward of the soft magnetic underlayer 23, thus the magnetic head is not affected by the magnetic flux. Therefore, the spike noise generated in reading attributed to the magnetic flux will be reduced.
In addition, to reduce the spike noise, there is another structure such that a single-layer soft magnetic underlayer is formed on the antiferromagnetic layer. In this case, the antiferromagnetic layer is composed of. e.g., IrMn or FeMn.
Then, the orientation control layer 24 is formed by growing, e.g., soft magnetic Ni90Cr10 to approximately 5 nm in thickness on the soft magnetic underlayer 23 by the sputter technique with 0.3-0.8 Pa sputtering pressures and a 2 nm/sec sputtering rate. The NiCr layer constructing the orientation control layer 24 can have a fcc crystal structure by using a FeCo alloy amorphous material for the upper underlayer 23-3. The orientation control layer 24 having such fcc crystal structure can be accomplished using NiCr, or any of NiFeCr, Pt, Pd, NiFe, NiFeSi, Al, Cu or In, or such alloys.
Composing the orientation layer 24 of a soft magnetic material such as NiFe makes the orientation control layer 24 act as the upper underlayer 23-3, which produces the same effect of shortening a substantial distance from the magnetic head to the upper underlayer 23-3, allowing the magnetic head to read the information written on the magnetic recording medium 1-3 with a good sensitivity.
Next, the lower nonmagnetic layer 25-1 is formed by growing Ru to approximately 10 nm in thickness on the orientation control layer 24 by the sputter technique with 4-10 Pa sputtering pressures and with 2-5 nm/sec sputtering rates. Thereafter, the upper nonmagnetic layer 25-2 is formed by growing Ru to approximately 5 nm in thickness on the lower nonmagnetic layer 25-1 by the sputter technique with 4-10 Pa sputtering pressures and a 0.5 nm/sec sputtering rate, which is lower than the sputtering rate used with the lower nonmagnetic layer 25-1. The lower nonmagnetic layer 25-1 and the upper nonmagnetic layer 25-2 form the intermediate layer 25.
Ru layers constricting the nonmagnetic layers 25-1 and 25-2 have an hcp crystal structure that has a good lattice matching with the fcc crystal structure of the soft magnetic layer of the orientation control layer 24. With such mechanism of the orientation control layer 24, the nonmagnetic layer 25-1 and 25-2 having favorable crystallinities oriented in one direction are grown.
The nonmagnetic layer 25-1 and 25-2 composing the intermediate layer 25 can be made of Ru having the hcp crystal structure, but can also be made of RuX2 alloy having the hcp crystal structure. In this case, X2 is an element selected from among Co, Cr, W or Re.
Then, the nonmagnetic granular layer 26 is formed by growing (Co60Cr40)94—(SiO2)6 to approximately 2 nm in thickness by the sputter technique with 0.5-7 Pa sputtering pressures and a relatively low sputtering rate, 0.5 nm/sec. The nonmagnetic granular layer 26 is in a state that the virtually-columnar magnetic grains composed of CoCr are segregated from the nonmagnetic material that contains at least one element selected from among the oxides such as SiO2, Tio2, Cr—OX, Ta2O5, and ZrO2 and the nitrides such as SiN, TiN, CrN, TaN and ZrN.
Then a Ar gas mixed with a slight amount of O2, e.g., 0.2-2% flow ratio of O2, is injected into a sputter chamber as sputter gas to stabilize the pressure at a relatively high pressure, approximately 3-7 Pa. The temperature of the substrate is kept relatively low at approximately 10-80 degrees C. In this state, Co66Cr14Pt20 and Ti0.2 are sputtered by applying approximately 400-100 W of high frequency current between a target and the substrate 21 having the nonmagnetic granular layer 26 thereon. A frequency of the high frequency current here can be 13.56 MHz. Substituting for the high frequency current, DC current on the order of 400-1000 W can be used for conducting a discharge in the sputter chamber.
As described above, using the sputter technique with a relatively high pressure (approximately 3-7 Pa) and relatively low temperatures (approximately 10-80 degrees C.), a layer in a lower density can be formed compared to the case of forming the layer with a relatively low pressure and a relatively high temperature. Therefore, on the nonmagnetic granular layer 26, the target materials, Co66Cr14Pt20 and TiO2 are not mixed together. Then the main recording layer, i.e., the lower granular magnetic layer 27-1, with the granular structure wherein the nonmagnetic material composed of Tio2 segregates the magnetic grains composed of Co66Cr14Pt20 is formed. For such lower granular magnetic layer 27-1, a content percentage of the nonmagnetic material is preferably approximately 5-12 mol %. In this embodiment, the (Co66Cr14Pt20)92(Tio2)8 containing an approximately 8 mol % of the nonmagnetic material is formed as the lower granular magnetic layer 27-1. A thickness of the lower granular magnetic layer 27-1 is not specified. However, in this embodiment, the thickness of the lower granular magnetic layer 27-1 is specified as approximately 12 nm with 3 nm/sec sputtering rate.
Of the intermediate layers 25 formed under the lower granular magnetic layer 27-1, the upper nonmagnetic layer 25-2 with the hcp crystal structure acts to orient the magnetic grains of the lower granular magnetic layer 27-1 in the perpendicular direction to the surface thereof. Thus, the magnetic grains of the lower granular magnetic layer 27-1 have the hcp crystal structure structuring perpendicular direction as with the upper nonmagnetic layer 25-2, and height directions of hexagonal cylinders in the hcp crystal structure are parallel to the direction of an axis of easy magnetization. Thus, the lower granular magnetic layer 27-1 shows a perpendicular magnetic anisotropy.
For the main recording layer composed of the lower granular magnetic layer 27-1 having such granular structure, the magnetic grains are decoupled from each other and their axis of easy magnetization is vertical. Thus, noise generated from the main recording layer can be reduced.
Further, for the magnetic grains of the lower granular magnetic layer 27-1, where their Pt contained amount is 25 at. % or greater, the magnetic anisotropic constant Ku is decreased. Therefore, the Pt contained in the magnetic grain is preferably less than 25 at. %.
Further, using the Ar gas mixed with the slight amount (0.2-2% flow ratios) of O2 as the sputter gas accelerates the magnetic separation of the magnetic grains in the lower granular magnetic layer 27-1, improving electromagnetic conversion characteristics.
The magnetic separation of the magnetic grains in the lower granular layer 27-1, i.e., widening intervals between the magnetic grains is feasible by comparatively increasing the degree of the surface roughness of the upper nonmagnetic layer 25-2 under the lower granular magnetic layer 27-1. To increase the degree of the surface roughness of the upper nonmagnetic layer 25-2, Ru in the upper nonmagnetic layer 25-2 is sputtered at a low sputtering rate, 0.5 nm/sec.
The nonmagnetic material used for the lower granular magnetic layer 27-1 is not limited to TiO2, but also can be other oxide (e.g., SiO2, Cr—Ox, Ta2O5 and ZrO2) or other nitride (e.g., SiN, TiN, CrN, Tan, ZrN). Alternatively, the magnetic grains used for the lower granular magnetic layer 27-1 can be CoFe or CoFe alloy. When the magnetic grains are composed of the CoFe alloy, the magnetic grains are preferably constructed into a HCT (honeycomb chained triangle) structure by being subjected to heat treatment. Further, Cu or Ag can be added to the CoFe alloy.
Next, with sputtering using the Ar gas as a sputter gas, the CoCrOPtB upper magnetic layer 27-2 acting as the recording auxiliary layer is formed on the lower granular magnetic layer 27-1 by growing an alloy containing Co and Cr (CoCr alloy), e.g., Co67Cr19Pt10O4, to approximately 6 nm in thickness. A sputtering condition of the CoCrOPtB upper magnetic layer 27-2 is not specified. However, in this embodiment, the sputtering pressure and the sputtering rate are specified as 0.3-0.8 Pa and 2 nm/sec, respectively.
The CoCrPtB upper magnetic layer 27-2 acting as the recording auxiliary layer has the same hcp crystal structure of the lower granular magnetic layer 27-1 formed under the CoCrPtB upper magnetic layer 27-2, acting as the main recording layer. Thus, the lattice matching of the magnetic grains of the CoCrPtB upper magnetic layer 27-2 and the lower granular magnetic layer 27-1 is high, so the CoCrPtB upper magnetic layer 27-2 can be grown on the lower granular magnetic layer 27-1 with a favorably crystallinity.
Thereafter, the protective layer 28 composed of the DLC is deposited on the recording layer 27 (the lower granular magnetic layer 27-1 and the CoCrPtB upper magnetic layer 27-2) by RF-CVD (radio frequency-chemical vapor deposition) using a C2H2 as a reactant gas to 4 nm in thickness. A deposition condition for depositing the protective layer 28 is, e.g., approximately 4 Pa of the deposition pressure, 1000 W of high frequency current, 200V of bias current applied between the substrate 21 having its CoCrPtB upper magnetic layer 27-2, and a shower head in the chamber.
In that manner, the magnetic recording medium 1-3 having a structure illustrated in
As shown in
For the sample SMP5, the effective track widths WCW are narrowed approximately 10 nm compared to the sample SMP4. For the sample SMPS, the VMM2Ls are decreased approximately 0.15 compared to the sample SMP4. Judging from the fact that forming the nonmagnetic granular layer 26 improves the reading/writing performances, the nonmagnetic granular layer 26 apparently accelerates the magnetic separation of the magnetic grains in recording layer 27. Forming the nonmagnetic granular layer 26 on the intermediate layer 25 further improves the magnetic separation of the magnetic grain.
For the samples SMP7-SMP9, the effective track widths WCW are narrowed compared to the sample SMP6. In addition, in the samples SMP7-SMP9, the VMM2Ls are also improved compared to the sample SMPG. Thus, the same improvement effect can be attained with CoCrRu as the nonmagnetic material as with CoCr. Likewise, the same improvement effect can be attained with nitride such as TiN as an additive to the nonmagnetic material, as with the oxide such as SiO2. Judging from the fact that forming the nonmagnetic granular layer 26 apparently improves the reading/writing performances, the nonmagnetic granular layer 26 accelerates the magnetic separation of the magnetic grains in recording layer 27. Forming the nonmagnetic granular layer 26 on the intermediate layer 25, further improves the magnetic separation of the magnetic grain.
Next, referring to
As shown in
In this embodiment, each magnetic recording medium 116 has a structure described in accordance with any of
The basic structure of the magnetic storage apparatus is not limited to the ones shown in
In the embodiments described above, the present invention is adopted to the perpendicular magnetic recording medium. However, the present invention is applicable to a longitudinal magnetic recording medium as well. Likewise, for the longitudinal magnetic recording medium, the magnetic separation of the magnetic grains in the recording layer is enhanced by forming the nonmagnetic granular layer beneath the recording layer as presented in the present invention, thereby improving the reading/writing performances.
In accordance with the present invention, the magnetic recording medium and the magnetic storage apparatus with improved reading/writing performances can be achieved.
Number | Date | Country | Kind |
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2007-135972 | May 2007 | JP | national |