1. Field of the Invention
The present invention generally relates to a magnetic recording medium and a magnetic storage device using the magnetic recording medium. The present invention also related to fabrication of such a magnetic recording medium and a magnetic storage device.
2. Description of the Related Art
In recent years and continuing, large-capacity magnetic data storages over 100 GB have become mainstream, responding to demand for recording video images (or moving images). One example of such a large-capacity magnetic storage is a magnetic disk device, which is loaded in personal computers or domestic home video recorders. It appears that demand for large-capacity and low-price magnetic disk devices will continuously increase in the future. As for the in-plane recording method currently employed in magnetic disk devices, it is said that 200 gigabits per square inch is the technical limit on the surface recording density.
To overcome the technical limit, so-called patterned media are proposed for the purpose of reducing the magnetic interaction caused in the conventional successive recording thin films and miniaturizing the unit of record. Examples of the pattered medium are disclosed in JP 2004-039015A, JP 2002-175621A, JP 2003-109333A, and JP 2003-157503A.
In a patterned medium, fine unit regions of a ferromagnetic material (referred to as “magnetic dots”) are arranged in a prescribed order on the surface of the recording layer. The interval between magnetic dots is set constant so as to reduce the magnetostatic interaction or exchange interaction. It is expected, with patterned media, that a high S/N ratio is to be achieved even in high-density recording.
The recording density of a patterned medium can be increased by reducing the number of those dots for recording one-bit information, as well as reducing the size and the interval of the magnetic dots. In addition, by reducing the area size of the sensor (reproducing) element in the magnetic head for detecting magnetic leakage flux from the magnetic dots, the information written in the magnetic dots is read in minute detail.
However, with this arrangement, the number of magnetic dots with leakage flux detectable by the sensor decreases. In addition, since the magnetic dots are positioned at a certain interval, detection of the maximum leakage flux from the individual magnetic dots is likely to deviate in time. As a result, the entirety of the maximum magnetic leakage flux detected from a group of magnetic dots defining one-bit information decreases, and the reproduction output and the S/N ratio are degraded.
The present invention was conceived to overcome the above-described problems in the prior art, and it is an object of the present invention to provide a magnetic recording medium, a magnetic storage device, and fabricating method thereof, which enable high-density magnetic recording operations.
To achieve the object, in one aspect of the invention, a magnetic recording medium is provided. The magnetic recording medium comprises a substrate and a recording layer formed over the substrate. The recording layer is structured by a nonmagnetic base and a plurality of magnetic dots formed in the nonmagnetic base. The magnetic dots are aligned in a prescribed direction for each track or each group of adjacent tracks of the magnetic recording medium.
With this arrangement, the maximum magnetic leakage flux is detected simultaneously from a plurality of magnetic dots, and the reproduction output is increased, while reducing the half-value width of the reproduced waveform. Consequently, high-density recording is achieved.
In a preferred example, the magnetic dots align in a direction tilting at a prescribed angle with respect to the width of the track.
Each of the magnetic dots is of a nano-scale and extends substantially perpendicular to a surface of the nonmagnetic base.
In another aspect of the invention, a magnetic storage device is provided. The magnetic storage device comprises a magnetic recording medium having a recording layer in which a plurality of magnetic dot are formed in a nonmagnetic base, and a magnetic head having a sensor element for detecting information from the magnetic dots. The magnetic dots are aligned in a direction consistent with a width direction of the sensor element of the magnetic head in each track or each group of adjacent tracks.
With this arrangement, the sensor element of the magnetic head can detect magnetic leakage flux from multiple magnetic dots simultaneously. Accordingly, the magnetic storage device can have a high reproduction output level, based on a high-density recording medium.
In still another aspect of the invention, a method for fabricating a magnetic recording medium is provided. The method comprises the steps of:
With this method, a pattern of magnetic dots aligned in a desired direction is fabricated easily in each of the grooves. The time and cost required for forming the grooves are reduced.
Other objects, features, and advantages of the present invention will become more apparent from the following detailed description when read in conjunction with the accompanying drawings, in which:
The preferred embodiments of the present invention are now described below with reference to the attached drawings.
First, explanation is made of the basic idea of the present invention. The inventors of the present invention found that alumite pores (which are openings or holes extending substantially perpendicular to the surface of an aluminum layer) can be created in a groove formed in the aluminum layer through an anodizing process under prescribed conditions, including a voltage level. The inventors also found that formation of pores is restrained in a flat area in which no grooves are formed. This means that alumite pores can be formed selectively by providing grooves in an aluminum layer (which is converted to an aluminum oxide layer by the anodizing process).
This experimental result indicates that a number of magnetic dots can be produced, being arranged regularly in a prescribed array, at high controllability. This can be applied to a magnetic recording medium of high recording density.
Making use of this phenomenon, magnetic dots are aligned in a prescribed direction, for example, in the direction of the track width of the sensor in the magnetic head, for each track or each group of tracks, and accordingly, the magnetic leakage fluxes from the magnetic dots can be simultaneously detected. This allows the reproduction output to rise, while narrowing the half-value width of the reproduced waveform, and high density recording is achieved.
The magnetic head 28 is of a combination type having both a reading head 34 and a single-pole recording head 35 formed on an AlTiC (Al2O3.TiO2) slider 30. The reading head 34 has a sensor element 33 embedded in an aluminum oxide insulating layer 31 sandwiched between shield layers 32a and 32b made of a soft magnetic material. The sensor element 33 is, for example, a giant magneto resistive (GMR) element.
The single-pole recording head 35 has a major magnetic pole 36 made of a soft magnetic material for applying a magnetic flux to the magnetic disk 23, a return yoke (not shown) magnetically connected to the major magnetic pole 36, and a recording coil (not shown) for inducing the recording magnetic flux to the major magnetic pole 36 and the return yoke. Preferably, the major magnetic pole 36 is made of a magnetic material with a high saturated magnetic flux density, such as 50% Ni-50% Fe alloy, FeCoNi alloy, FeCoNiB, or FeCoAlO. By using these materials, high-density magnetic flux can be concentrated on the magnetic disk 23, preventing magnetic saturation.
The GMR element used as the reading element 33 has a spin-valve structure and detects the direction of the magnetic flux leakage from the dots, representing information recorded in the magnetic disk 23, as change in resistance. In place of the GMR element, a ferromagnetic tunnel junction MR (TMR) element or a ballistic MR element may be used.
The magnetic disk 23 has a soft magnetic backing layer 41, a recording layer 42, and a protection layer 43 deposited in this order on a substrate 40. The recording layer 42 comprises a nonmagnetic base 44 and magnetic dots 46 located in prescribed positions in the nonmagnetic base 44. The magnetic dots 46 are fabricated by filling nanoholes (openings) 45 extending perpendicular to the base surface with a magnetic material.
The substrate 40 is, for example, a crystallized glass substrate, a reinforced glass substrate, a silicon (Si) substrate, an aluminum alloy substrate, or a plastic substrate.
The soft magnetic backing layer 41 has a thickness ranging from 50 nm to 2 μm, and is made of an amorphous or microcrystal alloy containing at least one element selected from Fe, Co, Ni, Al, Si, Ta, Ti, Zr, Hf, V, Nb, C, and B, or alternatively, layers of these alloys. From the viewpoint of concentrating the magnetic flux from the major magnetic pole during the recording operation, it is preferable to use a soft magnetic material with the saturated magnetic flux density at or above 1.0 T and with the coercivity (Hc) at or below 790 kA/m. To be more precise, the soft magnetic backing layer 41 is made of, for example, NiFe (Permalloy), FeSi, FeAlSi, FeC, FeTaC, FeCoB, FeCoNiB, CoNbZr, CoCrNb, NiFeNb, or NiP. The soft magnetic backing layer 41 is provided in order to absorb almost all the magnetic flux generated from the recording head 35. To record data in the recording layer 42 in the saturated state, it is preferable that the product of the saturated magnetic flux density and the film thickness be large. From the viewpoint of high-rate recording operation, it is preferable for the soft magnetic backing layer 41 to have a high magnetic permeability with respect to high frequencies. The soft magnetic backing layer 41 may be omitted depending on the specification of the magnetic head 28.
The thickness of the soft magnetic backing layer 41 is at or below 500 nm, preferably, at or below 300 nm, and more preferably, in the range from 20 nm to 200 nm. Exceeding 500 nm, high-density recording operation may not be achieved, and the recording layer may have to be polished. In this case, extra cost and time are required, and the recording quality may also be degraded.
The nonmagnetic base 44 may be made of an arbitrary nonmagnetic material. If the nanoholes 45 are alumite pores, aluminum oxide is used.
The nanoholes penetrate the nonmagnetic base 44. The size and the interval of the nanoholes 45 are appropriately selected based on the recording density of the magnetic disk 23 and/or the specification of the magnetic head 28. The fabrication process of the nanoholes 45 is described later.
The interval of nanoholes 45 formed in an area of the magnetic dot array ranges from 5 nm to 500 nm, and the range from 10 nm to 200 nm is more desirable. Below 5 nm, it becomes difficult to form nanoholes 45. Above 500 nm, regularity of nanohole alignment cannot be achieved.
The diameter of the nanohole 45 is sufficiently small so as to define a magnetic dot as a single magnetic section. Preferably, the diameter is less than or equal to 200 nm, and more preferably, 5 nm to 100 nm. If the diameter of the nanohole 45 exceeds 200 nm, the magnetic dot may not define a single magnetic section.
The aspect ratio (which is the ratio of the depth to the diameter) of the nanohole 45 may be appropriately selected, without restrictive limitations. However, a high aspect ratio is desirable because the anisotropism in shape increases and the vertical coercivity of the magnetic dot (generated perpendicular to the substrate) is improved. For example, the aspect ratio is greater than or equal to 1, and preferably, 2 to 15.
The magnetic dot 46 is made of a so-called perpendicularly magnetized thin film with an easy magnetization axis perpendicular to the substrate, which is made of a material selected from the group consisting of Fe, Co, Ni, Fe-based alloy, Co-based alloy, and Ni-based alloy. The thickness of the perpendicularly magnetized thin film is, for example, 5 nm to 100 nm. Examples of the magnetic material include Fe, Co, Ni, FeCo, FeNi, CoNi, FeCoNi, and CoNiP. The thickness of the magnetic dot 46 is preferably 5 nm to 50 nm. Since the magnetic dot 46 is surrounded by the nonmagnetic base 44, the magnetic flux generated from the recording head 35 focuses on the magnetic dot 46, preventing undesirable divergence during the recording operation. The thickness of the magnetic dot 46 can be set greater than that of a successive thin-film recording layer of a vertical magnetic recording medium.
The magnetic material of the magnetic dot 46 may also be selected from cobalt (Co) based alloys, including CoPt, CoCrTa, CoCrPt, CoPt-M, and CoCrPt-M, where M is chosen among B, Mo, Nb, Ta, W, Cu and their alloys. These magnetic materials are preferable from the viewpoint of controllability of saturated magnetization and magnetic anisotropy constant. Examples of such Co-based alloys include CoNiCr, CoCrPtB, CoCrPtTa, and CoCrPtTaNb. The magnetic material used for the magnetism dots 46 may be a regularized alloy, such as FePt or CoPt.
The protection layer 43 has a thickness of 0.5 nm to 5 nm, and it is made of amorphous carbon, hydrogenated carbon, carbon nitride, aluminium oxide, or zirconia.
The surface of the protection layer 43 may be coated with a lubrication layer. The lubrication layer is applied onto the protection layer 43 up to a thickness of 0.5 nm to 5 nm by a pulling method or spin coating. The lubrication layer may be made of a lubricant containing Per fluoro-polyether as the principal chain. The lubrication layer is not essential for the present invention, and it may or may not be provided, depending on the material of the protection layer 43 and the specification of the magnetic head 28.
In the example shown in
In the example shown in
Returning to
In
In
The dot aligning direction Ddot tilts at a certain angle with respect to the track width (along the X axis). The tilting angle θ1 between the dot aligning direction Ddot and the width of the track 38 varies along with the motion of the magnetic head 28 over the magnetic disk 23. For example, the tilting angle θ1 changes depending on whether the magnetic head 28 is located in the inner circumference (
The width direction DEL of the sensor element 33 continuously varies with respect to the width of the track 38 as the magnetic head 28 moves. The aligning direction Ddot of the magnetic dots 46 may be set for every track 38 or every group of tracks 38. If the number of tracks included in a group increases, the dot aligning direction Ddot of the magnetic dots 46 slightly deviates from the width direction DEL of the sensor element 33. The acceptable range of deviation is selected appropriately based on the reproduction output level, the diameter of the magnetic dot 46, or the thickness (or the height) of the sensor element 33 extending perpendicular to the width direction DEL thereof.
The problems in the convention magnetic storage devices are explained with reference to
As illustrated in
In contrast, with the present invention, the magnetic dot array is arranged such that the dot aligning direction Ddot of the magnetic dots 46 is always consistent with the width direction DEL of the sensor element 33. The detection timing of the sensor element 33 for detecting the maximum magnetic leakage fluxes from the magnetic dots 46 is stable regardless of the radial position on the magnetic disk 23, and the fluctuation of the reproduction output is prevented. The S/N ratio is improved, as compared with the conventional patterned media, and high-density recording is realized.
The magnetic dot arrays shown in
In
A metal layer 44a is formed as a nonmagnetic layer 44 over the soft magnetic backing layer 41, up to thickness of, for example, 150 nm. The metal layer 44a is formed of, for example, aluminum by electroplating, electroless plating, sputtering, evaporation, or chemical vapor deposition (CVD). It is desirable to carry out sputtering because a high-purity metal layer 44a can be deposited. When forming an aluminum layer, a sputter target with purity of 99.990% or higher is used. By using a high-purity sputter target, regularity of the nanoholes 45 created in the subsequent step is improved. In the following description, explanation is made on the assumption that the metal layer 44a, as an example of the nonmagnetic layer 44, is an aluminum layer.
In
The nickel stamper 65 is fabricated from a mold (not shown) having a groove pattern corresponding to the protrusion pattern 65a of the nickel stamper 65. The mold is fabricated by coating a glass substrate with a resist film made of photoresist or electron beam resist, producing a latent image of the groove pattern using an electron beam lithograph tool (acceleration voltage of 100 keV) or a deep UV exposure apparatus (wavelength of 257 nm) used to produce an optical master disk, and developing the latent image to create the groove pattern.
Alternatively, a mask may be prepared by an electron beam lithography tool to form the groove pattern in the resist film using the mask and a deep UV exposure apparatus with an optical system for reducing the image scale. The mask can be used repeatedly, and accordingly, the cost required for the lithography can be reduced.
The groove pattern includes a number of grooves 66 extending parallel to each other in the dot aligning direction Ddot. The length of each groove 66 covers three tracks.
When the mold with the groove pattern is prepared by the above-described process, a nickel film is formed by sputtering over the surface of the mold. This nickel film is used as an electrode. Then, electroplating is carried out using a nickel sulfamate bath to grow a nickel layer up to the thickness of 0.3 mm. The nickel layer is removed from the resist and the glass substrate, the back face of the removed nickel layer is polished, and the nickel stamper 65 is completed.
Returning to
In
In
There is no particular limitation on the anodizing conditions, such as the type, the density, and the temperature of the electrolytic solution, or the anodizing time. These conditions can be appropriately selected depending on the number, the size and the aspect ratio of the nanoholes 45. For example, if the pitch of the nanoholes (i.e., the distance between the centers of two adjacent nanoholes) is 150 nm to 500 nm, diluted phosphoric acid solution is used suitably. If the pitch is 80 nm to 200 nm, then diluted oxalic acid solution is used suitably. At the pitch of 10 nm to 150 nm, it is preferable to use diluted sulphuric acid solution. In either case, the aspect ratio of the nanohole 45 can be further adjusted by immersing the substrate 40 in a phosphoric acid solution after the anodization process to increase the diameter of the nanohole 45.
Preferably, the applied voltage in the anodization process is set so as to satisfy
Voltage [V]=(pitch of nanohole 45 [nm])/A[nm/V]
where the value of A ranges from 1.0 to 4.0.
In
Finally, in
After the polishing, a protection layer 43 is formed over the surface of the disk. The protection layer 43 is, for example, a carbon hydride layer formed by sputtering, chemical vapor deposition (CVD), or a filtered cathodic arc (FCA) method. As necessary, a lubrication layer may be formed over the protection layer 43 by a pulling method or spin coating. In this manner, a magnetic disk is completed.
In this manner the groove pattern 66a formed in the (nonmagnetic) metal layer 44a allows a line of nanoholes 45 to be formed through the anodization process, being aligned at a regular interval in each of the grooves 66. As compared with the conventional nanohole forming technique, in which a recess is formed for creating a single nanohole, a nanohole array can be fabricated efficiently. Because the number of grooves formed in the metal layer 44a is much less than that of the recesses formed in the conventional technique, time required for the electron beam lithography process or the deep UV lithography process can be reduced.
Well-aligned nanoholes 45 are formed in the grooves 66, with much less variation in dot aligning direction Ddot. Consequently, the reproduction output can be increased.
Next, explanation is made of some modifications of the present invention. In the modifications, the same components as those shown in the above-described embodiment are denoted by the same numerical references, and explanation for them is omitted.
The servo pattern 71 of the phase servo of a data-plane servo scheme is defined by a pattern arrangement of magnetic dots 46 in the servo region 70 of the magnetic disk. The data region in which data are recorded is the same as that shown in
The servo pattern 71 includes a first pad region 71p1, an A region 71A, a B region 71B, a C region 71C, a D region 71D, another A region 71A, another B region 71B, another C region 71C, another D region 71D, and a second pad region 71p2, which are arranged in this order in the Y direction. If the three tracks consisting of the center track 38N (as the reference track) and two adjacent tracks 38N−1 and 38N+1 cover 360 degrees, line patterns of the magnetic dots 46 are assigned in the A region 71A, the B regions 71B, the C region 71C, and the D region 71D with 90-degree phase shift.
In each of the regions 71A through 71D, four magnetic dots 461, 462, 463 and 464 are aligned in the width direction of the track, which is consistent with the width direction of the sensor element 33 of the magnetic head 28, as shown in
The servo pattern 71 may be modified so as to arrange A region 71A, C region 71C, B region 71B, and D region 71D in this order with 180-degree phase shift.
The servo patterns of the servo regions in the middle and outer circumferential areas are similar to those shown in
The number of repetitions of A region 71A through D region 71D is appropriately selected. The servo pattern in the servo region is not limited to the example shown in
The magnetic disk with the servo pattern 71 is fabricated in a similar manner as illustrated in
First, a soft magnetic backing layer 41 and a metal layer 44a are formed over a substrate 40, as illustrated in
Then, a mold for producing a nickel stamper 65 having a protrusion pattern 65a is prepared. The protrusion pattern 65a is a reverse pattern of the groove pattern for the servo pattern 71 shown in
Returning to
In
The magnetic disk having the magnetic dot pattern of
Preferably, gap 46GP2 between two adjacent grooves 66 within a track 38 is set smaller than a gap between two magnetic dots 46 of adjacent lines in the track 38.
With this fabrication process, a parallel groove pattern is formed for each track 38 such that two adjacent groove patterns are separated at gap 66GP1. Consequently, a magnetic disk with a guard band 72 in which magnetic dots are not to be formed is fabricated easily.
Although the present invention has been described using a specific embodiment, the present invention is not limited to the embodiment. There are many modifications and substitutions within the scope of the present invention, which is defined by the appended claims. For example, in place of the combination type magnetic head used in the embodiment, the major magnetic pole of a single-pole type recording head may be used as the sensor element. The shape of the magnetic recording medium is not limited to a disk, and a rectangle or other shapes may be employed. The present invention is applicable to magnetic tapes and magnetic cards.
This patent application is based on and claims the benefit of the earlier filing date of Japanese Patent Application No. 2004-257471 filed Sep. 3, 2004, the entire contents of which are incorporated herein by reference.
Number | Date | Country | Kind |
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2004-257471 | Sep 2004 | JP | national |