Number | Date | Country | Kind |
---|---|---|---|
2000-154395 | May 2000 | JP |
Number | Name | Date | Kind |
---|---|---|---|
RE32464 | Aine | Jul 1987 | E |
5908817 | Perettie et al. | Jun 1999 | A |
Number | Date | Country |
---|---|---|
59-154641 | Sep 1984 | JP |
61-126827 | Jun 1986 | JP |
6-220077 | Aug 1994 | JP |
8-106629 | Apr 1996 | JP |
9-305961 | Nov 1997 | JP |
10-251676 | Sep 1998 | JP |
11-267696 | Oct 1999 | JP |
11-328647 | Nov 1999 | JP |
2000-105916 | Apr 2000 | JP |
Entry |
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Journal of Applied Polymer Science, “Measurements of Carbon Thin Films Using X-Ray Reflectivity”, vol. 66, No. 4, 1989, pp. 1861-1863. |