Claims
- 1. A magnetic recording medium composed of an oriented polyethylene terephthalate film as a support layer and a thin magnetic metallic layer formed on one surface (A) of the support layer and optionally a lubricant layer formed on the other surface (B) of the support layer; characterized in that
- (1) the surface A has a center-line average (CLA) of not more than 0.005 .mu.m,
- (2) the surface A has a peak-to-valley (PV) value of not more than 0.06 .mu.m,
- (3) the number of protrusions having a height of 0.27 to 0.54 .mu.m on the surface A is at most 0.2 per mm.sup.2, and
- (4) the surface A is substantially free from protrusions having a height larger than 0.54 .mu.m,
- and wherein the oriented polyethylene terephthalate film support layer is produced by subjecting a lower alkyl ester of a dicarboxylic acid comprising terephthalic acid as a main component and a glycol comprising ethylene glycol as a main component to an ester-interchange reaction in the presence of, as a catalyst, a compound of at least one metal selected from Mn, Zn, Ca and Mg using a glycol solution of a trialkyl phosphate as a stabilizer wherein the concentration of phosphorus in the glycol solution is such that the amount of potassium hydroxide required to titrate the solution to a pH of 9.5 is expressed by the following formula: ##EQU4## wherein (P) is the amount (moles) of phosphorus in the glycol solution titrated, and (KOH) is the amount (moles) of potassium hydroxide required to the titration,
- polycondensing the ester-interchange reaction product, extruding the resultant polyethylene terephthalate, stretching the resulting film, and heat-setting the stretched film.
- 2. The magnetic recording medium of claim 1 wherein the surface A has a center-line average (CLA) of not more than 0.004 .mu.m.
- 3. The magnetic recording medium of claim 1 wherein the surface A is substantially free from protrusions having a height larger than 0.27 .mu.m.
- 4. The magnetic recording medium of claim 1 wherein the thin magnetic metal layer is formed by vacuum evaporation, sputtering, ion plating or electroless plating, and has a thickness of 0.02 to 1.5 .mu.m.
Priority Claims (3)
Number |
Date |
Country |
Kind |
56-45393 |
Mar 1981 |
JPX |
|
56-46348 |
Mar 1981 |
JPX |
|
56-68105 |
May 1981 |
JPX |
|
Parent Case Info
This application is a continuation of application Ser. No. 362,113, filed Mar. 26, 1982, now abandoned.
US Referenced Citations (6)
Number |
Name |
Date |
Kind |
3983285 |
Riboulet et al. |
Sep 1976 |
|
3993824 |
Shirahata et al. |
Nov 1976 |
|
4138386 |
Motegi et al. |
Feb 1979 |
|
4153920 |
Shirahata et al. |
May 1979 |
|
4233352 |
Ono et al. |
Nov 1980 |
|
4304807 |
Kawakami et al. |
Dec 1981 |
|
Continuations (1)
|
Number |
Date |
Country |
Parent |
362113 |
Mar 1982 |
|