Claims
- 1. A method of manufacturing a quantum box device having a plurality of spaced quantum dots comprising the steps of:
- a) forming a first GaAs layer having a thickness of a height of a quantum dot on an AlGaAs substrate,
- b) forming a resist layer on said first GaAs layer which has a pattern corresponding to that of the desired quantum dots,
- c) using said resist layer as a mask to remove said first GaAs layer where not covered by said resist layer,
- d) removing said resist layer,
- e) forming a second GaAs layer over the entire structure including the tops of the quantum dots, the side walls of the quantum dots and the top surface of said AlGaAs substrate between said quantum dots,
- f) removing said second GaAs layer on the tops of said quantum dots and on the top surface of said AlGaAs substrate, and
- g) forming a third AlGaAs layer over the entire structure.
- 2. The method for manufacturing a quantum box device according to claim 1 wherein said quantum dots are spaced a distant 1, said second GaAs layer has a thickness s, and said quantum dots are spaced a distant 1-2s.
- 3. The method for manufacturing a quantum box device according to claim 1 further comprising the step of providing a channel portion made of a third semiconductor among said quantum boxes on said semiconductor substrate.
- 4. The method for manufacturing a quantum box device according to claim 1 wherein said quantum box device include plural shapes of quantum dots which have different symmetries with respect to axes vertical to said semiconductor substrate.
- 5. The method for manufacturing a quantum box device according to claim 1 wherein said quantum box devices include at least cylindrical quantum dots and polygonal prismatic quantum dots.
- 6. The method for manufacturing a quantum device according to claim 5 wherein said quantum box device includes at least cylindrical quantum dots and quadrangular prismatic quantum dots.
- 7. A method of manufacturing a quantum box device having a plurality of spaced quantum dots comprising the steps of:
- a) forming by a first GaAs layer having a thickness of a quantum dot on an AlGaAs substrate,
- b) forming a resist layer on said first GaAs layer which has a pattern corresponding to that of the desired quantum dots,
- c) using said resist layer as a mask to remove said first GaAs layer where not covered by said resist layer,
- d) removing said resist layer,
- e) forming a second GaAs layer over the entire structure including the tops of the quantum dots and the top surface of said AlGaAs substrate between said quantum dots,
- f) removing said second GaAs layer on the tops of said quantum dots and on the top surface of aid AlGaAs substrate, and
- g) forming a channel layer of GaAs over said second layer of GaAs on the top and side walls of said quantum dots and over the top surface of said AlGaAs substrate.
Priority Claims (2)
| Number |
Date |
Country |
Kind |
| 4-237723 |
Aug 1992 |
JPX |
|
| 4-285341 |
Sep 1992 |
JPX |
|
Parent Case Info
This is a division of application Ser. No. 105,121, filed Aug. 12, 1992, now abandoned.
US Referenced Citations (1)
| Number |
Name |
Date |
Kind |
|
5313484 |
Arimoto |
May 1994 |
|
Foreign Referenced Citations (1)
| Number |
Date |
Country |
| 0170044 |
Feb 1986 |
EPX |
Non-Patent Literature Citations (2)
| Entry |
| Fukai et al in "Appl. Phys. Letts 58(18) 1991 (May), pp. 2018-2020" titled GaAs Tetrahedral Quantum Dot Structures . . . . |
| Japanese Journal of Applied Physics, Conf. Solid State Devices and Materials 1990 entitled "Fabrication and Optical Characterization of InGaAs/InP Quantum Wires and Dots", pp. 107-110. |
Divisions (1)
|
Number |
Date |
Country |
| Parent |
105121 |
Aug 1993 |
|