Number | Date | Country | Kind |
---|---|---|---|
00 14807 | Nov 2000 | FR |
Number | Name | Date | Kind |
---|---|---|---|
3178324 | Grange et al. | Apr 1965 | A |
3341372 | Sadowski | Sep 1967 | A |
3642595 | Saul | Feb 1972 | A |
5246511 | Nakamura et al. | Sep 1993 | A |
5441578 | Couderchon et al. | Aug 1995 | A |
5783145 | Coutu et al. | Jul 1998 | A |
5788783 | Coutu et al. | Aug 1998 | A |
5792286 | Inoue et al. | Aug 1998 | A |
5838080 | Couderchon et al. | Nov 1998 | A |
5888848 | Cozar et al. | Mar 1999 | A |
6146474 | Coutu et al. | Nov 2000 | A |
6190465 | Coutu et al. | Feb 2001 | B1 |
6214401 | Chaput et al. | Apr 2001 | B1 |
6309474 | Yagasaki | Oct 2001 | B1 |
6350293 | Carter et al. | Feb 2002 | B1 |
6350324 | Waeckerie et al. | Feb 2002 | B1 |
20010006081 | Uehara et al. | Dec 2000 | A |
Number | Date | Country |
---|---|---|
0 931 844 | Jul 1999 | EP |
1 111 080 | Jun 2001 | EP |
936557 | Sep 1963 | GB |
60-234920 | Nov 1985 | JP |
02285053 | Nov 1990 | JP |
2000-345302 | Dec 2000 | JP |
Entry |
---|
Derwent Acc. No. 1976-85468X abstract for JP 50079417 A, published Jun. 27, 1975.* |
E112-96e1 Standard Test Method for Determing Average Grain Size (Document Summary) for ASTM International. Copyright 2000. 2 pages.* |
Patent Abstracts of Japan, vol. 013, No. 423, Sep. 20, 1989; & JP 01 162726, Jun. 27, 1989. |
Patent Abstracts of Japan, vol. 013, No. 399, Sep. 5, 1989 & JP 01 14052, Jun. 2, 1989. |
Patent Abstracts of Japan, vol. 013, No. 399, Sep. 5, 1989 & JP 01 142021, Jun. 2, 1989. |