Embodiments relate to the design and placement of cell layout for the manufacture of lithography masks.
Multi-patterning techniques in lithography utilize more than one mask in the fabrication of a layer, where an image from each mask is exposed on a resist to define features of the layer. In layout design, multiple colors are used to designate the polygonal features of a mask, where in a multi-patterning layout each color refers to a separate mask. In double-patterning layout techniques, where two colors are employed for two separate masks, design rules include assigning power rails the same color, and maintaining the distance between a polygon and a cell border to be at least one-half the same-color spacing, where the same-color spacing is twice that of the different-color spacing.
For 10 nm process technology where extreme ultraviolet (EUV) lithography is not used, much of the semiconductor industry is moving to triple-patterning lithography in order to further scale pitch size in the M1 layer. The M1 mask layout is relatively difficult to color because it is bi-directional. Accordingly, it is desirable to provide design rules for the M1 metal layer in triple-patterning lithography.
Embodiments of the invention are directed to systems and methods for a mask assignment technique for M1 metal layer in triple-patterning lithography.
An embodiment relates to a method in the manufacture of lithography masks. The method comprises assigning a first color, a second color, and a third color to polygonal patterns in a first cell layout, the first cell layout having power rails assigned a same color chosen from the first, second, and third colors; and assigning the first color, the second color, and the third color to polygonal patterns in a second cell layout, the second cell layout having power rails assigned the same color. In the method, the first and second cell layouts each have left and right boundaries, a same-color spacing, and a different-color spacing, wherein for the first and second cell layouts exactly one polygonal pattern is at one-half the different-color spacing from each left boundary and exactly one polygonal pattern is at one-half the different-color spacing from each right boundary, wherein the exactly one polygonal patterns exclude the power rails of the first and second cell layouts.
Another embodiment relates to a non-transitory computer-readable medium having stored instructions that when executed by a processor performs the above-described method.
Another embodiment relates to a method in the manufacture of lithography masks. The method comprises assigning a first color, a second color, and a third color to polygonal patterns in a first cell layout, the first cell layout having power rails assigned a same color chosen from the first, second, and third colors; and assigning the first color, the second color, and the third color to polygonal patterns in a second cell layout, the second cell layout having power rails assigned the same color. In the method, the first and second cell layouts each have left and right boundaries, a same-color spacing, and a different-color spacing, wherein for the first cell layout exactly one polygonal pattern is at a first distance from a first boundary chosen from the left and right boundaries of the first cell layout, and for the second cell layout exactly one polygonal pattern is at a second distance from a second boundary chosen from the left and right boundaries of the second cell layout, wherein the first and second distances are each greater than or equal to the different-color spacing and are each less than one-half the same-color spacing, wherein the exactly one polygonal patterns exclude the power rails of the first and second cell layouts.
The accompanying drawings are presented to aid in the description of embodiments of the invention and are provided solely for illustration of the embodiments and not limitation thereof.
Aspects of the invention are disclosed in the following description and related drawings directed to specific embodiments of the invention. Alternate embodiments may be devised without departing from the scope of the invention. Additionally, well-known elements of the invention will not be described in detail or will be omitted so as not to obscure the relevant details of the invention.
The term “embodiments of the invention” does not require that all embodiments of the invention include the discussed feature, advantage or mode of operation.
The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of embodiments of the invention. As used herein, the singular forms “a”, “an” and “the” are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms “comprises”, “comprising”, “includes” and/or “including”, when used herein, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
Further, many embodiments are described in terms of sequences of actions to be performed by, for example, elements of a computing device. It will be recognized that specific circuits (e.g., application specific integrated circuits (ASICs)), one or more processors executing program instructions, or a combination of both, may perform the various actions described herein. Additionally, the sequences of actions described herein can be considered to be embodied entirely within any form of computer readable storage medium having stored therein a corresponding set of computer instructions that upon execution would cause an associated processor to perform the functionality described herein. Thus, the various aspects of the invention may be embodied in a number of different forms, all of which have been contemplated to be within the scope of the claimed subject matter. In addition, for each of the embodiments described herein, the corresponding form of any such embodiments may be described herein as, for example, “logic configured to” perform the described action.
Designing a chip layout, manufacturing masks, and wafer processing together involve many hundreds of steps, but for purposes of describing the disclosed embodiments and placing the embodiments within context,
In steps 102 and 104, well-known tools are used in design layout and verification, followed in step 106 by the decomposition of the layout into three single-exposure wafer targets. Well-known RET (Resolution Enhancement Technology), OPC (Optical Proximity Correction), and other computational lithography techniques may be applied in step 108. Verification follows in step 110. In step 112, mask data preparation results in the tapeout files used to manufacture the mask in step 114, where the masks are used in a foundry for wafer processing in step 116. Embodiments pertain to the design layout (step 102), verification (step 104), and decomposition (step 106), where design rules are provided.
In an embodiment, design rules are adhered to with respect to coloring of a cell layout.
Coloring the polygonal patterns of a cell layout refers to assigning the polygonal patterns to a mask. In triple patterning lithography, three colors are used, where each color represents one of three masks. A layout comprises multiple cells placed adjacent to one another, and the design rules according to an embodiment ensure proper mask alignment used in triple-patterning lithography for an M1 layer
Associated with a cell layout is a boundary, where a left boundary and a right boundary may be identified. For example, referring to the cell layout of
Referring to the cell layout of
Letting d denote the different-color spacing for the cell layout of
In the example of
For some embodiments, a more general statement of the design rule is that at most only one (exactly one) polygonal pattern may be at a distance x from a left or right cell boundary, where d/2≦x<s/2.
When placing cell layouts next to each other into a row to synthesize a layout, it may happen that two adjacent cells are such that two polygonal patterns of the same color are separated by the different-color spacing d. For example, suppose in a first cell layout a first polygonal pattern of color B is a distance d/2 from its right boundary, and in a second cell layout a second polygonal pattern of the same color B is a distance d/2 from its left boundary. If the second cell layout is placed adjacent and to the right of the first cell layout, then the first polygonal pattern and the second polygonal pattern are separated by the different-color spacing d, leading to an incorrect layout. In such a case, the color scheme in the second cell layout may be changed so that the color B is switched with another color, say the color C. That is, all polygonal patterns in the second cell layout previously colored B are now colored C, and all polygonal patterns in the second cell layout previously colored C are now colored B. In this way, as a row is built up by placing cell layouts adjacent to each other, color may be swapped if necessary to avoid violating a design rule in which polygonal regions of the same color should be separated by at least the same-color spacing s.
The above embodiments may be illustrated by
The step 306 may be generalized, as discussed previously, to where at most one polygonal pattern is allowed to be at a distance x from a left or right cell boundary, where d/2≦x<s/2.
In
That is, if in placing the second cell layout next to the first cell layout there is a polygonal pattern of color A in the second cell at a distance d (or more generally, a distance x for which x<s) from a polygonal pattern of color A in the first cell layout, then the color scheme for the second cell layout is changed to where colors A and B are substituted. Of course, the polygonal patterns indicated in the step 406 exclude the power rails.
In this way, the design rule for constraining at most one polygonal pattern per cell boundary to lie no closer than one-half the different-color spacing to the left or right cell boundary results in a layout for which polygonal patterns of a first color in a first cell are no closer than the same-color spacing to polygon patterns of the first color in a second cell.
Embodiments pertain to the manufacture of lithography masks, where files for generating the cell layouts and eventually the lithography masks may be data structures stored in a tangible, non-transitory computer-readable medium. For example, in the computer system 500 in
Those of skill in the art will appreciate that information and signals may be represented using any of a variety of different technologies and techniques. For example, data, instructions, commands, information, signals, bits, symbols, and chips that may be referenced throughout the above description may be represented by voltages, currents, electromagnetic waves, magnetic fields or particles, optical fields or particles, or any combination thereof.
Further, those of skill in the art will appreciate that the various illustrative logical blocks, modules, circuits, and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software, or combinations of both. To clearly illustrate this interchangeability of hardware and software, various illustrative components, blocks, modules, circuits, and steps have been described above generally in terms of their functionality. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the overall system. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.
The methods, sequences and/or algorithms described in connection with the embodiments disclosed herein may be embodied directly in hardware, in a software module executed by a processor, or in a combination of the two. A software module may reside in RAM memory, flash memory, ROM memory, EPROM memory, EEPROM memory, registers, hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art. An exemplary storage medium is coupled to the processor such that the processor can read information from, and write information to, the storage medium. In the alternative, the storage medium may be integral to the processor.
Accordingly, an embodiment of the invention can include a computer readable media embodying a method for a mask assignment technique for M1 metal layer in triple-patterning lithography. Accordingly, the invention is not limited to illustrated examples and any means for performing the functionality described herein are included in embodiments of the invention.
While the foregoing disclosure shows illustrative embodiments of the invention, it should be noted that various changes and modifications could be made herein without departing from the scope of the invention as defined by the appended claims. The functions, steps and/or actions of the method claims in accordance with the embodiments of the invention described herein need not be performed in any particular order. Furthermore, although elements of the invention may be described or claimed in the singular, the plural is contemplated unless limitation to the singular is explicitly stated.