Patent Application
20170268823
The present disclosure relates generally to apparatuses for melting batch materials, and more particularly to apparatuses for melting glass batch materials and the measurement of electrode length in such apparatuses.
Melting furnaces can be used to melt a wide variety of batch materials, such as glass and metal batch materials, to name a few. Batch materials can be placed in a vessel having two or more electrodes and melted by applying voltage to the electrodes. The life cycle of a melting furnace can depend, e.g., on electrode wear. For instance, during the melting process, the electrode can be gradually worn down due to contact with the molten batch materials. At some point, the electrode may become too short and may compromise the safe operation of the furnace. For instance, if the electrode wears down past a predetermined point during operation, the batch materials may come into contact with furnace components that may contaminate the batch. In the case of a glass melt, for example, such contact may introduce unwanted contaminants and/or color into the glass melt or final glass product. Moreover, any holes drilled into the electrode and/or furnace can also provide a pathway for leakage of the batch materials, which could compromise the operational safety of the furnace.
The accurate prediction of the end-of-life point for a melting furnace can yield significant cost savings while also maintaining operational safety. In melting furnaces where the electrodes are not replaceable and/or cannot be extended, if one electrode wears to the minimum safe length, then the melting furnace is shutdown. However, during a melting operation, it may not be possible to directly observe or measure the electrode length within the vessel. Applicant has previously calculated electrode length using a mass balance approach. For instance, in the case of an electrode comprising tin oxide, a mass balance of tin oxide in and out of the melt system can be used to estimate remaining electrode length. However, this approach may provide only an average wear value for all electrodes and may not provide information regarding the wear of individual electrode blocks. Additionally, such calculations may have a large margin of error, such as ±30% or more. During operation, several variables can affect the electrode wear rate, such as batch material composition and/or operating temperature, which may complicate the prediction of electrode wear or make a correct prediction impossible.
In the absence of specific values for individual electrode wear, melting furnaces may be shut down early to ensure that the molten batch materials are safely contained. In some instances, it has been discovered that the melting furnaces could have been run safely for several months past the point at which they were shut down. Additional operating time for a melting furnace, e.g., several days or as much as several months, can produce significant capital and operational cost savings.
Accordingly, it would be advantageous to provide methods for accurately estimating the length of electrodes in melting furnaces, which can lead to longer operating times and lower operational costs. Moreover, it would be advantageous to provide apparatuses for melting batch materials that can provide accurate individual electrode endpoint feedback to enable safe operation until the end point is reached.
The disclosure relates to apparatuses for melting batch materials, the apparatuses comprising a vessel; at least one electrode assembly disposed within the vessel comprising an electrode and at least one detection component coupled to the electrode; and at least one device configured to measure at least one electrical or optical property of the electrode assembly. According to various embodiments, the batch materials can be chosen from glass batch materials. In additional embodiments, the detection component can comprise an insulating layer, a conductive core surrounded by an insulating layer, or an optical fiber. According to further embodiments, at least one device can be configured to measure at least one of conductivity, impedance, resistance, capacitance, voltage, light intensity, backscattered light intensity, optical reflectivity, oscillation period, and/or frequency of the electrode assembly.
Also disclosed herein are electrode assemblies comprising an electrode and at least one electrical probe coupled to the electrode, wherein the electrical probe comprises a conductive core and an insulating layer surrounding the conductive core; and at least one device configured to measure the resistance or capacitance of the electrical probe. Further disclosed herein are electrode assemblies comprising an electrode, at least one optical probe coupled to the electrode, and at least one device configured to measure at least one optical property of the at least one optical probe. Also disclosed herein are electrode assemblies comprising an electrode and at least one probe coupled to the electrode, wherein the probe comprises an insulating rod comprising two conductive wires connected to an electrical oscillator circuit, and a device configured to measure the oscillation period or frequency of the oscillator circuit. Still further disclosed herein are apparatuses for melting batch materials, such as glass batch materials, comprising the electrode assemblies disclosed herein.
Additional features and advantages of the disclosure will be set forth in the detailed description which follows, and in part will be readily apparent to those skilled in the art from that description or recognized by practicing the methods as described herein, including the detailed description which follows, the claims, as well as the appended drawings.
It is to be understood that both the foregoing general description and the following detailed description present various embodiments of the disclosure, and are intended to provide an overview or framework for understanding the nature and character of the claims. The accompanying drawings are included to provide a further understanding of the disclosure, and are incorporated into and constitute a part of this specification. The drawings illustrate various embodiments of the disclosure and together with the description serve to explain the principles and operations of the disclosure.
The following detailed description can be best understood when read in conjunction with the following drawings, where like structures are indicated with like reference numerals where possible and in which:
Apparatuses
Disclosed herein are apparatuses for melting batch materials, the apparatuses comprising a vessel; at least one electrode assembly disposed within the vessel comprising an electrode and at least one detection component coupled to the electrode; and at least one device configured to measure at least one electrical or optical property of the electrode assembly.
Embodiments of the disclosure will be discussed with reference to
The term “batch materials” and variations thereof are used herein to denote a mixture of precursor components which, upon melting, react and/or combine to form the final desired product. The batch materials can, for example, comprise glass precursor materials, or metal alloy precursor materials, to name a few. The batch materials may be prepared and/or mixed by any known method for combining precursor materials. For example, in certain non-limiting embodiments, the batch materials can comprise a dry or substantially dry mixture of precursor particles, e.g., without any solvent or liquid. In other embodiments, the batch materials may be in the form of a slurry, for example, a mixture of precursor particles in the presence of a liquid or solvent.
According to various embodiments, the batch materials may comprise glass precursor materials, such as silica, alumina, and various additional oxides, such as boron, magnesium, calcium, sodium, strontium, tin, or titanium oxides. For instance, the glass batch materials may be a mixture of silica and/or alumina with one or more additional oxides. In various embodiments, the glass batch materials comprise from about 45 to about 95 wt % collectively of alumina and/or silica and from about 5 to about 55 wt % collectively of at least one oxide of boron, magnesium, calcium, sodium, strontium, tin, and/or titanium.
The batch materials can be melted according to any method known in the relevant art, e.g., conventional glass and/or metal melting techniques. For example, the batch materials can be added to a melting vessel and heated to a temperature ranging from about 1100° C. to about 1700° C., such as from about 1200° C. to about 1650° C., from about 1250° C. to about 1600° C., from about 1300° C. to about 1550° C., from about 1350° C. to about 1500° C., or from about 1400° C. to about 1450° C., including all ranges and subranges therebetween. The batch materials may, in certain embodiments, have a residence time in the melting vessel ranging from several minutes to several hours to several days, or more, depending on various variables, such as the operating temperature and the batch size. For example, the residence time may range from about 30 minutes to about 3 days, from about 1 hour to about 2 days, from about 2 hours to about 1 day, from about 3 hours to about 12 hours, from about 4 hours to about 10 hours, or from about 6 hours to about 8 hours, including all ranges and subranges therebetween.
In the case of glass processing, the molten glass batch materials can subsequently undergo various additional processing steps, including fining to remove bubbles, and stirring to homogenize the glass melt, to name a few. The molten glass can then be processed, e.g., to produce a glass ribbon, using any known method, such as fusion draw, slot draw, and float techniques. Subsequently, in non-limiting embodiments, the glass ribbon can be formed into glass sheets, cut, polished, and/or otherwise processed.
The vessel 110 can comprise any heat-resistant material suitable for use in a desired melting process, for example, refractory materials such as zircon, zirconia, alumina, magnesium oxide, silicon carbide, silicon nitride, and silicon oxynitride, precious metals such as platinum and platinum alloys, and combinations thereof. According to various embodiments, the vessel 110 can comprise an outer wall or layer (not shown) with an interior lining of heat-resistant material such as a refractory material or precious metal. The vessel 110 can have any suitable shape or size for the desired application and can, in certain embodiments, have a circular, oval, square, or polygonal cross-section. The dimensions of the vessel, including the length, height, width, and depth, to name a few, can vary depending on the desired application. It is within the ability of one skilled in the art to select these dimensions as appropriate for a particular manufacturing process or system.
While
The electrodes 140 can have any dimension and/or shape suitable for operation in a melting furnace. For instance, in some embodiments, the electrodes can be shaped as rods or blocks extending from one or more of the furnace walls. The electrodes can have any suitable cross-sectional shape, such as square, circular, or any other regular or irregular shape. Moreover, the initial length of the electrodes can vary depending on the application and/or size of the melting vessel. In some non-limiting embodiments, the electrodes can have an initial length ranging from about 10 cm to about 200 cm, such as from about 20 cm to about 175 cm, from about 30 cm to about 150 cm, from about 40 cm to about 125 cm, from about 50 cm to about 100 cm, or from about 60 cm to about 75 cm, including all ranges and subranges therebetween.
The electrodes 140 can comprise any material suitable for the desired melting application. For example, the electrode material can be selected such that the normal wear or erosion of the electrode during operation can have little or no detrimental impact on the batch composition and/or final product. In various non-limiting embodiments, such as a glass melting operations, the electrode can comprise one or more oxides or other materials that can be present in the final glass composition. For example, the electrode can comprise an oxide already present in the batch materials (e.g., nominally increasing the amount of the oxide in the final product) or an oxide not present in the batch materials (e.g., introducing small or trace amounts of oxide into the final product). By way of non-limiting example, the electrode can comprise, e.g., stannic tin oxide, molybdenum oxide, zirconium oxide, tungsten, molybdenum zirconium oxide, platinum and other noble metals, graphite, silicon carbide, and other suitable materials and alloys thereof.
According to various embodiments of the disclosure, the vessel 110 can comprise one or more electrode assemblies comprising an electrode and at least one detection component coupled to the electrode. As used herein, the terms “detection component,” “detection structure,” “probe,” and variations thereof are intended to denote any component that, alone or in conjunction with the electrode, can generate a measurable signal or participate in generating a signal, e.g., an electrical or optical signal. The detection component itself can generate a signal, or can be positioned within or adjacent the electrode so as to facilitate the generation of a signal by the electrode itself. For instance, in non-limiting embodiments, the detection component can be chosen from electrical probes, e.g., probes generating an electrical signal such as conductivity, impedance, resistance, capacitance, oscillation period or frequency of a circuit, etc.; and optical probes, e.g., probes generating an optical signal such as light intensity, backscattered light intensity, optical reflectivity, etc. In alternative embodiments, the detection component can be chosen from an insulating component which can, e.g., separate the electrode into two or more portions thereby generating an electrical signal (e.g., capacitance) between the two portions that can be detected.
As used herein the term “coupled to” and variations thereof is intended to denote that a detection component (e.g., probe, optical fiber, etc.) is in physical contact with an electrode. The detection component can be located within the electrode, for instance, inside a hole or channel drilled into or otherwise formed in the electrode. In various embodiments, the detection component can be located at least partially within the electrode. For instance, the detection component can comprise two ends and a center portion between the two ends, and one or both of the ends can be external to the electrode while at least a portion of the detection component (e.g., at least one end or at least a part of the center portion of the component) can be located within the electrode. The portion of the detection component external to the electrode can be connected, e.g., to the at least one detection device. The detection component can also be located on a surface of the electrode, e.g., physically attached to a surface of the electrode.
The apparatuses disclosed herein can comprise various detection mechanisms for estimating the length of an electrode. In some embodiments, the apparatuses may comprise an end-point detection system. In such apparatuses, a property (e.g., electrical or optical property) can change abruptly when the molten batch materials reach a specified point in the electrode. For instance, a change in an electrical property, such as resistance and/or voltage, can occur when the batch materials make first physical contact with a detection structure or probe disposed within the electrode. In other embodiments, the apparatuses may comprise a calibrated length measurement system. In such apparatuses, a property (e.g., electrical or optical property) can change gradually as the electrode length changes. A detection structure or probe can be coupled to the electrode, e.g., within the electrode or adjacent the electrode, and can wear at a rate similar or identical to the electrode wear rate. The probe thus acts as a proxy for the length of the electrode. The electrode length can be estimated by measuring a property of the probe, such as impedance, capacitance, time of flight of electromagnetic radiation, electromagnetic spectral response, oscillation period, frequency, or optical transmission, and correlating the property to the length of the probe and, thus, the length of the electrode.
Electrical Detection
Disclosed herein are electrode assemblies comprising an electrode; at least one electrical probe coupled to the electrode, wherein the electrical probe comprises a conductive core and an insulating layer surrounding the conductive core; and at least one device configured to measure the resistance or capacitance of the electrical probe. In additional embodiments, the electrode assembly can comprise a detection component chosen from insulating layers (e.g., without a conductive core). Apparatuses for melting batch materials, such as glass batch materials, comprising such electrode assemblies are also disclosed herein.
The minimum electrode length Lmin can be any length at which it may be advantageous to halt operations, whether for safety reasons or other operational concerns. In certain embodiments, the detection component can signal that the electrode length is less than about 100 mm in length, such as less than about 75 mm, less than about 60 mm, less than about 50 mm, or less than about 40 mm, including all ranges and subranges therebetween. For example, structures in the electrode and/or the holes drilled to accommodate such structures can extend into the electrode to a depth of about 40 mm from the cold end. In various embodiments, a margin of safety, such as greater than about 10 mm, e.g., from about 10 mm to about 35 mm, can be added to ensure safe operation of the furnace.
The detection component 150 can, in some embodiments, be an electrical probe comprising a conductive core 150a surrounded by an insulating layer 150b. Both the conductive core and the insulating layer should be chosen to withstand the working temperatures of the melting apparatus. The conductive core can comprise any number of conductive materials including, but not limited to, metals, metal alloys, metal oxides, and combinations thereof. These materials may or may not be soluble in the molten batch materials M. In certain embodiments, the core can comprise precious metals and alloys, such as platinum and platinum alloys, e.g., Pt/Rh alloys. The insulating layer can be chosen from any number of non-conductive materials, such as ceramic and glass materials, e.g., glass, alumina, fused silica, and other oxides that may be present in the molten batch materials, to name a few. A non-limiting embodiment of a commercially available insulating material is the high temperature, high silica-content Vycor® glass from Corning Incorporated. According to various embodiments, the insulating layer can be soluble in and/or otherwise destructible by the molten batch materials M.
The conductive core and/or insulating layer materials can be chosen, in certain embodiments, from materials that may not significantly contaminate the batch materials and/or final product. For instance, the conductive core can comprise a material that either does not dissolve or does not substantially dissolve in the batch materials at the operating temperature (e.g., Pt and Pt alloys). Alternatively, the conductive core and/or insulating layer can comprise a material that can dissolve in the batch materials, but does not introduce undesired material or properties (e.g., contaminants and/or coloration) to the batch and/or final product, such as a material the same as or similar to that used to construct the electrode. Thus, in some non-limiting embodiments, the probe can be constructed from materials already present in the batch composition or materials that can be present in the final product (e.g., not originally present in the batch composition) without producing undesirable results.
The dimensions of the detection component 150 can vary depending on the application and, for instance, the size of the electrode to which it is coupled. The detection component can, for example, be chosen from rods, wires, or blocks of electrically conductive material sheathed with at least one layer of a non-conductive material. In certain embodiments, the probe can measure and provide additional information relevant to the melt process, such as temperature, pressure, etc. Accordingly, the probe can, in various embodiments, comprise a conductive thermocouple with a non-conductive sheath.
Non-limiting examples of suitable probe dimensions can include, e.g., a diameter or thickness ranging from about 3 mm to about 15 mm, such as from about 5 mm to about 12 mm, or from about 8 mm to about 10 mm, including all ranges and subranges therebetween. In additional embodiments, the insulating layer can have a thickness ranging from about 0.5 mm to about 10 mm, such as from about 1 mm to about 8 mm, from about 2 mm to about 7 mm, from about 3 mm to about 6 mm, or from about 4 mm to about 5 mm, including all ranges and subranges therebetween.
The probe can be disposed at least partially within the electrode, such as within a hole or channel drilled or otherwise provided in the electrode. The diameter of such a hole or channel can vary as desired, keeping in mind various practical considerations. For example, the diameter should be small enough to avoid reducing the structural integrity of the electrode while also being large enough to accommodate the probe and reduce or avoid manufacturing difficulties. According to various embodiments, the diameter can range from about 5 mm to about 40 mm, such as from about 10 mm, to about 35 mm, from about 15 mm to about 30 mm, or from about 20 mm to about 25 mm, including all ranges and subranges therebetween.
For instance, as illustrated in
The resistance Rc and capacitance C of the conductive core can be proportional to the length L of the detection component. The resistance of the core can be estimated using formula (1):
and the capacitance of the core can be estimated using formula (2):
where d is the diameter of the conductive core, w is the insulating gap width, ∈ is the insulation dielectric constant, ∈o is the dielectric vacuum permittivity, ρc is the core resistivity, L is the electrode length, and A is the cross-sectional area of the core. During length measurement, the detection component should not be electrically connected to the electrode. The measured electrical property Z1 at the initial length L can be compared to the measured electrical property Z2, which may indicate that the detection component has reached a shorter length L1. For example, by monitoring the resistance Rc and/or capacitance C of the detection component, e.g., electrical probe, it can be possible to estimate the length L1 of the detection component (and thus the electrode) at any given point in time.
The resistance of the core may, in some embodiments, be relatively small as compared to the resistance of the molten batch materials. Thus, in various embodiments, it may be advantageous to measure the capacitance of the core. Capacitance measurements can be made using any method known in the art, for instance, standard methods for impedance measurement. Alternatively, the detection component surrounded by the conducting electrode can be effectively conceptualized as a “coaxial cable” terminated by a resistor (molten batch materials). Measuring the length of the “coaxial cable” (and thus the electrode length) can thus be carried out using standard Time Domain Reflection (TDR) methods or by measuring the resonant frequencies.
While
As with the one-dimensional detection component, the resistance and capacitance can be proportional to the surface area of the detection component and thus the length L (and height h) of the detection component (A=h×L). As depicted in
By way of a non-limiting example, the detection component 150 can be a multi-vibrator comprising two transistors connected as a differential pair. The two conductive wires 150c can be threaded into the insulating material 150b or rod (also referred to herein as a “stub”), which can be embedded in the electrode to create a shorted (e.g., in the molten batch materials M) transmission line. A signal propagated down the length of the stub is reflected off of the mismatched end of the wire. An initial negative going pulse is created when the first transistor is switched on (or conducts) and forms a positive going pulse after reflection from the mismatched end. When coupled into the base of the opposing second transistor, the positive pulse causes it to conduct and switch off the first transistor, and vice versa. The delay between the transistor on-off switching can be measured as an oscillation period.
Again, the insulating material should erode at a rate similar to or the same as the rate of electrode wear. While the wires themselves may not disintegrate or dissolve in the molten batch materials M (as shown in
τ=AL
s
+B (3)
Frequency can be expressed as the inverse of the period (f=1/τ) and can be similarly correlated to the stub length Ls (and thus the electrode length).
Optical Detection
Disclosed herein are electrode assemblies comprising an electrode, at least one optical probe coupled to the electrode, and at least one device configured to measure at least one optical property of the at least one optical probe. Apparatuses for melting batch materials, such as glass batch materials, comprising such electrode assemblies are also disclosed herein.
According to certain embodiments, the optical fiber can be hollow or can comprise a core, such as a pure silica core or a silica core doped with at least one dopant, such as index-increasing dopants, e.g., Ge, P, Al, and/or Ti. The core delta can range, for instance, from about 0.2% to about 2%, such as from about 0.3% to about 1.8%, from about 0.5% to about 1.5%, or from about 0.8% to about 1.2%, including all ranges and subranges therebetween. The core diameter can also vary, ranging for example, from about 5 microns to about 500 microns, such as from about 8 microns to about 400 microns, from about 10 microns to about 300 microns, from about 20 microns to about 200 microns, or from about 50 microns to about 100 microns, including all ranges and subranges therebetween. The optical fiber can further comprise a cladding layer which can, in some embodiments, comprise pure silica or silica doped with at least one dopant, e.g., index-decreasing dopants such as F and/or B, or index-increasing dopants, such as Ge, P, Al, and/or Ti. Other dopants can also be added to the fiber, e.g., to change the melting temperature of the fiber, such as CI, K, and/or Na dopants.
The diameter of the optical probe can vary depending on several operating parameters and can range, for example, from about 100 microns to about 10 mm, such as from about 200 microns to about 5 mm, from about 300 microns to about 3 mm, from about 400 microns to about 2 mm, or from about 500 microns to about 1 mm, including all ranges and subranges therebetween. In various embodiments, the optical probe can be inserted into the electrode through a hole or channel. The end point of the probe can correspond to the end of the electrode in contact with the molten batch materials M. The detection component 150, e.g., optical probe, can be connected to a measurement device 160, such as an optical reflectometer (e.g., OBR4600 by LUNA). The length of the optical probe can thus be estimated by measuring the backscattered signal. By assuming that the optical probe is consumed at a rate substantially similar to or the same as the electrode erosion rate, the estimated length of the optical probe can be correlated to the length of the electrode.
According to various embodiments, the optical probe may have a higher softening point than the surrounding electrode, but exposure to the molten batch materials can dissolve the probe in various embodiments. The rate of dissolution of the optical probe can, in certain instances, be higher than the rate of electrode wear. After a period of wear, however, it is believed that the dissolution rate can approximately match the electrode wear as the probe becomes further embedded in the electrode, which can limit exposure. Thus, any offset between the end point of the electrode and the end point of the optical probe can decrease and stabilize over time thereby improving measurement accuracy.
A still further exemplary and non-limiting electrode assembly according to various embodiments of the disclosure is depicted in
Until the molten batch materials reach the fiber, light from the source 165 can travel continuously through the loop and can be detected by the measuring device 160. When the molten batch materials reach the loop, the fiber will melt or dissolve into the molten batch materials and, in some instances, form two or more discontinuous segments, thereby significantly reducing or eliminating the light intensity registered by the measuring device. The measuring device can detect, e.g., a decrease in optical intensity, thus signaling that the minimum electrode length has been reached. As with the configuration illustrated in
In additional embodiments, the configuration illustrated in
Embodiments described herein should not be limited to any specific glass forming process as these embodiments are equally applicable to melters used in fusion forming processes (down draw, slot draw, and the like) as well as to melters used in float forming processes. Furthermore, it is envisioned that embodiments described herein can be used in conjunction with processes and systems which are used to push an exemplary electrode into the melt during the life of the electrode.
It is to be understood that the apparatuses disclose herein are not limited to one type of electrode assembly and can, in various embodiments, comprise combinations of electrode assemblies, such as combinations of assemblies employing electrical or optical detection components and/or combinations of assemblies employing end-point or calibrated length detection components. Moreover, it is to be understood that the various components describe in conjunction with specific embodiments can be used interchangeably to describe similar components in other embodiments without limitation. Further, the detection methods described herein can also be used to measure the length of other components in the melting furnace other than electrodes, e.g., any refractory component that may limit the lifespan of the melter.
The apparatuses disclosed herein may provide one or more advantages over prior art apparatuses. In certain embodiments, the apparatuses disclosed herein can reduce operational down time by enabling electrode length measurement in situ, without the need to drain the batch materials to allow visual assessment of the electrodes. Additionally, the apparatuses disclosed herein can provide more accurate endpoint feedback so as to avoid premature shutdown, thereby providing significant cost savings, while also avoiding glass leakage, thereby ensuring operational safety. Moreover, the electrode assemblies disclosed herein can be retrofit to existing melting furnaces, e.g., by modifying existing electrodes to include one or more detection components, either on the surface of the electrode or within the electrode itself. Measurement of electrical properties to estimate electrode length can be performed using standard methods and equipment and, thus, implementation of these measurements may not substantially increase operational costs. Finally, optical measurement of electrode length may avoid any electrical interference with high power and high voltage circuits. Of course, it is to be understood that the apparatuses disclosed herein may not have one or more of the above advantages, but such apparatuses are intended to fall within the scope of the appended claims.
It will be appreciated that the various disclosed embodiments may involve particular features, elements or steps that are described in connection with that particular embodiment. It will also be appreciated that a particular feature, element or step, although described in relation to one particular embodiment, may be interchanged or combined with alternate embodiments in various non-illustrated combinations or permutations.
It is also to be understood that, as used herein the terms “the,” “a,” or “an,” mean “at least one,” and should not be limited to “only one” unless explicitly indicated to the contrary. Thus, for example, reference to “an electrode” includes examples having two or more such electrodes unless the context clearly indicates otherwise.
Ranges can be expressed herein as from “about” one particular value, and/or to “about” another particular value. When such a range is expressed, examples include from the one particular value and/or to the other particular value. Similarly, when values are expressed as approximations, by use of the antecedent “about,” it will be understood that the particular value forms another aspect. It will be further understood that the endpoints of each of the ranges are significant both in relation to the other endpoint, and independently of the other endpoint.
The terms “substantial,” “substantially,” and variations thereof as used herein are intended to note that a described feature is equal or approximately equal to a value or description. Moreover, “substantially similar” is intended to denote that two values are equal or approximately equal. In some embodiments, “substantially similar” may denote values within about 10% of each other, such as within about 5% of each other, or within about 2% of each other.
Unless otherwise expressly stated, it is in no way intended that any method set forth herein be construed as requiring that its steps be performed in a specific order. Accordingly, where a method claim does not actually recite an order to be followed by its steps or it is not otherwise specifically stated in the claims or descriptions that the steps are to be limited to a specific order, it is no way intended that any particular order be inferred.
While various features, elements or steps of particular embodiments may be disclosed using the transitional phrase “comprising,” it is to be understood that alternative embodiments, including those that may be described using the transitional phrases “consisting” or “consisting essentially of,” are implied. Thus, for example, implied alternative embodiments to an apparatus that comprises A+B+C include embodiments where an apparatus consists of A+B+C and embodiments where an apparatus consists essentially of A+B+C.
It will be apparent to those skilled in the art that various modifications and variations can be made to the present disclosure without departing from the spirit and scope of the disclosure. Since modifications combinations, sub-combinations and variations of the disclosed embodiments incorporating the spirit and substance of the disclosure may occur to persons skilled in the art, the disclosure should be construed to include everything within the scope of the appended claims and their equivalents.
This application claims the benefit of priority to U.S. Application No. 62/084,154 filed Nov. 25, 2014 the content of which is incorporated herein by reference in its entirety.
| Filing Document | Filing Date | Country | Kind |
|---|---|---|---|
| PCT/US2015/061443 | 11/19/2015 | WO | 00 |
| Number | Date | Country | |
|---|---|---|---|
| 62084154 | Nov 2014 | US |
