Claims
- 1. A mechanical sensor for measuring distortion, consisting of a thermostable polymer layer having a major upper surface and a major lower surface, a conductive upper part (A) that is formed in the major upper surface and an insulating lower part (B) which forms the rest of the polymer layer, wherein the resistance of the upper part (A) varies with distortion of the polymer layer.
- 2. A mechanical sensor as claimed in claim 1 in which the upper part (A) includes linear patterns aligned with the direction of the sensor distortion and connected in series to increase the sensitivity of the sensor.
- 3. A mechanical sensor as claimed in claim 1 or 2 in which the distortion of the polymer layer is used to measure a pressure applied to the lower part (B) of the polymer layer which is thereby made concave.
- 4. A mechanical sensor as claimed in claim 1 in which the polymer is a polyimide.
- 5. A mechanical sensor as claimed in claim 1, in which the polymer is a polyphenylquinoxaline.
- 6. A mechanical sensor as claimed in claim 1, in which the polymer is a phenylene polysufide.
- 7. A sensor according to claim 1, further comprising means for measuring the resistance of the upper part (A).
- 8. A sensor according to claim 1, wherein there is an interface between the upper part (A) and the lower part (B) and the interface is a progressive interface.
- 9. A mechanical sensor according to claim 1, wherein thickness of the upper part (A) is about 1 micron.
- 10. A sensor according to claim 9, wherein thickness of both the upper part (A) and the lower part (B) is between 100 and 200 microns.
- 11. A sensor according to claim 1, further comprising an aperture formed by rigid material; and
- wherein the film is attached over the aperture to block the aperture.
- 12. A sensor according to claim 1 or claim 2, wherein the polymer layer is an ion-beam irradiated polymer layer.
- 13. A sensor according to claim 1, wherein the resistivity as a function of bend angle of the polymer layer is approximately linear over the range between 0 and 180 degrees.
- 14. A sensor according to claim 1 in which the polymer layer is bent at a bend angel of between 10 and 180 degrees.
- 15. A sensor according to claim 14, wherein the bent polymer layer major upper surface, which includes the upper part, is convex.
- 16. A sensor according to claim 15, wherein the resistivity of the upper part is less than 100 ohms per centimeter.
- 17. A sensor according to claim 14, wherein the upper part consists of ion irradiated thermostable polymer.
- 18. A sensor according to claim 17, wherein the upper part consists of ion irradiated thermostable polymer of the same composition as the lower part, but which has been irradiated at an ion flux density of greater than about 10.sup.16 ions per square centimeter.
Priority Claims (1)
Number |
Date |
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91 15640 |
Dec 1991 |
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Parent Case Info
This application is a Continuation of Ser. No. 07/989,655, filed on Dec. 14, 1992, now abandoned.
US Referenced Citations (8)
Foreign Referenced Citations (5)
Number |
Date |
Country |
65419 |
Nov 1982 |
EPX |
87665 |
Sep 1983 |
EPX |
321225 |
Jun 1989 |
EPX |
451636 |
Oct 1991 |
EPX |
2196790 |
May 1988 |
GBX |
Non-Patent Literature Citations (2)
Entry |
Kagerer, Thin Solid Films, vol. 182, No. 1, Dec. 1989, pp. 333-344. "Ion Beam Sputter Deposition of Thin Film Sensors for Applications in Highly Loaded Contacts". |
Norihiro, Patent Abstracts of Japan, JP3093201, Apr. 18, 1991. "Resistance Element, and Changeable Resistor and Heater Using It". |
Continuations (1)
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Number |
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Parent |
989655 |
Dec 1992 |
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