The present invention relates to illumination devices, and more particularly, is related to high-intensity arc lamps.
High intensity arc lamps are devices that emit a high intensity beam. The lamps generally include a gas containing chamber, for example, a glass bulb, with an anode and cathode that are used to excite the gas (ionizable medium) within the chamber. An electrical discharge is generated between the anode and cathode to provide power to the excited (e.g. ionized) gas to sustain the light emitted by the ionized gas during operation of the light source.
There are three main subassemblies in the prior art lamp 100: cathode; anode; and reflector. A cathode assembly 3a contains a lamp cathode 3b, a plurality of struts holding the cathode 3b to a window flange 3c, a window 3d, and getters 3e. The lamp cathode 3b is a small, pencil-shaped part made, for example, from thoriated tungsten. During operation, the cathode 3b emits electrons that migrate across a lamp arc gap and strike an anode 3g. The electrons are emitted thermionically from the cathode 3b, so the cathode tip must maintain a high temperature and low-electron-emission to function.
The cathode struts 3c hold the cathode 3b rigidly in place and conduct current to the cathode 3b. The lamp window 3d may be ground and polished single-crystal sapphire (AlO2). Sapphire allows thermal expansion of the window 3d to match the flange thermal expansion of the flange 3c so that a hermetic seal is maintained over a wide operating temperature range. The thermal conductivity of sapphire transports heat to the flange 3c of the lamp and distributes the heat evenly to avoid cracking the window 3d. The getters 3e are wrapped around the cathode 3b and placed on the struts. The getters 3e absorb contaminant gases that evolve in the lamp during operation and extend lamp life by preventing the contaminants from poisoning the cathode 3b and transporting unwanted materials onto a reflector 3k and window 3d. The anode assembly 3f is composed of the anode 3g, a base 3h, and tubulation 3i. The anode 3g is generally constructed from pure tungsten and is much blunter in shape than the cathode 3b. This shape is mostly the result of the discharge physics that causes the arc to spread at its positive electrical attachment point. The arc is typically somewhat conical in shape, with the point of the cone touching the cathode 3b and the base of the cone resting on the anode 3g. The anode 3g is larger than the cathode 3b, to conduct more heat. About 80% of the conducted waste heat in the lamp is conducted out through the anode 3g, and 20% is conducted through the cathode 3b. The anode is generally configured to have a lower thermal resistance path to the lamp heat sinks, so the lamp base 3h is relatively massive. The base 3h is constructed of iron or other thermally conductive material to conduct heat loads from the lamp anode 3g. The tubulation 3i is the port for evacuating the lamp 100 and filling it with Xenon gas. After filling, the tabulation 3i is sealed, for example, pinched or cold-welded with a hydraulic tool, so the lamp 100 is simultaneously sealed and cut off from a filling and processing station. The reflector assembly 3j consists of the reflector 3k and two sleeves 3l. The reflector 3k may be a nearly pure polycrystalline alumina body that is glazed with a high temperature material to give the reflector a specular surface. The reflector 3k is then sealed to its sleeves 3l and a reflective coating is applied to the glazed inner surface.
During operation, the anode and cathode become very hot due to electrical discharge delivered to the ionized gas located between the anode and cathode. For example, ignited Xenon plasma may burn at or above 15,000 C, and a tungsten anode/cathode may melt at or above 3600 C degrees. The anode and/or cathode may wear and emit particles. Such particles can impair the operation of the lamp, and cause degradation of the anode and/or cathode.
For existing laser sustained plasma lamps constructed with traditional brazing methods, these braze interfaces have to be cooled down to around 300 degrees Celsius for envelope and seal integrity over life of the product. Because of said cooling, the operating temperature of the lamp is not ideal to minimize gas turbulence in the envelopes of such lamps. It has been shown that operating at a higher lamp envelope temperature minimizes gas turbulence significantly with an improved plasma stability and higher radiance over aperture as a direct result. Similarly, some existing laser sustained plasma lamps are formed of a material that is not compatible with a mercury enhanced fill gas to obtain high internal operating pressure. Therefore, there is a need to address one or more of the above mentioned shortcomings.
Embodiments of the present invention provide a mechanically sealed tube for a laser sustained plasma lamp and a production method for same. Briefly described, the present invention is directed to a laser sustained plasma lamp having a mechanically sealed pressurized chamber assembly configured to contain an ionizable material. The chamber assembly is bounded by a chamber tube, an ingress sapphire window, a first metal seal ring configured to seal against the chamber tube ingress end and the ingress sapphire window, an egress sapphire window, and a second metal seal ring configured to seal against the chamber tube egress end and the egress sapphire window. A mechanical clamping structure external to the chamber assembly is configured to clamp across at least a portion of the ingress sapphire window and the egress sapphire window. The ingress sapphire window and the egress sapphire window are not connected to the chamber tube via welding and/or brazing.
Other systems, methods and features of the present invention will be or become apparent to one having ordinary skill in the art upon examining the following drawings and detailed description. It is intended that all such additional systems, methods, and features be included in this description, be within the scope of the present invention and protected by the accompanying claims.
The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification. The components in the drawings are not necessarily to scale, emphasis instead being placed upon clearly illustrating the principles of the present invention. The drawings illustrate embodiments of the invention and, together with the description, serve to explain the principles of the invention.
The following definitions are useful for interpreting terms applied to features of the embodiments disclosed herein, and are meant only to define elements within the disclosure.
As used within this disclosure, a lens refers to an optical element that redirects/reshapes light passing through the optical element. In contrast, a mirror or reflector redirects/reshapes light reflected from the mirror or reflector.
As used within this disclosure, a direct path refers to a path of a light beam or portion of a light beam that is not reflected, for example, by a mirror. A light beam passing through a lens or a flat window is considered to be direct.
As used within this disclosure, “substantially” means “very nearly,” or within normal manufacturing tolerances. For example, a substantially flat window, while intended to be flat by design, may vary from being entirely flat based on variances due to manufacturing.
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings. Wherever possible, the same reference numbers are used in the drawings and the description to refer to the same or like parts.
Laser sustained plasma lamps include a pressurized chamber containing ionizable media (noble gas mixture) that is ignited to form a plasma and sustained by laser light entering the chamber (or envelope) via an ingress window. As noted in the Background section, high intensity light produced by the plasma is emitted from the chamber, for example, via an egress window or waveguide. Plasma lamp chambers have been constructed with traditional brazing methods, where the operating temperature of the lamp must be capped to keep the braze interfaces around 300 degrees Celsius or below for envelope and seal integrity over the life of the lamp. However, such an operating temperature is not ideal to minimize gas turbulence within the chamber. Further the brazing materials may not be compatible with certain ionizable media. Envelopes where Sapphire windows are welded to Sapphire tubes have been difficult and expensive to produce (see U.S. Pat. No. 9,230,771 B2).
The first exemplary embodiment is directed to a sealable pressurized laser sustained plasma lamp 300 having a sapphire chamber (or “envelope”).
The ingress metal seal ring 320 may be in contact with both the flat portion 316 of the sapphire tube 310 and the interior surface 341 of the ingress sapphire window 340, to provide a seal therebetween. Likewise, the egress metal seal ring 322 may be in contact with both the flat portion 316 of the sapphire tube 310 and the interior surface 343 of the egress sapphire window 342, to provide a seal therebetween. Preferably, the sapphire tube 310 does not directly contact either the ingress sapphire window 340 or the egress sapphire window 342, the metal seal rings 320, 322 providing a gap that while very small, serves as buffer for thermal expansion of the windows 340, 342 and/or the sapphire tube 310 in both the egress and ingress directions.
While the inset portions 315 are shown in the drawings as having an L-shaped cross-section, other configurations are possible, for example, a curved cross section. The inset cross-section shape is preferably formed to exert pressure upon the metal mechanical seal rings 320, 322, holding the metal mechanical seal rings 320, 322 between the sapphire windows 340, 342 and the sapphire tube 310.
Rather than brazing the sapphire windows 340, 342 to the sapphire tube 310, the metal mechanical seal rings 320, 322 are used at each end of the tube 310 to seal between the tube 310 and the windows 340, 342. The metal seal rings 320, 322 are configured to fit tight against the sapphire windows 340, 342 and the sapphire tube 310 and provide a seal to contain the ionizable medium, for example, Xenon and/or Krypton, and (when ignited) plasma within the chamber 330. The metal seal rings 320, 322 may be a C-shape, O-shape, V-shape or W-shape, among other possible configurations, and are preferably formed from type 300 stainless steel or Alloy X 750 or Alloy 718, among others.
The metal seal rings 320, 322 may have a compressibility on the order of about 40 microns. While the metal seal rings 320, 322 are preferably soft plated, microscopic leaks may still be possible that over long term can depressurize the cavity 330. In order to ensure an improved seal, the area where the metal seal rings 320, 322 mate with the sapphire tube 310 may optionally be soft coated also, for example, with gold, silver, or (preferably) soft nickel. The seals themselves are configured to handle up to 50,000 psi at temperatures up to 1300 F, or higher.
Portions of the mated surfaces of the sapphire tube 310 and windows 340, 342 and/or the metal surfaces of the metal seal rings 320, 322 may be plated with a soft metal such as gold, silver, or nickel to suppress leakage of the ionizable material from the mechanical seal. The sapphire tube 310 may have one or more sealable portals (not shown) for filling and/or venting the ionizable material.
The chamber assembly 330 may be mechanically held together by an external structure that functions as a clamp applying pressure upon the ingress end of the ingress sapphire window 340 and the egress end of the egress window 342. This clamping pressure may be used to at least partially maintain the seal by the ingress metal seal ring 320 between the ingress sapphire window 340 and the sapphire tube 310, and also the seal by the egress metal seal ring 322 between the egress sapphire window 342 and the sapphire tube 310.
Under the first embodiment, the mechanical clamping is performed by a welded two piece sleeve structure 350, 355. As shown by
The first sleeve portion 350 and the second sleeve portion 355 may be substantially cylindrical in shape, so that at least an interior portion of the first sleeve portion 350 and the second sleeve portion 355 conforms to the exterior wall 312 of the chamber assembly 330.
The first sleeve portion 350 may include a first annular inward projecting lip portion 351 configured to abut the ingress sapphire window 340. Similarly, the second sleeve portion 355 may include a second annular inward projecting lip portion 356 configured to abut the egress window 342. When the first sleeve portion 350 is welded to the second sleeve portion 355, the first annular inward projecting lip portion 351 applies pressure to the ingress sapphire window 340, and similarly, the second annular inward projecting lip portion 356 applies pressure to the egress window 342, thereby holding the chamber assembly 330 together.
The first sleeve portion 350 is configured to mate with the second sleeve portion 355 at a weld joint 370 (
While under the first embodiment the first sleeve portion 350 and the second sleeve portion 355 are joined at a weld joint 370 across the mating portion 362 and the projecting flange 361 above the within an annular recess 360, other joint configurations are possible.
While
Under alternative embodiments, Kovar or Invar may be used as the tube material instead of sapphire, for example for a lamp operating at temperatures from 300 C up to around 900 C, having an operating pressure within the chamber 330 of up to 3500 psi. The windows 340, 342 may have diameters, for example, between 8 mm and 100 mm. In different embodiments, the windows 340, 342 may be coated to pass and/or reflect desired wavelengths. The windows 340, 342 may be fashioned as ingress and/or egress lenses to shape the ingress laser light and/or the egress high intensity light.
In general, the lamp 300 may not include traditional ignition electrodes, for example, electrodes piercing the sapphire tube 310. Instead, the lamp 300 may ignited via the energy of the ingress laser. Under alternative embodiments, active charge carriers such as Kr-85 and/or an internal passive thoriated tungsten electrode ring may be accommodated within the chamber 330 to facilitate ignition (ionization of the ionizable medium).
As shown by
While the first embodiment includes a chamber assembly 330 with a tube 310, two sapphire windows 340, 342 and two metal seal rings 320, 322, under a second embodiment (not shown), the chamber assembly may have a tube having one open end and a closed end, where the open end is sealed with a window and a metal seal ring in a manner similar to the first embodiment. Other alternative embodiments where the chamber tube is not welded and held together via a welded external structure/clamp are possible.
As shown by block 710, the components for the lamp 300 (e.g., and the sleeve 350, 355 and the chamber assembly 330 including the tube 310, the metal seal rings 320, 322, and the windows 340, 342) are placed inside a jig 610 within the pressurized tooling chamber 600, for example, at atmospheric pressure. Here, while the components of the chamber assembly 330 are mechanically held in position by the sleeve 350, 355, the chamber assembly 330 is not functionally sealed.
The pressurized tooling chamber 600 is sealed, as shown by block 720. The pressurized tooling chamber 600 is filled with the ionizable medium used to fill the chamber 330 of the lamp 300, as shown by block 730. The pressurized tooling chamber 600 is then pressurized, for example, between 250-2000 psi. A movable rod 630 within the pressurized tooling chamber 600 is used to push the windows 340, 342 and the metal seal rings 320, 322 together with the sapphire tube 310 to form a seal of the chamber assembly 330, as shown by block 740. For example, the rod may compress the lamp 300 against the jig 610.
Once a seal of the chamber assembly 330 is achieved, the tooling chamber is evacuated, as shown by block 750. For example, the engagement of the seals may be measured as the movable rod 630 pushes both sapphire windows 340, 342 against the metal seal rings 320, 322, which may flex a bit as the seals engaged. The fill gas (ionizable medium) may be retrieved for future fill-processing.
The metal sleeve portions 350, 355 are welded together, as shown by block 760, for example, via TIG welding. The movable rod 630 may be released after the TIG welding, the TIG welded sleeve 350, 355 takes over the function of restraining the windows 340, 342. The TIG weld need not be contiguous for 360 degrees around the perimeter of the sleeve 350, 355. For example, three 90% sections or another suitable configuration may suffice to maintain the integrity of the sleeve 350, 355 with respect to the design of the pressurized tooling chamber 600. The TIG welded metal sleeves 350, 355 serve as a clamp to hold the windows 340, 342 and sapphire tube 310 together against all pressure, so the windows 340, 342, which are pushed outward against the sleeves 350, 355 by the chamber assembly 330 internal fill gas pressure, are fully contained over life of the product.
In alternative embodiments, instead of TIG welding the metal sleeves 350, 355 together under atmospheric pressure, the metal sleeves 350, 355 may be brazed before the tooling chamber is evacuated, for example, via a radio frequency (RF) coil embedded within at least one of the metal sleeves 350, 355. A current passing through the RF coil heats the metal sleeves to enable the braze with a nonferrous alloy having a lower melting point than the metal sleeves 350, 355.
While the above method is described with respect to a sapphire window and tube, this method is not limited to a sapphire window and/or sapphire tube sealing. For example, this method may be applied to a sapphire window (or a window of another material) sealing to any high-temperature and chemical inert tube. This method may be utilized to produce a sealed and pressurized environment so that the resulting structure is capable of withstanding plasma temperatures and plasma radiation.
Additionally, the embodiments described above advantageously provide for easy introduction to the lamp chamber of metal halides, mercury and other solids to enhance operational pressure through metal vapors with a direct impact on black body color temperature and associated spectrum and radiance.
It will be apparent to those skilled in the art that various modifications and variations can be made to the structure of the present invention without departing from the scope or spirit of the invention. In view of the foregoing, it is intended that the present invention cover modifications and variations of this invention provided they fall within the scope of the following claims and their equivalents.
Number | Name | Date | Kind |
---|---|---|---|
3502929 | Richter | Mar 1970 | A |
3515491 | Emary | Jun 1970 | A |
3619588 | Chambers | Nov 1971 | A |
3808496 | McRae et al. | Apr 1974 | A |
3826996 | Jaegle | Jul 1974 | A |
3900803 | Silfvast et al. | Aug 1975 | A |
4088966 | Samis | May 1978 | A |
4152625 | Conrad | May 1979 | A |
4286239 | Gross | Aug 1981 | A |
4420690 | Kuehl | Dec 1983 | A |
4498029 | Yoshizawa | Feb 1985 | A |
4622464 | Suktgara et al. | Nov 1986 | A |
4646215 | Levin | Feb 1987 | A |
4710673 | Vrijssen et al. | Dec 1987 | A |
RE32626 | Yoshizawa | Mar 1988 | E |
4738748 | Kisa | Apr 1988 | A |
4780608 | Cross et al. | Oct 1988 | A |
4789788 | Cox | Dec 1988 | A |
4866517 | Mochizuki et al. | Sep 1989 | A |
4901330 | Wolfram | Feb 1990 | A |
5432398 | Kogelschatz | Jul 1995 | A |
5747813 | Norton et al. | May 1998 | A |
5798805 | Ooi | Aug 1998 | A |
5905268 | Garcia et al. | May 1999 | A |
5940182 | Lepper, Jr. et al. | Aug 1999 | A |
6184517 | Sawada | Feb 2001 | B1 |
6212989 | Beyer et al. | Apr 2001 | B1 |
6285743 | Hiroyuki | Sep 2001 | B1 |
6288780 | Fairley et al. | Sep 2001 | B1 |
6324255 | Kondo et al. | Nov 2001 | B1 |
6325255 | Lane et al. | Dec 2001 | B1 |
6356700 | Strobl | Mar 2002 | B1 |
6414436 | Eastlund | Jul 2002 | B1 |
6417625 | Brooks et al. | Jul 2002 | B1 |
6541924 | Kane et al. | Apr 2003 | B1 |
6587195 | Jennings | Jul 2003 | B1 |
6679276 | Brown et al. | Jan 2004 | B1 |
6737809 | Espiau et al. | May 2004 | B2 |
6762849 | Ruikens | Jul 2004 | B1 |
6788404 | Lange | Sep 2004 | B2 |
6956329 | Brooks et al. | Oct 2005 | B2 |
6960872 | Beeson | Nov 2005 | B2 |
6972421 | Melnychuk | Dec 2005 | B2 |
7050149 | Owa et al. | May 2006 | B2 |
7294839 | Rich et al. | Nov 2007 | B2 |
7295739 | Solarz | Nov 2007 | B2 |
7307375 | Smith | Dec 2007 | B2 |
7390116 | Jain | Jun 2008 | B2 |
7427167 | Holder et al. | Sep 2008 | B2 |
7429818 | Chang et al. | Sep 2008 | B2 |
7435982 | Smith | Oct 2008 | B2 |
7439530 | Ershov | Oct 2008 | B2 |
7652430 | Delgado | Jan 2010 | B1 |
7679276 | Blondia | Mar 2010 | B2 |
7744241 | Xu | Jun 2010 | B2 |
7786455 | Smith | Aug 2010 | B2 |
7989786 | Smith | Aug 2011 | B2 |
8192053 | Owen et al. | Jun 2012 | B2 |
8242671 | Blondia et al. | Aug 2012 | B2 |
8242695 | Sumitomo | Aug 2012 | B2 |
8253926 | Sumitomo et al. | Aug 2012 | B2 |
8288947 | Yokota et al. | Oct 2012 | B2 |
8309943 | Smith | Nov 2012 | B2 |
8525138 | Smith | Sep 2013 | B2 |
8702465 | Guthrie et al. | Apr 2014 | B2 |
8969841 | Smith | Mar 2015 | B2 |
9024252 | Chiarello et al. | May 2015 | B2 |
9048000 | Smith | Jun 2015 | B2 |
9185786 | Smith | Nov 2015 | B2 |
9230771 | Raggio | Jan 2016 | B2 |
9530636 | Oh et al. | Dec 2016 | B2 |
20010016430 | Nakano | Aug 2001 | A1 |
20010035720 | Guthrie et al. | Nov 2001 | A1 |
20020017399 | Chang | Feb 2002 | A1 |
20020021508 | Ishihara | Feb 2002 | A1 |
20020044629 | Hertz | Apr 2002 | A1 |
20020080834 | Kusunose | Jun 2002 | A1 |
20020185976 | Weaver et al. | Dec 2002 | A1 |
20030052609 | Eastlund | Mar 2003 | A1 |
20030068012 | Ahmad | Apr 2003 | A1 |
20030098638 | Beech et al. | May 2003 | A1 |
20030147499 | Kondo | Aug 2003 | A1 |
20030168982 | Kim | Sep 2003 | A1 |
20030231496 | Sato | Dec 2003 | A1 |
20040016894 | Wester | Jan 2004 | A1 |
20040026512 | Otsubo | Feb 2004 | A1 |
20040129896 | Schmidt | Jul 2004 | A1 |
20040163031 | Silverman et al. | Sep 2004 | A1 |
20040183031 | Silverman | Sep 2004 | A1 |
20040183038 | Hiramoto et al. | Sep 2004 | A1 |
20040238762 | Mizoguchi et al. | Dec 2004 | A1 |
20040264512 | Hartlove et al. | Dec 2004 | A1 |
20050099130 | Espiau et al. | May 2005 | A1 |
20050167618 | Hoshino et al. | Aug 2005 | A1 |
20050205811 | Partlo et al. | Sep 2005 | A1 |
20050207454 | Starodoumov et al. | Sep 2005 | A1 |
20050225739 | Hiura | Oct 2005 | A1 |
20050243390 | Tejnil | Nov 2005 | A1 |
20060039435 | Cheymol | Feb 2006 | A1 |
20060097203 | Byankov et al. | May 2006 | A1 |
20060109455 | Haverlag | May 2006 | A1 |
20060131515 | Partlo | Jun 2006 | A1 |
20060152128 | Manning | Jul 2006 | A1 |
20060175947 | Blondia et al. | Aug 2006 | A1 |
20060192152 | Ershov | Aug 2006 | A1 |
20060219957 | Ershov | Oct 2006 | A1 |
20070115468 | Barnard | May 2007 | A1 |
20070228288 | Smith | Oct 2007 | A1 |
20070228300 | Smith | Oct 2007 | A1 |
20070272832 | Fujimatsu et al. | Nov 2007 | A1 |
20070285921 | Zulim et al. | Dec 2007 | A1 |
20080055712 | Noelscher | Mar 2008 | A1 |
20080203922 | Guthrie et al. | Aug 2008 | A1 |
20080280079 | Watanabe | Nov 2008 | A1 |
20090032740 | Smith et al. | Feb 2009 | A1 |
20090140651 | Hori | Jun 2009 | A1 |
20090230326 | Vaschenko et al. | Sep 2009 | A1 |
20100045197 | Kessels | Feb 2010 | A1 |
20100140373 | Myhre et al. | Jun 2010 | A1 |
20100181503 | Yanagida et al. | Jul 2010 | A1 |
20100221484 | Meade et al. | Sep 2010 | A1 |
20100264820 | Sumitomo | Oct 2010 | A1 |
20110181191 | Smith | Jul 2011 | A1 |
20110204265 | Smith | Aug 2011 | A1 |
20120112624 | Jeong | May 2012 | A1 |
20130052903 | Gilliard et al. | Feb 2013 | A1 |
20130329204 | Pellemans et al. | Dec 2013 | A1 |
20140126043 | Senekerimyan | May 2014 | A1 |
20140362600 | Suckling | Dec 2014 | A1 |
20150034838 | Bezel | Feb 2015 | A1 |
20150201483 | Bezel | Jul 2015 | A1 |
20150262808 | Wang | Sep 2015 | A1 |
20150332908 | Blondia | Nov 2015 | A1 |
20150357179 | Wilson et al. | Dec 2015 | A1 |
20160057845 | Smith | Feb 2016 | A1 |
Number | Date | Country |
---|---|---|
243629 | Mar 1987 | DE |
10 2011 113681 | Mar 2013 | DE |
1335640 | Aug 2003 | EP |
2554302 | May 1985 | FR |
S61-193358 | Aug 1986 | JP |
H04-144053 | May 1992 | JP |
08299951 | Nov 1996 | JP |
2003-317675 | Nov 2003 | JP |
2006010675 | Jan 2006 | JP |
8403294 | Jun 1985 | NL |
2004097520 | Nov 2004 | WO |
WO2007120521 | Oct 2007 | WO |
WO2010002766 | Jan 2010 | WO |
2010093903 | Aug 2010 | WO |
Entry |
---|
H.M. Pask, et al, Ytterbium-Doped Silica Fiber Lasers: Versatile Sources for the 1-1.2 um Region; IEEE Journal of Selected Topics in Quantum Electronics vol. 1, No. 1; Apr. 1993. |
Christian Stewen; A 1-kW CW Thin Disc Laser, IEEE Journal of Selected Topics in Quantum Electronics, vol. 6, No. 4, Jul./Aug. 2000. |
Hecht, Eugene; Optics, 4ed; Pearson Addison Wesley; 2002; pp. 149-171, 243-273, 385-442. |
KLA-Tencor; High Power Laser-Sustained Plasma Light Sources for KLA-Tencor Broadband Inspection Tools; Conference Paper⋅ May 2015. |
Davis, Christopher C.; Lasers and Electro-Optics; Fundamentals and Engineering; 1996, Cambridge University Press, pp. 14-35. |
Tarn, Quasiresonant laser-produced plasma: an efficient mechanism for localized breakdown; J. Appl. Phys. 51(9), Sep. 1980, p. 4682. |
Measures, et al; Laser Interaction based on resonance saturation (LIBORS): an alternative to inverse bremsstrahlung for coupling laser energy into a plasma; Applied Optics, vol. 18, No. 11, Jun. 1, 1979. |
Eletskii el al; Formation kinetics and parameters of a photoresonant plasma; Sov. Phys. JETP 67 (5); May 1988. |
Ballman, et al; Synthetic Quartz with High Ultraviolet Transmission; Applied Optics; Jul. 1968, vol. 7, No. 7. |
Energetiq Technology, Inc; LDLS™ Laser-Driven Light Source Data Sheet; 2008. |
Patel and Zaidi, The suitability of sapphire for laser windows, MEas. Sci. Technol. 10 (1999). |
Waynant, et al; Electro-Optics Handbook, Second Edition; Chapter 10; published by McGraw-Hill, 2000. |
Excelitas Technologies Corp.; Cermax® Xenon Lamp Engineering Guide, 2011. |
Perkinelmer Optoelectronics; Cermax® Xenon Lamp Engineering Guide, 1998. |
G C Wei; Transparent ceramic lamp envelope materials; J. Phys. D: Appl. Phys. 38 (2005) 2057-3065. |
Pasco Scientific; Instruction Sheet for the PASCO Model OS-9286A Mercury Vapor Light Source; 1990. |
Generalov et al; “Continuous Optical Discharge,” ZhETF Pis. Red. 11, No. 9, May 5, 1970, pp. 302-304. |
Kozlov et al; “Radiative Losses by Argon Plasma and the Emissive Model of a Continuous Optical Discharge”; Sov. Phys.JETP, vol. 39, No. 3, Sep. 1974, pp. 463-468. |
Wibers et al, “The Continuum Emission of an Arc Plasma,” J. Quant. Spectrosc. Radiat, Transfer, vol. 45, No. 1, 1991, pp. 1-10 |
Wilbers, et al “The VUV Emissilivity of a High-Pressure Cascade Argon Arc from 125 to 200 nm.” J.Quant. Spectrosc. Radiat. Transfer, vol. 46, 1991, pp. 299-308. |
Luxtell LLC CeraLux Xenon Lamps Product Data Sheet; 2003-2004. |
Laufer, Gabriel; Introduction to Optics and Lasers in Engineering; pp. 449-454 Cambridge University Press, 1996. |
Yu, et al; LED-Based Projection Systems; Journal of Display Technology, vol. 3, No. 3, Sep. 2007. |
Derra et al; UHP lamp systems for projection applications; J. Phys. D: Appl. Phys. 38 (2005) 2995-3010. |
Ingle, James D., et al; Spectrochemical Analysis; 1988, Prentice-Hall Inc.; p. 59. |
M.J. Soileau et al., Laser-Induced Damage Measurements in CdTe and Other II-VI Materials, Applied Optics, vol. 21, No. 22, pp. 4059-4062 . |
Roy Henderson et al., Laser Safety, pp. 435-443 (2004). |
Turan Erdogan, Ph.D., CTO Semrock, Inc., A Unit of IDEX Corp; letter dated Feb. 28, 2011 regarding Energetiq Technology's EQ-99 system. |
Winners of 2010 Prism Awards Announced, Jan. 27, 2011; webpage from photonics.com. |
http://www.rdmag.com/award-winners/2011/08/light-source-lifetime-lifted-laser-tech; The EQ-99 LDLS Laser-Driven Light Source, produced by Energetiq Technology Inc. 2011. |
Energetiq Technology Inc. Press Release: Energetiq Announces Ultra-Compact Light. Source for Next Generation HPLC and Advanced Microscopy; Jan. 21, 2010. |
KLA-Tencor Launches 2830 and Puma 9500 Series, eDR-5210 | Product Releases | Press Releases; Jul. 13, 2009. |
International Search Report for PCT Application No. PCT/US2015/030740 dated Oct. 20, 2015. |
Partial International Search Report for PCT Application No. PCT/US2015/030740, dated Aug. 11, 2015, 2 pages. |
Excelitas Technologies; Cermax® Xenon Lamp Engineering Guide, Copyright 2011, www.excelitas.com. |
Partial Search Report for PCT/US2016/031983 dated Aug. 16, 2016. |
International Search Report for PCT/US16/32022, dated Jun. 24, 2016. |
I.M. Beterov et al., “Resonance radiation plasma (photoresonance plasma)”, Sov. Phys. Usp. 31 (6), 535 (1988). |
D. Keefer, “Laser Sustained Plasmas,” Chapter 4, in Radziemski et al., “Laser-Induced Plasmas and Applications,” CRC Press (1989). |
Norbert R. Böwering et al., “EUV Source Collector,” Proc. of SPIE vol. 6151, (Mar. 10, 2006). |
William T. Silfvast, Laser Fundamentals, 2d ed., pp. 1-6 (2004). |
Arp et al., Feasibility of generating a useful laser-induced breakdown spectroscopy plasma on rocks at high pressure: preliminary study for a Venus mission, published Jul. 30, 2004. |
J. Uhlenbusch and W. Viöl, “Hβ-Line Profile Measurements in Optical Dischagres”, J. Quant. Spectrosc. Radiat. Transfer, vol. 44, No. 1, 47-56 (1990). |
DS004 EQ-10M—Data Sheet, Energetiq, 2005. |
John Powell and Claes Magnusson; Handbook of Laser Technologies and Applications Volume III Applications, Part D:1.2, pp. 1587-1611; 2004, published by Institute of Physics Publishing. |
Digonnet, Michel J.F., editor; Rare-Earth-Doped-Fiber Lasers and Amplifiers, Second Edition, Revised and Expanded, published by Marcel Dekker, Inc., 2001, pp. 144-170. |
Cremers, et al; Evaluation of the Continuous Optical Discharge for Spectrochemical Analysis; Spechtrochimica Acta, Part B. Atomic Spectroscopy; vol. 40B No. 4, 1985. |
ASML's customer magazine, 2014, ASML Holding BV. |
Raizer, Yuri P.; Gas Discharge Physics, Springer-Verlag 1991; pp. 35-51; 307-310. |
Raizer, Yuri P.; Gas Discharge Physics, Springer-Verlag corrected and printing 1997; pp. 35-51; 307-310. |
V. P. Zimakov, et al; Interaction of Near-IR Laser Radiation with Plasma of a Continuous Optical Discharge; Plasma Physics Reports, 2016, vol. 42, No. 1, pp. 68-73. |
Bezel, et al “High Power Laser-Sustained Plasma Light Sources for KLA-Tencor Broadband Inspection Tool”; Conference Paper ⋅ May 2015, KLATencor, Milpitas, California. |
Energetiq Technology, Inc.; LDLS™ Laser-Driven Light Source EQ-1000 High Brightness DUV Light Source Data Sheet; 2008; Woburn, Massachusetts. |
Rudoy, et al; Xenon Plasma Sustained by Pulse-Periodic Laser Radiation; Plasma Physics Reports, 2015, vol. 41, No. 10, pp. 858-861, Pleiades Publishing, Ltd., 2015. |
Knecht, et al; Optical pumping of the XeF(C-+A) and iodine 1.315-pm lasers by a compact surface discharge system; Opt. Eng. 42(12) 3612-3621 (Dec. 2003). |
Fridman, et al; Plasma Physics and Engineering; Published in 2004 by Taylor & Francis, pp. 404-419; 618-619. |
Model EQ-99 LDLS™ Laser-Driven Light Source; Operation and Maintenance Manual Revision Mar. 2, 2012. |
Martin van den Brink; Many ways to shrink: The right moves to 10 nanometer and beyond; Presentation at ASML SmallTalk 2014; London; Nov. 2014. |
Laser Pumped Plasma Broadband Light Source by RnD Isan (no date). |
Toumanov; Plasma and High Frequency Processes for Obtaining and Processing Materials in the Nuclear Fuel Cycle; Nova Science Publishers, Inc., New York, 2003, p. 60. |
Klauminzer; Cost Considerations for Industrial Excimer Lasers; Laser Focus, The Magazine of Electro-Optics Technology; Dec. 1985. |
S. C. Tidwell, ; Highly efficient 60-W TEMoo cw diode-end-pumped Nd:YAG laser; Optics Letters / vol. 18, No. 2 / Jan. 15, 1993, pp. 116-118. |
R. J. Shine, Jr; 40-W cw, TEM00-mode, diode-laser-pumped, Nd:YAG miniature-slab laser, Mar. 1, 1995 / vol. 20, No. 5 / Optics Letters; pp. 459-461. |
W. Schone, et al; Diode-Pumped High-Power cw Nd:YAG Lasers; W. Waidelich, et al (eds.); Laser in Forschung and Technik; 1996. |
Diogiovanni, et al; High Power Fiber Lasers and Amplifiers; Optics & Photonics News, Jan. 1999. |
ASML YieldStar T-250D product sheet; ASML Product Catalog; Jan. 20, 2014. |
ASML YieldStar S-250D product sheet; SML Product Catalog; Jan. 20, 2014. |
Energetiq Technology Inc; Operation manual for LDLS™ Laser-Driven Light Source; Aug. 2009. |
Bussiahn; Experimental and theoretical investigations of a low-pressure He—Xe discharge for lighting purpose; Journal of Applied Physics vol. 95, No. 9 May 1, 2004. |
V.P. Zimakov, et al; Bistable behavior of a continuous optical discharge as a laser beam propagation effect; Laser Resonators, Microresonators, and Beam Control XV; vol. 8600, 860002 ⋅ © 2013 SPIE. |
Fridman, et al; Plasma Physics and Engineering, Second Edition; Published in 2011 by Taylor & Francis, pp. 409-424; 639-640. |
Energetiq Technology, Inc.; Model EQ-1500, LDLS™ Laser-Driven Light Source, Operation Manual, May 2011. |
Energetiq Technology, Inc.; Model EQ-77 LDLS™ Laser-Driven Light Source, Operation Manual, Dec. 2015. |
Energetiq Technology, Inc.; Model EQ-90-FC, LDLS™ Laser-Driven Light Source, Operation and Maintenance Manual, Jan. 2014. |
Raizer, “Optical discharges,” Soviet Physics Uspekhi 23(11) (1980). |
Energetiq Technology, Inc.; Operation and Maintenance Manual, Model EQ-99X, LDLS Laser-Driven, Light Source, Rev. 1 (Jan. 2014). |
Energetiq Technology, Inc.; Operation and Maintenance Manual, Model EQ-99-FC, LDLS Laser-Driven Light Source, Rev. 2 (Mar. 2012). |
Energetiq Technology, Inc.; Operation and Maintenance Manual, Model EQ-99X-FC, LDLS Laser Driven Light Source, Rev. 1 (Jan. 2014). |
Energetiq Technology, Inc.; Operation and Maintenance Manual, Model EQ-9-N, LDLS Laser-Driven Light Source, Rev. 6 (Sep. 2015). |
Energetiq Technology, Inc.; A presentation titled “EQ-400 LDLS Laser-Driven Light Source,” dated Feb. 2, 2015. |
A presentation titled “Eneretiq Laser-Driven Light Sources,” dated Apr. 21, 2015. |
A presentation titled “ASML BV LDLS Roadmap,” dated Jun. 11, 2013. |
Nanometrics, Organic Growth Opportunities for Nanometrics in Process Control. |
A presentation titled “LDLS Laser-Driven Light Source,” dated Jul. 8, 2011. |
Castellano, “Are the Brains at ASML Hurting Investors With High and Ambitious R&D Costs?” Jul. 20, 2015. |
M. W. P. Cann, Light Sources in the 0.15-20-μ Spectral Range, vol. 8 No. 8 Applied Optics (1969). |
Kuhn, Kelin; Laser Engineering; Prentice-hall Inc, 1998; pp. 384-440. |
Moulton, Peter F., Tunable Solid-State Lasers; Proceedings of the IEEE, vol. 80, No. 3, Mar. 1992. |
Koch, K.K.; Sodium Plasma Produced by Milliwatt cw Laser Irradiation; Journal of the Optical Society of America; vol. 70, No. 6; Jun. 1980. |
E. B. Saloman; Energy Levels and Observed Spectral Lines of Xenon, Xel through XeLIV; J. Phys. Chem. Ref. Data, vol. 33, No. 3, 2004. |
Lothar Klein; Measurements of Spectral Emission and Absorption of a High Pressure Xenon Arc in the Stationary and the Flashed Modes; Apr. 1968; vol. 7, No. 4, Applied Optics. |
Hailong Zhou, et al; Conductively cooled high-power, high-brightness bars and fiber coupled arrays; High-Power Diode Laser Technology and Applications III, edited by Mark S. Zediker, Proc. of SPIE vol. 5711 (SPIE, Bellingham, WA, 2005). |
Ytterbium-doped large-core fibre laser with 1 kW of continuous-wave output power; Y. Jeong, et al; Electronics Letters Apr. 15, 2004, vol. 40 No. 8. |
Bussiahn, R. et al, “Experimental and theoretical investigations of a low-pressure He—Xe discharge for lighting purpose” Journal of Applied Physics, vol. 95, No. 9. May 1, 2004, pp. 4627-4634. |
Beck, “Simple Pulse Generator for Pulsing Xenon Arcs with High Repetition Rate,” Rev. Sci. Instrum., vol. 45, No. 2, Feb. 1974, pp. 318-319. |
Carlhoff, et al, “Continuous Optical Discharges at Very High Pressure,” Physica 103C, pp. 439-447. |
Fiedorowicz et al, X-Ray Emission from Laser-Irradiated Gas Puff Targets, Appl. Phys. Lett. 62 (22). May 31, 1993. |
Franzen, “CW Gas Breakdown in Argon Using 10.6-urn Laser Radiation,” Appl. Phys. Lett. vol. 21, No. 2 Jul. 15, 1972 pp. 62-64. |
Jeng et al, Theoretical Investigation of Laser-sustained Argon Plasmas J.Appl.Phys. 60 (7), Oct. 1, 1986 pp. 2272-2279. |
Nakar, “Radiometric Characterization of Ultrahigh Radiance Xenon Short-arc Discharge Lamps” Applied Optics, vol. 47 No. 2, Jan. 9, 2008, pp. 224-229. |
Moody, “Maintenance of a Gas Breakdown in Argon Using 10.6-u cw Radiation,” Journal of Applied Physics, vol. 46, No. 6, Jun. 1975, pp. 2475-2482. |
Keefer, et al “Experimental Study of a Stationary Lesser-Sustained Air Plasma”, Journal of Applied Physics, vol. 46., No. 3, Mar. 1975, pp. 1080-1083. |
Nanometrics, Organic Growth Opportunities for Nanometrics in Process Control, Jan. 2016. |
M.J. Soileau et al., Laser-Induced Damage Measurements in CdTe and Other II-VI Materials, Applied Optics, vol. 21, No. 22, pp. 4059-4062; Nov. 15, 1982. |