This application is based upon and claims the benefit of priority from Japanese Patent Application No. 2023-021414, filed on Feb. 15, 2023, the entire contents of which are incorporated herein by reference.
Embodiments described herein relate generally to a memory system, a memory controller, and a control method.
In a memory system, in order to protect data stored in a memory such as a NAND flash memory, error-correction-coded data is stored in the memory. Therefore, when the data stored in the memory is read, the error-correction-coded data (also referred to as a received word) read from the memory is decoded to restore the data before the error-correction coding.
A memory system according to an embodiment includes a non-volatile memory and a memory controller. The non-volatile memory is configured to store data encoded with an error correction code for correcting an error of n (n is an integer of 3 or more) bits or less. The memory controller is configured to read a received word from the non-volatile memory and calculate syndromes by using the received word. The memory controller is configured to estimate the number of error bits by using the syndromes. The memory controller is configured to perform processing when the number of error bits is estimated to be 2 or 3. The processing includes executing variable transformation on a variable of an error locator polynomial corresponding to the number of error bits by using a calculated value being either a first value or a second value. The first value and the second value are calculated on the basis of the syndromes. The processing also includes executing, by using the first value and the second value, calculation of roots of a transformed polynomial into which the error locator polynomial has been transformed according to the variable transformation. The memory controller is configured to obtain roots of the error locator polynomial by executing a variable inverse transformation using the calculated value at roots of the transformed polynomial. The memory controller is configured to correct an error of error locations corresponding to roots of the error locator polynomial.
Hereinafter, a preferred embodiment of a memory system according to the present invention will be described in detail with reference to the accompanying drawings.
A memory system according to the present embodiment will be described in detail with reference to the drawings.
The non-volatile memory 20 is a non-volatile memory that stores data in a non-volatile manner. In one example, the non-volatile memory 20 is a NAND flash memory (hereinafter, simply referred to as a NAND memory). In the following description, a case where a NAND memory is used as the non-volatile memory 20 will be exemplified, but a storage device other than the NAND memory, such as a three-dimensional structure flash memory, a resistive random access memory (ReRAM), or a ferroelectric random access memory (FeRAM), can be used as the non-volatile memory 20. Moreover, the non-volatile memory 20 is not necessarily a semiconductor memory, and the present embodiment can also be applied to various storage media other than the semiconductor memory.
The memory system 1 may be any of various memory systems including the non-volatile memory 20, such as a so-called solid state drive (SSD) or a memory card in which the memory controller 10 and the non-volatile memory 20 are configured as one package.
The memory controller 10 controls writing to the non-volatile memory 20 in accordance with a write request from the host 30. In addition, the memory controller 10 controls reading from the non-volatile memory 20 in accordance with a read request from the host 30. The memory controller 10 is, for example, a semiconductor integrated circuit configured as a system on a chip (SoC). The memory controller 10 includes a host interface (host I/F) 15, a memory interface (memory I/F) 13, a control unit 11, an encoding/decoding unit (codec) 14, and a data buffer 12. The host I/F 15, the memory I/F 13, the control unit 11, the encoding/decoding unit 14, and the data buffer 12 are mutually connected by an internal bus 16. Some of or all operations of each component of the memory controller 10 described below may be implemented by executing firmware by a central processing unit (CPU) or may be implemented by hardware.
The host I/F 15 performs processing according to an interface standard with the host 30, and outputs a command received from the host 30, user data to be written, and the like to the internal bus 16. In addition, the host I/F 15 transmits user data that is read from the non-volatile memory 20 and restored, a response from the control unit 11, and the like to the host 30.
The memory I/F 13 performs write processing to the non-volatile memory 20 on the basis of an instruction from the control unit 11. In addition, the memory I/F 13 performs read processing from the non-volatile memory 20 on the basis of an instruction from the control unit 11.
The control unit 11 integrally controls each component of the memory system 1. Upon receiving a command from the host 30 via the host I/F 15, the control unit 11 performs control according to the command. For example, the control unit 11 instructs the memory I/F 13 to write user data and parity to the non-volatile memory 20 in accordance with a command from the host 30. In addition, the control unit 11 instructs the memory I/F 13 to read the user data and the parity from the non-volatile memory 20 in accordance with a command from the host 30.
Upon receiving a write request from the host 30, the control unit 11 determines a storage area (memory area) on the non-volatile memory 20 for the user data accumulated in the data buffer 12. That is, the control unit 11 manages a write destination of the user data. The correspondence between a logical address of the user data received from the host 30 and a physical address indicating the storage area on the non-volatile memory 20 in which the user data is stored is stored as an address conversion table.
In addition, upon receiving a read request from the host 30, the control unit 11 converts a logical address designated by the read request into a physical address by using the above-described address conversion table, and instructs the memory I/F 13 to perform reading from the physical address.
In the NAND memory, in general, writing and reading are performed in data units called pages, and erasing is performed in data units called blocks. In the present embodiment, a plurality of memory cells connected to the same word line is referred to as a memory cell group. When the memory cell is a single level cell (SLC), one memory cell group corresponds to one page. When the memory cell is a multiple level cell (MLC), one memory cell group corresponds to a plurality of pages. In the present description, the MLC includes a triple level cell (TLC), a quad level cell (QLC), and the like. Each memory cell is connected to a word line and is also connected to a bit line. Therefore, each memory cell can be identified by an address for identifying a word line and an address for identifying a bit line.
The data buffer 12 temporarily stores the user data received from the host 30 by the memory controller 10 until the user data is stored in the non-volatile memory 20. In addition, the data buffer 12 temporarily stores the user data read from the non-volatile memory 20 until the user data is transmitted to the host 30. As the data buffer 12, for example, a general-purpose memory such as a static random access memory (SRAM) or a dynamic random access memory (DRAM) can be used. Note that the data buffer 12 may be mounted outside the memory controller 10 instead of being built in the memory controller 10.
The user data transmitted from the host 30 is transferred to the internal bus 16 and temporarily stored in the data buffer 12. The encoding/decoding unit 14 encodes the user data stored in the non-volatile memory 20 to generate a code word. Further, the encoding/decoding unit 14 decodes the received word read from the non-volatile memory 20 to restore the user data. Therefore, the encoding/decoding unit 14 includes an encoding unit (encoder) 17 and a decoding unit (decoder) 18. Note that the data encoded by the encoding/decoding unit 14 may include control data or the like used inside the memory controller 10 in addition to the user data.
Next, the write processing of the present embodiment will be described. The control unit 11 instructs the encoding unit 17 to encode the user data at the time of writing to the non-volatile memory 20. At that time, the control unit 11 determines a storage location (storage address) of the code word in the non-volatile memory 20, and also instructs the memory I/F 13 on the determined storage location.
The encoding unit 17 encodes the user data on the data buffer 12 on the basis of an instruction from the control unit 11 to generate a code word. As the encoding method, for example, an encoding method using an algebraic code such as a Bose-Chaudhuri-Hocquenghem (BCH) code or a Reed-Solomon (RS) code, and an encoding method (product code or the like) using these codes as component codes in the row direction and the column direction can be adopted. The memory I/F 13 performs control to store a code word in a storage location on the non-volatile memory 20 instructed from the control unit 11. Hereinafter, a case where a BCH code for correcting an error of 3 bits or less is used will be described as an example.
Next, processing at the time of reading from the non-volatile memory 20 of the present embodiment will be described. At the time of reading from the non-volatile memory 20, the control unit 11 designates an address on the non-volatile memory 20 and instructs the memory I/F 13 to perform reading. Moreover, the control unit 11 instructs the decoding unit 18 to start decoding. The memory I/F 13 reads a received word from a designated address of the non-volatile memory 20 according to an instruction of the control unit 11, and inputs the read received word to the decoding unit 18. The decoding unit 18 decodes the received word read from the non-volatile memory 20.
As described above, the decoding unit 18 decodes the received word read from the non-volatile memory 20. The decoding unit 18 implements the calculation of the roots of the error locator polynomial in the case that the number of error bits (hereinafter, the number of errors) is 2 or 3 with a simpler configuration.
The syndrome calculation circuit 201 receives the received word r(x) and calculates and outputs syndromes. For example, let the received word be r(x):=c(x)+e(x), the syndrome calculation circuit 201 calculates syndromes si by si:=r(αi). c(x) represents a code word, and e(x) represents an error. α represents a primitive element of GF(2m). When a BCH code for correcting an error of 3 bits or less is used, the syndrome calculation circuit 201 receives the received word r(x) and outputs syndromes s1, s3, and s5. The syndromes s1, s3, and s5 respectively correspond to the values obtained by substituting the first power, the third power, and the fifth power of α for a received word, where α is a primitive element of the Galois field.
The arithmetic circuits 202 to 205 perform the following operations.
Note that β and γ are examples of calculated values (a first value and a second value) that are calculated on the basis of syndromes. As described below, in the first embodiment, the variable transformation is performed on the variable of the error locator polynomial by using γ as the calculation value out of β and γ, and the roots of the transformed polynomial obtained by transforming the error locator polynomial are calculated by using both β and γ. In the second embodiment, an example in which variable transformation is executed by using β that is the other of β and γ as a calculation value will be described.
The root calculation circuit 100 calculates the roots of the second-order or third-order error locator polynomial to be used when the number of errors is 2 or 3. In one example, the root calculation circuit 100 inputs β and γ, and outputs roots x1, x2, and x3 of the error locator polynomial. Details of the root calculation circuit 100 will be described below.
The root calculation circuit 210 calculates a root of a zeroth-order or first-order error locator polynomial to be used when the number of errors is 0 or 1. In one example, the root calculation circuit 210 receives syndrome s1 and outputs syndrome s1 as the root of the error locator polynomial.
The number of errors can be estimated as follows by using the value of the syndromes. The number of errors and the value of the syndromes have the following relationship.
The above-described relationship can be rephrased as follows.
Therefore, when (s13≠s3 or s15≠s5) and (s13=s3) (namely, when s13=s3 and s15≠s5), the number of errors is 4 or more. If assuming that the number of errors is 3 or less, the number of errors is 0 or 1 when s13=s3.
Let β:=s13+s3 and γ:=s15+s5, then β=0 is equivalent to s13=s3, and γ=0 is equivalent to s15=s5. Therefore, the above-described relationships can be rephrased with β and γ as follows.
The selection circuit 220 selects and outputs either the roots output from the root calculation circuit 100 or the root output from the root calculation circuit 210 in accordance with the number of errors. As described above, for example, assuming that the number of errors is 3 or less, β=0 means that the number of errors is 0 or 1. Therefore, when β=0, the selection circuit 220 selects and outputs the root output by the root calculation circuit 210.
The selection circuit 230 selects and outputs either the input roots or the information representing the correction failure in accordance with the number of errors. As described above, for example, β=0 and γ≠0 mean that the number of errors is 4 or more. Therefore, when β=0 and γ≠0, the selection circuit 230 outputs information indicating a correction failure.
The error location calculation circuit 240 inputs the roots of the error locator polynomial and outputs the error locations. In one example, when the roots x1, x2, and x3 output from the root calculation circuit 100 are input, the error location calculation circuit 240 outputs the error locations i1, i2, and i3. When syndrome s1 that is the root output from the root calculation circuit 210 is input, the error location calculation circuit 240 outputs an error location i1.
The bit flip circuit 250 receives the received word r(x) and the error locations output from the error location calculation circuit 240, and outputs a received word obtained by inverting the bit at the error locations.
Next, details of the root calculation circuit 100 will be described. First, an error locator polynomial will be described.
The 1-th-order (1 is an integer of 0 or more) error locator polynomial is expressed by the following Formula (1). For example, the error locator polynomial when 1-0 to 3, that is, the zeroth-order to third-order error locator polynomials is expressed by the following Formulas (2) to (5).
Πk=1l(x−αj
The zeroth-order and first-order error locator polynomials can collectively determine the root, as described below. Hereinafter, processing of collectively obtaining the root of the zeroth-order and first-order error locator polynomials is referred to as root calculation of a zeroth-order and first-order error locator polynomials. Similarly, the second-order and third-order error locator polynomials can collectively determine the roots. Hereinafter, the processing of collectively obtaining the roots of the second-order and third-order error locator polynomials is referred to as root calculation of a second-order and third-order error locator polynomials.
First, root calculation of the zeroth-order and first-order error locator polynomials will be described. When the number of errors is 0, s1=0 holds, and when the number of errors is 1, s1≠0 holds. Therefore, the root calculation of the zeroth-order and first-order error locator polynomials can be executed by “excluding 0 from the root of σ(x) with σ(x)=x+s1”. This is derived from the following.
Next, root calculation of the second-order and third-order error locator polynomials will be described. When the number of errors is 2, s1≠0, s13≠s3 and s16+s1s5=s13s3+s32 hold. When the number of errors is 3, s13≠s3 and s16+s1s5≠s13s3+s32 hold. Therefore, assuming that σ(x) is expressed by the following Formula (6), the root calculation of the second-order and third-order error locator polynomials can be executed by “excluding 0 from the roots of σ(x)”.
This is derived from the following.
Next, a procedure of root calculation of σ(x) expressed by Formula (6) will be described. Let the variable y be the variable obtained by the variable transformation from the variable x represented by x=y+s1, σ(x) is represented by the following Formula (9).
Note that Formula (9) corresponds to a polynomial obtained by transforming the error locator polynomial according to the variable transformation of x=y+s1. Hereinafter, the polynomial obtained by transforming the error locator polynomial according to the variable transformation in this way may be referred to as a transformed polynomial.
Let β:=s13+s3 and γ:=s15+s5, then σ(x) is expressed by the following Formula (10). Hereinafter, a case of (C1) γ=0 and a case of (C2) γ≠0 will be described separately.
From the following Formula (11), the roots y1, y2, and y3 are obtained by using correspondence information (LUT: lookup table, or the like) that returns the third roots of β by using β as key information. The LUT is an example of correspondence information in which possible values that can be taken by the key information and the roots of the transformed polynomial are associated with each other, and any other form of correspondence information may be used.
Let the variable z be the variable obtained by the variable transformation from the variable y expressed by the following Formula (12), then the roots z1, z2, and z3 are obtained by using the LUT that returns the roots of the polynomial expressed by the following Formula (15) by using the value expressed by the following Formula (14) as the key information from the following Formula (13).
By multiplying each of the obtained roots z1, z2, and z3 by 5√(γ), the roots y1, y2, and y3 of transformed polynomial are obtained. Note that “n√( )” represents the n-th root of the value in parentheses. For example, 5√(γ) represents the fifth root of γ. When n=2, it may be simply described as “√( )”. Moreover, by adding s1 to each of the obtained roots y1, y2, and y3, the roots x1, x2, and x3 of σ(x) are obtained.
Note that the third roots y2 and y3 of β may be obtained by y2=y1 ω and y3=y1ω2 by using the third root y1 of β. However, ω is the third root of 1 without 1.
In addition, the root x3 of σ(x) may be obtained by x3=x1+x2+s1 by using the roots x1 and x2 of σ(x). In this case, only the roots y1 and y2 and only the roots z1 and z2 may be obtained.
As shown in Formula (12), in the first embodiment, variable transformation is executed by using γ alone as a calculation value out of β and γ. The variable transformation can be interpreted as being used for reducing the number of pieces of key information of the LUT. For example, by using the variable transformation of Formula (12), the roots z1, z2, and z3 can be obtained from the LUT by using one piece of key information expressed by Formula (14).
As the variable transformation for by using one piece of key information, variable transformation other than Formula (12) is also conceivable. Hereinafter, a comparative example by using variable transformation other than Formula (12) will be described.
In the comparative example, let the variable z be the value obtained by the variable transformation from the variable y expressed by the following Formula (16), then the roots z1, z2, and z3 are obtained by using the LUT that returns the roots of the polynomial expressed by the following Formula (18) with √(β5/γ3) as one piece of key information according to the following Formula (17).
By multiplying each of the obtained roots z1, z2, and z3 by √(γ/β), the roots y1, y2, and y3 of transformed polynomial are obtained. Moreover, by adding s1 to each of the obtained roots y1, y2, and y3, the roots x1, x2, and x3 of σ(x) are obtained.
In the comparative example, calculation of the following two inverse elements is required.
On the other hand, in the present embodiment, calculation of γ to the power of (−⅗) is necessary for calculation of the key information expressed by Formula (14) (details will be described below).
In other words, in the present embodiment, only the calculation of (−⅗) power is required instead of the calculation of the two inverse elements. Although the calculation of the (−⅗) power may require a circuit scale similar to that of the inverse element, at least in the present embodiment, the calculation corresponding to the inverse element calculation can be reduced from twice to once.
The root calculation circuit 100 is configured to execute the root calculation of the second-order and third-order error locator polynomials as described above. Details of the root calculation circuit 100 of
The root calculation circuit 110 calculates the roots when (C1) γ=0. The root calculation circuit 110 includes an LUT 111 and an arithmetic circuit 112. The LUT 111 and the arithmetic circuit 112 perform the following operations.
The root calculation circuit 120 performs the root calculation when (C2) γ≠0.
The root calculation circuit 120 includes arithmetic circuits 121 to 123, an LUT 124, and arithmetic circuits 125 to 127. The arithmetic circuits 121 to 123, the LUT 124, and the arithmetic circuits 125 to 127 execute the following operations.
The selection circuit 131 selects and outputs either: the roots y1 and y2 calculated by the root calculation circuit 110, or the roots y1 and y2 calculated by the root calculation circuit 120 in accordance with whether γ is 0. In one example, the selection circuit 131 selects the roots y1 and y2 calculated by the root calculation circuit 110 when γ=0, and selects the roots y1 and y2 calculated by the root calculation circuit 120 when γ≠0.
The arithmetic circuits 132 to 135 perform the following operations.
Note that the arithmetic operation by the arithmetic circuits 132 to 135 can be interpreted as an arithmetic operation of executing inverse transform of variable transformation (variable inverse transformation) on the roots y1 and y2 of the transformed polynomial to obtain the roots x1, x2, and x3 of the error locator polynomial.
A configuration example of a circuit of a comparative example will be described.
The root calculation circuit 60 includes arithmetic circuits 61 to 65, an LUT 66, and arithmetic circuits 67 to 71. The arithmetic circuits 61 to 65, the LUT 66, and the arithmetic circuits 67 to 71 execute the following operations.
Thus, in the comparative example, two arithmetic circuits 61 and 67 are required as inverse element calculation circuits. On the other hand, in the present embodiment, one arithmetic circuit 121 that calculates the (−⅗) power may be provided as a calculation circuit having a scale similar to that of the inverse element calculation circuit. The inverse element calculation circuit may have a larger circuit scale than other arithmetic circuits. Even in such a case, according to the present embodiment, since the number of circuits having a large circuit scale can be reduced, the circuit scale of the decoding unit 18 can be more efficiently reduced.
In a case where the decoding unit 18 is implemented by the CPU and the firmware, the firmware may be configured to execute a single calculation of (−⅗) power as calculation on the same level as the inverse element calculation for root calculation of the second-order and third-order error locator polynomials. Therefore, firmware for performing error correction (decoding) can have a simpler configuration.
Moreover, in the present embodiment, only γ out of β and γ is used for variable transformation, so that the calculation necessary for B that is the other of β and γ is only one multiplication by the arithmetic circuit 123. Therefore, for example, a configuration can be made simpler than that of the comparative example in which β needs to be raised to the power of 5 (arithmetic circuit 63) and multiplied (arithmetic circuit 64).
The present embodiment can be applied to GF(2m) in which the existence of the fifth root is guaranteed (m is a value indivisible by 4), that is, applied to a case where m is indivisible by 4.
Next, the procedure of decoding processing by the memory system 1 will be described.
The control unit 11 reads the error correction code from non-volatile memory 20, and obtains the received word (Step S101). The control unit 11 then instructs the decoding unit 18 to start decoding.
The syndrome calculation circuit 201 of the decoding unit 18 calculates syndromes from the received word (Step S102).
Next, the decoding unit 18 estimates the number of errors (Step S103). The decoding unit 18 determines whether the number of errors is 3 or less (Step S104). In a case where the number of errors is larger than 3 (Step S104: No), the decoding unit 18 provides a notification of a decoding failure (Step S110), and ends the decoding processing.
When the number of errors is 3 or less (Step S104: Yes), the decoding unit 18 further determines whether the number of errors is 1 or less (Step S105). In a case where the number of errors is 1 or less (Step S105: Yes), the decoding unit 18 executes root calculation of the zeroth-order and first-order error locator polynomials (Step S106). When the number of errors is not 1 or less (Step S105: No), the decoding unit 18 executes root calculation of the second-order and third-order error locator polynomials (Step S107).
When the root calculation of the second-order and third-order error locator polynomials is executed, the decoding unit 18 determines whether the roots are obtained by the root calculation of the second-order and third-order error locator polynomials (Step S108).
For the second-order and third-order error locator polynomials, there may be no roots for the value of β/(5√(γ3)). In such a case, for example, the LUT is configured to associate information indicating that the roots do not exist with the key information of the LUT corresponding to this value. When the information indicating that the roots do not exist is obtained from the LUT, the decoding unit 18 determines that the roots cannot be obtained. It should be noted that syndrome s1 is always obtained as a root for the zeroth-order and first-order error locator polynomials.
In a case where the roots cannot be obtained (Step S108: No), the decoding unit 18 provides a notification of a decoding failure (Step S110), and ends the decoding processing.
When the roots are obtained (Step S108: Yes), and after the root calculation of the zeroth-order and first-order error locator polynomials, the decoding unit 18 corrects the error of the error locations corresponding to the roots (Step S109), and ends the decoding processing.
The decoding unit 18 may determine whether or not the values of all the syndromes are 0 after calculating the syndromes in Step S102, for example, and end the decoding processing when all the syndromes are 0. This is because when all syndromes are 0, it can be determined that there is no error in the received word.
While the case of using the BCH code that corrects errors of 3 bits or less has been described as an example, the similar procedure can also be applied to a configuration using the BCH code that corrects errors of n (n is an integer of 3 or more) bits or less. For example, in a case where α BCH code for correcting an error of 5 bits or less is used, the above procedure can be applied to decoding in a case where the number of errors is 0 to 3. Any procedure may be used for decoding when the number of errors is 4 or 5.
In the second embodiment, variable transformation using β alone as a calculation value out of β and γ is executed. The overall configuration of the memory system of the second embodiment is similar to that of
The second embodiment is different from the first embodiment in that, the root calculation circuit 100-2 does not include the root calculation circuit 110 and the selection circuit 131, and the function of a root calculation circuit 120-2 is different from the first embodiment. Other configurations are similar to those of the root calculation circuit 100 of the first embodiment, so that the same reference numerals are given, and description thereof is omitted.
In the second embodiment, it is not necessary to classify conditions such as classification into the conditions (C1) and (C2) in the above-described first embodiment. As a result, a circuit corresponding to the root calculation circuit 110 and a circuit corresponding to the selection circuit 131 for dividing the output of the circuit are unnecessary.
Hereinafter, the reason that the case division is unnecessary will be described. The condition (C1) of the first embodiment can be interpreted as a condition for separating the calculation (root calculation circuit 110) in the case of γ=0 from the calculation (root calculation circuit 120) in the case of γ≠0 so as not to cause division calculation by 0.
β used for variable transformation in the second embodiment. Since B≠0 holds, when the number of errors is 2 or 3, the root calculation circuit 100-2 that calculates the root of the second-order or third-order error locator polynomial used when the number of errors is 2 or 3 can be configured on the assumption that β≠0 is satisfied, in other words, division by 0(=β) does not occur. Thus, in the second embodiment, the classification into (C1) and (C2) in the first embodiment is unnecessary.
The root calculation of the second-order and third-order error locator polynomials σ(x) in the second embodiment will be described below. σ(x) is expressed by above-described Formula (10) as in the first embodiment. In the second embodiment, let the variable z be the value obtained by the variable transformation from the variable y expressed by the following Formula (19), then the roots z1, z2, and z3 are obtained from the following Formula (20) by using the LUT that returns the roots of the polynomial expressed by the following Formula (22) with a value represented by the following Formula (21) as the key information.
Moreover, by multiplying each of the obtained roots z1, z2, and z3 by ∛(β), the roots y1, y2, and y3 of transformed polynomial are obtained. Moreover, by adding s1 to each of the obtained roots y1, y2, and y3, the roots x1, x2, and x3 of σ(x) are obtained.
The root calculation circuit 100-2 is configured to execute the root calculation of the second-order and third-order error locator polynomials as described above. Details of the root calculation circuit 100-2 in
The root calculation circuit 120-2 includes arithmetic circuits 121-2 to 123-2, an LUT 124-2, and arithmetic circuits 125-2 to 127-2. The arithmetic circuits 121-2 to 123-2, the LUT 124-2, and the arithmetic circuits 125-2 to 127-2 execute the following operations, respectively.
In the present embodiment, one arithmetic circuit 121-2 that calculates (−5/3) power may be provided as a calculation circuit having a scale similar to that of the inverse element calculation circuit. Moreover, in the present embodiment, by using β alone as variable transformation out of β and γ, calculation to be necessary for γ out of β and γ is only one multiplication by the arithmetic circuit 123-2. Therefore, the calculation of the roots of the error locator polynomial in the case of 2 or 3 can be implemented by a simpler configuration.
Note that the present embodiment can be applied to GF(2m) in which the existence of the cubic root is guaranteed (m is a value indivisible by 2), that is, applied to a case where m is indivisible by 2 (when m is an odd number).
Since the procedure the decoding processing of the second embodiment is similar to the flowchart of
As described above, according to the first and second embodiments, error correction (decoding) can be executed with a simpler configuration.
While certain embodiments have been described, these embodiments have been presented by way of example only, and are not intended to limit the scope of the inventions. Indeed, the novel embodiments described herein may be embodied in a variety of other forms; moreover, various omissions, substitutions and changes in the form of the embodiments described herein may be made without departing from the spirit of the inventions. The accompanying claims and their equivalents are intended to cover such forms or modifications as would fall within the scope and spirit of the inventions.
Number | Date | Country | Kind |
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2023-021414 | Feb 2023 | JP | national |