MEMS micro-relay with coupled electrostatic and electromagnetic actuation

Information

  • Patent Grant
  • 6635837
  • Patent Number
    6,635,837
  • Date Filed
    Thursday, April 26, 2001
    23 years ago
  • Date Issued
    Tuesday, October 21, 2003
    20 years ago
Abstract
A microelectromechanical relay and a method of fabricating the same that combines electrostatic actuation with electromagnetic actuation. The relay has very low contact resistance when the relay is in its ON state and enhanced contact-to-contact isolation when the relay is in its OFF state. The relay includes a substrate having a trench formed therein, a first pair of contacts located in the trench and an actuator for controllably establishing electrical contact between the first pair of contacts. The actuator includes spaced apart supports on the substrate and a movable beam extending between the supports. A contact cross bar is located on the movable beam facing the first pair of contacts. A first electrode is located on the movable beam and a second electrode is located on the substrate. Electromagnetic force is used to deflect the movable beam towards the substrate and then electrostatic force is used to bring the contact cross bar in physical contact with the first pair of contacts.
Description




BACKGROUND OF THE INVENTION




Microelectromechanical systems (MEMS) have recently been developed as alternatives for conventional electromechanical devices such as relays, actuators, valves and sensors. MEMS fabrication allows the coupling of mechanical and electronic functionality in a single micro-scale device. Borrowing from integrated circuit fabrication, MEMS processes are typically performed on silicon wafers using batch processing techniques. This permits greater economies of scale, higher precision, and better device matching capabilities than conventional assembly-based manufacturing. New functionality may also be provided because MEMS devices are much smaller than conventional electromechanical devices.




One of the components of a mechanical relay is the actuator used to close or open the switch contacts. Common MEMS actuators are driven by electrostatic or electrothermal forces.




D. Bosch et al., “A Silicon Microvalve with Combined Electromagnetic/Electrostatic Actuation,” Sensors and Actuators, 37-38 (1993) 684-692, describes a silicon microvalve that uses a combination of electrostatic and electromagnetic actuation. The valve consists of two micromachined components which are then bonded together. Because the two micromachined components are bonded together, increased complexity in assembly is introduced which could lead to errors in alignment of the two parts.




It is desirable to provide a microrelay that has high contact-to-contact isolation when the relay is in the OFF state to increase relay performance. It is also important to provide a microrelay with very low contact resistance and negligible power dissipation when the microrelay is in the ON state to increase relay lifetime and reliability. Also, it is critical to provide a microrelay that requires minimal assembly and lends itself to batch fabrication techniques to reduce product cost. In addition, it is desirable to provide a microrelay that has reduced actuation currents and voltages to reduce device power and lessen heat generation.




SUMMARY OF THE INVENTION




According to a first aspect of the invention, there is provided a microelectromechanical relay. The relay has a substrate layer having a trench formed therein. A first pair of contacts and the bottom electrode are located in the trench of the substrate and a microelectromechanical actuator and contact bar are located on the substrate for controllably establishing electrical contact between the first pair of contacts on the substrate. The actuator includes spaced apart anchors on the substrate, a movable beam extending between the spaced apart supports, a contact cross bar located on the movable beam, the contact cross bar facing the first pair of contacts, means for deflecting the movable beam towards the first pair of contacts on the substrate, and means for bringing the cross bar in physical contact with the first pair of contracts.




According to a second aspect of the invention, there is provided a microelectromechanical relay. The relay includes a substrate having a trench formed therein. A first pair of contacts is located in the trench of the substrate and a microelectromechanical actuator is located on the substrate for controllably establishing electrical contact between the first pair of contacts on the substrate. The actuator includes spaced apart supports on the substrate, a movable beam extending between the spaced apart supports, a contact cross bar located on the movable beam, the contact cross bar facing the first pair of contacts, means for generating an electromagnetic (Lorentz) force on the movable beam to deflect the beam towards the substrate, and means for generating an electrostatic force between the beam and the substrate so that the contact cross bar is brought into physical contact with the first pair of contacts.




According to a third aspect of the invention, there is provided a microrelay that includes a first electrode located on the movable beam and a second electrode located on the substrate. The first electrode is at a different potential than the second electrode so that when the first and second electrodes are brought into close proximity to one another, an electrostatic force is generated therebetween to bring the contact cross bar in contact with the first pair of electrodes. Also included are current carrying coils located in the movable beam wherein when the relay is placed in a permanent magnetic field, an electromagnetic force is exerted on the movable beam to deflect the beam towards the pair of contacts close enough so that the electrostatic force takes over.




According to a fourth aspect of the invention, there is provided a method of fabricating a microelectromechanical relay. The method includes the steps of:




(a) etching a deep trench anisotropically into a silicon substrate;




(b) depositing an insulating film on the entire surface of the substrate;




(c) depositing a conductive film on the insulating film;




(d) etching away the conductive film deposited in step (c) to create a pair of contacts and an electrode in the deep trench;




(e) filling deep trench with a sacrificial material;




(f) polishing the substrate to create a flat surface;




(g) creating a beam layer over the deep trench; and




(h) removing the sacrificial material.











BRIEF DESCRIPTION OF THE DRAWINGS





FIG. 1

is a cross sectional view of a MEMS relay according to a preferred embodiment of the present invention in an OFF state.





FIG. 2

is a cross sectional view of the MEMS relay shown in

FIG. 1

in an ON state.





FIG. 3

is a top, planar view of a wafer on which a microrelay is constructed according to a preferred embodiment of the present invention.





FIG. 4

is a cross sectional view of the relay shown in

FIG. 1

taken along lines


4





4


.





FIG. 5

is a top view of the lower electrode and contacts of the relay shown in FIG.


1


.





FIG. 6

is a top planar view of a movable beam according to the present invention.





FIG. 7

is a top planar view of a wafer on which a microrelay according to a preferred embodiment is formed.





FIGS. 8-22

illustrate the processing step of forming a MEMS relay according to a preferred embodiment of the present invention.











DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS OF THE PRESENT INVENTION





FIG. 1

is a cross-sectional view of a MEMS microrelay according to a preferred embodiment of the present invention. The microrelay


10


is shown in an OFF state.

FIG. 2

is a cross-sectional view of the microrelay shown in

FIG. 1

in an ON state. The microrelay


10


includes a substrate


12


, a movable beam


14


, contacts


16


, a contact cross-bar


18


and an insulating layer


20


separating the contacts


6


from the substrate


12


. Also included are an upper electrode (not shown) in the movable beam


14


and a lower electrode (not shown) located on the substrate


12


. The upper and lower electrodes will be discussed in greater detail with reference to the views in

FIGS. 4 and 5

. The contacts


16


are isolated, conductive lines that are built in a trench


22


formed in the substrate


12


. One of the contacts


16


is an input and the other is an output.





FIG. 2

is a cross-sectional view of the MEMS relay shown in

FIG. 1

in an ON state. The relay


10


is switched “on” by electrically connecting the input and output lines, i.e., contacts


16


, with a movable, conductive, contact member, namely contact cross-bar


18


. The contact cross-bar


18


hangs directly over contacts


16


and is suspended on the movable beam


14


. The movable beam


14


is fixed at each end by two spaced apart supports


24


formed on each side of trench


22


.





FIG. 3

is a top view of a substrate having a microrelay formed thereon according to a preferred embodiment of the present invention. The movable beam


14


includes a diaphragm


30


on which the contact cross-bar (not shown) is located so that it is facing the substrate


12


and folded spring arms


32


extending from the diaphragm


30


and coupling the diaphragm to the spaced apart supports


24


. In this preferred embodiment, the diaphragm


30


is shown as a square but it may have other shapes such as a rectangle or triangle. If the diaphragm is triangular in shape, as shown in

FIG. 6

, three folded spring arms are needed as will be described hereinafter. The microrelay


10


is placed between the north and south poles,


34


,


36


of a permanent magnet. The movable beam


14


in the diaphragm region


30


has current coils


38


running on the top surface of the beam. The current coils are coupled to a source of current (not shown).




Relay transition from the “OFF” state to the “ON” state is accomplished using a two-stage actuation technique. In the first stage, the movable beam


14


is deflected to bring the contact cross-bar


18


closer to the contacts


16


. In order to do this, an electromagnetic or Lorentz force is used. The electromagnetic force is generated by placing the entire device in an external magnetic field as shown in FIG.


3


and passing current through current coils


38


fabricated on the movable beam


14


. Once the contact cross-bar


18


is brought close to contacts


16


, the second stage of actuation is used, more particularly electrostatic actuation. Using electrostatic actuation, the contact cross-bar


18


is brought into physical contact with contacts


16


. It is important to have a high contact force so that a stable “ON” state with low contact resistance is achieved. The electrostatic force is generated by two electrodes, one fabricated on the movable beam


14


and the other built within trench


22


, where the electrodes are held at different potentials.





FIG. 4

is a cross-sectional view of the microrelay shown in

FIG. 1

taken along lines


4





4


. The movable beam


14


is made up of the following five layers, starting with the layer closest to the substrate, a first conductive layer


18


, a first insulative layer


40


, a second conductive layer


42


, a second insulative layer


44


, and a third conductive layer


38


. The first conductive layer


18


forms the contact cross-bar, the second conductive layer


42


forms the upper electrode and the third conductive layer


38


forms the current coil. The first and second insulative layers


40


,


44


isolate the contact crossbar


18


, electrode


42


and current coils


38


from one another.





FIG. 5

is a top view of the lower electrode and contacts of the relay shown in

FIG. 1

(the movable beam not shown). The lower electrode


50


is located around the contacts


16


and the electrode as well as the contacts are built within trench


22


on top of insulating film


20


.





FIG. 6

is a top planar view of a movable beam according to a preferred embodiment of the present invention. The movable beam


14


has an overall length L


0


of about 3 mm and an overall width W


0


of about 0.8 mm. Parameter a is about 0.215 mm, parameter b is about 0.215 mm and parameter L is about 0.8 mm. Of course, those of ordinary skill in the art will appreciate that other dimensions may be used and the claimed invention is not limited to the preferred embodiments illustrated.





FIG. 7

is a top planar view of a microrelay


100


according to another preferred embodiment of the present invention. The microrelay has a triangular diaphragm region


110


and three spring arms. In both microrelays shown in

FIGS. 1 and 7

the shape and dimensions of the springs are optimized to provide the deflection required to bring the contact cross-bar closer to the contacts with smaller electromagnetic forces. Another interesting characteristic of this design is that the bending of the movable beam in the diaphragm region is minimal. This keeps the upper electrode parallel to the lower electrode even at large beam deflections, thereby increasing electrostatic force. Also, making the lower electrode surround the contacts results in a more effective and uniform transmission of the electrostatic force onto the contacts.





FIGS. 8-22

illustrate the microfabrication processing steps used to create a microrelay according to the preferred embodiments of the present invention. In

FIG. 8

, which is a cross-sectional view, the substrate


12


which in a preferred embodiment is silicon has a layer of nitride


200


deposited thereon using low pressure chemical vapor deposition (LPCVD) techniques. Preferably layer


200


is deposited to a thickness of about 1000 Å. Next, as shown in the cross-sectional view of

FIG. 9

, a reactive ion etch (RIE) is performed on the nitride layer


200


to form an opening


202


for the trench (see FIG.


1


).

FIG. 10

shows a top plan view of the wafer shown in FIG.


9


. Next, as shown in the cross-sectional view of

FIG. 11

an anisotropic KOH etch is formed to create the trench. In a preferred embodiment the trench is about 12 microns deep. In the cross-sectional view of

FIG. 12

a layer of nitride


204


is deposited using LPCVD to a thickness of about 1000 Å. Nitride layer


204


forms an insulation layer.




Next the lower electrode and contacts are created in the nitride layer


204


.

FIGS. 13 and 14

are cross-sectional and top plan views respectively of this processing step. About 1 micron of gold is sputtered and then patterned to form the contacts


16


and lower electrode


206


. It can be seen that contacts pads


208


extend to a side of the wafer where the electrode


206


can be electrically coupled to a voltage source and contacts


16


can be coupled to in and out terminals. Next, in the cross-sectional view of

FIG. 15

polyimide


210


is spun-on, cured, polished and etched back using an oxygen plasma etch so that the polyimide


210


fills the trench.




Now the movable beam can be created. As shown in the top plan view

FIG. 16

, the contact cross-bar


18


is created by electroplating gold onto the polyimide


210


. Preferably the contact cross-bar


18


is about 1 micron thick. As shown in the top view of

FIG. 17

, a layer of nitride is then sputtered and etched using RIE to define the diaphragm and folded spring arms of the movable beam. Then, as shown in the cross-sectional and top views of

FIGS. 18 and 19

, gold is electroplated over the nitride layer


212


to form the upper electrode


214


. Preferably the upper electrode has a thickness of about 5 microns. A layer of nitride


216


, shown in

FIGS. 20 and 21

, is then sputtered and etched using an RIE over the upper electrode. Then, as shown in the top plan view of

FIG. 22

, gold is electroplated on the nitride layer to form the current coils


218


. Preferably the current coils have a thickness of about 1 micron. Finally, a wet chemical etch with a solution of sulphuric acid hydrogen peroxide is performed to selectively remove the sacrificial polyimide and release portions of the beam.




The above specification, examples and data provide a complete description of the manufacture and use of the composition of the invention. Since many embodiments of the invention can be made without departing from the spirit and scope of the invention, the invention resides in the claims hereinafter appended.



Claims
  • 1. A microelectromechanical relay comprising:a substrate layer having a trench formed therein; a first pair of contacts located in the trench of the substrate; a microelectromechanical actuator on the substrate for controllably establishing electrical contact between the first pair of contacts on the substrate, the actuator comprising: spaced apart supports on the substrate; a movable beam extending between the spaced apart supports; a contact cross bar located on the movable beam, the contact cross bar facing the first pair of contacts; means for deflecting the movable beam towards the first pair of contacts on the substrate; and means for bringing the cross bar in physical contact with the first pair of contacts.
  • 2. The relay of claim 1 wherein the means for deflecting the movable beam comprise current carrying coils on the movable beam and a permanent magnetic field in which the relay is placed so that an electromagnetic force is exerted on the movable beam.
  • 3. The relay of claim 1 wherein the means for bringing the cross bar in physical contact with the pair of electrodes comprises a first electrode located on the movable beam and a second electrode located on the substrate wherein the first electrode is at a different potential than the second electrode so that an electrostatic force is exerted on the movable beam.
  • 4. The relay of claim 3 wherein the movable beam comprises the following five layers starting with a layer closest to the substrate, a first conductive film which forms the contact cross bar, an insulating film, a second conductive film that forms the first electrode, an insulating film and a third conductive film that forms current coils.
  • 5. The relay of claim 1 wherein the contact cross bar is square in shape.
  • 6. The relay of claim 1 wherein the contact cross bar is triangular in shape.
  • 7. A microelectromechanical relay comprising:a substrate having a trench formed therein; a first pair of contacts located in the trench of the substrate; a microelectromechanical actuator on the substrate for controllably establishing electrical contact between the first pair of contacts on the substrate, the actuator comprising: spaced apart supports on the substrate; a movable beam extending between the spaced apart supports; a contact cross bar located on the movable beam, the contact cross bar facing the first pair of contacts; means for generating an electromechanical force on the movable beam to deflect the beam towards the substrate; and means for generating an electrostatic force between the beam and the substrate so that the contact cross bar is brought into physical contact with the first pair of contacts.
  • 8. A microrelay comprising:a substrate layer having a trench formed therein; a first pair of contacts located in the trench of the substrate; a microelectromechanical actuator on the substrate for a controllably establishing electrical contact between the first pair of contacts on the substrate, the actuator comprising: spaced apart supports on the substrate; a movable beam extending between the spaced apart supports; a contact cross bar located on the movable beam, the contact cross bar facing the first pair of contacts; a first electrode located on the movable beam; a second electrode located on the substrate, wherein the first electrode is at a different potential than the second electrode so that when the first and second electrodes are brought into close proximity to one another, an electrostatic force exists therebetween to bring the contact cross bar in contact with the first pair of contacts; and current carrying coils located in the movable beam wherein when the relay is placed in a permanent magnetic field, an electromagnetic force is exerted on the movable beam to deflect the beam towards the pair of contacts close enough so that the electrostatic force takes over.
  • 9. The relay of claim 1 wherein the actuator comprises two spaced apart supports and the movable beam has a central area and two spring arms extending from the central area with each spring arm coupled to an individual support.
  • 10. The relay of claim 1 wherein the actuator comprises three spaced apart supports and the movable beam has a central area and three spring arms extending from the central area with each spring arm coupled to an individual support.
  • 11. The relay of claim 10 wherein the central area is triangular in shape.
  • 12. The relay of claim 9 wherein the central area is rectangular in shape.
  • 13. The relay of claim 9 wherein the central area is square in shape.
  • 14. The relay of claim 1 wherein the second electrode surrounds the contacts.
  • 15. A microelectromechanical relay comprising:a substrate layer; a first pair of contacts located on the substrate; a microelectromechanical actuator on the substrate for controllably establishing electrical contact between the first pair of contacts on the substrate, the actuator comprising: spaced apart supports on the substrate; a movable beam extending between the spaced apart supports; a contact cross bar located on the movable beam, the contact cross bar facing the first pair of contacts; an electromagnetic device configured and arranged to generate an electromagnetic force between the movable beam and the substrate to deflect the movable beam towards the first pair of contacts on the substrate; and an electrostatic device configured and arranged to generate a electrostatic force between the beam and the substrate to bring the cross bar in physical contact with the first pair of contacts.
  • 16. The relay of claim 15 wherein the electromagnetic device comprises a conductive layer on the movable beam and a permanent magnetic field in which the relay is situated so that an electromagnetic force is exerted on the movable beam when current passes through the conductive layer.
  • 17. The relay of claim 16 wherein the conductive layer comprises a coil structure.
  • 18. The relay of claim 15 wherein the electrostatic device comprises a fist electrode located on the movable beam and a second electrode located on the substrate, wherein the first electrode is at a different potential than the second electrode so that an electrostatic force is exerted on the movable beam.
  • 19. The relay of claim 18 wherein the second electrode on the substrate substantially surrounds the contacts.
  • 20. The relay of claim 18 wherein the movable beam comprises the following five layers starting with a layer closest to the substrate, a first conductive layer which forms the contact cross bar, an insulating layer, a second conductive layer that forms the first electrode, an insulating layer and a third conductive layer that is used to generate the electromagnetic force.
  • 21. The relay of claim 15 wherein the spaced apart supports define a trench in the substrate, wherein the first pair of contacts are located in the trench.
  • 22. The relay of claim 15 wherein the contact cross bar is square in shape.
  • 23. The relay of claim 15 wherein when the movable beam and the substrate are brought into close proximity to one another, an electrostatic force exists therebetween to bring the contact cross bar in contact with the first pair of contacts; andwherein when the relay is placed in a permanent magnetic field, an electromagnetic force is exerted on the movable beam to deflect the beam towards the pair of contacts close enough so that the electrostatic force takes over.
  • 24. The relay of claim 15 wherein the movable beam has a central area and two spring arms extending from the central area with each spring arm coupled to one of the spaced apart supports on the substrate.
  • 25. The relay of claim 24 wherein the central area is rectangular in shape.
  • 26. The relay of claim 24 wherein the central area is square in shape.
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