This is an application for reissue of U.S. Pat. No. 6,873,223. A related continuation reissue application Ser. No. 13/238,433, filed Sep. 21, 2011 is also an application for reissue of U.S. Pat. No. 6,873,223.
1. Field of the Invention
The present invention relates to millimeter wave switches and more particularly to millimeter wave switches useful at millimeter wave frequencies and higher frequencies with increased power handling capability relative to known switches, amenable to being fabricated using microelectromechanical system (MEMS) technology.
2. Description of the Prior Art
RF switches are used in a wide variety of applications. For example, such RF switches are known to be used in variable RF phase shifters, RF signal switching arrays, switchable tuning elements, as well as band switching of voltage controlled oscillators. In order to reduce the size and weight of such RF switches, microelectromechanical system (MEMS) technology has been known to be used to fabricate such switches. An example of such an RF switch is disclosed in commonly owned U.S. Pat. No. 6,218,911, hereby incorporated by reference. The RF switch disclosed therein includes a pair of relatively parallel spaced apart metal traces. An air-bridged metal beam is disposed between the parallel spaced apart metal traces.
Electrostatic forces are used to deflect the air bridge to contact one of the metal traces. The center beam is attached to a substrate at each end. As such, when electrostatic attraction forces are applied, the beam deflects into a U-shaped configuration, such that a point approximately at the center of the beam, contacts one of the parallel metal traces disposed adjacent the beam. In such a configuration, the RF input is applied to one end of the beam.
Although such a configuration provides satisfactory performance, such a configuration has a relatively high impedance (i.e. relatively high inductive and resistance) which results in relatively high RF power losses, and reduces the RF power capability of the switch.
In order to solve the problem of high RF power losses of such switches, capacitive-type switches using MEMS technology have been developed for use in millimeter wave and microwave applications. Such capacitive-type switches include a lower electrode, a dielectric layer and a movable metal membrane. Electrostatic forces are used to cause the movable metal membrane to snap and make contact with the dielectric layer to form a capacitive-type switch. Examples of these capacitive-type switches are disclosed in: “Performance of Low Loss RF MEMS Capacitive Switches,” by Goldsmith et al., IEEE Microwave and Guided Wave Letters, Vol. 8, No. 8, August 1998, pgs. 269, 271; and “Ka-Band RF MEMS Phase Shifters,” by Pillans et al., IEEE Microwave and Guided Wave Letters, Vol. 9, No. 12, December 1999, pgs 520-522. Although such capacitive-type switches provide adequate performance in the millimeter wave and microwave frequencies, the dielectric layer in the capacitive-type switches is known to store charges making it unsuitable for commercial applications. Thus, there is a need for an RF switch which provides true metal-to-metal contact which avoids problems associated with capacitive-type switching and also provides increased RF power handling capability relative to known RF switches.
Briefly, the present invention relates to various embodiments of an RF switch suitable for use at millimeter wave and higher frequencies of 30 GHz and above. All embodiments of the switch are configured to reduce portions of the switch structure which are not 50 ohm transmission lines in order to reduce the RF power losses of the switch and increase its RF power handling capability. Four embodiments of the invention are configured as ground switches. Two of the ground switch embodiments are configured with a planar air bridge. Both of these embodiments are configured so that the conduction path length in the air bridge is shortened between the transmission line and ground by introducing grounded stops. The other two ground switch embodiments include an elevated metal seesaw. In these embodiments, a shortened path to ground is provided with relatively low inductance by proper sizing and positioning of the seesaw structure. Lastly, a broadband power switch embodiment is configured to utilize only a small portion of the air bridge to carry the signal. The relatively short path length results in a relatively low inductance and resistance which reduces the RF power losses of the switch and increases its RF power handling capability relative to known RF switches.
These and other advantages of the present invention will be readily understood with reference to the following specification and attached drawings wherein:
In accordance with the present invention, various embodiments of millimeter wave switches are illustrated in
In all embodiments, the path lengths between the transmission line and ground are shortened relative to known RF switches. By shortening these path lengths, the inductance and resistance of the structure is thereby lowered, thereby lowering the RF power losses of the switch and increasing its power handling capability.
Two embodiments of a grounding switch formed with a planar air bridge illustrated in
Referring first to
A fixed RF contact 27 is formed, for example, on the microstrip transmission line 25 or a co-planar RF transmission line with an impedance of about 50 ohms (not shown). The contact 27 connects the beam 22 to the microstrip transmission line 25 in an actuated position. In accordance with an important aspect of the invention, one or more ground stops 28, 30, formed, for example, adjacent the microstrip transmission line 25 as shown, effectively reduce the path length of the air bridge 22, thereby reducing the impedance and RF power losses of the switch 20. As shown the ground stops 28, 30 are formed on the same side of the air bridge 22 as the fixed RF contact 27.
By appropriate placement of the ground stops 28, 30, the effective path length can be made to be about 50 micrometers or less. A relatively short path length provides a relatively good RF ground for the microstrip transmission line 25 up to millimeter wave frequencies. As such, the RF ground makes an effective RF reflection in the microstrip transmission line 25 when the beam 22 is attracted thereto allowing effective switching in circuits, such as a Ka-band phase shifter. In contrast, the path length of the RF switch disclosed in commonly owned U.S. Pat. No. 6,218,911 is approximately half the length of the air bridge or about 150 micrometers.
Two control pads 32 and 34 are provided. These control pads 32, 34 are used to cause deflection of the beam 22 by electrostatic forces. As such, when a bias voltage, for example, +50V, is applied to each of the control pads 32, 34, the beam 22 is deflected by electrostatic force so as to be electrically connected to the fixed RF contact 27 and fixed grounded stops 28, 30, effectively producing a relatively short path from the microstrip 25 transmission line to ground.
The reliability of the ground switch 20 may be increased by adding one or more optional control pads 36, 38 to the left side (
An alternative embodiment of the ground switch 20 is illustrated in
An air bridge beam 48 is formed on the substrate (not shown) and connected thereto by way of two end posts 50 and 52, formed, for example, by a 2 micrometer metal deposition on the substrate. In this embodiment, the air bridge beam 48 is parallel to the microstrip transmission line 46. An RF Input is available on one end of the microstrip 46 and an RF Output is available on the other end. A terminal 54 is formed between the microstrip transmission line 46 and the beam 48. A grounded stop 56 is positioned adjacent the beam 48 on a side opposite the terminal 54. A control pad 58 is disposed adjacent the beam 48 on the same side as the grounded stop 56.
When a biasing voltage, either positive, for example +50 V, or a negative voltage, is applied to the control pad 58, the left side of the beam (i.e. portion of the beam left of the grounded stop 56 as viewed in
Referring to
Various control pads 72(FIGS. 3A, 3B), 74(FIGS. 3A, 3C), 76(FIGS. 3A, 3C), and 78(FIGS. 3A, 3B) may be provided. These control pads 72-7872, 74, 76 and 78 are disposed on the substrate beneath the seesaw 62. When a bias voltage, for example 10 V, is applied to the control pads (as shown in FIG. 3A), electrostatic attraction forces cause the seesaw 62 to rotate. More particularly, when a bias voltage is applied to the control pads 72 and 76, the seesaw 62 will rotate in a clockwise direction. Similarly, when a bias voltage is applied to the control pad 74 and 78, the seesaw 62 rotates in a counterclockwise direction. As will be discussed in detail below, the seesaw 62 does not contact any of the control pads 72-7872, 74, 76 and 78 in a full clockwise or counter-clockwise position.
Such an arrangement provides a mechanical push-pull configuration. Accordingly, if the switch 60 sticks in one position, it can be returned to a normal position by removing the biasing voltage from the control pads in the stuck position and applying a biasing voltage to the opposite control pads. For example, if the switch is stuck in a position whereby the seesaw 62 is stuck in a clockwise position, the biasing voltage is removed from the control pads 72 and 76 and applied to the control pads 74 and 78. Application of the biasing voltage to the control pad 74 and 78, in turn, causes the seesaw 62 to rotate in a counterclockwise direction, thus returning the seesaw 62 to an at rest position.
Like the grounding switches illustrated in
In order to prevent the seesaw 62 from contacting the control pads 72, 76 when the millimeter wave switch 60 is actuated in the clockwise direction, optional electrically “floating” stops 80, 82 may be provided on the substrate, under the right end of the seesaw 62. These stops 80, 82 may be used to prevent the seesaw 62 from contacting the microstrip transmission line 64 when the switch is in the clockwise non-grounding position as shown in
The seesaw 62 may optionally be provided with one or more vent holes 84. The vent holes 84 facilitate the fabrication process as well as increase the speed of operation of the switch 60. In particular, the vent holes 84 facilitate removal of a sacrificial layer needed in fabrication. In addition, the vent holes 84 reduce the drag in the atmosphere, as well as lower the mass, thus making the switch faster.
The embodiment illustrated in
Referring first to
The air bridge beam 102 is rigidly attached to a substrate (not shown) by way of end posts 110, 112 formed on each end from a thick metal layer directly on the substrate. One or both of the end posts 110, 112 is terminated by an RF grounding impedance 114 and thereby connected to ground to allow charge flow so that the air bridge beam 102 can be attracted to the control pads.
As shown, two terminals 118,120 are formed on the input microstrip transmission line 104 while a single terminal 116, 122 is formed on each of the output RF transmission lines 106, 108, respectively. Additionally, the terminals 116, 118 are formed on one side of the beam 102 while the terminals 120, 122 are formed on an opposing side of the beam 102. The terminals 116, 118, 120, 122 are formed by an additional metalization layer on top of the microstrip transmission lines 104, 106 and 108 to a height that enables contact with the beam 102 when it is deflected either to the right or to the left to that shown in
A plurality of control pads 124, 126, 128 and 130 are provided in order to cause the beam to be deflected by electrostatic force. In particular, the control pads 124 and 128 are formed on one side of the beam 102, while the control pads 126 and 130 are formed on an opposing side of the beam. As shown in
An alternate embodiment of the broadband power switch is illustrated in
The beams 142 and 144 are rigidly attached on each end to the substrate (not shown) by way of a plurality of end posts 168, 170, 172, 174. In order to cause deflection of the beams 142, 144, a plurality of control pads 176, 178, 180, 182, 184, 186, 188 and 190 are provided. Application of the biasing voltage, for example +25V, to the various control pads 176-190176, 178, 180, 182, 184, 186, 188 and 190 causes deflection of the beams 142, 144 to connect various terminals 148, 150, 152 and 154 on the RF input transmission line 146 to be connected to various terminals 160, 162, 164 and 166 on the RF output transmission lines 156 and 158 respectively. As shown, applying a biasing voltage to the control pads 176, 180, 184 and 188 causes the beams 142 and 144 to deflect to the left (
Fabrication details for the planar air bridge grounding switch, seesaw switch and broadband power switch are illustrated in
Referring to FIGS.FIG. 9A-9J, the process is initiated by depositing a thin metalization layer 200 on a wafer or substrate 202. The metalization layer 200, identified as “METAL 1”, may be applied by conventional techniques. The metalization layer 200 may be deposited, for example to a thickness of 1000 angstroms.
As shown in
The second metal layer 210 is a relatively thick metal layer, for example 20,000 angstroms and is used to form the air bridge and raised contacts that need to be at the same height as the bridge. The thick metal layer 210 is also deposited on the transmission line away from the bridge and other electrodes in order to reduce resistance. Finally, as shown in
The process for making the seesaw switch, as illustrated in
FIGS. 10A-10C10a-10c illustrate the placement of the metal layers, METAL 1 and METAL 2(FIGS. 10a, 10b) in the formation of seesaw type switches illustrated in
Obviously, many modifications and variations of the present invention are possible in light of the above teachings. In particular, each embodiment can be configured with coplanar lines rather than microstrip lines. Thus, it is to be understood that, within the scope of the appended claims, the invention may be practiced otherwise than as specifically described above.
Number | Name | Date | Kind |
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5619061 | Goldsmith et al. | Apr 1997 | A |
6069540 | Berenz et al. | May 2000 | A |
6218911 | Kong et al. | Apr 2001 | B1 |
6307169 | Sun et al. | Oct 2001 | B1 |
6307452 | Sun | Oct 2001 | B1 |
6621387 | Hopcroft | Sep 2003 | B1 |
6678943 | Feng et al. | Jan 2004 | B1 |
20020000364 | Hong et al. | Jan 2002 | A1 |
Number | Date | Country |
---|---|---|
0 887 879 | Dec 1998 | DE |
100 31 569 | Feb 2001 | DE |
10031569 | Feb 2001 | DE |
0887879 | Dec 1998 | EP |
Entry |
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Milanovic et al., “Microrelays for Batch Transfer Integration in RF Systems” MEMS2000. Micro Electra Mechanical Systems 2000, vol. 1, Jan. 23, 2000, pp. 787-792. |
Yao et al., “A Surface Micromachined Miniature Switch for Telecommunications Applications with Signal Frequencies from DC up to 4 Ghz”, vol. 2, Jun. 25, 1995, pp. 384-387. |
B. Pillans et al., “Ka-Band RF MEMS Phase Shifters,” IEEE Microwave and Guided Wave Letters, vol. 9, No. 12, Sep. 1999, pp. 520-522. |
U.S. Appl. No. 13/238,433, filed Sep. 21, 2011, Robert Stokes. |
Charles L. Goldsmith et al., “Performance of Low-Loss RF MEMS Capacitive Switches,” IEEE Microwave and Guided Wave Letters, vol. 8, No. 8, Aug. 1998. |
B. Pillans et al., “Ka-Band RF MEMS Phase Shifters,” IEEE Microwave and Guided Wave Letters, vol. 9, No. 12, Dec. 1999, pp. 520-522. |
Number | Date | Country | |
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Parent | 10320926 | Dec 2002 | US |
Child | 11334823 | US |