Claims
- 1. A test switch apparatus comprising:a plurality of identical modules, each having a base and a planar barrier wall integrally extending from the base, the base having a first side wall opposed from the barrier wall; complementary interconnecting members formed on the first side wall of the base and the barrier wall for releasably interconnecting two modules in a side-by-side arrangement; mating lock elements formed on each barrier wall and each base for lockingly interconnecting two adjacent switch modules; and a switch mountable on each base.
- 2. The test switch apparatus of claim 1 wherein the interconnecting members comprise:at least one recess formed on one of the first side wall of the base and the lower portion of the barrier wall, and at least one complementary shaped projection formed on the other of the lower portion of the barrier wall and the first side wall of the base.
- 3. The test switch apparatus of claim 2 wherein the interconnecting elements comprise two spaced recesses and two spaced mating projections.
- 4. The test switch apparatus of claim 1 wherein the interconnecting members comprise:a recess having opposed side walls extending from an open end at one edge of the base to an opposed closed end; and one projection having opposed side walls extending from one edge of the base to a central end wall.
- 5. The test switch apparatus of claim 1 wherein the lock elements comprises:complementary lock elements formed on the first side wall of the base and the first portion of the barrier wall for locking two adjacent modules together.
- 6. The test switch apparatus of claim 1 wherein the lock elements interlock after adjacent modules are interconnected by the interconnecting members.
- 7. The test switch apparatus of claim 1 wherein the lock elements comprise:a projection extending outwardly from one of the first side wall of the base and the barrier wall; and a complementary shaped recess formed in the other of the barrier wall and the first side wall of the base.
- 8. The test switch apparatus of claim 1 further comprising:the interconnecting elements comprising two spaced recesses and two spaced mating projections, one lock element disposed between the two spaced recesses and one lock element disposed between the two spaced mating projections.
- 9. A test switch apparatus comprising:a plurality of identical modules, each having a base and a planar barrier wall extending from the base, the base having a first side wall opposed from the barrier wall; complementary interconnecting members formed on the first side wall of the base and the barrier wall for releasably interconnecting two modules in a side-by-side arrangement; a switch mountable on each base; an end piece mounted adjacent an endmost switch module, the end piece including an integral planar barrier wall and at least one interconnecting member releasably interconnectable with a mating interconnecting member on the adjacent endmost switch module; and at least one lock projection and one lock receiver formed on the end piece and releasably lockable with one complementary lock projection and one lock receiver formed on an adjacent switch module.
- 10. The test switch apparatus of claim 9 wherein the end piece comprises:a base having a first side wall and an opposed barrier wall with a first portion contiguous with and extending from the base; and the one interconnecting member formed on the first side wall releasably interconnectable with the one mating interconnecting member on the barrier wall of an adjacent disposed module.
- 11. The test switch apparatus of claim 1 further comprising:mating lock elements formed on each barrier wall and each base for lockingly interconnecting two adjacent switch modules.
- 12. The test switch apparatus of claim 11 wherein the lock elements comprises:complementary lock elements formed on the first side wall of the base and the first portion of the barrier wall for locking two adjacent modules together.
- 13. The test switch apparatus of claim 11 wherein the lock elements interlock after adjacent modules are interconnected by the interconnecting members.
- 14. The test switch apparatus of claim 11 wherein the lock elements comprise:a projection extending outwardly from one of the first side wall of the base and the barrier wall; and a complementary shaped recess formed in the other of the barrier wall and the first side wall of the base.
- 15. A test switch apparatus of comprising:a plurality of identical modules, each having a base and a planar barrier wall extending from the base, the base having a first side wall opposed from the barrier wall; complementary interconnecting members formed on the first side wall of the base and the barrier wall for releasably interconnecting two modules in a side-by-side arrangement; a switch mountable on each base; one end piece mounted to opposed ends of the plurality of identical modules; complimentary interconnecting members formed on each of the end pieces and on each adjacent module for releasably interconnecting each end pieces to each adjacent module; at least one lock projection and one lock receiver formed on the end piece and releasably lockable with one complementary lock projection and one lock receiver formed on an adjacent switch module; a cover removably affixed to the end pieces; and a bore extending through end piece, the bore receiving a fastener to removably affix the cover to each end piece.
CROSS REFERENCE TO CO-PENDING APPLICATION
This application claims to the benefit of the priority date of co-pending, provisional Patent Application Ser. No. 60/146,681 filed Aug. 2, 1999, the entire contents of which are incorporated herein by reference.
US Referenced Citations (19)
Non-Patent Literature Citations (2)
| Entry |
| “Test Switches”, MDI ©1999 Meter Devices Company, Inc. |
| “Testswitch, The New Safer Miniature Test Switch”, TestSwitch, Patent #5722534 No date. |
Provisional Applications (1)
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Number |
Date |
Country |
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60/146681 |
Aug 1999 |
US |