Number | Name | Date | Kind |
---|---|---|---|
RE31828 | Raymond et al. | Feb 1985 | |
3922537 | Jackson | Nov 1975 | |
3976864 | Gordon et al. | Aug 1976 | |
3976940 | Chau et al. | Aug 1986 | |
4016492 | Miller, Jr. et al. | Apr 1977 | |
4092589 | Chau et al. | Jun 1978 | |
4100532 | Farnbach | Jul 1978 | |
4102491 | DeVito et al. | Jul 1978 | |
4107651 | Martin | Aug 1978 | |
4108358 | Niemaszyk et al. | Aug 1978 | |
4175253 | Pitegoff | Nov 1979 | |
4176312 | Wrinn | Nov 1979 | |
4176313 | Wrinn | Nov 1979 | |
4178543 | Wrinn et al. | Dec 1979 | |
4178544 | Hoffman | Dec 1979 | |
4216539 | Raymond et al. | Aug 1980 | |
4228537 | Henckels et al. | Oct 1980 | |
4236246 | Skilling | Nov 1980 | |
4253059 | Bell et al. | Feb 1981 | |
4280220 | Vaeches | Jul 1981 | |
4338677 | Morrill, Jr. et al. | Jul 1982 | |
4433414 | Carey | Feb 1984 | |
4449065 | Davies, Jr. | Jun 1984 | |
4450560 | Conner | May 1984 | |
4459693 | Prang et al. | Jul 1984 | |
4480315 | Hickling | Oct 1984 | |
4493045 | Hughes, Jr. | Jan 1985 | |
4493079 | Hughes, Jr. | Jan 1985 | |
4500993 | Jacobson | Feb 1985 | |
4513395 | Henry et al. | Apr 1985 | |
4523143 | Dvorak | Jun 1985 | |
4555783 | Swanson | Nov 1985 | |
4588945 | Groves et al. | Jun 1986 | |
4594544 | Necoechea | Jun 1986 | |
4605894 | Cox et al. | Aug 1986 | |
4652814 | Groves et al. | Mar 1987 | |
4806852 | Swan et al. | Feb 1989 | |
4875210 | Russo et al. | Oct 1989 | |
4876685 | Rich | Oct 1989 | |
5027353 | Jarwala et al. | Jun 1991 | |
5051996 | Bergeson et al. | Sep 1991 | |
5127011 | Combs et al. | Jun 1992 |
Number | Date | Country |
---|---|---|
0154048 | Nov 1985 | EPX |
2305217 | Jan 1989 | EPX |
61-66973 | May 1986 | JPX |
61-126481 | Jun 1986 | JPX |
WO8908297 | Sep 1989 | WOX |
Entry |
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"Programming and Operating Fault Finder's Test System," Jan. 19, 1978. |
"FF303 Maintenance Manual," May 5, 1978. |
"FF303 Specifications," Feb. 1, 1977. |
Schwedner, "A Software System for In-circuit and Functional Testing," Wescow Proceedings, Sep. 1976. |
Snook, M. et al., "A new hardware architecture for digital in-circuit testing", IEEE International Test Conference 1983 Proceedings, pp. 64-71. |
"HP 3070 Board Test Family," Dec. 1988. |
"HP's Advance Testers Meet Your Test Challenges . . . Today and Tomorrow," Jan. 1989. |
"HP Sales Presentation," Jul. 1988. |
Frederick J. Hill and Gerald R. Peterson, Introduction to Switching Theory and Logical Design, Third Edition (New York: John Wiley & Sons, 1981). |
Tom E. Finnell, Membrain/Schlumberger "In-Circuit Testing of LSI-based PCBs," Electronic Production, vol. 11 No. 9, Sep. 1982, pp. 47-53. |