1. Field of the Invention
The present invention relates to flasked instrument assemblies that are used in downhole tools, and, in particular, to the cooling of the electronic chassis in such an assembly.
2. Description of the Prior Art
It is well-known that downhole instrument assemblies are used in extremely hostile environments. Downhole tools such as logging tools, logging while drilling tools, measurement while drilling tools, and guidance tools that are used in the drilling of deviated wells employ such assemblies. Downhole instrument assemblies typically comprise thermally sensitive components which have a maximum temperature above which they will not operate properly. Such components may, for example, be electronic, optical or mechanical devices which are used to measure various parameters of the well or the formation or the fluid in the well or the fluid in the formation. In order to protect the components in these downhole instrument assemblies, the components are encased in a thermal flask.
When these downhole instrument assemblies contain electronic components, such components are mounted on an electronics chassis in the thermal flask. One function that the thermal flask provides is to isolate the electronic components from the heat of the environment in the wellbore. Such thermal flasks also contain the heat which is generated by the operation of the electronic components in the electronics chassis. The electronics chassis is designed to provide a large thermal mass, which enables the instrument assembly to operate downhole for an extended period of time before the temperature within the thermal flask become such that the operation of the electronic components are degraded. When the electronics chassis reaches a certain critical temperature, downhole operations must be stopped and the instrument assembly must be hoisted back to the surface in order to prevent damage to the assembly. Downhole operations may only be resumed once the electronics chassis has sufficiently cooled down.
The properties of the thermal flask which protect the electronics chassis from environmental heat also retard the release of the heat generated by the electronic components within the flask. Accordingly, research studies by the Assignee of this application have shown that cooling a logging tool by radiation and convection alone (i.e., passive cooling) will require a substantial amount of time, e.g., sixty plus hours, before logging operations may be resumed. Further, it is not feasible to extract the hot electronic components from the thermal flask in an effort to expedite cooling, because such extraction subjects the electronic components to thermal shock and exposure to atmospheric moisture.
The present invention is directed to apparatus for use in a downhole assembly comprising a chamber containing thermally sensitive instrumentation and at least one passage through the chamber through which cooling fluid may flow. The thermally sensitive instrumentation may comprise electronic, optical or mechanical components. In one specific embodiment, apparatus in accordance with the present invention comprises a thermal flask in which an electronic chassis resides that contains electronic components that are used in a downhole instrument assembly. A thermal flask according to the present invention includes a passage through the flask proximate the electronic chassis. The passage has an inlet and an outlet, and the inlet is adapted to be coupled to a source of fluid. As the fluid in the fluid source flows in the passage, active cooling of the electronics chassis in the thermal flask assembly is provided. The passage is hermetically sealed from the volume containing the electronic components to prevent moisture damage to the electronic components.
In one embodiment of the invention, the inlet and outlet of the passage are located on the same side of the thermal flask, while in yet another embodiment the inlet and outlet of the passage are located on opposite ends of the thermal flask. In another embodiment of the present invention, multiple tools may be cooled simultaneously through serial or parallel connections.
In accordance with the present invention, apparatus is provided for cooling a downhole assembly comprising a hermetically sealed chamber containing components for measuring downhole parameters. The downhole assembly further comprises a passage through the hermetically sealed chamber in which a fluid may flow to cool the components in the chamber. The passage has an inlet and an outlet and is hermetically sealed from the components in the chamber.
In a particular embodiment of the invention, apparatus is provided for cooling an electronic chassis of a downhole instrument assembly. The apparatus comprises a thermal flask with a passage through it as described above. Such apparatus further comprises a pressure housing in which the thermal flask resides. Apparatus in accordance with the present invention also comprises a source of fluid, and an inlet coupling operatively connecting the inlet of the passage to the source of the fluid to permit fluid from the fluid source to flow in the passage. An outlet coupling is operatively connected to the outlet of the passage to permit fluid in the passage to exit the thermal flask.
In accordance with the present invention, the electronics chassis of a downhole instrument assembly may be cooled once the downhole instrument assembly has been retrieved from the downhole environment. Alternatively, the electronics chassis of the downhole instrument assembly may be cooled below ambient temperature before the downhole instrument assembly is conveyed downhole. In this embodiment, apparatus in accordance with the present invention comprises a heat exchanger which is interposed between the source of fluid and the inlet coupling and which is used to cool the electronics chassis to a temperature below ambient temperature, e.g. −30° C.
In accordance with the present invention, a method of cooling thermally sensitive instrumentation in a chamber of a downhole instrument assembly is provided. The method comprises forming a passage in the chamber having an inlet and outlet and conveying a fluid through the passage to cool the instrumentation in the chamber. In one particular embodiment, the method of the present invention enhances the transfer of heat out of an electronic chassis in a thermal flask in a downhole instrument assembly. The method comprises forming a passage in the thermal flask which has an inlet and an outlet and which is proximate to and hermetically sealed from the electronic chassis. The method further comprises operatively connecting a source of fluid to the inlet of the passage, and then passing the fluid through the passage to enhance the transfer of heat out of the electronics chassis of the thermal flask. In an alternative embodiment, a method in accordance with the present comprises the further step of cooling the fluid from the fluid source to a temperature below ambient temperature before the fluid is permitted to flow through the passage.
It will be appreciated that the present invention may take many forms and embodiments. Some embodiments of the present invention are described so as to give an understanding of the invention. Thus, the embodiments of the invention that are described herein are intended to be illustrative and not limiting of the invention.
As used in this specification and in the appended claims, two items are “operatively connected” when those items are directly connected to one another or connected to one another via another element. Additionally, the term “downhole instrument assembly” is used to refer to any instrument which is used in a downhole environment and which contains components which only operate satisfactorily up to a specified temperature limit. A “downhole instrument assembly” may, for example, comprise an electronic chassis which is encased in a thermal flask, and examples of such assembles are found in logging tools, logging while drilling tools, measurement while drilling tools and guidance assemblies that are used in the drilling of deviated wells.
Referring to
In accordance with the present invention, a passage 18 is formed in the thermal flask 12 which is proximate to the electronics package 16 and which is hermetically sealed from electronics package 16. Passage 18 has an inlet 18a and outlet 18b, and in one embodiment, has a diameter of approximately 0.25 inches. In
The thermal flask 12 of
Still referring to
The fluid in fluid source 24 may be any substance which deforms continuously under the application of a sheer stress and which is suitable for use in cooling applications. Compressed air, carbon dioxide or nitrogen gas are examples of suitable fluids that may be contained in fluid source 24. If the fluid in fluid source 24 is compressed air, air pump 28 is used to generate the compressed air and the output of air pump 28 is filtered by air filter 26.
Apparatus in accordance with present invention may be utilized to cool the electronics chassis 16 in thermal flask 12 not only after the instrument assembly has been used downhole, but also may be utilized to cool the electronics chassis to a temperature below ambient temperature before the instrument assembly is run downhole. Typically, electronic components are capable of operating reliably at temperatures as low as −30° C. By cooling the electronics package prior to conveying the instrument assembly downhole, the length of time that the electronics chassis can operate downhole before it has to be retrieved is increased. For example, if the electronics chassis is cooled to −30° C. before the instrument assembly is conveyed downhole, that electronics chassis has a 60° C. advantage over a chassis which is conveyed downhole at a typical ambient temperature of 30° C. That advantage translates to several more hours of downhole operating time.
Referring to
Referring to
The active cooling techniques in accordance with the present invention were applied to cool the electronics package in the thermal flask in the same logging instrument referred to in the immediately preceding paragraph where the logging instrument had been heated to 150° C. Compressed air was conveyed through a passage in the thermal flask that was 0.25 inches in diameter. The amount of time required to reduce the temperature of the electronics chassis from approximately 150° C. to about 30° C. was approximately 400 minutes, or about 6.66 hours, as illustrated by graph 33 in
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Number | Date | Country | |
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20060108116 A1 | May 2006 | US |