Patent Application
20100194842
Electrophotographic marking is a well known method of copying or printing documents by exposing a substantially uniformly charged photoreceptor to an optical light image of an original document, discharging the photoreceptor to create an electrostatic latent image of the original document on the photoreceptor's surface, selectively adhering toner to the latent image, and transferring the resulting toner pattern from the photoreceptor, either directly to a marking substrate such as a sheet of paper, or indirectly after an intermediate transfer step. The transferred toner powder image is fused to the marking substrate using heat and/or pressure to make the image permanent. Finally, the surface of the photoreceptor is cleaned of residual developing material and recharged in preparation for the creation of the next image.
While many types of light exposure systems have been developed, a commonly used system is the raster output scanner (ROS) comprised of a laser beam, or beams, a means for modulating the laser beam (which, as in the case of a laser diode, may be the action of turning the source itself on and off) so that the laser beam contains image information, a rotating polygon mirror having one or more reflective surfaces, pre-polygon optics for collimating the laser beam, post-polygon optics to focus the laser beam into a well-defined spot on the photoreceptor surface and to compensate for the mechanical error known as polygon wobble, and one or more path folding mirrors to reduce the overall physical size of the scanner housing. The laser source, modulator, and pre-polygon optics produce a collimated laser beam which is directed to strike the reflective polygon facets. Some of these systems utilize a vertical cavity surface emitting laser (VCSEL) as the laser beam source.
As the polygon rotates, the reflected beam passes through the post-polygon optics and is redirected by any folding mirrors to produce a focused spot that sweeps along the surface of the charged photoreceptor in a straight scan line. Since the photoreceptor moves in a direction substantially perpendicular to the scan line, the swept spot covers the entire photoreceptor surface in a raster pattern. By suitably modulating the laser beam in accordance with the position of the exposing spot at any instant, a desired latent image can be produced on the photoreceptor.
However, imagers of this type frequently experience banding defects during the imaging process. Banding defects are defects in the latent image, in which multiple scan lines do not print evenly. This results in a visible banding effect, in which some scan lines in the final image appear lighter than other lines of theoretically equal tone.
Some of the most common sources of banding defects are due to the imager. Examples are ROS once-per-polygon revolution wobble, jitter, and beam to beam differences. Much of the work has focused on the various mechanical causes of banding and how interlacing schemes can decrease sensitivity to these banding sources. Some of the known mechanical sources of banding include magnification errors, array rotation, and beam non-uniformity. However, all of the sources of blanding defects are not fully understood, and some banding defects seem to arise that defy predictive efforts and known mechanical solutions.
Applicants have investigated these unexplained banding defects, and as a result of this work, discovered that these defects can also occur due to quantum level effects within the photoreceptor. Specifically, it was discovered that neighboring swaths of pixels were attenuating the electrical field being created by the laser beams as they discharged along certain scan lines, as fully discussed below. This attenuation of the electric fields in the photoreceptor was found to be a source of the banding defects, as the attenuation disrupted the charge intended for a current scan line, resulting in undesirable banding.
Based on this work, a method for correcting banding defects in a photoreceptor image forming apparatus, a method for generating a power distribution profile to modulate one or more laser beams so as to compensate for field attenuation in a photoreceptor image forming apparatus, and an image forming apparatus utilizing these methods were developed to counteract the problem.
In various exemplary embodiments, the systems and methods according to this disclosure may provide a method for correcting banding defects in a photoreceptor image forming apparatus. The method may comprise a step of forming one or more images using one or more laser beams to alter an electrostatic charge on a photoreceptor. The method may further check the one or more images for one or more sets of image perfections arising from electric field attenuation in the photoreceptor. The method may further compensate for the electric field attenuation. Finally, the method may form a compensated desired image.
In various exemplary embodiments, the compensating step may further comprise of the steps for generating a power distribution profile for the one or more laser beams and modulating the one or more laser beams based on the power distribution profile. In various exemplary embodiments, the modulation involves altering at least one of a driving voltage, an intensity or a duration of the one or more laser beams. In further various exemplary embodiments, the power distribution profile is generated based on the set of image imperfections.
In various exemplary embodiments, the systems and methods according to this disclosure may provide that the set of image imperfections is a set of luminance value errors ΔLi*, and that a laser beam j of the one or more laser beams is modulated to alter an exposure of the laser beam by Δpj. In this exemplary embodiment Δpj is found by minimizing the formula
and where:
SL(X) is a slope of a luminance as a function of exposure curve at exposure X, βij is an exposure contribution for laser beam j at location i, and Nb is the total number of laser beams.
In further various exemplary embodiments, the checking step involves the step of comparing the one or more formed images against one or more corresponding predetermined expected images. In further various exemplary embodiments, the one or more images each have a different halftone level and the compensating step compensates based on the halftone level of a desired image to be formed.
In further various exemplary embodiments, the method further involves generating two or more power distribution profiles based on two or more sets of image imperfections. The method also determines a desired halftone level of the desired image to be formed. The method then interpolates or extrapolates a desired power distribution profile from the two or more power distribution profiles based on the desired halftone level as compared to the halftone levels of the images the two or more power distribution profiles were generated from. Finally, the method compensates for electric field attenuation using the desired power distribution profile.
In various exemplary embodiments, this method may be employed by a xerographic machine.
In various exemplary embodiments, the systems and methods according to this disclosure may also provide a method for generating a power distribution profile to modulate one or more laser beams so as to compensate for electric field attenuation in a photoreceptor image forming apparatus. The method may comprise a step of forming an image using the one or more laser beams to alter the electrostatic charge on a photoreceptor. Next the method checks the image for a set of image imperfections arising from electrostatic charge attenuation. Finally, the method generates a power distribution profile for the one or more laser beams based on the set of image imperfections.
In further various exemplary embodiments, the set of image imperfections are obtained by comparing the formed image against a predetermined expected image. In further various exemplary embodiments, the power distribution profile is such that an exposure generated by any given laser beam j of the one or more laser beams is altered by an exposure modulation Δpj. In this exemplary embodiment the set of image imperfections is a set of luminance value errors ΔLi*, and Δpj is found by minimizing the formula
and where:
SL(X) is a slope of a luminance as a function of exposure curve at exposure X, βij is an exposure contribution for laser beam j at location i, and Nb is the total number of laser beams.
In various exemplary embodiments, the systems and methods according to this disclosure may also provide for an image forming apparatus. This apparatus may have a photoreceptor having an electrostatic charge. The apparatus may further have one or more laser light sources capable of altering the electrostatic charge. The apparatus may also have an image forming material that is attracted to the electrostatic charge of the photoreceptor in proportion to the electrostatic charge. The apparatus may further have a laser control unit for individually controlling a driving voltage, intensity and duration of a plurality of laser beams generated by the one or more laser light sources. The apparatus may also have a modulation unit for modulating one or more of the laser beams to compensate for field attenuation.
In further various exemplary embodiments, the modulation unit modulates the one or more laser beams based on a power distribution profile. In further various exemplary embodiments, the apparatus further has a testing unit for comparing an electrostatic profile on the photoreceptor against an expected electrostatic profile for a particular image to generate an imperfection profile and a power distribution profile generating unit that generates a power distribution profile based on the imperfection profile. In this exemplary embodiment the modulation unit modulates the one or more laser beams based on the power distribution profile. In various exemplary embodiments, the modulation involves altering at least one of a driving voltage, an intensity or a duration of the one or more laser beams.
In various exemplary embodiments a laser beam j of the one or more laser beams is modulated to alter an exposure of the laser beam by Δpj. In this exemplary embodiment Δpj is found by minimizing the formula
and where:
V is a voltage profile of an exposure image, ΔVi is a change in voltage profile at location i, Sv(X) is a slope of a photo induced discharge curve at exposure X, βij is an exposure contribution for laser beam j at location i, and Nb is the total number of laser beams.
In further various exemplary embodiments, FWA profile of a uniform half tone area is used as a surrogate for the voltage profile (V). In further various exemplary embodiments, the apparatus further has a voltage profile determining unit that determines the voltage profile (V) of a latent image by determining ΔVi at a plurality of locations, where i is a matrix designation for each of the plurality of locations. The apparatus further has a testing unit for comparing against an expected electrostatic profile for a particular image to be formed against the voltage profile of the latent image and a power distribution profile generating unit that generates a power distribution profile based on the imperfection profile. In this exemplary embodiment the modulation unit modulates the one or more laser beams based on the power distribution profile.
a-c are demonstrative interlace patterns for pixel formation.
a-c are graphs showing a simulated voltage profile of a latent image formed using the interlace patterns of
As shown in
The beam deflector 158 may comprise an oscillating mirror or a rotating mirror assembly having many facets about the periphery thereof. In the example shown, the beam deflector 158 takes the form of a rotating polygon having a plurality of reflective facets 157. The light beam 104 is deflected by the reflective facet 157 and is projected through one or more imaging lens 162, 164 onto the photoreceptive surface 11 of the photoreceptor 10. The beam deflector 158 causes the light beam 104 to be scanned axially on the photoreceptor 10 forming a scan line 70 across the photoreceptive surface 11. When using a rotating polygon beam deflector 158, each facet 157 of the rotating polygon deflects the light beam 104 which is focused into a well defined spot on the surface of photoreceptor 10 by scan lens elements 162 and 164.
The beam spot diameter, which is greatly exaggerated in the figures for illustrative purposes, defines the width of the scan line 70. The width of the scan line 70 may be the subject of slight variations. These variations may be from machine to machine, as variations in the provided laser or in the optics, or in distance tolerances, as in the distance from the post-polygon lenses 162, 164 to the surface 11 of the photoreceptor 10. As beam deflector 158 rotates, the sharply focused spot formed by laser beam 104 traces a narrow path on the surface of photoreceptor 10 that defines the scan line 70.
As mentioned earlier, the surface 11 of the photoreceptor 10 comprises a photoreceptor. This photoreceptor is typically an electrostatic material. At the beginning of the image forming process, the electrostatic material on the surface of the photoreceptor 10 is uniformly charged at some preset level. When the light beam 104 is incident on the electrostatic material, photons in the light beam alter the charge. Each light beam 104 typically is incident at a single spot at a single time, and alters the electrostatic charge of the photoreceptor at a single point. This point is called a pixel 212. As the image forming process progresses, a plurality of pixels are formed on the photoreceptor and together form a “latent image” 670 on the photoreceptor surface.
Subsequently, in a writing stage, a printing material, such as toner, will typically be placed in proximity to the electrostatic surface 11. This process can be seen in
For high speed marking applications, multiple laser beam imagers, such as the VCSEL ROS, are frequently used. In some multi-beam imagers a VCSEL ROS is required. For these imagers, images are written on the photoreceptor in swaths 202. These swaths consist of series of pixels 212, 214. Each pixel in each swath is formed by a given laser beam from among the multiple laser beams, and each swath has N pixels, where N is a total number of laser beams.
The swaths 202 are laid down in interlace schemes 210, 220, 230.
Each swath 202 exposes an area on the photoreceptor of length N*s, where s is the spacing between the laser beams. In addition, each laser beam in the swath has a profile which is dependent on the optics of the imaging system. The full width at half maximum of this profile is frequently referred to as the laser spot size. The laser beams in a single swath expose the photoreceptor simultaneously, while the exposure by different swaths are staggered in space and time in a manner defined by the interlace scheme. As will be discussed later, the beam spot size, the beam to beam spacing and the interlace scheme affects the electric field attenuation.
In many printers known in the art, banding defects would sometimes arise in the latent image. Banding defects are defined as defects in which some or all of a given scan line is printed with an improper luminance level (L*), and this pattern repeats periodically in the process direction. In printed images having banding defects neighboring scan lines appear lighter and darker than each other, thus giving rise to a banding effect.
Several mechanical defects within printers similar to those shown in
However, this solution may not solve the banding defects. Furthermore, these persistent banding defects can often appear inconsistently, in a manner that defied prediction or explanation. Prior to investigation undertaken by the Applicants (“the investigation”), as described below, no explanation as to the source of the problem or solution had been found for correcting these types of banding defects.
The investigation sought to explain the banding defects by examining the electrostatic printing process on a theoretical level, and examining the energy interactions on the electrostatic surface of the photoreceptor at the quantum level.
A photoreceptor charge transport model was used to simulate the effect of interlacing on a latent image.
As seen in
Table 1 summarizes the voltage non-uniformities as well as their frequencies for the various interlacing schemes at two different process speeds.
After further study, the origin of these voltage irregularities was determined. Consider
It was determined that for swaths i and i+1 the electric fields were being attenuated by charges in transit from previous swaths. To fully understand this concept, consider the effect a laser beam has on a photoreceptor. The laser beam is composed of a plurality of photons that impact the surface of the photoreceptor. The photons excite the material in the charge generator layer of the photoreceptor, generating electron-hole pairs. The positively charged holes are transported through a transport layer by the electric field and create the exposure image on the surface. Therefore, to grossly simplify the process, the photons are converted into charge to create an electrostatic latent image on the surface of the photoreceptor.
Furthermore, in a typical photoreceptor the amount of charge V generated at a point is directly related to the number of photons that are converted. This relationship is defined as V(Vi,X) and is called the photo induced discharge curve (PIDC). A photoreceptor with initial surface voltage Vi, when exposed with exposure X, will discharge to a final voltage V. The amount of charge generated per unit area during exposure is given by (V−Vi) . . . Sv(X) is the slope of a photo induced discharge curve (“PIDC”) at exposure X. Thus,
S
v(X)=dV/dX (1)
In other words, S(X) defines the attenuation of charge V that will be generated for a given attenuation in exposure about exposure X.
Furthermore, for a given photoreceptor and image forming apparatus, a given amount of charge generated will yield a given luminance value L* in the printed image. Thus, it is further possible to know the relationship of how much luminance L* will be obtained from a given amount of exposure X. This relationship is defined as SL(X). In which,
S
L(X)=dL*/dX (2)
Note that V is sometimes referred to as voltage or the voltage profile. Charge, or voltage V is different from the driving voltage of a laser beam. Charge refers to the number of volts worth of charge in the photoreceptor at the given point.
To summarize, for every given amount of extra exposure ΔX a change in charge ΔV will occur on the photoreceptor. Additionally, for every change in charge ΔV, the final formed image will have a change in luminance ΔL*. The luminance L*, is of course, the L* in the L*a*b* values, that are well known by those in the image forming art. Furthermore, as explained above, the amount of change in charge ΔV for a given amount of exposure ΔX is determined by the collection efficiency of the photoreceptor.
However, collection efficiency, which is the efficiency with which photons are converted into electron-hole pairs, depends on the electric field at the generator layer.
Therefore, if the electric field at on the photoreceptor surface 11 is different at two points, and an identical light beam impacts these two points, two pixels having different amounts of charge will be created. However, luminance levels (L*) in printing are calculated based on the principle that a constant laser beam will produce a constant charge on the photoreceptor 10. Thus, alterations to the electric field on the surface of the photoreceptor 10, will results in errors in the luminance of pixels in the latent image 670.
Based on the analyses, it was determined that the electric fields at locations on the photoreceptor 10 were being affected in a repeating pattern. Specifically, it can be seen that the regions where the i−1 and i+1 swaths overlap, experienced inhomogeneous electric fields. Ideally, a laser beam 104 would experience approximately 15-20 V/micron of electric field at the generator layer point they strike. However, as shown in
In order to remove the banding defects, it was determined that an understanding of the cause of the electric field attenuation was needed. Therefore, the electric field attenuation, of the simulated latent images, was compared against the pixel patterns in the three interlace patterns 210, 220, 230. It was determined that electric field attenuation was a function of the distance between neighboring pixels 212, 222, 232 and swaths 202. As discussed above, when a given pixel is struck by a laser beam, the photons in the beam are converted to electrons-hole pairs on the generator layer surface. While the electrons move almost instantly to the ground plane, however, for a small period of time, in the range of 10 milliseconds, the holes continue to move across the transport layer. During this period, if a second laser beam strikes an area within a certain radius of the first pixel, these mobile holes can attenuate the electric field in the nearby area on the generator layer.
The investigation compared the different banding effects observed in the three interlace patterns, against the timing patterns and distance between pixels in the three interlace patterns 210, 220, 230. In doing so, the investigation was able to calculate relationships between the known timing and pixel distance values and the resulting electrical field attenuation. Based on these relationships, methods and an apparatus for correcting the banding defects caused by the electrical field attenuation were developed.
Based on this work, several potential methods for correcting the banding defects were developed, involving modulating the laser beams 104 to compensate for the attenuated electrical fields. Specifically, the methods individually modulate any one of the driving voltage, the timing, or the intensity of the laser beams 104. In the most preferable embodiments, the driving voltage of the laser beams are modulated by a modulation unit 152. By modulating the laser beams, those pixels in which an altered electrical field is expected will receive an modulated laser beam to compensate for the attenuating effect of the altered electrical field.
However, in order for the image modulation unit 152 to successfully modulate the individual laser beams 104, the image forming device must know how much modulation each individual laser beam 104 will need to compensate for the attenuating effects. In the various exemplary embodiments, several different methods of determining a power distribution profile (“PDP”) are used. The PDP contains information necessary to determine the needed amount of modulation to the driving voltage of an individual laser beam.
In a first embodiment, the method illustrated in
Based on experimental and theoretical data, the expected defects for the given image will be calculated, in step S101. This defect will be in the form of the difference in charge ΔVi on the photoreceptor between what is desired and what is expected to be present at pixel i in a scan line of the given type of pixel.
Next, in step S103 the change in exposure ΔX needed to correct the defect of each pixel in a scan line, is be calculated. In other words, ΔXi is calculated, where i is the given pixel on the scan line. ΔXi is calculated using formula (1), based on the ΔVi determined in step S101.
It might be expected that once we know the needed change in exposure ΔXi for each pixel in a scan line is known, the defects could then be eliminated by altering the driving voltage of the laser beams 104 to provide the modulated amount of exposure by a given laser Δpj. However, every alteration in beam exposure to a given pixel location, will inevitably result in ripple effects to pixels around it. Therefore, unless the total effect on the entire voltage profile V of the latent image 670 is considered, defects will not be eliminated.
Therefore, in step S105 the effect that each modulation in exposure Δpj by each laser beam j has on every other pixel i is accounted for. In various exemplary embodiments, these cross-attenuation effects will be accounted for by minimizing the formula
as Δpj is changed for the given type of pixel. In formula (3) is ΔXi is calculated using the formula
and ΔXi* is calculated using the formula
In formula (5) Nb is the total number of laser beams. Additionally, βij is an exposure contribution for laser beam j at location i. More specifically, βij is a matrix based on several of the intrinsic properties of the image forming device and allows for the effect of every laser beam on every pixel to be accounted for when correcting for banding defects.
To explain further, ΔXi* is the sum of βij matrix multiplied by Δpj. As noted above, βij is the exposure contribution for laser beam j at location i. Based on the investigation, it was determined that several factors will affect the expected electrical field attenuation of a given pixel. Some of these factors are dependent on the image to be formed, while others are image independent and result solely from the intrinsic properties of the image forming device.
Among the intrinsic properties of the image forming device that will affect electrical field attenuation of a given pixel are: number of lasers beams, the types of laser beams, the beam spot size (s), the beam to beam spacing, the optical elements, and the electrostatic material of the photoreceptor. These will be collectively referred to as the intrinsic factors. Some image specific properties which will affect electrical field attenuation of a given pixel are: the speed at which the latent image is formed, the tone of the desired image and the interlace pattern. βij defines the attenuating effect that laser beam j will experience at any given pixel i, based on the effects of the intrinsic properties of the printer, as well as the plurality of other laser beams.
Therefore, in summary ΔXi defines the actual exposure which will occur at pixel i, after accounting for the attenuation ripple effects that the modulation of beam j, at location i, will have on and from the surrounding pixels and laser beams.
Finally, as discussed above, Δpj is the required additional exposure that will bridge the gap between ΔXi* and ΔXi. Specifically, Δpj is the additional number of photons we wish for exposure on the photoreceptor at pixel j to ensure pixel j reaches its intended voltage while accounting for its affect on neighboring pixels.
As Δpj is modified, it is possible to minimize the difference between ΔXi* and ΔXi. Thus, formula (3) can be minimized by modifying Δpj. The optimization process continues as the various interactions between the Nj number of laser beams 104 being modified at the various pixels are collectively accounted for.
Eventually, a Δpj is determined for each laser beam j, for every pixel i in the scan line for the given type of pixel. For example, every time the image forming device intends to form a full tone pixel, in an overlapping interlace pattern 1, in the third scan line down in the interlace pattern, Δpj's worth of extra (or less) exposure will be incident on the pixel to ensure the proper charge is laid down.
Once Δpj is calculated for each give type of pixel, the power distribution profile necessary to provide the proper Δpj's is calculated in step S107. The power distribution profile would typically constitute a collection of modified driving voltages to be applied at pixel location i along the scan line. The necessary calculations needed to determine a modulation of a driving voltage to achieve a given change in exposure are well known in the art, and will not be discussed here. Finally, in step S109 the power distribution profile is thereafter used when forming the image.
In a second envisioned embodiment, the Power Distribution Profile is determined by forming a test image of a uniform halftone density by the image forming device. This test image will be checked for imperfections in luminance L*. Based on any imperfections found, the power distribution profile will be obtained.
To further elaborate on this envisioned embodiment, and with reference to
Next in step S205 the luminance error detection unit 690 would compare the luminance values of each scanline, against an predetermined expected value for the halftone density of the test image. Based on this comparison, a set of luminance error values ΔLi* would be developed. These luminance error values ΔLi* would be sent to a processor 690 that is connected to the laser modulation unit 152.
In step S207 the change in exposure ΔXi needed to create the desired ΔLi* is calculated for each scanline in scanline i in the scan line using formula (6) below.
These luminance error values ΔLi* are the amount the luminance value L* at scanline i needs to be modified (either up or down). As can easily be see, the formula closely mirrors formula (4). However, in formula (6), rather than dealing with a desired amount of charge ΔVi desired at a location i, the desired change in luminance ΔLi* is used. Likewise, SL(X), as defined in formula (2) is used to determine the necessary change in exposure ΔXi needed to create the desired ΔLi*.
As discussed above, if only a single pixel were being fixed, it would be easy to modify the luminance value by modifying the exposure at the pixel. However, as discussed above, in any image having multiple pixels it is necessary to account for the ripple effect each modification will have on every other modification.
Therefore, in step S209 the amount of exposure modulation for each beam j of the swath Δpj needed to correct for all of the luminance errors ΔLi* would be determined. Specifically, the exposure modulation Δpj would be calculated by minimizing the formula
where, as calculated above
and where
As explained above, as Δpj is modified, it is possible to minimize the difference between ΔXi* and ΔXi. Thus, formula (3) can be minimized by modifying Δpj. The optimization process continues as the various interactions between the Nj number of lasers beams in a swath being modified at the various scanlines are collectively accounted for.
Eventually, a Δpj is determined for each laser beam j, for every pixel in the scan line i for the given halftone density of the test image. For example, every time the image forming device intends to form a pixel, in an overwriting interlace pattern 1, in the third scan line down in the interlace pattern, Δpj's worth of extra (or less) exposure will be incident on the pixel to ensure the proper charge is laid down.
Once Δpj is calculated, the power distribution profile power distribution profile necessary to provide the proper Δpj's is calculated in step S211. As before, the Power Distribution Profile would typically constitute a collection of modified driving voltages to be applied for the given type of pixel at pixel location i along the scan line.
At this time, the method may branch along two further possibilities. If the image formed in step S201 is the desired final image, the image may be re-formed using the power distribution profile to correct for the banding defects in step S213.
Additionally, if the image is reformed in step S213, steps S203 through S213 may be iteratively repeated to further modify and enhance the accuracy of the power distribution profile generated.
The power distribution profile created in steps S201-211 may be used for correcting future images formed. In this embodiment, the Power Distribution Profile profile obtained above is used to modulate the beam power in every swath for all future images formed by the image forming apparatus.
In a third envisioned embodiment, the power distribution profile is also determined in a design stage of the image forming device in a manner similar to that of embodiment 2. However, rather than forming a single halftone image, the power distribution profile is developed by forming two or more images each having a different halftone value. This allows for further improvement in the correction of banding defects as will be explained.
To further elaborate on this envisioned embodiment, and with reference to
Next in step S205 the luminance error detection unit 690 would compare the luminance values of each pixel, against an predetermined expected value for the pixel. Based on this comparison, a set of luminance error values ΔLi* would be developed.
It should be noted at this time, several changes between the ΔLi* calculated here and the ΔVi's calculated in the first embodiment. As discussed above, in the first embodiment a given ΔVi was calculated for each pixel i in a scan line, for a given type of pixel. However, in this embodiment such assumptions regarding a given type of pixel are not necessary. The formed image may contain pixels at each scan line 70, each swath 202, and potentially of multiple halftones. Thus, as will be discussed in greater length below, greater accuracy in the banding defect correction may be possible.
In step S207 the change in exposure ΔXi needed to create the desired ΔLi* is calculated for each pixel i in the scan line using formula (6) below.
These luminance error values ΔLi* are the amount the luminance value L* at pixel i needs to be modified (either up or down).
Next, in step S209 the amount of exposure modulation Δpj needed to correct for all of the luminance errors ΔLi* would be determined in a single series of calculations. Specifically, the exposure modulation Δpj would be calculated by minimizing the formula
where, as calculated above
and where
As explained above, as Δpj is modified, it is possible to minimize the difference between ΔXi* and ΔXi. Thus, formula (3) can be minimized by modifying Δpj. The optimization process continues as the various interactions between the Nj number of lasers being modified at the various pixels are collectively accounted for.
Eventually, a Δpj is determined for each laser beam j, for every pixel i in the scan line having the first halftone level. Using Δpj a power distribution profile is created for pixels having the first halftone value in step S211.
Next, steps S201-S211 are repeated in which a second image having a second halftone level is formed in step s201. In this manner a second power distribution profiles is created for the second halftone value. Steps s201-s211 may be repeated as many times as desired for as many formed images, each having a unique halftone level, as desired. In this manner two or more power distribution profiles are created for two or more halftone values.
Once the two or more power distribution profiles have been created, in step s303 a desired image to be formed is inputted into the image forming device. For each pixel and halftone level is supplied to the image forming device. In step s305 the halftone level of a pixel to be formed is compared against the halftone levels of the two or more power distribution profiles and the two power distribution profiles having the two closest halftone values are determined. In step s307 a unique power distribution profile for the desired image is determined by either extrapolating or interpolating from the relevant driving voltages in the two or more power distribution profiles for each pixel based on its halftone value. At this stage, the correction to all future images, may be applied in one of several possible ways. One possible method would be to compute a unique Power Distribution Profile based on the average halftone density of the image, through interpolation of the Power Distribution Profiles obtained for the discrete halftone values in the test images. A second method would be to compute a unique Power Distribution Profile for each swath based on a weighted average halftone density of the image pixels in the swath and the neighboring swaths. Another method would be to compute a unique Power Distribution Profile to each pixel in a swath based on a weighted average halftone density of the surrounding pixels. Each of the above methods would result in a unique Power Distribution Profile to be applied to the entire image, or to each swath of the image or to each pixel in the swath.
Finally, in step s309 the laser beam modulation unit 152 supplies the modulated driving voltage to the laser 150. In this maimer a more precise driving voltage correction may be applied. It anticipated that as more additional power distribution profiles are created, the more accurate the interpolated driving voltages will be in removing banding defects.
In a further envisioned embodiment, the latent image on the photoreceptor would be modified prior to the writing stage of the image forming process. Referring now to
Next, in step s405 the voltage profile V would be compared against an expected voltage profile, and a set of voltage errors ΔVi would be created. Then in step s407 the necessary exposure modulations ΔXi needed to correct for these voltage errors ΔVi would calculated using formula (4). Furthermore in step s409 the attenuation ripple effects due to the modulation of each pixel would be calculated by minimizing formula (3).
A power distribution profile for fixing the banding defects in the latent image would be created in step s411 based on the Δpj calculated in step s409. A second latent image would then be formed using this power distribution profile in step s413. Finally, in step s415 the second latent image would be sent to the writing stages of the image forming apparatus. In this manner, a dynamic method for correcting banding defects could be accomplished. Furthermore, because no interpolation or pixel assumptions need to be made in this potential embodiment, yet further reduction of banding defects are anticipated.
Referring back to step s403, any known method in the art for determining the voltage profile of the latent image may be used. Referring to
In an alternative embodiment, the latent image would be placed in proximity to toner, or a similar writing material. The photoreceptor 10 with the toner would be scanned by the sensor 610, which would determine the voltage profile based off of the latent image 670 shown in the toner. The toner would then be cleaned off the photoreceptor 10 before the modified latent image would be formed.
It will be appreciated that various of the above-disclosed and other features and functions, or alternatives thereof, may be desirably combined in many other embodiments, systems or applications. Also, various presently unforeseen or unanticipated alternatives, modifications, variations or improvements may be subsequently made by those of skill in the art, and are also intended to be encompassed by the following claims.
