Claims
- 1. A method, comprising:
providing an image correcting system for correcting an image using a first defect map; providing a selection unit for displaying a second defect map of pixels that were not corrected using said first defect map; and providing a method for selecting one or more defective pixels in said second defect map for correction.
- 2. A method according to claim 1, including providing a method for using values of nondefective pixels within a correction region surrounding said one or more defective pixels to obtain a replacement value for said one or more defective pixels.
- 3. A method according to claim 2, said displaying a second defect map comprising comparing one or more pixels in said first defect map with a threshold value.
- 4. A method according to claim 2, said displaying a second defect map comprising determining which pixels on said first defect map were not corrected using said first defect map.
- 5. A method for correcting an image, comprising: displaying a secondary defect map of pixels that were not corrected using a primary defect map.
- 6. A method according to claim 5, including using values of nondefective pixels within a correction region surrounding one or more defective pixels on said secondary defect map to obtain a replacement value for said one or more defective pixels.
- 7. A method according to claim 5, said displaying a secondary defect map comprising comparing one or more pixels in said primary defect map with a threshold value.
- 8. A method according to claim 5, said displaying a secondary defect map comprising determining which pixels on said primary defect map were not corrected using said primary defect map.
- 9. A system for correcting an image, comprising:
an image input device; an image correcting system adapted to correct said image using a first defect map; a selection unit configured to display a second defect map of pixels that were not corrected using said first defect map; wherein said selection unit is further configured to select one or more defective pixels in said second defect map for correction.
- 10. A system according to claim 9, said image correcting system configured to use values of nondefective pixels within a correction region surrounding said one or more defective pixels to obtain a replacement value for said one or more defective pixels.
- 11. A system according to claim 10, said selection unit adapted to compare one or more pixels in said first defect map with a threshold value.
- 12. A system according to claim 9, said selection unit configured to determine which pixels on said first defect map were not corrected using said first defect map.
- 13. A system comprising:
a selection unit adapted to display a secondary defect map of pixels that were not corrected using a primary defect map; and a user interface operable to receive instructions from a user for choosing a user correction method for correcting the pixels of the secondary defect map.
- 14. A system according to claim 13, wherein the user correction method comprises using values of nondefective pixels within a correction region surrounding one or more defective pixels on said secondary defect map to obtain a replacement value for said one or more defective pixels.
- 15. A system according to claim 14, said selection unit adapted to compare one or more pixels in said primary defect map with a threshold value.
- 16. A system according to claim 14, said selection unit adapted to determine which pixels on said primary defect map were not corrected using said primary defect map.
RELATED APPLICATIONS
[0001] This application claims priority from U.S. Provisional Application Serial No. 60/173,423 filed Dec. 29, 1999 under 35 U.S.C. §119(e). This application is related to U.S. patent application Ser. No. ______, entitled “Method and Apparatus for Correcting Large Defects in Digital Images,” having Attorney Docket No. ASF99005-PA-US filed ______.
Provisional Applications (1)
|
Number |
Date |
Country |
|
60173423 |
Dec 1999 |
US |