S. Joe Qin and Thomas A. Badgwell, An Overview of Industrial Model Predictive Control Technology, pp. 1-31. |
Minh S. Le, Taber H. Smith, Duane S. Boning, and Herbert H. Sawin, Run-to-Run Process Control on a Dual-Coil Transformer Coupled Plasma Etcher with Full Wafer Interferometry and Spatially. |
Taber H. Smith, Duane S. Boning, Jerry Stefani and Stephanie Watts Butler, Run By Run Advanced Process Control of Metal Sputter Deposition, 9 pages. |
George Box and Tim Kramer, Statistical Process Monitoring and Feedback Adjustment-A Discussion, Aug. 1992, vol. 34, No. 3, pp. 251-267. |
Duane Boning, William Moyne, Taber Smith, James Moyne and Arnon Hurwitz, Practical Issues in Run by Run Process Control, 1995, pp. 1-18. |