Number | Name | Date | Kind |
---|---|---|---|
4228537 | Henckels et al. | Oct 1980 | |
5293323 | Doskocil et al. | Mar 1994 | |
5325309 | Halaviati et al. | Jun 1994 | |
5377197 | Patel et al. | Dec 1994 | |
5418792 | Maamari | May 1995 |
Entry |
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Test Generation By Fault Sampling; Agrawal et al; 1988 IEEE. |