Claims
- 1. A method of increasing process yields of data storage devices in which data is stored on a plurality of media surfaces, and at least one read/write head is associated with each media surface in order to read/write data from/to each media surface, the method comprising steps of:
(a) testing each read/write head in order to allocate a read/write density to each read/write head relating to the density at which each read/write head is capable of reading/writing data from/to a media surface; (b) determining whether said data storage device will have sufficient logical storage sectors to provide a predetermined data storage capacity for said data storage device if the allocated read/write densities are used in said data storage device; and (c) altering the allocated read/write density of at least one read/write head if necessary so as to ensure that said storage device has sufficient logical storage sectors.
- 2. A method as claimed in claim 1, wherein step (b) involves testing the data storage device to determine a number of logical storage sectors provided by the plurality of media surfaces.
- 3. A method as claimed in claim 1, wherein step (b) involves calculating how many physical sectors will be provided if the allocated read/write densities are used, testing the data storage device to determine how many physical sectors are defective, and using the calculated number of physical sectors and the determined number of defective physical sectors to determine a number of logical storage sectors provided by the plurality of media surfaces.
- 4. A method as claimed in claim 1, wherein step (c) involves altering the allocated read/write density of at least one read/write head so as to minimise the risk of a read/write head having an altered allocated read/write density failing to perform at said altered allocated read/write density.
- 5. A method as claimed in claim 1, wherein allocating a read/write density to each read/write head comprises allocating a bits per inch (BPI) setting to each read/write head.
- 6. A method as claimed in claim 5, wherein step (c) involves altering the BPI setting of at least one read/write head by at least one unit.
- 7. A method as claimed in claim 6, wherein step (c) involves increasing the BPI setting of read/write heads in a predetermined order until said storage device has sufficient logical storage
- 8. A method as claimed in claim 1, wherein testing each read/write head involves determining a quality index for each read/write head and allocating a read/write density relating to the determined quality index.
- 9. An apparatus for increasing process yields of data storage devices in which data is stored on a plurality of media surfaces, and at least one read/write head is associated with each media surface in order to read/write data from/to each media surface, the apparatus comprising:
(a) testing means for testing each read/write head in order to allocate a read/write density to each read/write head relating to the density at which each read/write head is capable of reading/writing data from/to a media surface; (b) determining means for determining whether said data storage device will have sufficient logical storage sectors to provide a predetermined data storage capacity for said data storage device if the read/write densities allocated by the testing means are used in said data storage device; and (c) means for altering the allocated read/write density of at least one read/write head as necessary so as to ensure that said storage device has sufficient logical storage sectors.
- 10. The apparatus as claimed in claim 9, wherein said determining means includes media surface test means for testing the data storage device to determine a number of logical storage sectors provided by the plurality of media surfaces.
- 11. The apparatus as claimed in claim 9, wherein said determining means calculates how many physical sectors will be provided if the allocated read/write densities are used, and said determining means includes media surface test means for testing the data storage device to determine how many physical sectors are defective, whereafter said determining means uses the calculated number of physical sectors and the determined number of defective physical sectors to determine a number of logical storage sectors provided by the plurality of media surfaces.
- 12. The apparatus as claimed in claim 9, wherein said allocation means alters the allocated read/write density of at least one read/write head in such a manner so as to minimise the risk of a read/write head having an increased allocated read/write density failing to perform at said increased allocated read/write density.
- 13. The apparatus as claimed in claim 9, wherein said testing means and said allocation means allocate a read/write density in the form of a bits per inch (BPI) setting for each read/write head.
- 14. The apparatus as claimed in claim 13, wherein said allocation means alters the BPI setting of at least one read/write head by one unit.
- 15. The apparatus as claimed in claim 14, wherein said allocation means increases the BPI setting of read/write heads in a predetermined order until said storage device has sufficient logical storage
- 16. The apparatus as claimed in claim 9, wherein said testing means tests each read/write head to determine a quality index for each read/write head and allocates a read/write density to said head which relates to the determined quality index.
- 17. A data storage device produced using the method of claim 1.
- 18. The data storage device as claimed in claim 17, wherein the data storage device is a magnetic disc drive.
- 19. The data storage device as claimed in claim 17, including a controller, and a memory accessible by the controller, and wherein the read/write densities allocated to each read/write head are stored in said memory.
RELATED APPLICATIONS
[0001] The present application claims benefit of the U.S. provisional patent application No. 60/222,997, filed Aug. 4, 2000.
Provisional Applications (1)
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Number |
Date |
Country |
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60222997 |
Aug 2000 |
US |