| Number | Date | Country | Kind |
|---|---|---|---|
| 61-278163 | Nov 1986 | JPX | |
| 61-247428 | Oct 1988 | JPX |
| Filing Document | Filing Date | Country | Kind |
|---|---|---|---|
| PCT/JP87/00789 | 10/16/1987 |
| Publishing Document | Publishing Date | Country | Kind |
|---|---|---|---|
| WO88/02857 |
| Number | Name | Date | Kind |
|---|---|---|---|
| 4656595 | Hognestad | Apr 1987 | |
| 4683419 | Neuelman | Jul 1987 | |
| 4764970 | Hayashi et al. | Aug 1988 | |
| 4789829 | Stribling | Dec 1988 |
| Number | Date | Country |
|---|---|---|
| 0024804 | Feb 1982 | JPX |
| Entry |
|---|
| IBM Technical Disclosure, H. Hova, Measuring Thickness and Resistance of Semiconductor Layers, vol. 6, No. 2, Jul. 1963. |