1. Field of the Invention
The present invention relates generally to memory devices, and in particular to write assist on memory devices.
2. Background Information
With conventional technologies it has become increasingly difficult to design static random access memory (SRAM) cells that are both stable and writeable. Due to small device variations, the design centering window for these functions has greatly narrowed. One technique for expanding the design centering window involves decreasing the voltage differential across the source and supply of the SRAM cell during a write, and restoring the standard chip differential during a read. During a write operation this is achieved by either lowering the supply voltage or raising the source voltage (or a combination of both). Conventional techniques employ an additional supply or an off-chip device such as a voltage regulator to achieve this functionality. However, additional on-chip supplies and/or off-chip devices are costly and power prohibitive.
The invention provides a method and apparatus for write assist for a static random access memory (SRAM) array, which increases the write ability of the SRAM cell by locally raising the source voltage. One embodiment involves locally generating a virtual ground for write assist on column selected SRAM cells, including locally raising the source voltage to increase the write ability of the SRAM cell; wherein locally raising the source voltage comprises locally generating a virtual source/ground node for boosting the write ability of a column of SRAM cells without using an additional on-chip or off-chip supply; thereby decreasing the voltage differential across the source and supply of the column of SRAM cells during a write, and restoring the standard chip differential during a read.
Other aspects and advantages of the present invention will become apparent from the following detailed description, which, when taken in conjunction with the drawings, illustrate by way of example the principles of the invention.
For a fuller understanding of the nature and advantages of the invention, as well as a preferred mode of use, reference should be made to the following detailed description read in conjunction with the accompanying drawings, in which:
The following description is made for the purpose of illustrating the general principles of the invention and is not meant to limit the inventive concepts claimed herein. Further, particular features described herein can be used in combination with other described features in each of the various possible combinations and permutations. Unless otherwise specifically defined herein, all terms are to be given their broadest possible interpretation including meanings implied from the specification as well as meanings understood by those skilled in the art and/or as defined in dictionaries, treatises, etc.
The invention provides a method and apparatus for write assist for a static random access memory (SRAM) array, which increases the write ability of the SRAM cell by locally raising the source voltage. One embodiment involves locally generating a virtual ground for write assist on column selected SRAM cells, including locally raising the source voltage to increase the write ability of the SRAM cell; wherein locally raising the source voltage comprises locally generating a virtual source/ground node for boosting the write ability of a column of SRAM cells without using an additional on-chip or off-chip supply; thereby decreasing the voltage differential across the source and supply of the column of SRAM cells during a write, and restoring the standard chip differential during a read.
In
For WRITE operation (e.g., WRITE COLUMN 0), a signal WRTAST transitions HIGH, and BSW0_B signal transitions LOW, while a signal BSW1_B is held HIGH. Thus n-channel transistor device N9 is disabled and VG1 is isolated. Meantime, with pulldown device N2 also disabled, the signal VG0 tracks a signal VGX.
Before WRTAST goes high, in STANDBY or READ operation, WRTAST was held LOW and WFB was held HIGH through a p-channel transistor device P0, thus enabling n-channel transistor device N12.
With WRTAST at HIGH (WRTAST_B is LOW), a p-channel transistor device P1 is enabled and the path to ground (Gnd) through n-channel transistor device N13 is disabled, thereby allowing node VGX to collect charge.
As the collected charge approaches a NFET threshold voltage, the VG0 gate connected n-channel transistor device N10 begins to turn on. This pulls node WFB to ground, disabling device N12 and terminating the path to the supply voltage Vs.
Throughout the WRITE operation, the diode connected devices N0 and N1 provide protection on the bit lines and will be enabled if VG0 or VG1 increase above the NFET threshold voltage.
As shown by an example in
As is known to those skilled in the art, the aforementioned example embodiments described above, according to the present invention, can be implemented in many ways, such as program instructions for execution by a processor, as software modules, as computer program product on computer readable media, as logic circuits, as silicon wafers, as integrated circuits, as application specific integrated circuits, as firmware, etc. Though the present invention has been described with reference to certain versions thereof; however, other versions are possible. Therefore, the spirit and scope of the appended claims should not be limited to the description of the preferred versions contained herein.
Those skilled in the art will appreciate that various adaptations and modifications of the just-described preferred embodiments can be configured without departing from the scope and spirit of the invention. Therefore, it is to be understood that, within the scope of the appended claims, the invention may be practiced other than as specifically described herein.