Method and apparatus for measuring a parameter of a vehicle electrical system

Information

  • Patent Grant
  • 9018958
  • Patent Number
    9,018,958
  • Date Filed
    Wednesday, October 19, 2011
    13 years ago
  • Date Issued
    Tuesday, April 28, 2015
    9 years ago
Abstract
An apparatus for measuring electrical parameters for an electrical system measures a first and second parameters of the electrical system between connections to the electrical system. A processor determines a third electrical parameter of the electrical system as a function of the first parameter and the second parameter. Wireless communication is provided between components of the apparatus.
Description

The present invention relates to the measurement of electrical parameters of a vehicle electrical system. More specifically, the present invention relates to measuring an electrical parameter of an electrical system of a vehicle through the use of multiple measurements.


Electrical systems, such as those which are used in automotive vehicles, consist of a number of discreet components or systems which are interconnected. Techniques for measuring and utilizing parameters, such as dynamic parameters, of electrical systems are shown and disclosed in U.S. Pat. No. 3,873,911, issued Mar. 25, 1975, to Champlin; U.S. Pat. No. 3,909,708, issued Sep. 30, 1975, to Champlin; U.S. Pat. No. 4,816,768, issued Mar. 28, 1989, to Champlin; U.S. Pat. No. 4,825,170, issued Apr. 25, 1989, to Champlin; U.S. Pat. No. 4,881,038, issued Nov. 14, 1989, to Champlin; U.S. Pat. No. 4,912,416, issued Mar. 27, 1990, to Champlin; U.S. Pat. No. 5,140,269, issued Aug. 18, 1992, to Champlin; U.S. Pat. No. 5,343,380, issued Aug. 30, 1994; U.S. Pat. No. 5,572,136, issued Nov. 5, 1996; U.S. Pat. No. 5,574,355, issued Nov. 12, 1996; U.S. Pat. No. 5,583,416, issued Dec. 10, 1996; U.S. Pat. No. 5,585,728, issued Dec. 17, 1996; U.S. Pat. No. 5,589,757, issued Dec. 31, 1996; U.S. Pat. No. 5,592,093, issued Jan. 7, 1997; U.S. Pat. No. 5,598,098, issued Jan. 28, 1997; U.S. Pat. No. 5,656,920, issued Aug. 12, 1997; U.S. Pat. No. 5,757,192, issued May 26, 1998; U.S. Pat. No. 5,821,756, issued Oct. 13, 1998; U.S. Pat. No. 5,831,435, issued Nov. 3, 1998; U.S. Pat. No. 5,871,858, issued Feb. 16, 1999; U.S. Pat. No. 5,914,605, issued Jun. 22, 1999; U.S. Pat. No. 5,945,829, issued Aug. 31, 1999; U.S. Pat. No. 6,002,238, issued Dec. 14, 1999; U.S. Pat. No. 6,037,751, issued Mar. 14, 2000; U.S. Pat. No. 6,037,777, issued Mar. 14, 2000; U.S. Pat. No. 6,051,976, issued Apr. 18, 2000; U.S. Pat. No. 6,081,098, issued Jun. 27, 2000; U.S. Pat. No. 6,091,245, issued Jul. 18, 2000; U.S. Pat. No. 6,104,167, issued Aug. 15, 2000; U.S. Pat. No. 6,137,269, issued Oct. 24, 2000; U.S. Pat. No. 6,163,156, issued Dec. 19, 2000; U.S. Pat. No. 6,172,483, issued Jan. 9, 2001; U.S. Pat. No. 6,172,505, issued Jan. 9, 2001; U.S. Pat. No. 6,222,369, issued Apr. 24, 2001; U.S. Pat. No. 6,225,808, issued May 1, 2001; U.S. Pat. No. 6,249,124, issued Jun. 19, 2001; U.S. Pat. No. 6,259,254, issued Jul. 10, 2001; U.S. Pat. No. 6,262,563, issued Jul. 17, 2001; U.S. Pat. No. 6,294,896, issued Sep. 25, 2001; U.S. Pat. No. 6,294,897, issued Sep. 25, 2001; U.S. Pat. No. 6,304,087, issued Oct. 16, 2001; U.S. Pat. No. 6,310,481, issued Oct. 30, 2001; U.S. Pat. No. 6,313,607, issued Nov. 6, 2001; U.S. Pat. No. 6,313,608, issued Nov. 6, 2001; U.S. Pat. No. 6,316,914, issued Nov. 13, 2001; U.S. Pat. No. 6,323,650, issued Nov. 27, 2001; U.S. Pat. No. 6,329,793, issued Dec. 11, 2001; U.S. Pat. No. 6,331,762, issued Dec. 18, 2001; U.S. Pat. No. 6,332,113, issued Dec. 18, 2001; U.S. Pat. No. 6,351,102, issued Feb. 26, 2002; U.S. Pat. No. 6,359,441, issued Mar. 19, 2002; U.S. Pat. No. 6,363,303, issued Mar. 26, 2002; U.S. Pat. No. 6,377,031, issued Apr. 23, 2002; U.S. Pat. No. 6,392,414, issued May 21, 2002; U.S. Pat. No. 6,417,669, issued Jul. 9, 2002; U.S. Pat. No. 6,424,158, issued Jul. 23, 2002; U.S. Pat. No. 6,441,585, issued Aug. 17, 2002; U.S. Pat. No. 6,437,957, issued Aug. 20, 2002; U.S. Pat. No. 6,445,158, issued Sep. 3, 2002; U.S. Pat. Nos. 6,456,045; 6,466,025, issued Oct. 15, 2002; U.S. Pat. No. 6,465,908, issued Oct. 15, 2002; U.S. Pat. No. 6,466,026, issued Oct. 15, 2002; U.S. Pat. No. 6,469,511, issued Nov. 22, 2002; U.S. Pat. No. 6,495,990, issued Dec. 17, 2002; U.S. Pat. No. 6,497,209, issued Dec. 24, 2002; U.S. Pat. No. 6,507,196, issued Jan. 14, 2003; U.S. Pat. No. 6,534,993; issued Mar. 18, 2003; U.S. Pat. No. 6,544,078, issued Apr. 8, 2003; U.S. Pat. No. 6,556,019, issued Apr. 29, 2003; U.S. Pat. No. 6,566,883, issued May 20, 2003; U.S. Pat. No. 6,586,941, issued Jul. 1, 2003; U.S. Pat. No. 6,597,150, issued Jul. 22, 2003; U.S. Pat. No. 6,621,272, issued Sep. 16, 2003; U.S. Pat. No. 6,623,314, issued Sep. 23, 2003; U.S. Pat. No. 6,633,165, issued Oct. 14, 2003; U.S. Pat. No. 6,635,974, issued Oct. 21, 2003; U.S. Pat. No. 6,707,303, issued Mar. 16, 2004; U.S. Pat. No. 6,737,831, issued May 18, 2004; U.S. Pat. No. 6,744,149, issued Jun. 1, 2004; U.S. Pat. No. 6,759,849, issued Jul. 6, 2004; U.S. Pat. No. 6,781,382, issued Aug. 24, 2004; U.S. Pat. No. 6,788,025, filed Sep. 7, 2004; U.S. Pat. No. 6,795,782, issued Sep. 21, 2004; U.S. Pat. No. 6,805,090, filed Oct. 19, 2004; U.S. Pat. No. 6,806,716, filed Oct. 19, 2004; U.S. Pat. No. 6,850,037, filed Feb. 1, 2005; U.S. Pat. No. 6,850,037, issued Feb. 1, 2005; U.S. Pat. No. 6,871,151, issued Mar. 22, 2005; U.S. Pat. No. 6,885,195, issued Apr. 26, 2005; U.S. Pat. No. 6,888,468, issued May 3, 2005; U.S. Pat. No. 6,891,378, issued May 10, 2005; U.S. Pat. No. 6,906,522, issued Jun. 14, 2005; U.S. Pat. No. 6,906,523, issued Jun. 14, 2005; U.S. Pat. No. 6,909,287, issued Jun. 21, 2005; U.S. Pat. No. 6,914,413, issued Jul. 5, 2005; U.S. Pat. No. 6,913,483, issued Jul. 5, 2005; U.S. Pat. No. 6,930,485, issued Aug. 16, 2005; U.S. Pat. No. 6,933,727, issued Aug. 23, 200; U.S. Pat. No. 6,941,234, filed Sep. 6, 2005; U.S. Pat. No. 6,967,484, issued Nov. 22, 2005; U.S. Pat. No. 6,998,847, issued Feb. 14, 2006; U.S. Pat. No. 7,003,410, issued Feb. 21, 2006; U.S. Pat. No. 7,003,411, issued Feb. 21, 2006; U.S. Pat. No. 7,012,433, issued Mar. 14, 2006; U.S. Pat. No. 7,015,674, issued Mar. 21, 2006; U.S. Pat. No. 7,034,541, issued Apr. 25, 2006; U.S. Pat. No. 7,039,533, issued May 2, 2006; U.S. Pat. No. 7,058,525, issued Jun. 6, 2006; U.S. Pat. No. 7,081,755, issued Jul. 25, 2006; U.S. Pat. No. 7,106,070, issued Sep. 12, 2006; U.S. Pat. No. 7,116,109, issued Oct. 3, 2006; U.S. Pat. No. 7,119,686, issued Oct. 10, 2006; and U.S. Pat. No. 7,126,341, issued Oct. 24, 2006; U.S. Pat. No. 7,154,276, issued Dec. 26, 2006; U.S. Pat. No. 7,198,510, issued Apr. 3, 2007; U.S. Pat. No. 7,363,175, issued Apr. 22, 2008; U.S. Pat. No. 7,208,914, issued Apr. 24, 2007; U.S. Pat. No. 7,246,015, issued Jul. 17, 2007; U.S. Pat. No. 7,295,936, issued Nov. 13, 2007; U.S. Pat. No. 7,319,304, issued Jan. 15, 2008; U.S. Pat. No. 7,363,175, issued Apr. 22, 2008; U.S. Pat. No. 7,398,176, issued Jul. 8, 2008; U.S. Pat. No. 7,408,358, issued Aug. 5, 2008; U.S. Pat. No. 7,425,833, issued Sep. 16, 2008; U.S. Pat. No. 7,446,536, issued Nov. 4, 2008; U.S. Pat. No. 7,479,763, issued Jan. 20, 2009; U.S. Pat. No. 7,498,767, issued Mar. 3, 2009; U.S. Pat. No. 7,501,795, issued Mar. 10, 2009; U.S. Pat. No. 7,505,856, issued Mar. 17, 2009; U.S. Pat. No. 7,545,146, issued Jun. 9, 2009; U.S. Pat. No. 7,557,586, issued Jul. 7, 2009; U.S. Pat. No. 7,595,643, issued Sep. 29, 2009; U.S. Pat. No. 7,598,699, issued Oct. 6, 2009; U.S. Pat. No. 7,598,744, issued Oct. 6, 2009; U.S. Pat. No. 7,598,743, issued Oct. 6, 2009; U.S. Pat. No. 7,619,417, issued Nov. 17, 2009; U.S. Pat. No. 7,642,786, issued Jan. 5, 2010; U.S. Pat. No. 7,642,787, issued Jan. 5, 2010; U.S. Pat. No. 7,656,162, issued Feb. 2, 2010; U.S. Pat. No. 7,688,074, issued Mar. 30, 2010; U.S. Pat. No. 7,705,602, issued Apr. 27, 2010; U.S. Pat. No. 7,706,992, issued Apr. 27, 2010; U.S. Pat. No. 7,710,119, issued May 4, 2010; U.S. Pat. No. 7,723,993, issued May 25, 2010; U.S. Pat. No. 7,728,597, issued Jun. 1, 2010; U.S. Pat. No. 7,772,850, issued Aug. 10, 2010; U.S. Pat. No. 7,774,151, issued Aug. 10, 2010; U.S. Pat. No. 7,777,612, issued Aug. 17, 2010; U.S. Pat. No. 7,791,348, issued Sep. 7, 2010; U.S. Pat. No. 7,808,375, issued Oct. 5, 2010; U.S. Pat. No. 7,924,015, issued Apr. 12, 2011; U.S. Pat. No. 7,940,053, issued May 10, 2011; U.S. Pat. No. 7,940,052, issued May 10, 2011; U.S. Pat. No. 7,959,476, issued Jun. 14, 2011; U.S. Pat. No. 7,977,914, issued Jul. 12, 2011; U.S. Pat. No. 7,999,505, issued Aug. 16, 2011; U.S. Pat. No. D643,759, issued Aug. 23, 2011; U.S. Ser. No. 09/780,146, filed Feb. 9, 2001, entitled STORAGE BATTERY WITH INTEGRAL BATTERY TESTER; U.S. Ser. No. 09/756,638, filed Jan. 8, 2001, entitled METHOD AND APPARATUS FOR DETERMINING BATTERY PROPERTIES FROM COMPLEX IMPEDANCE/ADMITTANCE; U.S. Ser. No. 09/862,783, filed May 21, 2001, entitled METHOD AND APPARATUS FOR TESTING CELLS AND BATTERIES EMBEDDED IN SERIES/PARALLEL SYSTEMS; U.S. Ser. No. 09/880,473, filed Jun. 13, 2001; entitled BATTERY TEST MODULE; U.S. Ser. No. 10/042,451, filed Jan. 8, 2002, entitled BATTERY CHARGE CONTROL DEVICE; U.S. Ser. No. 10/109,734, filed Mar. 28, 2002, entitled APPARATUS AND METHOD FOR COUNTERACTING SELF DISCHARGE IN A STORAGE BATTERY; U.S. Ser. No. 10/112,998, filed Mar. 29, 2002, entitled BATTERY TESTER WITH BATTERY REPLACEMENT OUTPUT; U.S. Ser. No. 10/263,473, filed Oct. 2, 2002, entitled ELECTRONIC BATTERY TESTER WITH RELATIVE TEST OUTPUT; U.S. Ser. No. 10/310,385, filed Dec. 5, 2002, entitled BATTERY TEST MODULE; U.S. Ser. No. 09/653,963, filed Sep. 1, 2000, entitled SYSTEM AND METHOD FOR CONTROLLING POWER GENERATION AND STORAGE; U.S. Ser. No. 10/174,110, filed Jun. 18, 2002, entitled DAYTIME RUNNING LIGHT CONTROL USING AN INTELLIGENT POWER MANAGEMENT SYSTEM; U.S. Ser. No. 10/258,441, filed Apr. 9, 2003, entitled CURRENT MEASURING CIRCUIT SUITED FOR BATTERIES; U.S. Ser. No. 10/681,666, filed Oct. 8, 2003, entitled ELECTRONIC BATTERY TESTER WITH PROBE LIGHT; U.S. Ser. No. 10/791,141, filed Mar. 2, 2004, entitled METHOD AND APPARATUS FOR AUDITING A BATTERY TEST; U.S. Ser. No. 10/867,385, filed Jun. 14, 2004, entitled ENERGY MANAGEMENT SYSTEM FOR AUTOMOTIVE VEHICLE; U.S. Ser. No. 10/958,812, filed Oct. 5, 2004, entitled SCAN TOOL FOR ELECTRONIC BATTERY TESTER; U.S. Ser. No. 60/587,232, filed Dec. 14, 2004, entitled CELLTRON ULTRA, U.S. Ser. No. 60/653,537, filed Feb. 16, 2005, entitled CUSTOMER MANAGED WARRANTY CODE; U.S. Ser. No. 60/665,070, filed Mar. 24, 2005, entitled OHMMETER PROTECTION CIRCUIT; U.S. Ser. No. 60,694,199, filed Jun. 27, 2005, entitled GEL BATTERY CONDUCTANCE COMPENSATION; U.S. Ser. No. 60/705,389, filed Aug. 4, 2005, entitled PORTABLE TOOL THEFT PREVENTION SYSTEM, U.S. Ser. No. 11/207,419, filed Aug. 19, 2005, entitled SYSTEM FOR AUTOMATICALLY GATHERING BATTERY INFORMATION FOR USE DURING BATTERY TESTER/CHARGING, U.S. Ser. No. 60/712,322, filed Aug. 29, 2005, entitled AUTOMOTIVE VEHICLE ELECTRICAL SYSTEM DIAGNOSTIC DEVICE, U.S. Ser. No. 60/713,168, filed Aug. 31, 2005, entitled LOAD TESTER SIMULATION WITH DISCHARGE COMPENSATION, U.S. Ser. No. 60/731,881, filed Oct. 31, 2005, entitled PLUG-IN FEATURES FOR BATTERY TESTERS; U.S. Ser. No. 60/731,887, filed Oct. 31, 2005, entitled AUTOMOTIVE VEHICLE ELECTRICAL SYSTEM DIAGNOSTIC DEVICE; U.S. Ser. No. 11/304,004, filed Dec. 14, 2005, entitled BATTERY TESTER THAT CALCULATES ITS OWN REFERENCE VALUES; U.S. Ser. No. 60/751,853, filed Dec. 20, 2005, entitled BATTERY MONITORING SYSTEM; U.S. Ser. No. 11/304,004, filed Dec. 14, 2005, entitled BATTERY TESTER WITH CALCULATES ITS OWN REFERENCE VALUES; U.S. Ser. No. 60/751,853, filed Dec. 20, 2005, entitled BATTERY MONITORING SYSTEM; U.S. Ser. No. 11/356,443, filed Feb. 16, 2006, entitled ELECTRONIC BATTERY TESTER WITH NETWORK COMMUNICATION; U.S. Ser. No. 11/519,481, filed Sep. 12, 2006, entitled BROAD-BAND LOW-CONDUCTANCE CABLES FOR MAKING KELVIN CONNECTIONS TO ELECTROCHEMICAL CELLS AND BATTERIES; U.S. Ser. No. 60/847,064, filed Sep. 25, 2006, entitled STATIONARY BATTERY MONITORING ALGORITHMS; U.S. Ser. No. 11/641,594, filed Dec. 19, 2006, entitled METHOD AND APPARATUS FOR MEASURING A PARAMETER OF A VEHICLE ELECTRONIC SYSTEM; U.S. Ser. No. 60/950,182, filed Jul. 17, 2007, entitled BATTERY TESTER FOR HYBRID VEHICLE; U.S. Ser. No. 60/973,879, filed Sep. 20, 2007, entitled ELECTRONIC BATTERY TESTER FOR TESTING STATIONARY BATTERIES; U.S. Ser. No. 60/992,798, filed Dec. 6, 2007, entitled STORAGE BATTERY AND BATTERY TESTER; U.S. Ser. No. 61/061,848, filed Jun. 16, 2008, entitled KELVIN CLAMP FOR ELECTRONICALLY COUPLING TO A BATTERY CONTACT; U.S. Ser. No. 12/168,264, filed Jul. 7, 2008, entitled BATTERY TESTERS WITH SECONDARY FUNCTIONALITY; U.S. Ser. No. 12/174,894, filed Jul. 17, 2008, entitled BATTERY TESTER FOR ELECTRIC VEHICLE; U.S. Ser. No. 12/204,141, filed Sep. 4, 2008, entitled ELECTRONIC BATTERY TESTER OR CHARGER WITH DATABUS CONNECTION; U.S. Ser. No. 12/328,022, filed Dec. 4, 2008, entitled STORAGE BATTERY AND BATTERY TESTER; U.S. Ser. No. 12/416,457, filed Apr. 1, 2009, entitled SYSTEM FOR AUTOMATICALLY GATHERING BATTERY INFORMATION; U.S. Ser. No. 12/416,453, filed Apr. 1, 2009, entitled INTEGRATED TAG READER AND ENVIRONMENT SENSOR; U.S. Ser. No. 12/416,445, filed Apr. 1, 2009, entitled SIMPLIFICATION OF INVENTORY MANAGEMENT; U.S. Ser. No. 12/498,642, filed Jul. 7, 2009, entitled ELECTRONIC BATTERY TESTER; U.S. Ser. No. 12/697,485, filed Feb. 1, 2010, entitled ELECTRONIC BATTERY TESTER; U.S. Ser. No. 12/712,456, filed Feb. 25, 2010, entitled METHOD AND APPARATU FOR DETECTING CELL DETERIORATION IN AN ELECTROCHEMICAL CELL OR BATTERY; U.S. Ser. No. 61/311,485, filed Mar. 8, 2010, entitled BATTERY TESTER WITH DATABUS FOR COMMUNICATING WITH VEHICLE ELECTRICAL SYSTEM; U.S. Ser. No. 61/313,893, filed Mar. 15, 2010, entitled USE OF BATTERY MANUFACTURE/SELL DATE IN DIAGNOSIS AND RECOVERY OF DISCHARGED BATTERIES; U.S. Ser. No. 12/758,407, filed Apr. 12, 2010, entitled ELECTRONIC BATTERY TESTER WITH NETWORK COMMUNICATION; U.S. Ser. No. 12/765,323, filed Apr. 22, 2010, entitled AUTOMOTIVE VEHICLE ELECTRICAL SYSTEM DIAGNOSTIC DEVICE; U.S. Ser. No. 12/769,911, filed Apr. 29, 2010, entitled STATIONARY BATTERY TESTER; U.S. Ser. No. 61/330,497, filed May 3, 2010, entitled MAGIC WAND WITH ADVANCED HARNESS DETECTION; U.S. Ser. No. 61/348,901, filed May 27, 2010, entitled ELECTRONIC BATTERY TESTER; U.S. Ser. No. 61/351,017, filed Jun. 3, 2010, entitled IMPROVED ELECTRIC VEHICLE AND HYBRID ELECTRIC VEHICLE BATTERY MODULE BALANCER; U.S. Ser. No. 12/818,290, filed Jun. 18, 2010, entitled BATTERY MAINTENANCE DEVICE WITH THERMAL BUFFER; U.S. Ser. No. 61/373,045, filed Aug. 12, 2010, entitled ELECTRONIC BATTERY TESTER FOR TESTING STATIONERY STORAGE BATTERY; U.S. Ser. No. 12/888,689, filed Sep. 23, 2010, entitled BATTERY TESTER FOR ELECTRIC VEHICLE; U.S. Ser. No. 12/894,951, filed Sep. 30, 2010, entitled BATTERY PACK MAINTENANCE FOR ELECTRIC VEHICLES; U.S. Ser. No. 61/411,162, filed Nov. 8, 2010, entitled ELECTRONIC BATTERY TESTER; U.S. Ser. No. 13/037,641, filed Mar. 1, 2011, entitled MONITOR FOR FRONT TERMINAL BATTERIES; U.S. Ser. No. 13/037,641, filed Mar. 1, 2011, entitled: MONITOR FOR FRONT TERMINAL BATTERIES; U.S. Ser. No. 13/048,365, filed Mar. 15, 2011, entitled ELECTRONIC BATTERY TESTER WITH BATTERY AGE UNIT; U.S. Ser. No. 13/098,661, filed May 2, 2011, entitled METHOD AND APPARATUS FOR MEASURING A PARAMETER OF A VEHICLE ELECTRICAL SYSTEM; U.S. Ser. No. 13/113,272, filed May 23, 2011, entitled ELECTRONIC STORAGE BATTERY DIAGNOSTIC SYSTEM; U.S. Ser. No. 13/152,711, filed Jun. 3, 2011, entitled BATTERY PACK MAINTENANCE FOR ELECTRIC VEHICLE; U.S. Ser. No. 13/205,949, filed Aug. 9, 2011, entitled ELECTRONIC BATTERY TESTER FOR TESTING STORAGE BATTERY; U.S. Ser. No. 13/205,904, filed Aug. 9, 2011, entitled IN-VEHICLE BATTERY MONITOR; which are incorporated herein by reference in their entirety.


There is an ongoing need to measure parameters of electrical systems of vehicles and heavy equipment. Such measurements can be used to diagnose operation, failure or impending failure of components or subsystems of electrical systems. For example, in electrical systems used in vehicles, measurement of electrical parameters of such systems can be used to diagnose operation of system or indicate that maintenance is required before ultimate failure.


One particular measurement is the resistance of cabling used in large equipment such as heavy trucks. For example, one such cable or set of cables connects the battery of vehicle to the starter motor. The starter motor has a relatively large current draw and even a relatively small cable resistance can have a significant impact on operation of the starter motor.


Because the cable resistance is relatively small it typically cannot be measured using a standard ohm meter or other techniques which are normally used to measure resistance. One technique which has been used to measure the cable resistance is to run a very large current through the cable and measure the voltage drop. However, this is cumbersome and requires components capable of handling the large current.


SUMMARY OF THE INVENTION

An apparatus for measuring electrical parameters for an electrical system includes measurement circuitry which is configured to measure a first parameter of the electrical system between a first connection to the electrical system and a second connection to the electrical system. The measurement circuitry is further configured to measure a second parameter of the electrical system between a third connection to the electrical system and the second connection to the electrical system. A processor determines a third electrical parameter of the electrical system as a function of the first parameter and the second parameter. Wireless communication is provided between components of the apparatus. A method can also be employed.





BRIEF DESCRIPTION OF THE DRAWINGS


FIG. 1 is a simplified diagram of an electrical system of a vehicle.



FIG. 2 is a diagram showing test equipment for determining the resistance of cables of the electrical system shown in FIG. 1.



FIG. 3 shows another example embodiment of test equipment for determining cable resistance.



FIG. 4 is a block diagram showing another example embodiment of test circuitry of the present invention.





DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS


FIG. 1 is a diagram of an electrical system 10 of large equipment 12 such as a heavy truck. Electrical system 10 includes a battery 20, a high current load 22 and cables 24 and 26. Cables 24 and 26 have resistances R1 and R2, respectively and connect load 22 to battery 20. FIG. 1 also shows connection points C, D and C′, D′. Connections C and D are cross load 22 and connections C′ and D′ are cross battery 20.


As discussed in the Background section, the resistances R1 and R2 of cables 24 and 26 can have a significant impact on the amount of power which can be delivered to load 22. Even if the resistance values are relatively small, because a relatively large current passes through cables 24 and 26, the resultant voltage drop can significantly reduce the voltage at points C and D and therefore the amount of power (or voltage) which can be delivered to load 22. In industrial equipment, it is often desirable to measure the resistance R1 and R2 of cables 24 and 26, respectively, in order to identify a cable with a resistance which is too high. One technique which has been used to measure the resistance of the cables is to pass a large current through the cable and measure the resulting voltage drop across the cable. However, this is a cumbersome test and requires electrical test equipment which is capable of handling the large current draw. The present invention provides an apparatus and technique for measuring the resistance of a cable in a configuration similar to that shown in FIG. 1.



FIG. 2 is a simplified block diagram of one example embodiment of electrical test equipment 50 for measuring electrical parameters of the electrical system 10 shown in FIG. 1. Test equipment 50 includes measurement circuitry 52, microprocessor 54, memory 56 and output 58. Measurement circuitry 52 is configured to couple to electrical system 10 of FIG. 1 through electrical connections 60 and 62. Measurements obtained by measurement circuitry 52 are used by microprocessor 54 in accordance with program instructions contained in memory 56. Based upon the measurements, an output is provided through output 58, for example, to a user or to other equipment. Connectors 60 and 62 are configured to couple to points C, D and C′, D′ in order to measure parameters of system 10. Any number of connectors may be used and the invention is not limited to the two illustrated in FIG. 2.


In one aspect of the present invention, test equipment 50 measures a parameter P(C, D′) between points C and D′ and a parameter P(C′, D′) between points C′ and D′. These measurements are used to determine the resistance of R1 in accordance with the formula:

R1=F[P(C, D′), P(C′, D′)]  EQ. 1


Further, a third measurement can be taken to obtain a parameter P(C′,D) between points C′ and D in FIG. 1. With this additional parameter, the resistance of R2 can be determined as:

R2=F[P(C′, D),P(C′, D′)]  EQ. 2


Microprocessor 54 can determine the actual values of R1 and R2, or can make some other determination related to R1 and R2, for example a pass/fail determination, a relative determination, a gradient based determination, etc. Microprocessor 54 provides an output through output 58 based upon the determination related to R1 and R2. The output can be a visual output, audible output, or the like, to an operator. In another example, the output is suitable for receipt by other circuitry.



FIG. 3 is a simplified diagram showing another example embodiment of circuitry in accordance with the present invention. In FIG. 3, test equipment 100 includes a microprocessor 54, memory 56 and output 58, similar to the configuration discussed with respect to FIG. 2. Additionally, measurement circuitry 102 is provided for coupling to the C, D and C′, D′ connections shown in FIG. 1. More specifically, Kelvin connections 104 and 106 are provided and are identified as A, B, C and D with connections 104B, 106A, 104A and 106B, respectively. Kelvin connection 104 is configured to couple to location C shown in FIG. 1. Kelvin connection 106 is configured to couple to location D shown in FIG. 1. An additional pair of connections 108 and 110 are configured to couple to locations C′ and D′ shown in FIG. 1. A forcing function 120 couples to connections 104B and 106A (A and B) and is configured to apply a time varying signal therebetween. The signal can be any type of time varying signal including a periodic signal and may have any type of waveform at a desired frequency or multiple frequencies. Further, in some embodiments, measurements are taken using different forcing functions at differing frequencies or waveforms. The forcing function can be an active signal which is injected through the A/B connection, or can be a passive signal in which a signal is drawn from points A/B through selective application of a resistance, etc.


An amplifier 122 couples to connections 104A and 106B (C and D) and provides an output to an analog to digital converter 124. Connections 108 and 110 (C′ and D′) couple to an amplifier 126 which provides an output to analog to digital converter 124. Note that this configuration is for explanation only and other configurations can be implemented in accordance with the present invention including different amplifier configurations, different analog to digital converter configurations, etc. Further, the forcing function 120 can be an active forcing function in which a signal is actively applied or can be a passive forcing function in which a signal is applied passively through a resistance or the like which is selectively applied to draw current from battery 20 shown in FIG. 1. The circuitry can be implemented in analog or digital circuitry, or their combination. Circuitry in accordance with techniques set forth in the Background section can be implemented, or other measurement techniques can be used.


Using the configuration set forth in FIG. 3, Kelvin connections 104 and 106 can be applied to points C and D identified in FIG. 1. Additional connections 108 and 110 can be applied to points C′ and D′ shown in FIG. 1. Using this configuration, the parameters measured in accordance with FIGS. 1 and 2 can be dynamic parameters which are functions of the applied forcing function 120. In another example embodiment, a single pair of Kelvin connections is used in which the connections are moved between various positions C, D, C′ and D′ shown in FIG. 1 and the resistance R1 and R2 of the cables 24 and 26 are determined.


Using the circuitry set forth in FIG. 3, conductance values between the various connections shown in FIG. 1 can be obtained. Using these conductance values, the resistances R1 and R2 can be determined using the following equations:

R1=(K1/GCD′)−(K2/GC′D′)  EQ. 3
R2=(K3/GC′D)−(K4/GC′D′)  EQ. 4


Where GCD′ is the conductance measured between points C and D′, GC′D′ is the conductance measured between points C′ and D′ and GC′D is the conductance measured between points C′ and D. The values K1, K2, K3 and K4 are constants and can be, in some examples, the same value, for example unity. The conductance values can be either direct conductance values or can be conductance values converted to a cold cranking amps (CCA) scale. When CCA values are measured, the values of R1 and R2 can be determined using the formula:

R1=(3.125/CCACD′)−(3.125/CCAC′D′)  EQ. 5
R2=(3.125/CCAC′D)−(3.125/CCAC′D′)  EQ. 6


The value of 3.125 can be adjusted based upon the particular CCA scale employed.


The load 22 can be any type of load including loads which draw high current levels, for example, a starter motor, a magnetic switch, a ground connection, wiring harness, a terminal which may be susceptible to corrosion, a connection through a bolt which may have inappropriate torque or otherwise provide a poor connection, trailer wiring, etc. In one example output, a particular voltage drop is provided for a particular current draw through the cabling. For example, the output can comprise an indication that there is a 0.5 volt drop through the cable under a 500 amp current. Such a parameter can also be used, for example, in a pass/fail test, i.e., if the voltage drop is more than a particular threshold at a given current level, a failure indication can be provided as an output. In one embodiment, the measured parameters comprise dynamic conductance. However, any dynamic parameter can be used in accordance with the present invention including dynamic resistance, reactance, impedance, conductance, susceptance, and/or admittance, including any combination of these parameters.



FIG. 4 is a simplified block diagram showing another example embodiment of circuitry in accordance with the present invention. In FIG. 4, the test equipment 100 is divided into modules 140 and 140′. In this configuration, module 140 includes the forcing function 120 as discussed above. Module 140′ include elements similar to those shown in connection with FIG. 3 the numbering has been retained accordingly. Further, module 140′ includes an analog to digital converter 124′, microprocessor 54′, memory 56′ and output 58′. These elements are similar to those described in connection with FIG. 3 and shown in module 140 of FIG. 4. Additionally, modules 140 and 140′ include a clock 150, 150′ and communication circuitry 152, 152′, respectively.


In the configuration of FIG. 4, modules 140 and 140′ may be spaced apart and communicate over a wireless communication link 160. In the configuration of FIG. 4, the module 140 and 140′ may be spaced apart in the vehicle without requiring a separate physical connection. In such a configuration, the modules may include individual power supplies, or, may receive power from the vehicle under test. The modules include optional output circuits 58 and 58′ whereby an output may be provided to an operator or other electronic circuitry. This configuration allows data collected at one of the modules to be provided to the other module whereby the above described computations may be performed. Thus, depending upon which of the modules 140, 140′ performs the computations, that particular module may include a more advanced microprocessor 54, 54′ as required. Similarly, if a module is performing little or no computations, a much simpler configuration can be used and may not require a complete microprocessor system.


When the small forcing function or test signals described above are sent over long cables, detection and measurements can be difficult. This is because of noise in the electrical system as well as difficulty in managing long cable runs between the modules. The long cable run problem is alleviated in the configuration of FIG. 4 by the wireless communication link 160. In another aspect, the clock circuits 150 and 150′ are synchronized whereby the testing is performed in synchronization between the two modules 140 and 140′. This allows measurements to be obtained in synchronization prior to application of the forcing function (i.e., a load pulse), during application of the forcing function and after application of the forcing function. The cable resistance may be calculated based upon one such measurement cycle or, may be calculated using multiples of such cycles which are used together based upon statistical parameters, for example, an average, etc. Although the measurements may include small errors due to calibrations due to the two independent analog to digital converters, these calibration problems should not significantly alter the measurements because the cable resistance is calculated based upon changes in measured values as opposed to absolute values.


The particular circuitry of communication circuit 152, 152′ may be chosen as desired. Examples include a radio frequency communication link including a proprietary link, or standardized communication links such as those based upon Bluetooth® communication technology, Wi-Fi, etc. The synchronization of data can be shared over the wireless communication link 160. The wireless communication link 160 may, based upon device requirements, be bi-direction or uni-directional. In one configuration, circuitry 58 and/or 58′ may operate as a user input/output circuitry and include components to receive an input from an operator or from other electronic circuitry and/or display information to a user, send information to another device, etc. This allows the device to interact with an operator, for example, instructing the operator on steps required in performing the test, receive parameters from the operator, receiving instructions to begin testing, receive calibration information from the operator, etc. Additionally, multiple modules 140, 140′ may be used during testing whereby multiple cables may be tested. The testing of multiple cables may be using a single forcing function, or may be through the application of multiple forcing functions. Additional diagnostic information can be provided to an operator, for example, to indicate that the modules are coupled to the same electrical cable, verify that the electrical connections to the wiring have sufficiently low resistance to provide good test results, etc.


Although the present invention has been described with reference to preferred embodiments, workers skilled in the art will recognize that changes may be made in form and detail without departing from the spirit and scope of the invention. The measurements can be taken using multiple connections to the electrical system or by moving a single pair of connections to various positions on the electrical system. An output can be provided to instruct the operator where to place the connections.

Claims
  • 1. An apparatus for measuring electrical parameters of an electrical system comprising: measurement circuitry configured to measure a first parameter of the electrical system between a first connection to the electrical system and a second connection to the electrical system;the measurement circuitry further configured to measure a second parameter of the electrical system between a third connection to the electrical system and the second connection to the electrical system, the third connection separate from the first connection and the second connection;a processor configured to determine a third electrical parameter of the electrical system as a function of the first parameter and the second parameter;the measurement circuitry further configured to measure a fourth parameter between the third electrical connection to the electrical system and a fourth connection to the electrical system, the fourth connection separate from the first connection, the second connection, and the third connection, the processor configured to determine a fifth electrical parameter of the electrical system as a function of the fourth dynamic parameter and the second parameter; andwireless communication circuitry configured to wirelessly communicate at least one of the first, second, or fourth parameters to the processor.
  • 2. The apparatus of claim 1 wherein the first and second parameters comprise dynamic parameters.
  • 3. The apparatus of claim 1 wherein the first and second parameters are measured in response to a forcing function.
  • 4. The apparatus of claim 3 wherein the forcing function comprises an active forcing function.
  • 5. The apparatus of claim 3 wherein the forcing function comprises a passive forcing function.
  • 6. The apparatus of claim 1 including Kelvin connectors configured to couple to the electrical system.
  • 7. The apparatus of claim 1 wherein the third electrical parameter comprises electrical resistance of a cable of the electrical system.
  • 8. The apparatus of claim 1 wherein the electrical system comprises an electrical system of a vehicle.
  • 9. The apparatus of claim 1 wherein the third electrical parameter comprises electrical resistance and is determined in accordance with the equation: R1=F[P(C, D′), P(C′, D′)]
  • 10. The apparatus of claim 9 including a forcing function applied between the C point on the electrical system and a D point on the electrical system.
  • 11. The apparatus of claim 1 wherein the first and second parameters are indicative of a cold cranking amps (CCA) measurement.
  • 12. The apparatus of claim 1 including an output configured to provide an output related to the third electrical parameter.
  • 13. The apparatus of claim 12 wherein the output comprises an output to an operator.
  • 14. The apparatus of claim 12 wherein the output comprises an output to electrical circuitry.
  • 15. The apparatus of claim 12 wherein the output comprises a pass/fail output.
  • 16. The apparatus of claim 12 wherein the output is indicative of a voltage drop for a particular current through the electrical system.
  • 17. The apparatus of claim 1 wherein the measurement circuitry comprises first and second measurement circuitry, and the first measurement circuitry and the second measurement circuitry are in communication over a wireless communication link.
  • 18. The apparatus of claim 1 wherein the measurement circuitry comprises first and second measurement circuitry, and the first measurement circuitry and the second measurement circuitry operate in synchronization.
  • 19. The apparatus of claim 17 wherein the wireless communication link comprises a radio frequency communication link.
  • 20. A method for measuring electrical parameters of an electrical system comprising: measuring a first parameter of the electrical system between a first connection to the electrical system and a second connection to the electrical system;measuring a second parameter of the electrical system between a third connection to the electrical system and the second connection to the electrical system, the third connection separate from the first connection and the second connection;determining, using a processor, a third parameter of the electrical system as a function of the first parameter and the second parameter;measuring a fourth parameter between the third electrical connection to the electrical system and a fourth connection to the electrical system, the fourth connection separate from the first connection, the second connection, and the third connection;determining, using the processor; a fifth parameter of the electrical system as a function of the fourth parameter and the second parameter; andwirelessly communicating at least one of the first, the second, and the fourth parameters to the processor.
  • 21. The method of claim 20 wherein the first and second parameters comprise dynamic parameters.
  • 22. The method of claim 20 including applying a forcing function and wherein the first and second parameters are measured in response to the forcing function.
  • 23. The method of claim 22 wherein the forcing function comprises an active forcing function.
  • 24. The method of claim 22 wherein the forcing function comprises a passive forcing function.
  • 25. The method of claim 20 including applying Kelvin connectors configured to couple to the electrical system.
  • 26. The method of claim 20 wherein the third electrical parameter comprises electrical resistance of a cable of the electrical system.
  • 27. The method of claim 20 wherein the electrical system comprises an electrical system of a vehicle.
  • 28. The method of claim 20 wherein the third parameter comprises electrical resistance and is determined in accordance with the equation: Ri=F[P(C, D′), P(C′, D′)] Where C, C′ and D′ are points on the electrical system.
  • 29. The method of claim 28 including applying a forcing function between the C point on the electrical system and a D point on the electrical system.
  • 30. The method of claim 20 wherein the first and second parameters are indicative of a cold cranking amps (CCA) measurement.
  • 31. The method of claim 20 including providing an output related to the third electrical parameter.
  • 32. The method of claim 31 wherein the output is provided to an operator.
  • 33. The method of claim 31 wherein the output is provided to electrical circuitry.
  • 34. The method of claim 31 wherein the output comprises a pass/fail output.
  • 35. The method of claim 31 wherein the output is indicative of a voltage drop for a particular current through the electrical system.
  • 36. The method of claim 20 including communicating wirelessly between circuitry configured to measure the first parameter and circuitry configured to measure the second parameter.
  • 37. The method of claim 36 wherein the wireless communicating comprises communicating a radio frequency communication link.
  • 38. The method of claim 20 including synchronizing the step of measuring a first parameter and the step of measuring a second parameter.
  • 39. An apparatus for measuring electrical parameters of an electrical system comprising: measurement means for: measuring a first parameter of the electrical system between a first connection to the electrical system and a second connection to the electrical system;measuring a second parameter of the electrical system between a third connection to the electrical system and the second connection to the electrical system, the third connection separate from the first connection and the second connection; andmeasuring a third parameter between the third electrical connection to the electrical system and a fourth connection to the electrical system, the fourth connection separate from the first connection, the second connection, and the third connection;processor means for determining a fourth electrical parameter of the electrical system as a function of the first parameter and the second parameter and for determining a fifth parameter of the electrical system as a function of the third parameter and the second parameter; andmeans for wireles sly communicating at least one of the first, second, and third parameters to the process means.
BACKGROUND OF THE INVENTION

The present application is a Continuation-In-Part of application Ser. No. 11/641,594, filed Dec. 19, 2006 which is a Divisional of and claims priority of U.S. patent application Ser. No. 10/656,526, filed Sep. 5, 2003, now U.S. Pat. No. 7,154,276, the contents of which are hereby incorporated by reference in their entirety.

US Referenced Citations (789)
Number Name Date Kind
85553 Adams Jan 1869 A
2000665 Neal May 1935 A
2417940 Lehman Mar 1947 A
2437772 Wall Mar 1948 A
2514745 Dalzell Jul 1950 A
2727221 Springg Dec 1955 A
3178686 Mills Apr 1965 A
3223969 Alexander Dec 1965 A
3267452 Wolf Aug 1966 A
3356936 Smith Dec 1967 A
3562634 Latner Feb 1971 A
3593099 Scholl Jul 1971 A
3607673 Seyl Sep 1971 A
3652341 Halsall et al. Mar 1972 A
3676770 Sharaf et al. Jul 1972 A
3699433 Smith, Jr. Oct 1972 A
3729989 Little May 1973 A
3750011 Kreps Jul 1973 A
3753094 Furuishi et al. Aug 1973 A
3776177 Bryant et al. Dec 1973 A
3796124 Crosa Mar 1974 A
3808522 Sharaf Apr 1974 A
3811089 Strzelewicz May 1974 A
3816805 Terry Jun 1974 A
3850490 Zehr Nov 1974 A
3857082 Van Opijnen Dec 1974 A
3873911 Champlin Mar 1975 A
3876931 Godshalk Apr 1975 A
3886426 Daggett May 1975 A
3886443 Miyakawa et al. May 1975 A
3889248 Ritter Jun 1975 A
3906329 Bader Sep 1975 A
3909708 Champlin Sep 1975 A
3920284 Lane et al. Nov 1975 A
3936744 Perlmutter Feb 1976 A
3946299 Christianson et al. Mar 1976 A
3947757 Grube et al. Mar 1976 A
3969667 McWilliams Jul 1976 A
3979664 Harris Sep 1976 A
3984762 Dowgiallo, Jr. Oct 1976 A
3984768 Staples Oct 1976 A
3989544 Santo Nov 1976 A
3997830 Newell et al. Dec 1976 A
4008619 Alcaide et al. Feb 1977 A
4023882 Pettersson May 1977 A
4024953 Nailor, III May 1977 A
4047091 Hutchines et al. Sep 1977 A
4053824 Dupuis et al. Oct 1977 A
4056764 Endo et al. Nov 1977 A
4057313 Polizzano Nov 1977 A
4070624 Taylor Jan 1978 A
4086531 Bernier Apr 1978 A
4106025 Katz Aug 1978 A
4112351 Back et al. Sep 1978 A
4114083 Benham et al. Sep 1978 A
4126874 Suzuki et al. Nov 1978 A
4160916 Papasideris Jul 1979 A
4178546 Hulls et al. Dec 1979 A
4193025 Frailing et al. Mar 1980 A
4207610 Gordon Jun 1980 A
4207611 Gordon Jun 1980 A
4217645 Barry et al. Aug 1980 A
4218745 Perkins Aug 1980 A
4280457 Bloxham Jul 1981 A
4297639 Branham Oct 1981 A
4307342 Peterson Dec 1981 A
4315204 Sievers et al. Feb 1982 A
4316185 Watrous et al. Feb 1982 A
4322685 Frailing et al. Mar 1982 A
4351405 Fields et al. Sep 1982 A
4352067 Ottone Sep 1982 A
4360780 Skutch, Jr. Nov 1982 A
4361809 Bil et al. Nov 1982 A
4363407 Buckler et al. Dec 1982 A
4369407 Korbell Jan 1983 A
4379989 Kurz et al. Apr 1983 A
4379990 Sievers et al. Apr 1983 A
4385269 Aspinwall et al. May 1983 A
4390828 Converse et al. Jun 1983 A
4392101 Saar et al. Jul 1983 A
4396880 Windebank Aug 1983 A
4408157 Beaubien Oct 1983 A
4412169 Dell'Orto Oct 1983 A
4423378 Marino et al. Dec 1983 A
4423379 Jacobs et al. Dec 1983 A
4424491 Bobbett et al. Jan 1984 A
4425791 Kling Jan 1984 A
4441359 Ezoe Apr 1984 A
4459548 Lentz et al. Jul 1984 A
4514694 Finger Apr 1985 A
4520353 McAuliffe May 1985 A
4521498 Juergens Jun 1985 A
4564798 Young Jan 1986 A
4620767 Woolf Nov 1986 A
4633418 Bishop Dec 1986 A
4637359 Cook Jan 1987 A
4659977 Kissel et al. Apr 1987 A
4663580 Wortman May 1987 A
4665370 Holland May 1987 A
4667143 Cooper et al. May 1987 A
4667279 Maier May 1987 A
4678998 Muramatsu Jul 1987 A
4679000 Clark Jul 1987 A
4680528 Mikami et al. Jul 1987 A
4686442 Radomski Aug 1987 A
4697134 Burkum et al. Sep 1987 A
4707795 Alber et al. Nov 1987 A
4709202 Koenck et al. Nov 1987 A
4710861 Kanner Dec 1987 A
4719428 Liebermann Jan 1988 A
4723656 Kiernan et al. Feb 1988 A
4743855 Randin et al. May 1988 A
4745349 Palanisamy et al. May 1988 A
4773011 VanHoose Sep 1988 A
4781629 Mize Nov 1988 A
D299909 Casey Feb 1989 S
4816768 Champlin Mar 1989 A
4820966 Fridman Apr 1989 A
4825170 Champlin Apr 1989 A
4847547 Eng, Jr. et al. Jul 1989 A
4849700 Morioka et al. Jul 1989 A
4874679 Miyagawa Oct 1989 A
4876495 Palanisamy et al. Oct 1989 A
4881038 Champlin Nov 1989 A
4885523 Koenck Dec 1989 A
4888716 Ueno Dec 1989 A
4901007 Sworm Feb 1990 A
4907176 Bahnick et al. Mar 1990 A
4912416 Champlin Mar 1990 A
4913116 Katogi et al. Apr 1990 A
4926330 Abe et al. May 1990 A
4929931 McCuen May 1990 A
4931738 MacIntyre et al. Jun 1990 A
4932905 Richards Jun 1990 A
4933845 Hayes Jun 1990 A
4934957 Bellusci Jun 1990 A
4937528 Palanisamy Jun 1990 A
4947124 Hauser Aug 1990 A
4949046 Seyfang Aug 1990 A
4956597 Heavey et al. Sep 1990 A
4965738 Bauer et al. Oct 1990 A
4968941 Rogers Nov 1990 A
4968942 Palanisamy Nov 1990 A
4969834 Johnson Nov 1990 A
4983086 Hatrock Jan 1991 A
5004979 Marino et al. Apr 1991 A
5030916 Bokitch Jul 1991 A
5032825 Kuznicki Jul 1991 A
5034893 Fisher Jul 1991 A
5037778 Stark et al. Aug 1991 A
5047722 Wurst et al. Sep 1991 A
5081565 Nabha et al. Jan 1992 A
5087881 Peacock Feb 1992 A
5095223 Thomas Mar 1992 A
5108320 Kimber Apr 1992 A
5109213 Williams Apr 1992 A
5126675 Yang Jun 1992 A
5130658 Bohmer Jul 1992 A
5140269 Champlin Aug 1992 A
5144218 Bosscha Sep 1992 A
5144248 Alexandres et al. Sep 1992 A
D330338 Wang Oct 1992 S
5159272 Rao et al. Oct 1992 A
5160881 Schramm et al. Nov 1992 A
5164653 Reem Nov 1992 A
5168208 Schultz et al. Dec 1992 A
5170124 Blair et al. Dec 1992 A
5179335 Nor Jan 1993 A
5187382 Kondo Feb 1993 A
5194799 Tomantschger Mar 1993 A
5204611 Nor et al. Apr 1993 A
5214370 Harm et al. May 1993 A
5214385 Gabriel et al. May 1993 A
5241275 Fang Aug 1993 A
5254952 Salley et al. Oct 1993 A
5266880 Newland Nov 1993 A
5278759 Berra et al. Jan 1994 A
5281919 Palanisamy Jan 1994 A
5281920 Wurst Jan 1994 A
5295078 Stich et al. Mar 1994 A
5298797 Redl Mar 1994 A
5300874 Shimamoto et al. Apr 1994 A
5302902 Groehl Apr 1994 A
5313152 Wozniak et al. May 1994 A
5315287 Sol May 1994 A
5321626 Palladino Jun 1994 A
5321627 Reher Jun 1994 A
5323337 Wilson et al. Jun 1994 A
5325041 Briggs Jun 1994 A
5331268 Patino et al. Jul 1994 A
5332927 Paul et al. Jul 1994 A
5336993 Thomas et al. Aug 1994 A
5338515 Dalla Betta et al. Aug 1994 A
5339018 Brokaw Aug 1994 A
5343380 Champlin Aug 1994 A
5345384 Przybyla et al. Sep 1994 A
5347163 Yoshimura Sep 1994 A
5352968 Reni et al. Oct 1994 A
5357519 Martin et al. Oct 1994 A
5365160 Leppo et al. Nov 1994 A
5365453 Startup et al. Nov 1994 A
5369364 Renirie et al. Nov 1994 A
5381096 Hirzel Jan 1995 A
5384540 Dessel Jan 1995 A
5387871 Tsai Feb 1995 A
5394093 Cervas Feb 1995 A
5402007 Center et al. Mar 1995 A
5410754 Klotzbach et al. Apr 1995 A
5412308 Brown May 1995 A
5412323 Kato et al. May 1995 A
5425041 Seko et al. Jun 1995 A
5426371 Salley et al. Jun 1995 A
5426416 Jefferies et al. Jun 1995 A
5430645 Keller Jul 1995 A
5432025 Cox Jul 1995 A
5432426 Yoshida Jul 1995 A
5434495 Toko Jul 1995 A
5435185 Eagan Jul 1995 A
5442274 Tamai Aug 1995 A
5445026 Eagan Aug 1995 A
5449996 Matsumoto et al. Sep 1995 A
5449997 Gilmore et al. Sep 1995 A
5451881 Finger Sep 1995 A
5453027 Buell et al. Sep 1995 A
5457377 Jonsson Oct 1995 A
5459660 Berra Oct 1995 A
5469043 Cherng et al. Nov 1995 A
5485090 Stephens Jan 1996 A
5488300 Jamieson Jan 1996 A
5504674 Chen et al. Apr 1996 A
5508599 Koenck Apr 1996 A
5519383 De La Rosa May 1996 A
5528148 Rogers Jun 1996 A
5537967 Tashiro et al. Jul 1996 A
5541489 Dunstan Jul 1996 A
5546317 Andrieu Aug 1996 A
5548273 Nicol et al. Aug 1996 A
5550485 Falk Aug 1996 A
5561380 Sway-Tin et al. Oct 1996 A
5562501 Kinoshita et al. Oct 1996 A
5563496 McClure Oct 1996 A
5572136 Champlin Nov 1996 A
5573611 Koch et al. Nov 1996 A
5574355 McShane et al. Nov 1996 A
5578915 Crouch, Jr. et al. Nov 1996 A
5583416 Klang Dec 1996 A
5585416 Audett et al. Dec 1996 A
5585728 Champlin Dec 1996 A
5589757 Klang Dec 1996 A
5592093 Klingbiel Jan 1997 A
5592094 Ichikawa Jan 1997 A
5596260 Moravec et al. Jan 1997 A
5596261 Suyama Jan 1997 A
5598098 Champlin Jan 1997 A
5602462 Stich et al. Feb 1997 A
5606242 Hull et al. Feb 1997 A
5614788 Mullins et al. Mar 1997 A
5621298 Harvey Apr 1997 A
5631536 Tseng May 1997 A
5631831 Bird et al. May 1997 A
5633985 Severson et al. May 1997 A
5637978 Kellett et al. Jun 1997 A
5642031 Brotto Jun 1997 A
5644212 Takahashi Jul 1997 A
5650937 Bounaga Jul 1997 A
5652501 McClure et al. Jul 1997 A
5653659 Kunibe et al. Aug 1997 A
5654623 Shiga et al. Aug 1997 A
5656920 Cherng et al. Aug 1997 A
5661368 Deol et al. Aug 1997 A
5666040 Bourbeau Sep 1997 A
5675234 Greene Oct 1997 A
5677077 Faulk Oct 1997 A
5684678 Barrett Nov 1997 A
5691621 Phuoc et al. Nov 1997 A
5699050 Kanazawa Dec 1997 A
5701089 Perkins Dec 1997 A
5705929 Caravello et al. Jan 1998 A
5707015 Guthrie Jan 1998 A
5710503 Sideris et al. Jan 1998 A
5711648 Hammerslag Jan 1998 A
5712795 Layman et al. Jan 1998 A
5717336 Basell et al. Feb 1998 A
5717937 Fritz Feb 1998 A
5721688 Bramwell Feb 1998 A
5732074 Spaur et al. Mar 1998 A
5739667 Matsuda et al. Apr 1998 A
5744962 Alber et al. Apr 1998 A
5745044 Hyatt, Jr. et al. Apr 1998 A
5747189 Perkins May 1998 A
5747909 Syverson et al. May 1998 A
5747967 Muljadi et al. May 1998 A
5754417 Nicollini May 1998 A
5757192 McShane et al. May 1998 A
5760587 Harvey Jun 1998 A
5772468 Kowalski et al. Jun 1998 A
5773962 Nor Jun 1998 A
5773978 Becker Jun 1998 A
5778326 Moroto et al. Jul 1998 A
5780974 Pabla et al. Jul 1998 A
5780980 Naito Jul 1998 A
5789899 van Phuoc et al. Aug 1998 A
5793359 Ushikubo Aug 1998 A
5796239 van Phuoc et al. Aug 1998 A
5808469 Kopera Sep 1998 A
5811979 Rhein Sep 1998 A
5818201 Stockstad et al. Oct 1998 A
5818234 McKinnon Oct 1998 A
5820407 Morse et al. Oct 1998 A
5821756 McShane et al. Oct 1998 A
5821757 Alvarez et al. Oct 1998 A
5825174 Parker Oct 1998 A
5831435 Troy Nov 1998 A
5832396 Moroto et al. Nov 1998 A
5850113 Weimer et al. Dec 1998 A
5862515 Kobayashi et al. Jan 1999 A
5865638 Trafton Feb 1999 A
5869951 Takahashi Feb 1999 A
5871858 Thomsen et al. Feb 1999 A
5872443 Williamson Feb 1999 A
5872453 Shimoyama et al. Feb 1999 A
5883306 Hwang Mar 1999 A
5884202 Arjomand Mar 1999 A
5895440 Proctor et al. Apr 1999 A
5903154 Zhang et al. May 1999 A
5903716 Kimber et al. May 1999 A
5912534 Benedict Jun 1999 A
5914605 Bertness Jun 1999 A
5916287 Arjomand et al. Jun 1999 A
5927938 Hammerslag Jul 1999 A
5929609 Joy et al. Jul 1999 A
5935180 Fieramosca et al. Aug 1999 A
5939855 Proctor et al. Aug 1999 A
5939861 Joko et al. Aug 1999 A
5945829 Bertness Aug 1999 A
5946605 Takahisa et al. Aug 1999 A
5950144 Hall et al. Sep 1999 A
5951229 Hammerslag Sep 1999 A
5953322 Kimball Sep 1999 A
5955951 Wischerop et al. Sep 1999 A
5961561 Wakefield, II Oct 1999 A
5961604 Anderson et al. Oct 1999 A
5963012 Garcia et al. Oct 1999 A
5969625 Russo Oct 1999 A
5973598 Beigel Oct 1999 A
5978805 Carson Nov 1999 A
5982138 Krieger Nov 1999 A
5990664 Rahman Nov 1999 A
6002238 Champlin Dec 1999 A
6005489 Siegle et al. Dec 1999 A
6005759 Hart et al. Dec 1999 A
6008652 Theofanopoulos et al. Dec 1999 A
6009369 Boisvert et al. Dec 1999 A
6016047 Notten et al. Jan 2000 A
6031354 Wiley et al. Feb 2000 A
6031368 Klippel et al. Feb 2000 A
6037745 Koike et al. Mar 2000 A
6037749 Parsonage Mar 2000 A
6037751 Klang Mar 2000 A
6037777 Champlin Mar 2000 A
6037778 Makhija Mar 2000 A
6046514 Rouillard et al. Apr 2000 A
6051976 Bertness Apr 2000 A
6055468 Kaman et al. Apr 2000 A
6061638 Joyce May 2000 A
6064372 Kahkoska May 2000 A
6072299 Kurle et al. Jun 2000 A
6072300 Tsuji Jun 2000 A
6075339 Reipur et al. Jun 2000 A
6081098 Bertness et al. Jun 2000 A
6081109 Seymour et al. Jun 2000 A
6087815 Pfeifer et al. Jul 2000 A
6091238 McDermott Jul 2000 A
6091245 Bertness Jul 2000 A
6094033 Ding et al. Jul 2000 A
6097193 Bramwell Aug 2000 A
6100670 Levesque Aug 2000 A
6100815 Pailthorp Aug 2000 A
6104167 Bertness et al. Aug 2000 A
6113262 Purola et al. Sep 2000 A
6114834 Parise Sep 2000 A
6121880 Scott et al. Sep 2000 A
6136914 Hergenrother et al. Oct 2000 A
6137269 Champlin Oct 2000 A
6140797 Dunn Oct 2000 A
6141608 Rother Oct 2000 A
6144185 Dougherty et al. Nov 2000 A
6147598 Murphy et al. Nov 2000 A
6150793 Lesesky et al. Nov 2000 A
6158000 Collins Dec 2000 A
6161640 Yamaguchi Dec 2000 A
6163156 Bertness Dec 2000 A
6164063 Mendler Dec 2000 A
6167349 Alvarez Dec 2000 A
6172483 Champlin Jan 2001 B1
6172505 Bertness Jan 2001 B1
6177737 Palfey et al. Jan 2001 B1
6181545 Amatucci et al. Jan 2001 B1
6184656 Karunasiri et al. Feb 2001 B1
6191557 Gray et al. Feb 2001 B1
6202739 Pal et al. Mar 2001 B1
6211651 Nemoto Apr 2001 B1
6215275 Bean Apr 2001 B1
6218805 Melcher Apr 2001 B1
6218936 Imao Apr 2001 B1
6222342 Eggert et al. Apr 2001 B1
6222369 Champlin Apr 2001 B1
D442503 Lundbeck et al. May 2001 S
6225808 Varghese et al. May 2001 B1
6225898 Kamiya et al. May 2001 B1
6236186 Helton et al. May 2001 B1
6236332 Conkright et al. May 2001 B1
6236949 Hart May 2001 B1
6238253 Qualls May 2001 B1
6242887 Burke Jun 2001 B1
6249124 Bertness Jun 2001 B1
6250973 Lowery et al. Jun 2001 B1
6254438 Gaunt Jul 2001 B1
6259170 Limoge et al. Jul 2001 B1
6259254 Klang Jul 2001 B1
6262563 Champlin Jul 2001 B1
6262692 Babb Jul 2001 B1
6263268 Nathanson Jul 2001 B1
6263322 Kirkevold et al. Jul 2001 B1
6271643 Becker et al. Aug 2001 B1
6271748 Derbyshire et al. Aug 2001 B1
6272387 Yoon Aug 2001 B1
6275008 Arai et al. Aug 2001 B1
6285191 Gollomp et al. Sep 2001 B1
6294896 Champlin Sep 2001 B1
6294897 Champlin Sep 2001 B1
6304087 Bertness Oct 2001 B1
6307349 Koenck et al. Oct 2001 B1
6310481 Bertness Oct 2001 B2
6313607 Champlin Nov 2001 B1
6313608 Varghese et al. Nov 2001 B1
6316914 Bertness Nov 2001 B1
6320351 Ng et al. Nov 2001 B1
6323650 Bertness et al. Nov 2001 B1
6324042 Andrews Nov 2001 B1
6329793 Bertness et al. Dec 2001 B1
6331762 Bertness Dec 2001 B1
6332113 Bertness Dec 2001 B1
6346795 Haraguchi et al. Feb 2002 B2
6347958 Tsai Feb 2002 B1
6351102 Troy Feb 2002 B1
6356042 Kahlon et al. Mar 2002 B1
6356083 Ying Mar 2002 B1
6359441 Bertness Mar 2002 B1
6359442 Henningson et al. Mar 2002 B1
6363303 Bertness Mar 2002 B1
RE37677 Irie Apr 2002 E
6377031 Karuppana et al. Apr 2002 B1
6384608 Namaky May 2002 B1
6388448 Cervas May 2002 B1
6389337 Kolls May 2002 B1
6392414 Bertness May 2002 B2
6396278 Makhija May 2002 B1
6407554 Godau et al. Jun 2002 B1
6411098 Laletin Jun 2002 B1
6417669 Champlin Jul 2002 B1
6420852 Sato Jul 2002 B1
6424157 Gollomp et al. Jul 2002 B1
6424158 Klang Jul 2002 B2
6437957 Karuppana et al. Aug 2002 B1
6441585 Bertness Aug 2002 B1
6445158 Bertness et al. Sep 2002 B1
6448778 Rankin Sep 2002 B1
6449726 Smith Sep 2002 B1
6456036 Thandiwe Sep 2002 B1
6456045 Troy et al. Sep 2002 B1
6465908 Karuppana et al. Oct 2002 B1
6466025 Klang Oct 2002 B1
6466026 Champlin Oct 2002 B1
6469511 Vonderhaar et al. Oct 2002 B1
6473659 Shah et al. Oct 2002 B1
6477478 Jones et al. Nov 2002 B1
6495990 Champlin Dec 2002 B2
6497209 Karuppana et al. Dec 2002 B1
6500025 Moenkhaus et al. Dec 2002 B1
6505507 Imao Jan 2003 B1
6507196 Thomsen et al. Jan 2003 B2
6526361 Jones et al. Feb 2003 B1
6529723 Bentley Mar 2003 B1
6531848 Chitsazan et al. Mar 2003 B1
6532425 Boost et al. Mar 2003 B1
6533316 Breed et al. Mar 2003 B2
6534992 Meissner et al. Mar 2003 B2
6534993 Bertness Mar 2003 B2
6536536 Gass et al. Mar 2003 B1
6544078 Palmisano et al. Apr 2003 B2
6545599 Derbyshire et al. Apr 2003 B2
6556019 Bertness Apr 2003 B2
6566883 Vonderhaar et al. May 2003 B1
6570385 Roberts et al. May 2003 B1
6577107 Kechmire Jun 2003 B2
6586941 Bertness et al. Jul 2003 B2
6597150 Bertness et al. Jul 2003 B1
6599243 Woltermann et al. Jul 2003 B2
6600815 Walding Jul 2003 B1
6611740 Lowrey et al. Aug 2003 B2
6614349 Proctor et al. Sep 2003 B1
6618644 Bean Sep 2003 B2
6621272 Champlin Sep 2003 B2
6623314 Cox et al. Sep 2003 B1
6624635 Lui Sep 2003 B1
6628011 Droppo et al. Sep 2003 B2
6629054 Makhija et al. Sep 2003 B2
6633165 Bertness Oct 2003 B2
6635974 Karuppana et al. Oct 2003 B1
6636790 Lightner et al. Oct 2003 B1
6667624 Raichle et al. Dec 2003 B1
6679212 Kelling Jan 2004 B2
6686542 Zhang Feb 2004 B2
6696819 Bertness Feb 2004 B2
6707303 Bertness et al. Mar 2004 B2
6732031 Lightner et al. May 2004 B1
6736941 Oku et al. May 2004 B2
6737831 Champlin May 2004 B2
6738697 Breed May 2004 B2
6740990 Tozuka et al. May 2004 B2
6744149 Karuppana et al. Jun 2004 B1
6745153 White et al. Jun 2004 B2
6759849 Bertness et al. Jul 2004 B2
6771073 Henningson et al. Aug 2004 B2
6777945 Roberts et al. Aug 2004 B2
6781344 Hedegor et al. Aug 2004 B1
6781382 Johnson Aug 2004 B2
6784635 Larson Aug 2004 B2
6784637 Raichle et al. Aug 2004 B2
6788025 Bertness et al. Sep 2004 B2
6795782 Bertness et al. Sep 2004 B2
6796841 Cheng et al. Sep 2004 B1
6805090 Bertness et al. Oct 2004 B2
6806716 Bertness et al. Oct 2004 B2
6825669 Raichle et al. Nov 2004 B2
6832141 Skeen et al. Dec 2004 B2
6842707 Raichle et al. Jan 2005 B2
6845279 Gilmore et al. Jan 2005 B1
6850037 Bertness Feb 2005 B2
6856162 Greatorex et al. Feb 2005 B1
6856972 Yun et al. Feb 2005 B1
6871151 Bertness Mar 2005 B2
6885195 Bertness Apr 2005 B2
6888468 Bertness May 2005 B2
6891378 Bertness et al. May 2005 B2
6904796 Pacsai et al. Jun 2005 B2
6906522 Bertness et al. Jun 2005 B2
6906523 Bertness et al. Jun 2005 B2
6906624 McClelland et al. Jun 2005 B2
6909287 Bertness Jun 2005 B2
6909356 Brown et al. Jun 2005 B2
6911825 Namaky Jun 2005 B2
6913483 Restaino et al. Jul 2005 B2
6914413 Bertness et al. Jul 2005 B2
6919725 Bertness et al. Jul 2005 B2
6930485 Bertness et al. Aug 2005 B2
6933727 Bertness et al. Aug 2005 B2
6941234 Bertness et al. Sep 2005 B2
6957133 Hunt et al. Oct 2005 B1
6967484 Bertness Nov 2005 B2
6972662 Ohkawa et al. Dec 2005 B1
6983212 Burns Jan 2006 B2
6993421 Pillar et al. Jan 2006 B2
6998847 Bertness et al. Feb 2006 B2
7003410 Bertness et al. Feb 2006 B2
7003411 Bertness Feb 2006 B2
7012433 Smith et al. Mar 2006 B2
7015674 VonderHaar Mar 2006 B2
7029338 Orange et al. Apr 2006 B1
7034541 Bertness et al. Apr 2006 B2
7039533 Bertness et al. May 2006 B2
7042346 Paulsen May 2006 B2
7058525 Bertness et al. Jun 2006 B2
7081755 Klang et al. Jul 2006 B2
7089127 Thibedeau et al. Aug 2006 B2
7098666 Patino Aug 2006 B2
7102556 White Sep 2006 B2
7106070 Bertness et al. Sep 2006 B2
7116109 Klang Oct 2006 B2
7119686 Bertness et al. Oct 2006 B2
7120488 Nova et al. Oct 2006 B2
7126341 Bertness et al. Oct 2006 B2
7129706 Kalley Oct 2006 B2
7154276 Bertness Dec 2006 B2
7170393 Martin Jan 2007 B2
7177925 Carcido et al. Feb 2007 B2
7182147 Cutler et al. Feb 2007 B2
7184905 Stefan Feb 2007 B2
7198510 Bertness Apr 2007 B2
7200424 Tischer et al. Apr 2007 B2
7202636 Reynolds et al. Apr 2007 B2
7208914 Klang Apr 2007 B2
7209850 Brott et al. Apr 2007 B2
7209860 Trsar et al. Apr 2007 B2
7212887 Shah et al May 2007 B2
7219023 Banke et al. May 2007 B2
7233128 Brost et al. Jun 2007 B2
7235977 Koran et al. Jun 2007 B2
7246015 Bertness et al. Jul 2007 B2
7272519 Lesesky et al. Sep 2007 B2
7287001 Falls et al. Oct 2007 B1
7295936 Bertness et al. Nov 2007 B2
7319304 Veloo et al. Jan 2008 B2
7339477 Puzio et al. Mar 2008 B2
7363175 Bertness et al. Apr 2008 B2
7398176 Bertness Jul 2008 B2
7408358 Knopf Aug 2008 B2
7425833 Bertness et al. Sep 2008 B2
7446536 Bertness Nov 2008 B2
7453238 Melichar Nov 2008 B2
7479763 Bertness Jan 2009 B2
7498767 Brown et al. Mar 2009 B2
7501795 Bertness et al. Mar 2009 B2
7505856 Restaino et al. Mar 2009 B2
7545146 Klang et al. Jun 2009 B2
7557586 Vonderhaar et al. Jul 2009 B1
7590476 Shumate Sep 2009 B2
7592776 Tsukamoto et al. Sep 2009 B2
7595643 Klang Sep 2009 B2
7598699 Restaino et al. Oct 2009 B2
7598743 Bertness Oct 2009 B2
7598744 Bertness et al. Oct 2009 B2
7619417 Klang Nov 2009 B2
7642786 Philbrook Jan 2010 B2
7642787 Bertness et al. Jan 2010 B2
7656162 Vonderhaar et al. Feb 2010 B2
7657386 Thibedeau et al. Feb 2010 B2
7667437 Johnson et al. Feb 2010 B2
7679325 Seo Mar 2010 B2
7684908 Ogilvie et al. Mar 2010 B1
7688074 Cox et al. Mar 2010 B2
7698179 Leung et al. Apr 2010 B2
7705602 Bertness Apr 2010 B2
7706991 Bertness et al. Apr 2010 B2
7710119 Bertness May 2010 B2
7723993 Klang May 2010 B2
7728556 Yano et al. Jun 2010 B2
7728597 Bertness Jun 2010 B2
7751953 Namaky Jul 2010 B2
7772850 Bertness Aug 2010 B2
7774151 Bertness Aug 2010 B2
7777612 Sampson et al. Aug 2010 B2
7791348 Brown et al. Sep 2010 B2
7808375 Bertness et al. Oct 2010 B2
7848857 Nasr et al. Dec 2010 B2
7883002 Jin et al. Feb 2011 B2
7902990 Delmonico et al. Mar 2011 B2
7924015 Bertness Apr 2011 B2
7940053 Brown et al. May 2011 B2
7999505 Bertness Aug 2011 B2
8164343 Bertness Apr 2012 B2
8306690 Bertness Nov 2012 B2
20010035737 Nakanishi et al. Nov 2001 A1
20010048215 Breed et al. Dec 2001 A1
20020004694 McLeod Jan 2002 A1
20020007237 Phung et al. Jan 2002 A1
20020010558 Bertness et al. Jan 2002 A1
20020021135 Li et al. Feb 2002 A1
20020027346 Breed et al. Mar 2002 A1
20020030495 Kechmire Mar 2002 A1
20020036504 Troy et al. Mar 2002 A1
20020041175 Lauper et al. Apr 2002 A1
20020044050 Derbyshire et al. Apr 2002 A1
20020047711 Bertness et al. Apr 2002 A1
20020050163 Makhija et al. May 2002 A1
20020074398 Lancos et al. Jun 2002 A1
20020118111 Brown et al. Aug 2002 A1
20020121901 Hoffman Sep 2002 A1
20020128985 Greenwald Sep 2002 A1
20020171428 Bertness Nov 2002 A1
20020176010 Wallach et al. Nov 2002 A1
20030006779 H. Youval Jan 2003 A1
20030009270 Breed Jan 2003 A1
20030017753 Palmisano et al. Jan 2003 A1
20030025481 Bertness Feb 2003 A1
20030036909 Kato Feb 2003 A1
20030040873 Lesesky et al. Feb 2003 A1
20030060953 Chen Mar 2003 A1
20030078743 Bertness et al. Apr 2003 A1
20030088375 Bertness et al. May 2003 A1
20030124417 Bertness et al. Jul 2003 A1
20030128036 Henningson et al. Jul 2003 A1
20030137277 Mori et al. Jul 2003 A1
20030169018 Berels et al. Sep 2003 A1
20030169019 Oosaki Sep 2003 A1
20030171111 Clark Sep 2003 A1
20030177417 Malhotra et al. Sep 2003 A1
20030184262 Makhija Oct 2003 A1
20030184306 Bertness et al. Oct 2003 A1
20030187556 Suzuki Oct 2003 A1
20030194672 Roberts et al. Oct 2003 A1
20030197512 Miller et al. Oct 2003 A1
20030212311 Nova et al. Nov 2003 A1
20030214395 Flowerday et al. Nov 2003 A1
20040000590 Raichle et al. Jan 2004 A1
20040000891 Raichle et al. Jan 2004 A1
20040000893 Raichle et al. Jan 2004 A1
20040000913 Raichle et al. Jan 2004 A1
20040000915 Raichle et al. Jan 2004 A1
20040002824 Raichle et al. Jan 2004 A1
20040002825 Raichle et al. Jan 2004 A1
20040002836 Raichle et al. Jan 2004 A1
20040032264 Schoch Feb 2004 A1
20040036443 Bertness Feb 2004 A1
20040044452 Bauer et al. Mar 2004 A1
20040044454 Ross et al. Mar 2004 A1
20040049361 Hamdan et al. Mar 2004 A1
20040051533 Namaky Mar 2004 A1
20040051534 Kobayashi et al. Mar 2004 A1
20040054503 Namaky Mar 2004 A1
20040064225 Jammu et al. Apr 2004 A1
20040088087 Fukushima et al. May 2004 A1
20040113588 Mikuriya et al. Jun 2004 A1
20040145342 Lyon Jul 2004 A1
20040164706 Osborne Aug 2004 A1
20040172177 Nagai et al. Sep 2004 A1
20040178185 Yoshikawa et al. Sep 2004 A1
20040189309 Bertness et al. Sep 2004 A1
20040199343 Cardinal et al. Oct 2004 A1
20040207367 Taniguchi et al. Oct 2004 A1
20040227523 Namaky Nov 2004 A1
20040239332 Mackel et al. Dec 2004 A1
20040251876 Bertness Dec 2004 A1
20050007068 Johnson et al. Jan 2005 A1
20050017726 Koran et al. Jan 2005 A1
20050021294 Trsar et al. Jan 2005 A1
20050025299 Tischer et al. Feb 2005 A1
20050043868 Mitcham Feb 2005 A1
20050057256 Bertness Mar 2005 A1
20050060070 Kapolka et al. Mar 2005 A1
20050073314 Bertness et al. Apr 2005 A1
20050076381 Gross Apr 2005 A1
20050096809 Skeen et al. May 2005 A1
20050102073 Ingram May 2005 A1
20050128083 Puzio et al. Jun 2005 A1
20050128902 Tsai Jun 2005 A1
20050143882 Umezawa Jun 2005 A1
20050159847 Shah et al. Jul 2005 A1
20050162172 Bertness Jul 2005 A1
20050168226 Quint et al. Aug 2005 A1
20050173142 Cutler et al. Aug 2005 A1
20050182536 Doyle et al. Aug 2005 A1
20050212521 Bertness Sep 2005 A1
20050218902 Restaino et al. Oct 2005 A1
20050231205 Bertness et al. Oct 2005 A1
20050254106 Silverbrook et al. Nov 2005 A9
20050256617 Cawthorne et al. Nov 2005 A1
20050258241 McNutt et al. Nov 2005 A1
20060012330 Okumura et al. Jan 2006 A1
20060030980 St. Denis Feb 2006 A1
20060089767 Sowa Apr 2006 A1
20060095230 Grier et al. May 2006 A1
20060152224 Kim et al. Jul 2006 A1
20060161313 Rogers et al. Jul 2006 A1
20060161390 Namaky et al. Jul 2006 A1
20060217914 Bertness Sep 2006 A1
20060282323 Walker et al. Dec 2006 A1
20070024460 Clark Feb 2007 A1
20070026916 Juds et al. Feb 2007 A1
20070046261 Porebski Mar 2007 A1
20070088472 Ganzhorn et al. Apr 2007 A1
20070159177 Bertness et al. Jul 2007 A1
20070182576 Proska et al. Aug 2007 A1
20070194791 Huang Aug 2007 A1
20070194793 Bertness Aug 2007 A1
20070259256 Le Canut et al. Nov 2007 A1
20080036421 Seo et al. Feb 2008 A1
20080059014 Nasr et al. Mar 2008 A1
20080086246 Bolt et al. Apr 2008 A1
20080094068 Scott Apr 2008 A1
20080169818 Lesesky et al. Jul 2008 A1
20080303528 Kim Dec 2008 A1
20080303529 Nakamura et al. Dec 2008 A1
20080315830 Bertness Dec 2008 A1
20090006476 Andreasen et al. Jan 2009 A1
20090024266 Bertness Jan 2009 A1
20090085571 Bertness Apr 2009 A1
20090146800 Grimlund et al. Jun 2009 A1
20090198372 Hammerslag Aug 2009 A1
20090247020 Gathman et al. Oct 2009 A1
20090276115 Chen Nov 2009 A1
20100023198 Hamilton Jan 2010 A1
20100145780 Nishikawa et al. Jun 2010 A1
20100314950 Rutkowski et al. Dec 2010 A1
20110004427 Gorbold et al. Jan 2011 A1
20110273181 Park et al. Nov 2011 A1
20120046824 Ruther et al. Feb 2012 A1
20130158782 Bertness et al. Jun 2013 A1
Foreign Referenced Citations (69)
Number Date Country
2470964 Jan 2002 CN
201063352 May 2008 CN
29 26 716 Jan 1981 DE
196 38 324 Sep 1996 DE
10 2008 036 595 Feb 2010 DE
0 022 450 Jan 1981 EP
0 391 694 Apr 1990 EP
0 476 405 Sep 1991 EP
0 637 754 Feb 1995 EP
0 772 056 May 1997 EP
0 982 159 Mar 2000 EP
1 810 869 Nov 2004 EP
1 807 710 Jul 2007 EP
1 807 710 Jan 2010 EP
2 749 397 Dec 1997 FR
2 029 586 Mar 1980 GB
2 088 159 Jun 1982 GB
2 246 916 Oct 1990 GB
2 275 783 Jul 1994 GB
2 387 235 Oct 2003 GB
59-17892 Jan 1984 JP
59-17893 Jan 1984 JP
59017894 Jan 1984 JP
59215674 Dec 1984 JP
60225078 Nov 1985 JP
62-180284 Aug 1987 JP
63027776 Feb 1988 JP
03274479 Dec 1991 JP
03282276 Dec 1991 JP
4-8636 Jan 1992 JP
04095788 Mar 1992 JP
04131779 May 1992 JP
04372536 Dec 1992 JP
05211724 Aug 1993 JP
5216550 Aug 1993 JP
7-128414 May 1995 JP
09061505 Mar 1997 JP
10056744 Feb 1998 JP
10232273 Sep 1998 JP
11103503 Apr 1999 JP
11-150809 Jun 1999 JP
2001057711 Feb 2001 JP
2003-346909 Dec 2003 JP
2006331976 Dec 2006 JP
2009-244166 Oct 2009 JP
2089015 Aug 1997 RU
WO 9322666 Nov 1993 WO
WO 9405069 Mar 1994 WO
WO 9601456 Jan 1996 WO
WO 9606747 Mar 1996 WO
WO 9628846 Sep 1996 WO
WO 9701103 Jan 1997 WO
WO 9744652 Nov 1997 WO
WO 9804910 Feb 1998 WO
WO 9821132 May 1998 WO
WO 9858270 Dec 1998 WO
WO 9923738 May 1999 WO
WO 9956121 Nov 1999 WO
WO 0016083 Mar 2000 WO
WO 0062049 Oct 2000 WO
WO 0067359 Nov 2000 WO
WO 0159443 Feb 2001 WO
WO 0116614 Mar 2001 WO
WO 0116615 Mar 2001 WO
WO 0151947 Jul 2001 WO
WO 03047064 Jun 2003 WO
WO 03076960 Sep 2003 WO
WO 2004047215 Jun 2004 WO
2010007681 Jan 2010 WO
Non-Patent Literature Citations (96)
Entry
“Electrochemical Impedance Spectroscopy in Battery Development and Testing”, Batteries International, Apr. 1997, pp. 59 and 62-63.
“Battery Impedance”, by E. Willihnganz et al., Electrical Engineering, Sep. 1959, pp. 922-925.
“Determining the End of Battery Life”, by S. DeBardelaben, IEEE, 1986, pp. 365-368.
“A Look at the Impedance of a Cell”, by S. Debardelaben, IEEE, 1988, pp. 394-397.
“The Impedance of Electrical Storage Cells”, by N.A. Hampson et al., Journal of Applied Electrochemistry, 1980, pp. 3-11.
“A Package for Impedance/Admittance Data Analysis”, by B. Boukamp, Solid State Ionics, 1986, pp. 136-140.
“Precision of Impedance Spectroscopy Estimates of Bulk, Reaction Rate, and Diffusion Parameters”, by J. Macdonald et al., J. Electroanal, Chem., 1991, pp. 1-11.
Internal Resistance: Harbinger of Capacity Loss in Starved Electrolyte Sealed Lead Acid Batteries, by Vaccaro, F.J. et al., AT&T Bell Laboratories, 1987 IEEE, Ch. 2477, pp. 128, 131.
“Field and Laboratory Studies to Assess the State of Health of Valve-Regulated Lead Acid Batteries: Part I Conductance/Capacity Correlation Studies”, by D. Feder et al., IEEE, Aug. 1992, pp. 218-233.
IEEE Recommended Practice for Maintenance, Testings, and Replacement of Large Lead Storage Batteries for Generating Stations and Substations, The Institute of Electrical and Electronics Engineers, Inc., ANSI/IEEE Std. 450-1987, Mar. 9, 1987.
“Performance of Dry Cells”, by C. Hambuechen, Preprint of Am. Electrochem. Soc., Apr. 18-20, 1912, paper No. 19, pp. 1-5.
“A Bridge for Measuring Storage Battery Resistance”, by E. Willihncanz, The Electrochemical Society, preprint 79-20, Apr. 1941, pp. 253-258.
“JIS Japanese Industrial Standard-Lead Acid Batteries for Automobiles”, Japanese Standards Association UDC, 621.355.2.629.113.006, Nov. 1995.
National Semiconductor Corporation, “High Q Notch Filter”, Mar. 1969, Linear Brief 5.
Burr-Brown Corporation, “Design a 60 Hz Notch Filter with the UAF42”, Jan. 1994, AB-071, 1994.
National Semiconductor Corporation, “LMF90-4th -Order Elliptic Notch Filter”, Dec. 1994, RRD-B30M115.
“Alligator Clips with Wire Penetrators” J.S. Popper, Inc. product information, downloaded from http://www.jspopper.com/, prior to Oct. 1, 2002.
“#12: LM78S40 Simple Switcher DC to DC Converter”, ITM e-Catalog, downloaded from http://www.pcbcafe.com, prior to Oct. 1, 2002.
“Simple DC-DC Converts Allows Use of Single Battery”, Electronix Express, downloaded from http://www.elexp.com/t—dc-dc.htm, prior to Oct. 1, 2002.
“DC-DC Converter Basics”, Power Designers, downloaded from http://www.powederdesigners.com/InforWeb.design—center/articles/DC-DC/converter.shtm , prior to Oct. 1, 2002.
“Notification of Transmittal of the International Search Report or the Declaration”, PCT/US02/29461, filed Sep. 17, 2002 and mailed Jan. 3, 2003.
“Notification of Transmittal of the International Search Report or the Declaration”, PCT/US03/07546, filed Mar. 13, 2003 and mailed Jul. 4, 2001.
“Notification of Transmittal of the International Search Report or the Declaration”, PCT/US03/06577, filed Mar. 5, 2003 and mailed Jul. 24, 2003.
“Notification of Transmittal of the International Search Report or the Declaration”, PCT/US03/07837, filed Mar. 14, 2003 and mailed Jul. 4, 2003.
“Improved Impedance Spectroscopy Technique for Status Determination of Production Li/SO2 Batteries” Terrill Atwater et al., pp. 10-113, (1992).
“Notification of Transmittal of the International Search Report or the Declaration”, PCT/US03/41561; Search Report completed Apr. 13, 2004, mailed May 6, 2004.
“Notification of Transmittal of the International Search Report or the Declaration”, PCT/US03/27696, filed Sep. 4, 2003 and mailed Apr. 15, 2004.
“Programming Training Course, 62-000 Series Smart Engine Analyzer”, Testproducts Division, Kalamazoo, Michigan, pp. 1-207, (1984).
“Operators Manual, Modular Computer Analyzer Model MCA 3000”, Sun Electric Corporation, Crystal Lake, Illinois pp. 1-1-14-13, (1991).
Supplementary European Search Report Communication for Appl. No. 99917402.2; Sep. 7, 2004.
“Dynamic modelling of lead/acid batteries using impedance spectroscopy for parameter identification”, Journal of Power Sources, pp. 69-84, (1997).
“Results of Discrete Frequency Immittance Spectroscopy (DFIS) Measurements of Lead Acid Batteries”, by K.S. Champlin et al., Proceedings of 23rdInternational Teleco Conference (INTELEC), published Oct. 2001, IEE, pp. 433-440.
“Examination Report” from the UK Patent Office for App. No. 0417678.0; Jan. 24, 2005.
Notification of Transmittal of the International Search Report for PCT/US03/30707, filed Sep. 30, 2003 and mailed Nov. 24, 2004.
“A review of impedance measurements for determination of the state-of-charge or state-of-health of secondary batteries”, Journal of Power Sources, pp. 59-69, (1998).
“Search Report Under Section 17” for Great Britain Application No. GB0421447.4, date of search Jan. 27, 2005, date of document Jan. 28, 2005.
Wikipedia Online Encyclopedia, Inductance, 2005, http://en.wikipedia.org/wiki/inductance, pp. 1-5, mutual Inductance, pp. 3,4.
“Professional BCS System Analyzer Battery-Charger-Starting”, pp. 2-8, (2001).
Young Illustrated Encyclopedia Dictionary of Electronics, 1981, Parker Publishing Company, Inc., pp. 318-319.
“DSP Applications in Hybrid Electric Vehicle Powertrain”, Miller et al., Proceedings of the American Control Conference, Sand Diego, CA, Jun. 1999; 2 ppg.
“Notification of Transmittal of the International Search Report and the Written Opinion of the International Searching Authority, or the Declaration” for PCT/US2008/008702 filed Jul. 2008; 15 pages.
“A Microprocessor-Based Control System for a Near-Term Electric Vehicle”, Bimal K. Bose; IEEE Transactions on Industry Applications, vol. IA-17, No. 6, Nov./Dec. 1981; 0093-9994/81/1100-0626$00.75 © 1981 IEEE, 6 pages.
Notification of Transmittal of the International Search Report and the Written Opinion of the International Searching Authority, or the Declaration for PCT/US2011/038279 filed May 27, 2011, date of mailing Sep. 16, 2011, 12 pages.
U.S. Appl. No. 60/387,912, filed Jun. 13, 2002 which is related to U.S. Patent No. 7,089,127.
“Conductance Testing Compared to Traditional Methods of Evaluating the Capacity of Valve-Regulated Lead-Acid Batteries and Predicting State-of-Health”, by D. Feder et al., May 1992, pp. 1-8; (13 total pgs. ).
“Field and Laboratory Studies to Assess the State of Health of Valve-Regulated Lead Acid Batteries: Part I—Conductance/Capacity Correlation Studies”, by D. Feder at al., Oct. 1992, pp. 1-15; (19 total pgs. ).
“Field Application of Conductance Measurements Use to Ascertain Cell/Battery and Inter-Cell Connection State-of-Health in Electric Power Utility Applications”, by M. Hlavac et al., Apr. 1993, pp. 1-14; (19 total pgs.).
“Conductance Testing of Standby Batteries in Signaling and Communications Applications for the Purpose of Evaluating Battery State-of-Health”, by S. McShane, Apr. 1993, pp. 1-9; (14 total pgs.).
“Condutance Monitoring of Recombination Lead Acid Batteries”, by B. Jones, May 1993, pp. 1-6; (11 total pgs.).
“Evaluating the State-of-Health of Lead Acid Flooded and Valve-Regulated Batteries: A Comparison of Conductance Testing vs. Traditional Methods”, by M. Hlavac et al., Jun. 1993, pp. 1-15; (20 total pgs.).
“Updated State of Conductance/Capacity Correlation Studies to Determine the State-of-Health of Automotive SLI and Standby Lead Acid Batteries”, by D. Feder et al., Sep. 1993, pp. 1-17; (22 total pgs.).
“Field and Laboratory Studies to Access the State-of-Health of Valve-Regulated Lead-Acid Battery Technologies Using Conductance Testing Part II-Further Conductance/Capacity Correlation Studies”, by M. Hlavac et al., Sep. 1993, pp. 1-9; (14 total pgs.).
“Field Experience of Testing VRLA Batteries by Measuring Conductance”, by M.W. Kniveton, May 1994, pp. 1-4; (9 total pgs.).
“Reducing the Cost of Maintaining VRLA Batteries in Telecom Applications”, by M.W. Kniveton, Sep. 1994, pp. 1-5; (10 total pgs.).
“Analysis and Interpretation of Conductance Measurements used to Access the State-of-Health of Valve Regulated Lead Acid Batteries Part III: Analytical Techniques”, by M. Hlavac, Nov. 1994, 9 pgs; (13 total pgs.).
“Testing 24 Volt Aircraft Batteries Using Midtronics Conductance Technology”, by M. Hlavac et al., Jan. 1995, 9 pgs; (13 total pgs.).
“VRLA Battery Monitoring Using Conductance Technology Part IV: On-Line State-of-Health Monitoring and Thermal Runaway Detection/Prevention”, by M. Hlavac et al., Oct. 1995, 9 pgs; (13 total pgs.).
“VRLA Battery Conductance Monitoring Part V: Strategies for VRLA Battery Testing and Monitoring in Telecom Operating Environments”, by M. Hlavac et al., Oct. 1996, 9 pgs; (13 total pgs.).
“Midpoint Conductance Technology Used in Telecommunication Stationary Standby Battery Applications Part VI: Considerations for Deployment of Midpoint Conductance in Telecommunications Power Applications”, by M. Troy et al., Oct. 1997, 9 pgs; (13 total pgs.).
“Impedance/Conductance Measurements as an Aid to Determining Replacement Strategies”, M. Kniveton, Sep. 1998, pp. 297-301; (9 total pgs.).
“A Fundamentally New Approach to Battery Performance Analysis Using DFRA™/DTIS™ Technology”, by K. Champlin et al., Sep. 2000, 8 pgs; (12 total pgs.).
“Battery State of Health Monitoring, Combining Conductance Technology With Other Measurement Parameters for Real-Time Battery Performance Analysis”, by D. Cox et la., Mar. 2000, 6 pgs; (10 total pgs.).
Search Report and Written Opinion from PCT Application No. PCT/US2011/026608, dated Aug. 29, 2011, 9 pgs.
Office Action for corresponding U.S. Appl. No. 10/656,526, dated Apr. 4, 2005, 8 pages.
Office Action for corresponding U.S. Appl. No. 10/656,526, dated Mar. 10, 2006, 7 pages.
Office Action for corresponding U.S. Appl. No. 10/656,526, dated Sep. 22, 2005, 5 pgs.
Office Action for corresponding U.S. Appl. No. 10/656,526, dated Oct. 5, 2004, 6 pgs.
Office Action for corresponding U.S. Appl. No. 11/641,594, dated Feb. 28, 2008, 7 pgs.
Office Action for corresponding U.S. Appl. No. 11/641,594, dated Mar. 5, 2010, 10 pgs.
Office Action for corresponding U.S. Appl. No. 11/641,594, dated Mar. 10, 2011, 11 pgs.
Office Action for corresponding U.S. Appl. No. 11/641,594, dated May 24, 2010, 8 pgs.
Office Action for corresponding U.S. Appl. No. 11/641,594, dated Jun. 1, 2009, 9 pgs.
Office Action for corresponding U.S. Appl. No. 11/641,594, dated Aug. 25, 2008, 8 pgs.
Office Action for corresponding U.S. Appl. No. 11/641,594, dated Sep. 6, 2011, 13 pgs.
Office Action for corresponding U.S. Appl. No. 11/641,594, dated Sep. 15, 2009, 9 pgs.
Office Action for corresponding U.S. Appl. No. 11/641,594, dated Oct. 29, 2010, 11 pgs.
Office Action for corresponding U.S. Appl. No. 11/641,594, dated Dec. 11, 2008, 8 pgs.
Communication from GB1216105.5, dated Sep. 21, 2012.
Notification of Transmittal of the International Search Report and Written Opinion from PCT/US2011/039043, dated Jul. 26, 2012.
Notification of Transmittal of the International Search Report and Written Opinion from PCT/US2011/053886, dated Jul. 27, 2012.
“Field Evaluation of Honda's EV PLUS Battery Packs”, by A. Paryani, IEEE AES Systems Magazine, Nov. 2000, pp. 21-24.
Examination Report under section 18(3) for corresponding Great Britain Application No. GB1000773.0, dated Feb. 6, 2012, 2 pages.
Search Report from PCT/US2011/047354, dated Nov. 11, 2011.
Written Opinion from PCT/US2011/047354, dated Nov. 11, 2011.
First Office Action (Notification of Reasons for Rejections) dated Dec. 3, 2013 in related Japanese patent application No. 2013-513370, 9 pgs. Including English Translation.
Official Action dated Jan. 22, 2014 in related Korean patent application No. 10-2012-7033020, 2 pgs including English Translation.
Office Action from U.S. Appl. No. 11/641,594, dated Mar. 22, 2013.
Office Action from U.S. Appl. No. 11/641,594, dated Dec. 10, 2012.
Office Action from U.S. Appl. No. 11/641,594, dated Mar. 29, 2012.
Official Action dated Feb. 20, 2014 in Korean patent application No. 10-2013-7004814, 6 pgs. including English Translation.
First Office Action for Chinese Patent Application No. 201180011597.4, dated May 6, 2014, 20 pages.
Office Action from Korean Application No. 10/2012-7033020, dated Jul. 29, 2014.
Office Action for Chinese Patent Application No. 201180038844.X, dated Jul. 1, 2014, 11 pages.
Office Action for Chinese Patent Application No. 201180030045.8, dated Jul. 21, 2014, 16 pages.
Office Action for Japanese Patent Application No. 2013-513370, dated Aug. 5, 2014, 9 pages.
Office Action for Japanese Patent Application No. 2013-531839, dated Jul. 8, 2014, 10 pages.
Related Publications (1)
Number Date Country
20120035870 A1 Feb 2012 US
Divisions (1)
Number Date Country
Parent 10656526 Sep 2003 US
Child 11641594 US
Continuation in Parts (1)
Number Date Country
Parent 11641594 Dec 2006 US
Child 13276639 US