Number | Date | Country | Kind |
---|---|---|---|
199 21 063 | May 1999 | DE |
Filing Document | Filing Date | Country | Kind |
---|---|---|---|
PCT/DE00/01392 | WO | 00 |
Publishing Document | Publishing Date | Country | Kind |
---|---|---|---|
WO00/68750 | 11/16/2000 | WO | A |
Number | Name | Date | Kind |
---|---|---|---|
5089970 | Lee et al. | Feb 1992 | A |
5463555 | Ward et al. | Oct 1995 | A |
5544062 | Johnston, Jr. | Aug 1996 | A |
5550735 | Slade et al. | Aug 1996 | A |
5596502 | Koski et al. | Jan 1997 | A |
5777876 | Beauchesne | Jul 1998 | A |
5974004 | Dockes et al. | Oct 1999 | A |
6141598 | Nam | Oct 2000 | A |
6345259 | Sandoval | Feb 2002 | B1 |
6424878 | Barker et al. | Jul 2002 | B1 |
Entry |
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The Authoritative Dictionary of IEEE Standards Terms 2000, 7th edition, Standards Information Network IEEE Press, p. 685. |