The present invention relates to magnetic storage devices. More particularly, the present invention relates to the early detection of thermal decay in magnetic storage devices.
Computer disk drives store digital information on magnetic disks. The magnetic disks are generally coated with a magnetic material capable of changing the direction of its magnetic orientation in response to an applied magnetic field. Information is stored on the magnetic disks as a series of magnetic transitions. Typically, the information is stored on each disk in concentric tracks that are divided into servo sectors and data sectors. Information is written to or read from a disk by a transducer head mounted on an actuator arm that is capable of moving the transducer head radially over the disk. The movement of the actuator arm allows the transducer head to access different tracks. The disks are rotated by a spindle motor at a high speed, allowing the transducer head to access different sectors within each track on the disk. The transducer head may include integrated read and write heads.
In response to the increasing need to store large amounts of digital data in connection with computer systems, magnetic storage devices have utilized increased data storage densities. In order to support high data densities, the magnetic material of the magnetic disks must be provided in a very thin layer. In addition, high data densities require magnetic material with a small grain size. A thin layer and a small grain size reduce noise, and allow magnetic transitions to be more closely spaced together. However, the energy required to switch the magnetization of the material is decreased when the magnetic material has a small grain size and is provided in a thin layer. Accordingly, as the grain size and the layer thickness of the magnetic material has decreased, the material has become more susceptible to data loss due to thermal decay.
Thermal decay is related to the ratio of the energy barrier that must be crossed in order to switch the magnetization of the magnetic material of a magnetic disk to the thermal energy of the surrounding environment. In general, as the energy in the environment becomes more nearly equal to this energy barrier, thermal decay is more likely to occur. A magnetic disk having only a thin layer of magnetic material is particularly susceptible to thermal decay because the energy required to switch the magnetization of a portion of that disk is low. In addition, when data is stored at high densities, the area of the disk used to store a bit of information as a particular magnetic polarity (i.e. a bit cell) is small. Therefore, the energy required to switch the magnetization of a bit cell is reduced with increased areal densities. Furthermore, as grain sizes have been reduced, the anisotropic energy associated with each grain has also been reduced. As the anisotropic energy of each grain becomes nearer to the ambient thermal energy in a disk drive, information stored on the magnetic disk is more likely to be lost due to thermal decay.
As will be understood by those skilled in the art, the anisotropic energy of a grain is the fixed amount of energy required to maintain a stored direction of magnetization in the magnetic material, and is equal to the anisotropic energy density, Ku, times the volume of the grain, V. A thermal instability ratio is defined as the anisotropic energy divided by the thermal energy, kT, and is given by the formula KuV/kT, which should be greater than 50 in a conventional disk drive for adequate thermal stability. Ultimately, if a certain number of grains change their direction of magnetization due to thermal effects, the amplitude of a signal produced in the transducer head when the affected area is read will be decreased. Once the stored information decays beyond a threshold level, it will be impossible to properly read data written to the disk with the read head. In particular, the loss in the amplitude of a signal produced in the transducer head will cause data to be lost.
In order to address the effects of thermal decay, various measures have been taken. For example, error correction code may be used to restore data lost through processes such as thermal decay. However, the ability of error correction code to restore lost data is limited. In addition, the use of error correction code results in decreased user data density.
Attempts have also been made to produce magnetic disks having grains with large anisotropic energies. However, increasing the anisotropic energy of the grains generally requires larger grain sizes. As mentioned above, a larger grain size increases the noise of a signal produced by data stored on the magnetic disk. In particular, the transition noise is increased. Increased noise reduces the signal to noise ratio, and may adversely affect the bit error rate of the disk drive. In addition, if the anisotropic energy is increased by increasing the anisotropic constant (Ku), the coercivity (Hc) is also increased, and it becomes more difficult to write transitions to the magnetic disk.
Disk drive manufacturers have also limited the effects of thermal decay by requiring the magnetic material on a magnetic disk to be at least a certain minimum thickness, thereby increasing the volume of grains within a bit cell. However, as with increased grain sizes, increasing the thickness of the magnetic material increases noise when data is read from the magnetic disk.
For the above-stated reasons, it would be desirable to provide a method and an apparatus that allowed for increased data storage densities, without losing data due to thermal decay. In particular, it would be desirable to provide a method and an apparatus capable of providing an early warning of thermal decay. In addition, it would be advantageous to provide such a method and apparatus that are reliable in operation and that are inexpensive to implement.
In accordance with the present invention, a method and an apparatus for providing an early warning of thermal decay in connection with magnetic storage media are provided. The present invention generally allows thermal decay to be detected before such decay has led to data loss from the magnetic storage device. In particular, the present invention allows remedial action to be taken before thermal decay results in data loss.
In accordance with one embodiment of the present invention, a test pattern determined to have a relatively high susceptibility to thermal decay is written to a magnetic storage device. For example, the test pattern may be written to a smaller volume of magnetic material than would be used if that test pattern were written as normal user data. This may be achieved by writing the test pattern using smaller bit cells, by writing the test pattern to an area of the disk having a thinner than average layer of magnetic material, or by using a combination of these approaches.
In accordance with a further embodiment of the present invention, the test pattern is written at a data frequency associated with a track or zone located at an outside diameter of a magnetic storage disk, but is written on a track located towards an inner diameter of the disk. Such an embodiment is particularly useful in connection with a longitudinal recording scheme.
In accordance with yet another embodiment, a gray code pattern of transitions is written to the outside diameter of the disk. Alternatively or in addition, the test pattern is written at a data frequency associated with a track or zone located at an inside diameter of a magnetic storage disk, but is written on a track located towards an outer diameter of the disk. Such an embodiment is particularly useful in connection with a perpendicular recording scheme.
In accordance with another embodiment of the present invention, the test pattern utilizes a pattern of transitions that have been determined to be particularly susceptible to thermal decay. Such a test pattern may be developed by design engineers in consideration of the magnetic and mechanical properties of the storage device. In addition, automated testing of a plurality of test patterns to select a pattern that is particularly susceptible to thermal decay in connection with a particular storage device or family of storage devices may be performed.
In accordance with still another embodiment of the present invention, a portion of the media upon which data is stored that is particularly susceptible to thermal decay is identified. For example, an area of the disk having an especially thin layer of magnetic material is identified. This area of the disk may be identified by reading the amplitudes of selected servo information, such as automatic gain control (AGC) fields. A sector associated with a piece of monitored servo sector information having a low amplitude is generally more susceptible to thermal decay, for example because it is associated with an area of the disk in which the layer of magnetic material is thinner. Accordingly, the volume of magnetic material in the area is relatively low, and the area is thus more susceptible to the effects of thermal decay. In accordance with yet another embodiment of the present invention, an area of a magnetic storage disk that is particularly susceptible to the effects of thermal decay is created on purpose. For example, an area of the disk corresponding to one or more sectors or tracks may be provided with a layer of magnetic material that is thinner than the layer of magnetic material in areas of the disk intended for storing normal user data. A test pattern may then be written to the area identified as being more susceptible to thermal decay or created to be more susceptible to thermal decay.
According to still another embodiment of the present invention, a pattern that has been determined to be particularly susceptible to thermal decay may be written to an area of the disk that is particularly susceptible to thermal decay.
Following the selection of a test pattern and/or a test pattern location, the test pattern is written to the storage device. The test pattern is then read, and the amplitude of the signal produced by reading the test pattern is stored. In order to detect an indication of thermal decay, the test pattern is later read again, and the amplitude of the signal thus obtained is observed. The observed amplitude is compared to the stored amplitude. If the stored amplitude is greater than the observed amplitude, a signal warning of thermal decay is generated. In accordance with still another embodiment of the present invention, a signal warning that thermal decay has been detected is generated if the stored amplitude is greater than the observed amplitude plus a marginal value.
In response to a signal warning of thermal decay, the storage device may automatically take measures to prevent data loss. For example, data stored in the device may be rewritten. Rewriting the data protects against data loss due to thermal decay by realigning magnetic domains that may have been altered due to the effects of thermal decay.
Additional advantages of the present invention will become readily apparent from the following discussion, particularly when taken together with the accompanying drawings.
With reference now to
Actuator arm assemblies 116 (only one of which is shown in
With reference now to
The tracks 132 on the magnetic disk 108 may further be divided into a plurality of zones 212a-c. The grouping of tracks 132 into a plurality of zones 212 facilitates the efficient storage of data on the disk 108. For example, because the disk 108 rotates at a constant speed, user data may be stored in tracks 132 associated with a zone (e.g., zone 212a) located towards an outside diameter of the disk 108 at a relatively high frequency, while maintaining adequate disk area to reliably store the data as magnetic transitions. In contrast, user data generally cannot be written to a track 132 within a zone (e.g., zone 212c) located towards an inner diameter of the disk 108 at the same high frequency as user data for storage in a track in a zone at an outer diameter, such as zone 212a. This is because at the inside diameter, insufficient disk area would be then used in connection with the magnetic transitions used to store user data reliably.
Although the magnetic disk 108 illustrated in
In addition, alternate configurations of magnetic disks 108 are possible. For example, in a computer disk drive 100 having several magnetic disks 108, a surface of one of the disks 108 may be dedicated to servo information, while the surfaces of the remaining disks may be used exclusively to store data.
With reference now to
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The inventors of the present invention have recognized that particular sequences of data and the location on the magnetic disk 108 to which data is written affect the susceptibility of the data to thermal decay. In general, with respect to a longitudinal recording scheme, a sequence of data featuring a relatively high number of magnetic transitions, such as a 1T pattern, utilizes a relatively small continuous volume of magnetic material for each magnetic polarization. Because fewer grains of magnetic material are aligned in the same direction, a change in the orientation of relatively few of the grains due to thermal decay has a relatively large effect. Also, if a sequence of data is written at a higher than normal frequency in a longitudinal recording scheme, the volume of each bit cell (e.g., bit cells 300 in
With respect to a perpendicular recording scheme, a sequence featuring a relatively low number of magnetic transitions, for example a 12T or 24T pattern, is more susceptible to thermal decay. In addition, a pattern written towards the outside diameter of a disk, where individual bit cells (e.g. bit cells 400 in
With respect to both longitudinal and perpendicular recording schemes, an area of the disk 108 having a thinner than normal layer of magnetic material will result in bit cells 300 or 400 having a smaller than normal volume of magnetic material. Therefore, a test pattern written to an area identified as having a particularly thin layer of magnetic material will be more susceptible to thermal decay. Thinner areas of a disk 108 may be the result of normal manufacturing variations, or they may be created intentionally during manufacture of the disk 108.
With reference now to
With respect to a longitudinal recording scheme, the test pattern is preferably more susceptible to thermal decay than a 1T pattern written as normal user data. For example, the test pattern may be written at a frequency that is higher than the frequency used to write user data to the same or a similar track 132, and thus at a relatively high data density. The test pattern may be written at a higher frequency than that used for normal user data by writing the test pattern to a track 132 included in a zone 212 (e.g., zone 212c of
With respect to a perpendicular recording scheme, the test pattern may be written so that the frequency of magnetic transitions is relatively low. For example, in accordance with one embodiment of the present invention, the test pattern is written as a 12T pattern. In accordance with still another embodiment of the present invention, the test pattern is written as a 24T pattern. In addition, the test pattern may be written at a lower frequency (and thus at a lower data density) than that used for normal user data, by writing the test pattern to a track 132 included in a zone 212 (e.g., zone 212a of
In accordance with still another embodiment of the present invention, the test pattern may involve the writing of a series of magnetic transitions that is particularly susceptible to thermal decay. For example, a test pattern may be developed in which, due to the particular pattern of magnetic transitions, the magnetic domains that comprise the magnetic transitions are particularly unstable. Such a test pattern may be selected, at least in part, utilizing an automated process in which a plurality of evaluation test patterns are written to a disk 108. The disk 108 may then be stressed, for example, by subjecting the disk 108 to elevated temperatures. The evaluation test pattern with respect to which the greatest amount of thermal decay is evident may then be selected as a thermal decay test pattern for writing to all surfaces of the disk 108 included in a drive 100. Alternatively, such a determination may be made in connection with a family of disk drives 100 by analyzing a particular example disk drive 100. An example of such a test pattern in connection with a longitudinal recording scheme is a pattern that includes a combination of 2T and 1T patterns. In connection with a perpendicular recording scheme, such a test pattern may include a combination of 24T and 12T patterns.
At step 504, the amplitude of a signal produced in the channel 140 from reading the test pattern is measured. That amplitude, which will be used as a reference amplitude, is then stored (step 508). The amplitude may be stored in the disk drive 100 itself, for example on the magnetic storage disk 108, or in memory (not shown) associated with the disk drive 100. In general, steps 500-508 may be performed before the disk drive 100 is delivered to the end user.
At step 512, a determination is made as to whether the drive 100 should be tested for indications of thermal decay. For example, testing of the drive 100 may be indicated after a predetermined period of time has elapsed. For instance, a disk drive may initiate a self test for indications of thermal decay every two weeks. Alternatively or in addition, testing for thermal decay may be initiated in response to a user's instruction to begin such testing. Testing may also be indicated based on a combination of the amount of time that has elapsed since the last test was performed, and the operating temperature experienced by the disk drive 100. Once it has been determined that the disk drive 100 should be tested for indications of thermal decay, the test pattern is read from the disk 108 to obtain an observed amplitude of the signal produced in the channel 140 by the test pattern (step 516).
At step 520, a determination is made as to whether the stored reference amplitude is greater than the observed amplitude. In order to reduce the sensitivity of the disk drive 100 to normal variations in the observed amplitude, the comparison may be made between the stored amplitude and the observed amplitude plus a marginal value. In general, the marginal value should be large enough that a small attenuation of the observed signal, such as may be caused by noise in the channel 140, does not cause a thermal decay warning signal to be generated. If the stored amplitude is greater than the observed amplitude plus a marginal amount, a thermal decay warning signal is generated (step 524).
In response to a thermal decay warning signal, the hard disk drive 100 may take steps to ensure the integrity of user data stored in the disk drive 100. For example, data stored in the disk drive 100, or on a surface of a disk 108 in connection with which an indication of thermal decay has been detected, may be rewritten. Alternatively, the warning may be communicated to the user, and the user may decide what action should be taken to ensure the integrity of the data.
With reference now to
Next, a determination is made as to whether testing for indications of thermal decay should be performed (step 616). As with the previous embodiment described in connection with
In accordance with another embodiment of the present invention, a test pattern can be used in connection with a disk drive's 100 internal diagnostic procedures to provide an early warning of thermal decay. For example, the voltage gain amplitude (VGA) register value obtained when the transducer head 124 is reading the test pattern can be stored. When testing of the disk drive 100 is desired, the test pattern is again read and the VGA value obtained is compared to the stored VGA value. If the observed VGA value is 10% less than the stored VGA value, a thermal decay warning signal may be generated.
With respect to any of the embodiments of the present invention, testing for thermal decay may be performed in connection with each surface of each disk 108 included in a disk drive 100. Furthermore, certain of the described embodiments may be combined in a single, additional embodiment. For example, a test pattern that has been determined to be particularly susceptible to thermal decay may be written to an area of a disk surface that has been identified as being particularly susceptible to thermal decay. In addition, although the above description has used a hard disk drive as an example, the present invention is equally applicable to other types of magnetic storage devices.
The foregoing discussion of the invention has been presented for purposes of illustration and description. Further, the description is not intended to limit the invention to the form disclosed herein. Consequently, variations and modifications commensurate with the above teachings, within the skill and knowledge of the relevant art, are within the scope of the present invention. The embodiments described hereinabove are further intended to explain the best mode presently known of practicing the invention and to enable others skilled in the art to utilize the invention in such or in other embodiments and with various modifications required by their particular application or use of the invention. It is intended that the appended claims be construed to include the alternative embodiments to the extent permitted by the prior art.
Priority is claimed from U.S. Provisional Patent Application No. 60/223,444, filed Aug. 4, 2000 entitled “METHODS OF EARLY WARNINGS FOR THERMAL DECAY IN MAGNETIC DEVICES,” which is incorporated herein by reference in its entirety.
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