Number | Name | Date | Kind |
---|---|---|---|
4164003 | Cutchaw | Aug 1979 | |
4376560 | Olsson et al. | Mar 1983 | |
4554505 | Zachry | Nov 1985 | |
4830623 | Owens et al. | May 1989 | |
4832612 | Grabbe et al. | May 1989 | |
4933808 | Horton et al. | Jun 1990 | |
4943242 | Frankeny et al. | Jul 1990 | |
5037311 | Frankeny et al. | Aug 1991 | |
5099393 | Bentlage et al. | Mar 1992 | |
5163834 | Chapin et al. | Nov 1992 | |
5248262 | Busacco et al. | Sep 1993 | |
5262925 | Matta et al. | Nov 1993 | |
5397245 | Roebuck et al. | Mar 1995 | |
5413489 | Switky | May 1995 | |
5426405 | Miller et al. | Jun 1995 | |
5468158 | Roebuck et al. | Nov 1995 | |
5653600 | Ollivier | Aug 1997 | |
5730620 | Chan et al. | Mar 1998 |
Entry |
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DieMate from Texas Instruments A Bare Die Burn-in & Test Interconnect System--Texas Instruments 1994. |
IBM Microelectronics CBeam.TM. Connector 1995. |