Number | Name | Date | Kind |
---|---|---|---|
5566371 | Ogawa | Oct 1996 | |
5579322 | Orodera | Nov 1996 | |
5590087 | Chung | Dec 1996 |
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Ad J. van de Goor et al., "Fault Models and Tests for Ring Address Type FIFOs", VLSI Test Symposium (IEEE) Jun., 1994, pp. 300-305. |
T. Matsumura, "An Efficient Test Method for Embedded Multi-port RAM with BIST Circuitry", International Test Conference 1995, pp. 62-67. |
B. Nadeau-Dostie et al., "Serial Interfacting for Embedded-Memory Testing", IEEE Design & Test of Computers, Apr. 1990, pp. 52-63. |