Claims
- 1. A method of laser treatment for the ablation, by UV laser radiation in an oxidizing environment, of photoresists from substrate surfaces chosen from the group consisting of semiconductor wafers and flat panel, said method comprising:(a) dividing a substrate surface into a plurality of transverse strips, said transverse strips being parallel and adjacent each other, each of said strips being divided into a number of elementary portions; (b) irradiating a pulse laser beam onto a first of said elementary portions comprised in a first of said strips; (c) irradiating said beam onto a second of said elementary portions comprised in a second of said strips, wherein said second of said strips is not adjacent to said first of said strips; (d) thereafter, successively irradiating said beam onto said elementary portions arranged in such a succession that each of said portions is comprised in a strip which is different from the strip which comprises the immediately preceding and from the strip which comprises the immediately following ones of said elementary portions; and (e) continuing to irradiate said beam onto said elementary portions of said succession until all of said elementary portions of said plurality of transverse strips have been irradiated.
- 2. The method of claim 1, wherein said pulse laser beam impinges on each elementary portion of said substrate surface successively at two angles opposite to one another relative to a plane perpendicular to said substrate surface.
- 3. The method of claim 1, wherein said pulsed laser beam is displaced relative to said substrate in a continuous manner parallel to said transverse strips and in a discontinuous manner perpendicular to said transverse strips.
- 4. The method of claim 3, wherein said pulsed laser beam irradiates a portion of said transverse strips with a pre-determined amount of energy.
- 5. The method of claim 1, wherein said transverse strips are rectilinear.
- 6. The method of claim 3, wherein said displacement of said pulsed laser beam relative to said substrate is effected by displacing said beam.
- 7. The method of claim 3, wherein said displacement of said pulsed laser beam relative to said substrate is effected by displacing said substrate.
- 8. The method of claim 3, wherein said displacement of said pulsed laser beam relative to said substrate is synchronized with laser pulses.
- 9. The method of claim 2, wherein said angle is equal to arc cotangent of an expected aspect ratio of substrate surface depressions.
- 10. The method of claim 9, wherein said angle is between 20 and 60 degrees.
- 11. The method of claim 1, wherein an oxidizing gas flows over the substrate surface parallel to said transverse strips.
Priority Claims (1)
Number |
Date |
Country |
Kind |
119672 |
Nov 1996 |
IL |
|
Parent Case Info
This Application is a continuation of PCT/IL97/00365 filed Nov. 12, 19997.
US Referenced Citations (6)
Foreign Referenced Citations (4)
Number |
Date |
Country |
0200089 |
Dec 1986 |
DE |
0200089 |
Dec 1986 |
DE |
0276078 |
Jul 1988 |
GB |
WO9507152 |
Mar 1995 |
WO |
Continuations (1)
|
Number |
Date |
Country |
Parent |
PCT/IL97/00365 |
Nov 1997 |
US |
Child |
09/314205 |
|
US |