The present invention relates to a method for the stabilization of spectrometric transducers.
An embodiment of the present invention will now be described by way of example only with reference to the accompanying drawings, in which:
In
where λ is wavelength, t is time, g(λ, t) is the filter response function, and Fy[·] is a slightly nonlinear scalar function of a scalar variable. For a monochromatic input signal, whose spectrum is χ(λ)=δ(λ−1), this model responds with:
and to the input signal whose spectrum is flat, χ(λ)=1, it responds with:
The response g(1, t), defined by Equation 2, is a gaussoid-like function with a maximum changing monotonically with the wavelength 1. The function of time g0(t), defined by Equation 3, characterizes the amplitude variability of the filter response along the wavelength axis.
As shown in
Assume that the function λ=F0 (u) is the result of wavelength calibration for a selected ambient temperature T0 represented by the voltage U0. Assume, moreover, that the input signal is generated by a battery of lasers whose central wavelengths are uniformly distributed in the interval [λmin, λmax]:
Then, the maxima y0,jmax of the response of the stabilized filter to such a signal may be easily identified together with the corresponding values of the voltage u(t):u0,j=F0−1(λj) for j=1, . . . , J. The practical purpose of controlling the current i(t) 38 may be now formulated as follows. For an arbitrary ambient temperature T, find i(t) such that the maxima of the stabilized filter response remain as close as possible to the maxima determined for T0 , i.e. the coordinates of the maxima for the ambient temperature T, the values u1, . . . , uJ of the voltage u(t) and the values y1max, . . . , yJmax of the output signal y(t), satisfy the condition:
w[(u1−u0,1)2+ . . . , +(uJ−u0,J)2]+(1−w)[(y1max−y0,1max)2+ . . . +(yJmax−y0,Jmax)2]→MIN Equation 5
where w∈[0, 1] is a weighing factor.
The task of control may be significantly simplified (at the price of the sub-optimality of the solution) by an appropriate parameterization of the heating current i(t). An example of such a parameterization is defined by the formula:
where i1, i2, i3, t2 and t3 are parameters of the current to be optimized by minimization of the left-hand side of Equation 5. The parameterization of controlled current enables one to use an empirical procedure of optimization that does not require any explicit reference to the mathematical model of the stabilized filter. This procedure is implemented in the controller and is depicted by the flow chart shown in
In block 62, for the selected ambient temperature T0, the values of i1, i2, i3, t2 and t3 are chosen so as to produce a relatively uniform distribution of u0,j=F0−1(λj) for j=1, . . . , J.
Then in block 64, on the basis of measurements performed for the same ambient temperature, the matrix Sy, of the sensitivity of the maxima y1max, . . . , yJmax is computed for a small change in the ambient temperature ΔT and for small changes Δi1, Δi2, Δi3, Δt2 and Δt3 in the parameters i1, i2, i3, t2 and t3.
Similarly, in block 66, on the basis of measurements performed for the same ambient temperature, the matrix Su of the sensitivity of the corresponding maxima voltage values u1, . . . , uJ to is computed for a small change in the ambient temperature ΔT and for small changes Δi1, Δi2, Δi3, Δt2 and Δt3 in the parameters i1, i2, i3, t2 and t3 .
In block 68, the following minimization problem is solved:
with respect to Δi1, Δi2, Δi3, Δt2 and Δt3 for an assumed (sufficiently small) increment ΔT of the ambient temperature.
Following which, in block 70, the ambient temperature is changed to the value T=T0+ΔT; the new values of i1, i2, i3, t2 and t3 are computed using increments Δi1, Δi2, Δi3, Δt2 and Δt3 determined in block 68; i1, i2, i3, t2 and t3 are empirically corrected in such away as to satisfy the condition defined by Equation 5.
Finally, blocks 62 to 70 are repeated iteratively as to cover the whole range of ambient temperatures the stabilized filter is assumed to operate in.
It should be noted that the whole process of optimization is subject to the constraint concerning the admissible values of current and heating time.
A further refinement of the thermal stabilization of the stabilized filter is possible during the software pre-processing of the data provided by the stabilized filter using the above described hardware means. The residual instabilities may be characterized during general calibration of the stabilized filter, and the results of this characterization may next be used for correction of the raw data before their pre-processing.
A closer empirical study of the current i(t) control based on Equation 6 provides the following:
Consequently, a second example of the current i(t) parameterization may been designed. It is defined by the formula:
where the parameters a1, b1, c1 and a2, b2, c2 should satisfy the following conditions:
i(0)=I0, i(1)=I1, i(3)=I3, and i(5)=I5 Equation 9
The solution of the above algebraic problem has the form:
and c1=I0, c2=I1. An example of the current i(t) generated according to the above formula is shown in
The components of a spectrometer or the device in which it is used such as an OPM are subject to aging. Consequently, the parameters of the OPM drift in time. In particular, the absolute accuracy of wavelength estimation is deteriorating. Taking into account that the contemporary DWDM transmitters contain highly stable lasers, one may use the time series of wavelength estimates as the basis for compensation of the time drift of the OPM.
The idea of using time series of wavelength estimates provided by the OPM for time drift compensation of this OPM is based on an assumption that the average deviation of the central wavelength of the laser signal used for this purpose is close to zero, i.e. there is no systematic evolution of this wavelength over time. Consequently, the average deviation of the central wavelength as computed by the OPM should be expected to also be close to zero. If not, this average deviation may be used to model the OPM's drift and provide a way of stabilizing the OPM by compensating for this time drift.
A wavelength such as described above may be modelled by means of a stochastic process:
l(t)=i+δl(t) Equation 11
where t is time, i is the central wavelength value according to the ITU grid, and δl(t) is a stochastic process modelling the wavelength deviation from the ITU-grid value. The latter process is assumed to be zero-mean and stationary. Consequently, the time sampling of l(t) at equidistant time points, t1, . . . , tN, yields the vector of random variables:
1=[l(t1) . . . l(tN)]T Equation 12
such that:
Under the above assumptions, a result of central wavelength measurement, provided by the OPM drifting in time, may be modelled with:
i(tn)=l(tn)+Δl(tn)=i+Δl(tn)+δl(tn) for n=1, . . . , N Equation 14
where Δl(tn) is the time drift of wavelength to be estimated on the basis of the realizations {circumflex over (l)}(tn) of the random variables {circumflex over (l)}(tn). The vector {circumflex over (l)}=└{circumflex over (l)}(t1) . . . {circumflex over (l)}(tN)┘T has the following statistical properties:
Assuming that the solution is to be approximated by a linear combination:
of known functions δj(t), such as, for example, a polynomial, an orthogonal polynomial, a trigonometric polynomial, a b-spline, etc, with unknown coefficients pj forming the vector p=[pi . . . pJ]T. This vector is to be estimated on the basis of the approximate equations:
that may be given a matrix form:
Φp≅Δl Equation 18
where:
Under an assumption that there is no correlation between consecutive samples provided by the OPM, i.e. all cn,v=0, the LS solution of this equation has the form:
{circumflex over (p)}=(ΦTΦ)−1ΦT Δ{circumflex over (l)} Equation 20
and the corresponding covariance matrix is:
Cov[{circumflex over (p)}]=(ΦT Φ)−1 σ2 Equation 21
If the correlation between samples cannot be neglected, then the solution takes on the form:
{circumflex over (p)}=(ΦT Σ−1 Φ)−1 ΦT Σ−1 Δ{circumflex over (l)}̂ Equation 22
and the corresponding covariance matrix is:
Cov[{circumflex over (p)}]=(ΦT Σ−1 Φ)−1 Equation 23
If the samples may be considered uncorrelated, then estimates {circumflex over (p)}j, . . . , {circumflex over (p)}K of the parameters pJ, . . . , pK, characterizing the drift of K DWDM channels, may be obtained using the LS method, described in the previous section, in an integrated numerical process:
[{circumflex over (p)}l . . . {circumflex over (p)}K]=(ΦT Φ)−1 ΦT [Δ{circumflex over (l)}1. . . Δ{circumflex over (l)}K] Equation 24
where Δ{circumflex over (l)}K is the vector of deviations of the results of measurements of the central wavelength in the kth channel from the ITU-grid value of this wavelength. In general, the channels may differ in the laser wavelength deviation; the corresponding variances σ12, . . . σK2 may be estimated according to the formula:
Then the uncertainty-based weighing may be applied to obtain the solution:
characterizing the wavelength-averaged drift of the OPM over time.
If the maximum deviation of the central wavelength of the laser signal used for the OPM drift compensation is negligible with respect to the assumed maximum error of wavelength measurements performed by the OPM, then the time drift of the OPM may be corrected on the basis of a single result of measurement.
As well, if the standard deviation of the central wavelength averaged over a time interval ΔT is negligible with respect to the assumed standard deviation of the error of wavelength measurements performed by the OPM, and the OPM drift during the time interval ΔT is negligible, then the time drift of OPM may be corrected on the basis of the average of results of measurement performed during ΔT.
Although the present invention has been described by way of a particular embodiment and examples thereof, it should be noted that it will be apparent to persons skilled in the art that modifications may be applied to the present particular embodiment without departing from the scope of the present invention.
This application is a continuation of U.S. patent application Ser. No. 12/318,040 filed on Dec. 19, 2008 which is a continuation of U.S. patent application Ser. No. 11/754,781 filed on May 29, 2007 which is a continuation of U.S. patent application Ser. No. 11/038,490 filed on Jan. 21, 2005 which claims priority from U.S. Provisional Patent Application No. 60/537,919 filed on Jan. 22, 2004.
Number | Date | Country | |
---|---|---|---|
60537919 | Jan 2004 | US |
Number | Date | Country | |
---|---|---|---|
Parent | 12318040 | Dec 2008 | US |
Child | 12901238 | US | |
Parent | 11754781 | May 2007 | US |
Child | 12318040 | US | |
Parent | 11038490 | Jan 2005 | US |
Child | 11754781 | US |