Number | Name | Date | Kind |
---|---|---|---|
4296371 | Keizer et al. | Oct 1981 | |
4341472 | Gorog et al. | Jul 1982 | |
4523850 | Covey et al. | Jun 1985 |
Entry |
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M. T. Gale et al. Entitled "Image Sampling and Analysis Technique for High-Resolution Measurement of Micrometer-Sized Features", Intern'l Conf. on Optoelectronics in Telecommunication and Measurement Systems, Oct. 12, 1982. |
M. T. Gale et al. Entitled "Image Sampling and Analysis Technique for High-Resolution Measurement of Micrometer-Sized Features," RCA Engineer, 29-2 Mar./Apr. 1984. |