The present invention relates to electromagnetic interference (EMI) shielding, and more particularly, to an improved method and apparatus for shielding electronic modules from EMI entering or exiting. The invention has particular applicability in small form factor pluggable (SFP and SFP+) optical transceivers, small pluggable modules that are typically installed in a shelf or chassis and used in optical communications systems.
Small form factor pluggable optical transceivers (“SFPs”) are known in the art. Typically, such transceivers consist of an elongated module with at least optical two ports, one for receiving light pulses and another for transmitting light pulses to a remote location. Such devices also typically include an electrical interface. Examples of such devices are disclosed in U.S. Pat. Nos. 7,314,384, and 7,186,134.
These SFP modules typically plug into a shelf or chassis to be used in an optical switch or router. Such modules often include fingerstock that extend outwardly and upwardly from the device in a manner that leaves the end of the fingers not in contact with the SFP. The ends of the fingers resiliently press the rack or chassis and serve to connect the outside of the SFP module to the chassis. One such finger is shown in
One problem is that the point of contact between each finger and the SFP housing is somewhat undefined. Among numerous fingers for a particular SFP module, there may be different contact points. This is due largely to imperfections in the outside surface of the SFP module and the bottom surfaces of the fingers, as depicted in
The distance between the end of the finger that resiliently presses against the chassis, to the part of the finger that contacts the outer surface of the SFP module, represents a source of EMI leakage. Because of the variability of this distance among the plural fingers for a particular SFP module, in some cases, this distance may be longer than the wavelength of signal which represents the EMI (Electromagnetic Interference). This means the gap under the finger permits EMI interference to pass. This problem is particularly acute in relatively high frequency systems, wherein the wavelengths of interest are relatively short.
Another problem with prior art arrangements such as that shown in
A still further problem relates to the latch used to maintain the SFP module in the chassis in which it is typically installed. More specifically, there is often a slidable latch or similar type mechanism that clips the SFP into the chassis. However, this movable part also presents a source of EMI leakage because the EMI signals may leak in around the slidable part.
In view of the foregoing, there exists a need in the art for a more effectively sealed module in order to prevent EMI leakage.
Turning to
The force pushing the seam together may arise by curving either or both portions. Moreover, by orienting the tab 513 and lip 512 slightly downwardly, rather than completely horizontally as shown, a prying force can be obtained which results in similar pressure being placed at the seam. However, the curved embodiment is more preferred and believed to result in a tighter seal.
The area 704 represents an opening in which a latch or suitable structure typically slides or otherwise moves. Because the latch must be able to engage some portion of the chassis into which the SFP module is installed, there is an opening through which EMI leakage may occur.
To minimize leakage here, an EMI gasket materials used to create a seal around the latch. The EMI seal is realized as a compressive/compliant conductive foam gasket or as a metallic spring finger. The positive electrical contact between the sliding latch mechanism and the optical transceiver provided by the conductive foam or metallic spring finger results in an effective EMI seal. The EMI material is preferably placed underneath any slidable, moving mechanism, such as a latch, and assists in further sealing the opening to EMI leakage.
The combination of the fingers with the deformities, one or more curved sections of the module, and additional of the EMI gasket results in the sealing of the SFP module to EMI to a greater degree than was previously thought possible, particularly at higher data rates (e.g.; above 10 GB/s). Any one of more of the foregoing may be used alone or in combination to assist in the diminishing EMI from interfering with the operation of the device. While the foregoing describes the preferred embodiment of the invention, various modifications and/or additions will be apparent to those of skill in the art.