Number | Date | Country | Kind |
---|---|---|---|
3412115 | Mar 1984 | DEX | |
3420163 | May 1984 | DEX | |
3430223 | Aug 1984 | DEX | |
3507178 | Mar 1985 | DEX |
Number | Name | Date | Kind |
---|---|---|---|
3440537 | Warner et al. | Apr 1969 | |
4251769 | Ewert et al. | Feb 1981 | |
4549168 | Sieradzki | Oct 1985 | |
4575711 | Suzuki et al. | Mar 1986 | |
4586403 | Lee et al. | May 1986 | |
4589079 | Peter | May 1986 | |
4589554 | Edelbruck et al. | May 1986 |
Number | Date | Country |
---|---|---|
1135384 | Nov 1982 | CAX |
1498062 | Nov 1965 | DEX |
3142468 | Oct 1981 | DEX |
3005746 | Oct 1983 | DEX |
Entry |
---|
Hewlett Packard Catalog, 1984, pp. 90-92. |
Industriellen Messtechnik, 1978, pp. 163-174 and 200-229. |
Siemens-Zeitschrift, 1971, pp. 812-816. |
Feinwerktechnik & Messtechnik, 1977, pp. 863-864 and 1983, p. 115. |