Claims
- 1. A method for identifying chatter conditions including the ability of identifying approaching chatter conditions between machine tool and workpiece in material removal operations comprising
providing a first signal capable of identifying chatter in the material removal operation; providing a second signal at periodic intervals of the material removal operation in synchronism with tool rotation; providing for sampling said first signal with the reception of said second signal over a selected number of said periodic intervals; providing for a first accumulation of the synchronously sampled signals over the selected number of periodic intervals; and providing for the analysis of the values of said synchronously sampled signals to supply an indication of whether the values are tightly grouped showing a stable operation without chatter or a spread distribution of values showing an unstable operation with the presence of chatter.
- 2. The method of claim 1 wherein providing for the analysis of the values of said synchronously sampled signals further includes
providing for the establishment of several groups of signal values; providing for the allocation of each sampled signal to one of said groups of signal values; providing for counting the number of occurrences of sampled signals in each group over said first accumulation; providing for the plotting of a histogram showing the number of occurrences in each group; and providing for the display of said histogram to visually show tight or spread distribution of sampled signals so that action can be taken to alleviate a chatter condition if present.
- 3. The method of claim 2 further including
providing for a second accumulation of the synchronously sampled signals; providing for the determination of the number of occurrences of sampled signals in each said group during said second accumulation; and providing for the updating of the results of said first accumulation with said second accumulation to modify said histogram.
- 4. The method of claim 3 further including
providing for the modification of said histogram over n number of said accumulations; and providing for a moving window by deleting said first accumulation when the n+1 accumulation is determined so that the most recent data is included in said histogram.
- 5. The method of claim 4 wherein said second accumulation includes a portion of signals in said first accumulation and wherein said n+1 accumulation includes a portion of signals in the n accumulation.
- 6. The method of claim 1 wherein said periodic interval occurs once with each revolution of said machine tool.
- 7. The method of claim 6 wherein said first signal is sampled upon the change of state of said second signal.
- 8. The method of claim 1 wherein providing for the analysis of the values of said synchronously sampled signals further includes
providing for the machine implemented calculation of the statistical variance in said first accumulation of the synchronously sampled data wherein relatively low variance values indicate stable operation.
- 9. The method of claim 8 wherein providing for the calculation of variance values further includes
providing for the calculation according to 2σ2=∑i=1N(xi-xm2)N-1,where xm=∑i=1NxiN(1)wherein N=the number of sampled values in an accumulation and x=the value of each synchronously sampled signal in said accumulation.
- 10. The method of claim 9 further including
providing for the display of the calculated variance so that action can be taken to alleviate chatter conditions if present.
- 11. The method of claim 9 further including
providing for a second accumulation of the synchronously sampled signals; providing for the machine implemented calculation of variance in said second accumulation; providing for variance calculations over n number of accumulations; and providing for the deletion of said first accumulation when the n+1 accumulation is determined so that only the most recent data is included.
- 12. The method of claim 11 wherein said second accumulation includes a portion of signals in said first accumulation and wherein said n+1 accumulation includes a portion of signals in the n accumulation.
- 13. Apparatus for identifying chatter conditions including the ability of identifying approaching chatter conditions produced at a machine tool/workpiece interface in material removal operations comprising
a vibration sensor located near said interface to produce first signals indicative of tool and/or workpiece vibration; a processor connected to said vibration sensor to receive said first signals; a source of sampling signals to enable said processor to record the value of said first signal at periodic intervals in synchronism with tool rotation; said processor capable of accumulating sampled first signal values over a selected number of said periodic intervals; and said processor capable of supplying an indication of whether the accumulation of said sampled first signal values are tightly grouped showing a stable operation without chatter or a spread distribution of values showing an unstable operation with the presence of chatter.
- 14. The apparatus of claim 13 further including
a display connected to said processor to visually show tight or spread distributions of said sampled values.
- 15. The apparatus of claim 13 wherein said source of sampling signals is an emitter/detector located near said tool to detect at least a portion of each revolution of said tool and generate a sampling signal used by said processor to trigger sampling of said first signal in synchronism with tool rotation.
- 16. The apparatus of claim 13 wherein said source of sampling signals is the nominal spindle speed of said tool enabling said processor to trigger sampling of said first signal at said periodic intervals.
Parent Case Info
[0001] This application claims the benefit of U.S. Provisional Patent Application No. 60/271,396 filed Feb. 26, 2001 and is an invention of the National Institute of Standards and Technology, Department of Commerce, United States Government.
Provisional Applications (1)
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Number |
Date |
Country |
|
60271396 |
Feb 2001 |
US |