Number | Date | Country | Kind |
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7-128049 | May 1995 | JPX |
This is a divisional of application Ser. No. 08/653,834 filed May 28, 1996, now U.S. Pat. No. 5,815,002, the disclosure of which is incorporated herein by reference.
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Entry |
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"Novel Method for Detection of . . . Resistance," Jpn. J. Appl. Phys. vol. 34, pp. 2260-2265, May 1995. |
Kiyoshi Nikawa et al., Internal Current Imaging of Integrated Circuit Using Optical/Electron/Ion Beam Induced Resistance Change Method (Text in Japanese--Source Unknown) Dec., 1994. |
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Number | Date | Country | |
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Parent | 653834 | May 1996 |