Number | Date | Country | Kind |
---|---|---|---|
7-128049 | May 1995 | JPX |
Number | Name | Date | Kind |
---|---|---|---|
4736159 | Shiragasawa et al. | Apr 1988 | |
4827212 | Kamieniecki | May 1989 | |
4891584 | Kamieniecki et al. | Jan 1990 | |
5087876 | Reiss et al. | Feb 1992 |
Number | Date | Country |
---|---|---|
6-300824 | Oct 1994 | JPX |
Entry |
---|
T. Koyama et al., "Bias-free evaluation technique for Al . . . high sensitive OBIC", Publication of Extended Absts. (The 55th Autumn Mtg, 1994), The Japan Society of Applied Physics, 22a-ZP 10, p. 586 (unavailable month). |
K. Nikawa et al., "Novel Method for Defect Detection in Al Stripes by Means . . . and Detection of Changes in Electrical Resistance", Jpn. J. Appl. Phys., vol. 34, Part 1, No. 5A, May 1995, pp. 2260-2265. |