Number | Name | Date | Kind |
---|---|---|---|
4969122 | Jensen | Nov 1990 | |
5051997 | Sakashita et al. | Sep 1991 | |
5077826 | Grohoski et al. | Dec 1991 | |
5099481 | Miller | Mar 1992 | |
5107501 | Zorian | Apr 1992 | |
5138619 | Fasang et al. | Aug 1992 | |
5173906 | Dreibelbis et al. | Dec 1992 | |
5224101 | Popyack, Jr. | Jun 1993 | |
5258986 | Zerbe | Nov 1993 | |
5301156 | Talley | Apr 1994 | |
5311520 | Raghavachari | May 1994 | |
5329471 | Swoboda et al. | Jul 1994 | |
5349587 | Nadeau-Dostie et al. | Sep 1994 | |
5351213 | Nakashima | Sep 1994 | |
5377148 | Rajsuman | Dec 1994 | |
5388104 | Shirotori et al. | Feb 1995 | |
5574875 | Stansfield et al. | Nov 1996 |
Entry |
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"Testing Embedded Single and Multi-Port RAMs Using BIST and Boundary Scan," Alves, et al. IMAG/TIMA Laboratory publication, 1992 IEEE. |