Number | Name | Date | Kind |
---|---|---|---|
5343251 | Nafeh | Aug 1994 | |
5410619 | Fujisawa et al. | Apr 1995 | |
5659399 | Lin et al. | Aug 1997 | |
5729632 | Tai | Mar 1998 | |
5754681 | Watanabe et al. | May 1998 | |
5765029 | Schweid et al. | Jun 1998 | |
5778156 | Schweid et al. | Jul 1998 | |
5828776 | Lee et al. | Oct 1998 | |
6021220 | Anderholm | Feb 2000 |
Entry |
---|
Dufort et al., Test vehicle for a wafer-scale field programmable gate array, 7th annual Int. conf. on Wafer Scale Inegration, Jan. 20, 1995. |